the radiation being X-rays

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CPC
G01N23/083

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/083the radiation being X-rays

Industries

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Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection apparatus and article handling system
- Patent number 12,292,392
- Issue date May 6, 2025
- ISHIDA CO., LTD.
- Kazuyuki Sugimoto
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Processing head for a forestry machine
- Patent number 12,290,029
- Issue date May 6, 2025
- MICROTEC S.R.L.
- Federico Giudiceandrea
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Article inspection verification system
- Patent number 12,287,347
- Issue date Apr 29, 2025
- Anritsu Corporation
- Eiji Asai
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
System and method for utilization of photon counting for colorizati...
- Patent number 12,287,298
- Issue date Apr 29, 2025
- Kub Technologies Inc
- Chester Lowe
- G01 - MEASURING TESTING
Information Patent Grant
Parameterizing x-ray scattering measurement using slice-and-image t...
- Patent number 12,288,706
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Movable detection device and detection method
- Patent number 12,281,994
- Issue date Apr 22, 2025
- Nutech Company Limited
- Kejin Gao
- G01 - MEASURING TESTING
Information Patent Grant
State change tracking device, X-ray imaging system, state change tr...
- Patent number 12,276,622
- Issue date Apr 15, 2025
- Konica Minolta, Inc.
- Tadashi Arimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identifying foil position in power storage device and me...
- Patent number 12,276,621
- Issue date Apr 15, 2025
- PRIME PLANET ENERGY & SOLUTIONS, INC.
- Hisataka Fujimaki
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection device
- Patent number 12,276,623
- Issue date Apr 15, 2025
- Hamamatsu Photonics K.K.
- Kunihiko Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for monitoring feature sizes in digital X-ray i...
- Patent number 12,270,770
- Issue date Apr 8, 2025
- QSA GLOBAL INC.
- Paul Benson
- G01 - MEASURING TESTING
Information Patent Grant
Material detection in X-ray security screening
- Patent number 12,270,772
- Issue date Apr 8, 2025
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection device and x-ray inspection system
- Patent number 12,270,771
- Issue date Apr 8, 2025
- SEC CO., LTD.
- Jong Hui Kim
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Food product quality control system
- Patent number 12,258,221
- Issue date Mar 25, 2025
- Ishida Europe Limited
- Graham Neale
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Grant
Jet blades optical inspection
- Patent number 12,253,481
- Issue date Mar 18, 2025
- AEROSPACE INDUSTRIAL SCAN LTD.
- Lior Greenstein
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for determining information regarding chemica...
- Patent number 12,253,480
- Issue date Mar 18, 2025
- Imagine Scientific, Inc.
- Eric H. Silver
- G01 - MEASURING TESTING
Information Patent Grant
High-energy x-ray imaging system
- Patent number 12,253,648
- Issue date Mar 18, 2025
- Smiths Detection Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
X-ray phase imaging apparatus and X-ray phase imaging method
- Patent number 12,247,933
- Issue date Mar 11, 2025
- Shimadzu Corporation
- Kana Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector, radiation CT apparatus, and method of manufactu...
- Patent number 12,243,903
- Issue date Mar 4, 2025
- Canon Kabushiki Kaisha
- Takashi Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,235,227
- Issue date Feb 25, 2025
- JED CO., LTD
- Osamu Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 12,228,527
- Issue date Feb 18, 2025
- Saki Corporation
- Hiroyuki Murata
- G01 - MEASURING TESTING
Information Patent Grant
Food product monitoring solution
- Patent number 12,228,528
- Issue date Feb 18, 2025
- MEKITEC OY
- Peng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Carbon nitride nanosensor for effective and ultrasensitive X-ray de...
- Patent number 12,230,664
- Issue date Feb 18, 2025
- Qatar University
- Belal Salah Mohammed Hussien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-destructive detection method and system for Conopomorpha sinens...
- Patent number 12,228,529
- Issue date Feb 18, 2025
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,222,301
- Issue date Feb 11, 2025
- ISHIDA CO., LTD.
- Ken Iwakawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for real-time monitoring of organic matter porosity evolu...
- Patent number 12,222,273
- Issue date Feb 11, 2025
- Saudi Arabian Oil Company
- Abrar Alabbad
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for quality analysis of a product to be inspected
- Patent number 12,222,296
- Issue date Feb 11, 2025
- Multiscan Technologies, S.L.
- Simon Hendrik E. Van Olmen
- G01 - MEASURING TESTING
Information Patent Grant
Flexible and/or deformable mechanical elements with radiographic ma...
- Patent number 12,216,066
- Issue date Feb 4, 2025
- Science Applications International Corporation
- Theodore W. Eastes
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Inspection device with integrated x-ray and weighing device
- Patent number 12,209,976
- Issue date Jan 28, 2025
- Wipotec GmbH
- Theo Düppre
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Two-stage screening technique for prohibited objects at security ch...
