time-of-flight

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G01N2223/506

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/506time-of-flight

Industries

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for state detection
- Patent number 11,579,105
- Issue date Feb 14, 2023
- ZTE Corporation
- Shaowu Shen
- G08 - SIGNALLING
Information Patent Grant
Information handling system infrared proximity detection with ambie...
- Patent number 11,294,054
- Issue date Apr 5, 2022
- Dell Products L.P.
- Daniel L. Hamlin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus to mitigate ripple in a time of flight (TOF) s...
- Patent number 11,143,552
- Issue date Oct 12, 2021
- Texas Instruments Incorporated
- Subhash Chandra Venkata Sadhu
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal acceleration coaxial cylinder time of flight mass analyser
- Patent number 9,978,577
- Issue date May 22, 2018
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight aspects for X-Ray fluorescence visualizer, imager, o...
- Patent number 7,660,385
- Issue date Feb 9, 2010
- Searete LLC
- Edward S. Boyden
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING APPARATUS AND CONTROL METHOD FOR INFORMATION...
- Publication number 20220252531
- Publication date Aug 11, 2022
- Canon Kabushiki Kaisha
- Akihiro Taya
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR TIME-OF-FLIGHT X-RAY TOMOGRAPHY
- Publication number 20170219501
- Publication date Aug 3, 2017
- The Research Foundation for the State University of New York
- Michael Yakimov
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO MITIGATE RIPPLE IN A TIME OF FLIGHT (TOF) S...
- Publication number 20150308949
- Publication date Oct 29, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Subhash Chandra Venkata Sadhu
- G01 - MEASURING TESTING
Information Patent Application
ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...
- Publication number 20140374585
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
Time of flight aspects for X-Ray fluorescence visualizer, imager, o...
- Publication number 20090086894
- Publication date Apr 2, 2009
- Searete LLC, a limited liability corporation of the State of Delaware
- Edward S. Boyden
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE