Timing aspects, clock generation, synchronisation

Industry

CPC
G11C29/56012

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/56012Timing aspects, clock generation, synchronisation

Industries

Patents Grantslast 30 patents

Information Patent Grant
Apparatus, systems, and methods for dynamically reconfigured semico...
- Patent number 12,174,717
- Issue date Dec 24, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing system and testing method
- Patent number 12,142,340
- Issue date Nov 12, 2024
- Realtek Semiconductor Corporation
- Shih-Chieh Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus, systems, and methods for dynamically reconfigured semico...
- Patent number 12,099,424
- Issue date Sep 24, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for receiver equalization and stressed eye testin...
- Patent number 12,032,018
- Issue date Jul 9, 2024
- Huawei Technologies Co., Ltd.
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Slave communication apparatus and master communication apparatus
- Patent number 12,007,825
- Issue date Jun 11, 2024
- Fuji Electric Co., Ltd.
- Masashi Akahane
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method for testing memory
- Patent number 11,929,137
- Issue date Mar 12, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yangyang Dai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storage devices and methods of operating storage devices
- Patent number 11,830,561
- Issue date Nov 28, 2023
- Samsung Electronics Co., Ltd.
- Youngmin Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Command clock gate implementation with chip select signal training...
- Patent number 11,823,729
- Issue date Nov 21, 2023
- Micron Technology, Inc.
- Liang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Delay fault testing of pseudo static controls
- Patent number 11,768,726
- Issue date Sep 26, 2023
- Texas Instruments Incorporated
- Aravinda Acharya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for testing memory chip by calculating resistance...
- Patent number 11,721,411
- Issue date Aug 8, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jinghong Xu
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for receiver equalization and stressed eye testin...
- Patent number 11,624,780
- Issue date Apr 11, 2023
- Huawei Technologies Co., Ltd.
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device, method of testing the same and test sy...
- Patent number 11,501,846
- Issue date Nov 15, 2022
- Samsung Electronics Co., Ltd.
- Sanglok Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Reduced error correction code for dual channel DDR dynamic random-a...
- Patent number 11,437,114
- Issue date Sep 6, 2022
- Meta Platforms, Inc.
- Narsing Krishna Vijayrao
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test method and related device
- Patent number 11,393,553
- Issue date Jul 19, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Stacked semiconductor device and semiconductor system including the...
- Patent number 11,289,174
- Issue date Mar 29, 2022
- SK Hynix Inc.
- Yo-Sep Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor apparatus
- Patent number 11,200,923
- Issue date Dec 14, 2021
- SK Hynix Inc.
- Sang Hyun Ku
- G11 - INFORMATION STORAGE
Information Patent Grant
Delay fault testing of pseudo static controls
- Patent number 11,194,645
- Issue date Dec 7, 2021
- Texas Instruments Incorporated
- Aravinda Acharya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Slave communication apparatus and master communication apparatus
- Patent number 11,188,137
- Issue date Nov 30, 2021
- Fuji Electric Co., Ltd.
- Masashi Akahane
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Environment control apparatus
- Patent number 11,183,265
- Issue date Nov 23, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device performing duty ratio adjustment operation
- Patent number 11,170,829
- Issue date Nov 9, 2021
- SK hynix Inc.
- Min Sik Han
- G11 - INFORMATION STORAGE
Information Patent Grant
Chip testing method, device, electronic apparatus and computer read...
- Patent number 11,145,386
- Issue date Oct 12, 2021
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ruei-Yuan Guo
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit memory devices having buffer dies and test inter...
- Patent number 11,049,584
- Issue date Jun 29, 2021
- Samsung Electronics Co., Ltd.
- Ki-Heung Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for measuring round-trip time of test signal u...
- Patent number 11,031,091
- Issue date Jun 8, 2021
- UniTest Inc.
- Ho Sang You
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock frequency counting during high-voltage operations for immedia...
- Patent number 10,991,447
- Issue date Apr 27, 2021
- SanDisk Technologies LLC
- Daniel Linnen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Erase-write cycling method of a flash device
- Patent number 10,991,441
- Issue date Apr 27, 2021
- Shanghai Huali Microelectronics Corporation
- Hongliang Du
- G11 - INFORMATION STORAGE
Information Patent Grant
Receiver equalization and stressed eye testing system
- Patent number 10,859,626
- Issue date Dec 8, 2020
- FutureWei Technologies, Inc.
- Gang Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Data transmission and reception system, data transmission and recep...
- Patent number 10,861,514
- Issue date Dec 8, 2020
- Fujitsu Limited
- Toshiaki Ozawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor apparatuses and test system for performing burn-in te...
- Patent number 10,816,591
- Issue date Oct 27, 2020
- SK hynix Inc.
- Jung Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Test interface boards, test systems, and methods of operating test...
- Patent number 10,811,118
- Issue date Oct 20, 2020
- Samsung Electronics Co., Ltd.
- Sung-Ho Joo
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having a test circuit
- Patent number 10,790,039
- Issue date Sep 29, 2020
- Micron Technology, Inc.
- Hyunui Lee
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE INCLUDING DRAM AND METHOD FOR OPERATING THE SAME
- Publication number 20240304274
- Publication date Sep 12, 2024
