the radiation being X-rays

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G01N23/083

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/083the radiation being X-rays

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for monitoring feature sizes in digital X-ray i...
- Patent number 12,270,770
- Issue date Apr 8, 2025
- QSA GLOBAL INC.
- Paul Benson
- G01 - MEASURING TESTING
Information Patent Grant
Material detection in X-ray security screening
- Patent number 12,270,772
- Issue date Apr 8, 2025
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection device and x-ray inspection system
- Patent number 12,270,771
- Issue date Apr 8, 2025
- SEC CO., LTD.
- Jong Hui Kim
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Food product quality control system
- Patent number 12,258,221
- Issue date Mar 25, 2025
- Ishida Europe Limited
- Graham Neale
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Grant
Jet blades optical inspection
- Patent number 12,253,481
- Issue date Mar 18, 2025
- AEROSPACE INDUSTRIAL SCAN LTD.
- Lior Greenstein
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for determining information regarding chemica...
- Patent number 12,253,480
- Issue date Mar 18, 2025
- Imagine Scientific, Inc.
- Eric H. Silver
- G01 - MEASURING TESTING
Information Patent Grant
High-energy x-ray imaging system
- Patent number 12,253,648
- Issue date Mar 18, 2025
- Smiths Detection Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
X-ray phase imaging apparatus and X-ray phase imaging method
- Patent number 12,247,933
- Issue date Mar 11, 2025
- Shimadzu Corporation
- Kana Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector, radiation CT apparatus, and method of manufactu...
- Patent number 12,243,903
- Issue date Mar 4, 2025
- Canon Kabushiki Kaisha
- Takashi Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,235,227
- Issue date Feb 25, 2025
- JED CO., LTD
- Osamu Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 12,228,527
- Issue date Feb 18, 2025
- Saki Corporation
- Hiroyuki Murata
- G01 - MEASURING TESTING
Information Patent Grant
Food product monitoring solution
- Patent number 12,228,528
- Issue date Feb 18, 2025
- MEKITEC OY
- Peng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Carbon nitride nanosensor for effective and ultrasensitive X-ray de...
- Patent number 12,230,664
- Issue date Feb 18, 2025
- Qatar University
- Belal Salah Mohammed Hussien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-destructive detection method and system for Conopomorpha sinens...
- Patent number 12,228,529
- Issue date Feb 18, 2025
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,222,301
- Issue date Feb 11, 2025
- ISHIDA CO., LTD.
- Ken Iwakawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for real-time monitoring of organic matter porosity evolu...
- Patent number 12,222,273
- Issue date Feb 11, 2025
- Saudi Arabian Oil Company
- Abrar Alabbad
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for quality analysis of a product to be inspected
- Patent number 12,222,296
- Issue date Feb 11, 2025
- Multiscan Technologies, S.L.
- Simon Hendrik E. Van Olmen
- G01 - MEASURING TESTING
Information Patent Grant
Flexible and/or deformable mechanical elements with radiographic ma...
- Patent number 12,216,066
- Issue date Feb 4, 2025
- Science Applications International Corporation
- Theodore W. Eastes
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Inspection device with integrated x-ray and weighing device
- Patent number 12,209,976
- Issue date Jan 28, 2025
- Wipotec GmbH
- Theo Düppre
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Two-stage screening technique for prohibited objects at security ch...
- Patent number 12,205,359
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Mohamed Nooman Ahmed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing and detection of discontinuities in battery cells
- Patent number 12,203,880
- Issue date Jan 21, 2025
- GM Global Technology Operations LLC
- Sean Robert Wagner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pulse frequency adjustment
- Patent number 12,203,879
- Issue date Jan 21, 2025
- SMITHS DETECTION FRANCE S.A.S.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
Spent or decommissioned accumulator treatment plant and process
- Patent number 12,191,463
- Issue date Jan 7, 2025
- Engitec Technologies S.p.A.
- Gianfranco Diegoli
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method and device for controlling output beam of ray machine in ima...
- Patent number 12,188,882
- Issue date Jan 7, 2025
- Nuctech Company Limited
- Zhiqiang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Secondary image removal using high resolution x-ray transmission so...
- Patent number 12,181,423
- Issue date Dec 31, 2024
- Sigray, Inc.
- Sylvia Jia Yun Lewis
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of stationary-source nonplanar-trajectory narr...
- Patent number 12,181,424
- Issue date Dec 31, 2024
- MALCOVA, INC.
- Peymon Mirsaeid Ghazi
- G01 - MEASURING TESTING
Information Patent Grant
Image pickup device and image generation method
- Patent number 12,181,425
- Issue date Dec 31, 2024
- Kioxia Corporation
- Takeshi Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Disinfection apparatus for transport containers of an inspection ar...
- Patent number 12,178,932
- Issue date Dec 31, 2024
- Smiths Detection Germany GmbH