- Patent number 12,205,359
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Mohamed Nooman Ahmed
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY INSPECTION SYSTEM FOR INSPECTION OF AN OBJECT
- Publication number 20250146958
- Publication date May 8, 2025
- Carl Zeiss SMT GMBH
- Johannes Ruoff
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF MATERIAL
- Publication number 20250146957
- Publication date May 8, 2025
- Smiths Detection France S.A.S.
- Serge MAITREJEAN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250137944
- Publication date May 1, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE EQUIPMENT QUALITY CONTROL
- Publication number 20250137943
- Publication date May 1, 2025
- CARESTREAM HEALTH, INC.
- Luca BOGONI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20250137947
- Publication date May 1, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ken GOTO
- G01 - MEASURING TESTING
Information Patent Application
RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, METHOD OF CO...
- Publication number 20250130181
- Publication date Apr 24, 2025
- Canon Kabushiki Kaisha
- NAOTO SHIBATA
- G01 - MEASURING TESTING
Information Patent Application
UNDERWATER X-RAY IMAGING EMITTER AND FLOAT ASSEMBLY
- Publication number 20250123221
- Publication date Apr 17, 2025
- UT-Battelle, LLC
- Paul B. Rose
- G01 - MEASURING TESTING
Information Patent Application
Baggage Inspection Device
- Publication number 20250123224
- Publication date Apr 17, 2025
- The Nippon Signal Co., Ltd.
- Kazuaki TAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250123222
- Publication date Apr 17, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
ARTICLE INSPECTION APPARATUS
- Publication number 20250116616
- Publication date Apr 10, 2025
- Anritsu Corporation
- Takashi KANAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System to Assess Golf ball quality using multiple orientations of x...
- Publication number 20250110065
- Publication date Apr 3, 2025
- Guilherme Cardoso
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER
- Publication number 20250108576
- Publication date Apr 3, 2025
- The Yokohama Rubber Co., LTD.
- Mitsuo TSUJI
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
- Publication number 20250110064
- Publication date Apr 3, 2025
- VIDERAY TECHNOLOGIES, INC.
- PAUL Bradshaw
- G01 - MEASURING TESTING
Information Patent Application
ITEM INSPECTION SYSTEMS AND METHODS
- Publication number 20250110067
- Publication date Apr 3, 2025
- Smiths Detection France S.A.S.
- Jean-Michel FAUGIER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF
- Publication number 20250093283
- Publication date Mar 20, 2025
- Anritsu Corporation
- Akira OHASHI
- G01 - MEASURING TESTING
Information Patent Application
MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS
- Publication number 20250085239
- Publication date Mar 13, 2025
- Anritsu Corporation
- Michihiko IKEDA
- G01 - MEASURING TESTING
Information Patent Application
CORRECTING AMBIENT CAPILLARY PRESSURE CURVES TO ACCOUNT FOR DOWNHOL...
- Publication number 20250076221
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Mohammed Fadhel Al-Hamad
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20250076220
- Publication date Mar 6, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATING DETECTORS IN A DETECTOR ARRAY
- Publication number 20250067687
- Publication date Feb 27, 2025
- Thermo EGS Gauging LLC
- Carter Watson
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
- Publication number 20250060323
- Publication date Feb 20, 2025
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Application
Non-destructive Detection Method and System for Conopomorpha Sinens...
- Publication number 20250060322
- Publication date Feb 20, 2025
- Institute of Facility Agriculture, Guangdong Academy of agricultural Sciences
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DEVICE WITH FOLDED FIELD-OF-VIEW
- Publication number 20250052698
- Publication date Feb 13, 2025
- Lumafield, Inc.
- Adam P. Damiano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...
- Publication number 20250052699
- Publication date Feb 13, 2025
- FPI FOOD PROCESSING INNOVATION GMBH & CO. KG
- Christoph Fabian Isernhagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CARGO INSPECTION SYSTEM AND A METHOD FOR DISCRIMINATING MATERIAL IN...
- Publication number 20250054107
- Publication date Feb 13, 2025
- Billion Prima Sdn Bhd
- Ameer Safuan Bin MUHAMAD KAHIRI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ANALYSING A GEOLOGICAL SAMPLE
- Publication number 20250052700
- Publication date Feb 13, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...
- Publication number 20250052701
- Publication date Feb 13, 2025
- GE Precision Healthcare LLC
- Norbert J. Pelc
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250040021
- Publication date Jan 30, 2025
- Anritsu Corporation
- Jyunichi MORIYA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...
- Publication number 20250035569
- Publication date Jan 30, 2025
- NUCTECH (BEIJING) COMPANY LIMITED
- Yuanjing LI
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20250027889
- Publication date Jan 23, 2025
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR POWERLINE INSPECTION
- Publication number 20250029224
- Publication date Jan 23, 2025
- Abhinav Singh
- G06 - COMPUTING CALCULATING COUNTING

