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CPC
G01N2201/1247

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/1247Thresholding

Industries

Patents Grantslast 30 patents

Information Patent Grant
FTIR spectrometer with cut-off filter for hydrogen sulfide detection
- Patent number 11,754,496
- Issue date Sep 12, 2023
- MLS ACQ, Inc.
- Martin L. Spartz
- G01 - MEASURING TESTING
Information Patent Grant
FTIR spectrometer with cut-off filter for hydrogen sulfide detection
- Patent number 11,143,589
- Issue date Oct 12, 2021
- MLS ACQ, Inc
- Martin L. Spartz
- G01 - MEASURING TESTING
Information Patent Grant
Multi-spectral gas analyzer system with multiple sets of spectral s...
- Patent number 11,022,545
- Issue date Jun 1, 2021
- Konica Minolta Business Solutions U.S.A., Inc.
- Leiming Wang
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device, automatic analysis system, and automatic...
- Patent number 10,725,028
- Issue date Jul 28, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Inabe
- G01 - MEASURING TESTING
Information Patent Grant
Scattered radiation optical scanner
- Patent number 10,648,928
- Issue date May 12, 2020
- Lumina Instruments Inc.
- Steven W. Meeks
- G02 - OPTICS
Information Patent Grant
Measuring a size distribution of nucleic acid molecules in a sample
- Patent number 10,379,038
- Issue date Aug 13, 2019
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- Samuel Martin Stavis
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Methods for manufacturing semiconductor device and for detecting en...
- Patent number 9,935,023
- Issue date Apr 3, 2018
- RENESAS ELECTRONICS CORPORATION
- Toshikazu Hanawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for manufacturing semiconductor device and for detecting en...
- Patent number 9,711,423
- Issue date Jul 18, 2017
- RENESAS ELECTRONICS CORPORATION
- Toshikazu Hanawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Onboard device and method for analyzing fluid in a heat engine
- Patent number 9,562,850
- Issue date Feb 7, 2017
- SP3H
- Sylvain Oberti
- G01 - MEASURING TESTING
Information Patent Grant
Onboard device and method for analyzing fluid in a heat engine
- Patent number 9,562,851
- Issue date Feb 7, 2017
- SP3H
- Sylvain Oberti
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring system for the acquisition of the layer thickness of dus...
- Patent number 8,451,460
- Issue date May 28, 2013
- Vanguard Sensor Technology Limited
- Nigel Jones
- G01 - MEASURING TESTING
Information Patent Grant
Blood analysis apparatus and setting method of measurement position...
- Patent number 8,248,586
- Issue date Aug 21, 2012
- Rohm Co., Ltd.
- Mamoru Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Gas detector
- Patent number 7,999,232
- Issue date Aug 16, 2011
- Photonic Innovations Limited
- Andrew Colin Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining an optium sunscreen factor at any given time
- Patent number 4,749,865
- Issue date Jun 7, 1988
- Klaus Scheller
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING APPARATUS, MICROSCOPE SYSTEM, AND INFORMATIO...
- Publication number 20240361245
- Publication date Oct 31, 2024
- SONY GROUP CORPORATION
- Sakiko Yasukawa
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SCATTERING MEASUREMENT BASED ON SKIP LIGHT PULSES
- Publication number 20240361238
- Publication date Oct 31, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Pulak SARANGI
- G01 - MEASURING TESTING
Information Patent Application
FTIR Spectrometer with cut-off filter for hydrogen sulfide detection
- Publication number 20220018760
- Publication date Jan 20, 2022
- MLS ACQ, Inc. D/B/A Max Analytical Technologies
- Martin L. Spartz
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR MANUFACTURING SEMICONDUCTOR DEVICE AND FOR DETECTING EN...
- Publication number 20170062288
- Publication date Mar 2, 2017
- RENESAS ELECTRONICS CORPORATION
- Toshikazu HANAWA
- G01 - MEASURING TESTING
Information Patent Application
MONITORING SYSTEM FOR THE ACQUISITION OF THE LAYER THICKNESS OF DUS...
- Publication number 20110122423
- Publication date May 26, 2011
- Nigel Jones
- G01 - MEASURING TESTING
Information Patent Application
Gas Detector
- Publication number 20100140478
- Publication date Jun 10, 2010
- PHOTONIC INNOVATIONS LIMITED
- Andrew Colin Wilson
- G01 - MEASURING TESTING
Information Patent Application
BLOOD ANALYSIS APPARATUS AND SETTING METHOD OF MEASUREMENT POSITION...
- Publication number 20090268194
- Publication date Oct 29, 2009
- Ushio Denki Kabushiki Kaisha
- Mamoru TOMITA
- G01 - MEASURING TESTING

Thresholding

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

FTIR spectrometer with cut-off filter for hydrogen sulfide detection

FTIR spectrometer with cut-off filter for hydrogen sulfide detection

Multi-spectral gas analyzer system with multiple sets of spectral s...

Automatic analysis device, automatic analysis system, and automatic...

Scattered radiation optical scanner

Measuring a size distribution of nucleic acid molecules in a sample

Methods for manufacturing semiconductor device and for detecting en...

Methods for manufacturing semiconductor device and for detecting en...

Onboard device and method for analyzing fluid in a heat engine

Onboard device and method for analyzing fluid in a heat engine

Monitoring system for the acquisition of the layer thickness of dus...

Blood analysis apparatus and setting method of measurement position...

Gas detector

Apparatus for determining an optium sunscreen factor at any given time

Patents Applicationslast 30 patents

INFORMATION PROCESSING APPARATUS, MICROSCOPE SYSTEM, AND INFORMATIO...

LIGHT SCATTERING MEASUREMENT BASED ON SKIP LIGHT PULSES

FTIR Spectrometer with cut-off filter for hydrogen sulfide detection

METHODS FOR MANUFACTURING SEMICONDUCTOR DEVICE AND FOR DETECTING EN...

MONITORING SYSTEM FOR THE ACQUISITION OF THE LAYER THICKNESS OF DUS...

Gas Detector

BLOOD ANALYSIS APPARATUS AND SETTING METHOD OF MEASUREMENT POSITION...