- Gregor Hess
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ARTICLE INSPECTION APPARATUS
- Publication number 20250116616
- Publication date Apr 10, 2025
- Anritsu Corporation
- Takashi KANAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System to Assess Golf ball quality using multiple orientations of x...
- Publication number 20250110065
- Publication date Apr 3, 2025
- Guilherme Cardoso
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER
- Publication number 20250108576
- Publication date Apr 3, 2025
- The Yokohama Rubber Co., LTD.
- Mitsuo TSUJI
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
- Publication number 20250110064
- Publication date Apr 3, 2025
- VIDERAY TECHNOLOGIES, INC.
- PAUL Bradshaw
- G01 - MEASURING TESTING
Information Patent Application
ITEM INSPECTION SYSTEMS AND METHODS
- Publication number 20250110067
- Publication date Apr 3, 2025
- Smiths Detection France S.A.S.
- Jean-Michel FAUGIER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF
- Publication number 20250093283
- Publication date Mar 20, 2025
- Anritsu Corporation
- Akira OHASHI
- G01 - MEASURING TESTING
Information Patent Application
MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS
- Publication number 20250085239
- Publication date Mar 13, 2025
- Anritsu Corporation
- Michihiko IKEDA
- G01 - MEASURING TESTING
Information Patent Application
CORRECTING AMBIENT CAPILLARY PRESSURE CURVES TO ACCOUNT FOR DOWNHOL...
- Publication number 20250076221
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Mohammed Fadhel Al-Hamad
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20250076220
- Publication date Mar 6, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATING DETECTORS IN A DETECTOR ARRAY
- Publication number 20250067687
- Publication date Feb 27, 2025
- Thermo EGS Gauging LLC
- Carter Watson
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
- Publication number 20250060323
- Publication date Feb 20, 2025
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Application
Non-destructive Detection Method and System for Conopomorpha Sinens...
- Publication number 20250060322
- Publication date Feb 20, 2025
- Institute of Facility Agriculture, Guangdong Academy of agricultural Sciences
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DEVICE WITH FOLDED FIELD-OF-VIEW
- Publication number 20250052698
- Publication date Feb 13, 2025
- Lumafield, Inc.
- Adam P. Damiano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CARGO INSPECTION SYSTEM AND A METHOD FOR DISCRIMINATING MATERIAL IN...
- Publication number 20250054107
- Publication date Feb 13, 2025
- Billion Prima Sdn Bhd
- Ameer Safuan Bin MUHAMAD KAHIRI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...
- Publication number 20250052699
- Publication date Feb 13, 2025
- FPI FOOD PROCESSING INNOVATION GMBH & CO. KG
- Christoph Fabian Isernhagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ANALYSING A GEOLOGICAL SAMPLE
- Publication number 20250052700
- Publication date Feb 13, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...
- Publication number 20250052701
- Publication date Feb 13, 2025
- GE Precision Healthcare LLC
- Norbert J. Pelc
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250040021
- Publication date Jan 30, 2025
- Anritsu Corporation
- Jyunichi MORIYA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...
- Publication number 20250035569
- Publication date Jan 30, 2025
- NUCTECH (BEIJING) COMPANY LIMITED
- Yuanjing LI
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20250027889
- Publication date Jan 23, 2025
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR POWERLINE INSPECTION
- Publication number 20250029224
- Publication date Jan 23, 2025
- Abhinav Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COATING QUALITY DETECTION METHOD, DETECTION APPARATUS, AND DETECTIO...
- Publication number 20250012692
- Publication date Jan 9, 2025
- Jiangsu Contemporary Amperex Technology Limited
- Zhiyong He
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...
- Publication number 20250003895
- Publication date Jan 2, 2025
- Canon Kabushiki Kaisha
- Atsushi IWASHITA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION
- Publication number 20240420386
- Publication date Dec 19, 2024
- Baker Hughes Holdings LLC
- Alexander Suppes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIRECT ATTACH RADIATION DETECTOR STRUCTURES HAVING REDUCED CROSS-TALK
- Publication number 20240418877
- Publication date Dec 19, 2024
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
Fast 3D Radiography with Multiple Pulsed X-ray Sources by Deflectin...
- Publication number 20240415482
- Publication date Dec 19, 2024
- Jianqiang Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AN X-RAY SYSTEM
- Publication number 20240418658
- Publication date Dec 19, 2024
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
DENOISING AND SUPER RESOLUTION
- Publication number 20240412339
- Publication date Dec 12, 2024
- Smiths Detection France S.A.S.
- Najib GADI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
- Publication number 20240412476
- Publication date Dec 12, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CYLINDRICAL BATTERY INCLUDING ELECTRODE GROUP AND CURRENT COLLECTOR...
- Publication number 20240405383
- Publication date Dec 5, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Haruhisa YAGI
- H01 - BASIC ELECTRIC ELEMENTS