- Samsung Electronics Co., Ltd.
- Jiyong YOO
- G11 - INFORMATION STORAGE
Information Patent Application
MODE REGISTER UPDATE (MRUPD) MODE
- Publication number 20240249795
- Publication date Jul 25, 2024
- Intel Corporation
- Saravanan SETHURAMAN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE, OPERATION METHOD OF MEMORY DEVICE, AND OPERATION MET...
- Publication number 20240233857
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Kuihan Ko
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR DYNAMICALLY RECONFIGURED SEMICO...
- Publication number 20240193058
- Publication date Jun 13, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL SKEW CORRECTION IN INTEGRATED CIRCUIT MEMORY DEVICES
- Publication number 20240055068
- Publication date Feb 15, 2024
- Rambus Inc.
- Srinivas Satish Babu Bamdhamravuri
- G11 - INFORMATION STORAGE
Information Patent Application
System and Method for Receiver Equalization and Stressed Eye Testin...
- Publication number 20230324457
- Publication date Oct 12, 2023
- Huawei Technologies Co., Ltd
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING SYSTEM AND TESTING METHOD
- Publication number 20230230652
- Publication date Jul 20, 2023
- REALTEK SEMICONDUCTOR CORPORATION
- Shih-Chieh LIN
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES
- Publication number 20230094273
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Youngmin LEE
- G11 - INFORMATION STORAGE
Information Patent Application
SIGNAL GENERATOR AND MEMORY
- Publication number 20230026826
- Publication date Jan 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Jianyong QIN
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR TESTING MEMORY CHIP, COMPUTER DEVICE, AND MEDIUM
- Publication number 20220343997
- Publication date Oct 27, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Jinghong XU
- G11 - INFORMATION STORAGE
Information Patent Application
DELAY FAULT TESTING OF PSEUDO STATIC CONTROLS
- Publication number 20220091919
- Publication date Mar 24, 2022
- TEXAS INSTRUMENTS INCORPORATED
- ARAVINDA ACHARYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE, METHOD OF TESTING THE SAME AND TEST SY...
- Publication number 20220076778
- Publication date Mar 10, 2022
- Samsung Electronics Co., Ltd.
- SANGLOK KIM
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST METHOD AND RELATED DEVICE
- Publication number 20210319844
- Publication date Oct 14, 2021
- Changxin Memory Technologies, Inc.
- Chuanqi SHI
- G11 - INFORMATION STORAGE
Information Patent Application
STACKED SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM INCLUDING THE...
- Publication number 20210193253
- Publication date Jun 24, 2021
- SK HYNIX INC.
- Yo-Sep LEE
- G11 - INFORMATION STORAGE
Information Patent Application
CHIP TESTING METHOD, DEVICE, ELECTRONIC APPARATUS AND COMPUTER READ...
- Publication number 20210166778
- Publication date Jun 3, 2021
- Changxin Memory Technologies, Inc.
- Ruei-Yuan GUO
- G11 - INFORMATION STORAGE
Information Patent Application
Flash Device Endurance Test Method
- Publication number 20210090668
- Publication date Mar 25, 2021
- SHANGHAI HUALI MICROELECTRONICS CORPORATION
- Hongliang Du
- G11 - INFORMATION STORAGE
Information Patent Application
ENVIRONMENT CONTROL APPARATUS
- Publication number 20210020260
- Publication date Jan 21, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
CLOCK FREQUENCY COUNTING DURING HIGH-VOLTAGE OPERATIONS FOR IMMEDIA...
- Publication number 20200411131
- Publication date Dec 31, 2020
- SANDISK TECHNOLOGIES LLC
- Dan Linnen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Receiver Equalization and Stressed Eye Testin...
- Publication number 20200333396
- Publication date Oct 22, 2020
- Huawei Technologies Co., Ltd
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Application
DELAY FAULT TESTING OF PSEUDO STATIC CONTROLS
- Publication number 20200142768
- Publication date May 7, 2020
- TEXAS INSTRUMENTS INCORPORATED
- ARAVINDA ACHARYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RECEIVER EQUALIZATION AND STRESSED EYE TESTING SYSTEM
- Publication number 20200025824
- Publication date Jan 23, 2020
- FutureWei Technologies, Inc.
- Gang Zhao
- G01 - MEASURING TESTING
Information Patent Application
TEST INTERFACE BOARDS, TEST SYSTEMS, AND METHODS OF OPERATING TEST...
- Publication number 20190378590
- Publication date Dec 12, 2019
- Samsung Electronics Co., Ltd.
- SUNG-HO JOO
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR APPARATUS AND TEST SYSTEM INCLUDING THE SEMICONDUCTOR...
- Publication number 20190277906
- Publication date Sep 12, 2019
- SK HYNIX INC.
- Jung Hyun KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR APPARATUS AND SYSTEM RELATING TO PERFORMING A HIGH SP...
- Publication number 20190198131
- Publication date Jun 27, 2019
- SK HYNIX INC.
- Soo Young JANG
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN TEST DEVICE AND TEST METHOD USING INTERPOSER
- Publication number 20190170814
- Publication date Jun 6, 2019
- Samsung Electronics Co., Ltd.
- Joosung YUN
- G11 - INFORMATION STORAGE
Information Patent Application
DATA TRANSMISSION AND RECEPTION SYSTEM, DATA TRANSMISSION AND RECEP...
- Publication number 20190122712
- Publication date Apr 25, 2019
- Fujitsu Limited
- Toshiaki Ozawa
- G11 - INFORMATION STORAGE
Information Patent Application
TRACKING ERRORS ASSOCIATED WITH MEMORY ACCESS OPERATIONS
- Publication number 20190012222
- Publication date Jan 10, 2019
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Derek Alan Sherlock
- G11 - INFORMATION STORAGE
Information Patent Application
Technique for Determining Performance Characteristics Of Electronic...
- Publication number 20180335477
- Publication date Nov 22, 2018
- RAMBUS INC.
- Haw-Jyh Liaw
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST MODE CONTROL CIRCUIT
- Publication number 20180259575
- Publication date Sep 13, 2018
- SK HYNIX INC.
- Haeng Seon CHAE
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS AND METHOD FOR MEASURING ROUND-TRIP TIME OF TEST SIGNAL U...
- Publication number 20180261304
- Publication date Sep 13, 2018
- Unitest Inc.
- Ho Sang YOU
- H03 - BASIC ELECTRONIC CIRCUITRY