the radiation being X-rays

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray inspection apparatus and article handling system

Processing head for a forestry machine

Article inspection verification system

System and method for utilization of photon counting for colorizati...

Parameterizing x-ray scattering measurement using slice-and-image t...

Movable detection device and detection method

State change tracking device, X-ray imaging system, state change tr...

Method for identifying foil position in power storage device and me...

Foreign matter inspection device

Systems and methods for monitoring feature sizes in digital X-ray i...

Material detection in X-ray security screening

X-ray inspection device and x-ray inspection system

Food product quality control system

Jet blades optical inspection

Methods and apparatus for determining information regarding chemica...

High-energy x-ray imaging system

X-ray phase imaging apparatus and X-ray phase imaging method

Radiation detector, radiation CT apparatus, and method of manufactu...

Inspection apparatus and inspection method

X-ray inspection apparatus

Inspection device

Food product monitoring solution

Carbon nitride nanosensor for effective and ultrasensitive X-ray de...

Non-destructive detection method and system for Conopomorpha sinens...

X-ray inspection apparatus

Apparatus for real-time monitoring of organic matter porosity evolu...

Inspection system for quality analysis of a product to be inspected

Flexible and/or deformable mechanical elements with radiographic ma...

Inspection device with integrated x-ray and weighing device

Two-stage screening technique for prohibited objects at security ch...

Patents Applicationslast 30 patents

X-RAY INSPECTION SYSTEM FOR INSPECTION OF AN OBJECT

DETERMINATION OF MATERIAL

X-RAY INSPECTION APPARATUS

PROTECTIVE EQUIPMENT QUALITY CONTROL

X-RAY ANALYSIS APPARATUS

RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, METHOD OF CO...

UNDERWATER X-RAY IMAGING EMITTER AND FLOAT ASSEMBLY

Baggage Inspection Device

X-RAY INSPECTION APPARATUS

ARTICLE INSPECTION APPARATUS

System to Assess Golf ball quality using multiple orientations of x...

METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER

HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL

ITEM INSPECTION SYSTEMS AND METHODS

X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF

MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS

CORRECTING AMBIENT CAPILLARY PRESSURE CURVES TO ACCOUNT FOR DOWNHOL...

X-RAY IMAGING APPARATUS

METHOD AND SYSTEM FOR CALIBRATING DETECTORS IN A DETECTOR ARRAY

AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM

Non-destructive Detection Method and System for Conopomorpha Sinens...

X-RAY DEVICE WITH FOLDED FIELD-OF-VIEW

METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...

CARGO INSPECTION SYSTEM AND A METHOD FOR DISCRIMINATING MATERIAL IN...

METHOD OF ANALYSING A GEOLOGICAL SAMPLE

SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...

X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME

SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

SYSTEM AND METHOD FOR POWERLINE INSPECTION