the radiation being X-rays

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for monitoring feature sizes in digital X-ray i...

Material detection in X-ray security screening

X-ray inspection device and x-ray inspection system

Food product quality control system

Jet blades optical inspection

Methods and apparatus for determining information regarding chemica...

High-energy x-ray imaging system

X-ray phase imaging apparatus and X-ray phase imaging method

Radiation detector, radiation CT apparatus, and method of manufactu...

Inspection apparatus and inspection method

X-ray inspection apparatus

Inspection device

Food product monitoring solution

Carbon nitride nanosensor for effective and ultrasensitive X-ray de...

Non-destructive detection method and system for Conopomorpha sinens...

X-ray inspection apparatus

Apparatus for real-time monitoring of organic matter porosity evolu...

Inspection system for quality analysis of a product to be inspected

Flexible and/or deformable mechanical elements with radiographic ma...

Inspection device with integrated x-ray and weighing device

Two-stage screening technique for prohibited objects at security ch...

Image processing and detection of discontinuities in battery cells

Pulse frequency adjustment

Spent or decommissioned accumulator treatment plant and process

Method and device for controlling output beam of ray machine in ima...

Secondary image removal using high resolution x-ray transmission so...

System and method for inspecting defects of structure by using X-ray

Method and apparatus of stationary-source nonplanar-trajectory narr...

Image pickup device and image generation method

Disinfection apparatus for transport containers of an inspection ar...

Patents Applicationslast 30 patents

ARTICLE INSPECTION APPARATUS

System to Assess Golf ball quality using multiple orientations of x...

METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER

HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL

ITEM INSPECTION SYSTEMS AND METHODS

X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF

MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS

CORRECTING AMBIENT CAPILLARY PRESSURE CURVES TO ACCOUNT FOR DOWNHOL...

X-RAY IMAGING APPARATUS

METHOD AND SYSTEM FOR CALIBRATING DETECTORS IN A DETECTOR ARRAY

AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM

Non-destructive Detection Method and System for Conopomorpha Sinens...

X-RAY DEVICE WITH FOLDED FIELD-OF-VIEW

CARGO INSPECTION SYSTEM AND A METHOD FOR DISCRIMINATING MATERIAL IN...

METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...

METHOD OF ANALYSING A GEOLOGICAL SAMPLE

SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...

X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME

SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

SYSTEM AND METHOD FOR POWERLINE INSPECTION

COATING QUALITY DETECTION METHOD, DETECTION APPARATUS, AND DETECTIO...

IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...

SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION

DIRECT ATTACH RADIATION DETECTOR STRUCTURES HAVING REDUCED CROSS-TALK

Fast 3D Radiography with Multiple Pulsed X-ray Sources by Deflectin...

AN X-RAY SYSTEM

DENOISING AND SUPER RESOLUTION

Methods and Systems for Generating Three-Dimensional Images that En...

CYLINDRICAL BATTERY INCLUDING ELECTRODE GROUP AND CURRENT COLLECTOR...