Timing aspects, clock generation, synchronisation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus, systems, and methods for dynamically reconfigured semico...

Testing system and testing method

Apparatus, systems, and methods for dynamically reconfigured semico...

System and method for receiver equalization and stressed eye testin...

Slave communication apparatus and master communication apparatus

Method for testing memory

Storage devices and methods of operating storage devices

Command clock gate implementation with chip select signal training...

Delay fault testing of pseudo static controls

Method and device for testing memory chip by calculating resistance...

System and method for receiver equalization and stressed eye testin...

Semiconductor memory device, method of testing the same and test sy...

Reduced error correction code for dual channel DDR dynamic random-a...

Memory test method and related device

Stacked semiconductor device and semiconductor system including the...

Semiconductor apparatus

Delay fault testing of pseudo static controls

Slave communication apparatus and master communication apparatus

Environment control apparatus

Semiconductor device performing duty ratio adjustment operation

Chip testing method, device, electronic apparatus and computer read...

Integrated circuit memory devices having buffer dies and test inter...

Apparatus and method for measuring round-trip time of test signal u...

Clock frequency counting during high-voltage operations for immedia...

Erase-write cycling method of a flash device

Receiver equalization and stressed eye testing system

Data transmission and reception system, data transmission and recep...

Semiconductor apparatuses and test system for performing burn-in te...

Test interface boards, test systems, and methods of operating test...

Semiconductor device having a test circuit

Patents Applicationslast 30 patents

ELECTRONIC DEVICE INCLUDING DRAM AND METHOD FOR OPERATING THE SAME

MODE REGISTER UPDATE (MRUPD) MODE

MEMORY DEVICE, OPERATION METHOD OF MEMORY DEVICE, AND OPERATION MET...

APPARATUS, SYSTEMS, AND METHODS FOR DYNAMICALLY RECONFIGURED SEMICO...

SIGNAL SKEW CORRECTION IN INTEGRATED CIRCUIT MEMORY DEVICES

System and Method for Receiver Equalization and Stressed Eye Testin...

TESTING SYSTEM AND TESTING METHOD

STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES

SIGNAL GENERATOR AND MEMORY

METHOD FOR TESTING MEMORY CHIP, COMPUTER DEVICE, AND MEDIUM

DELAY FAULT TESTING OF PSEUDO STATIC CONTROLS

SEMICONDUCTOR MEMORY DEVICE, METHOD OF TESTING THE SAME AND TEST SY...

MEMORY TEST METHOD AND RELATED DEVICE

STACKED SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM INCLUDING THE...

CHIP TESTING METHOD, DEVICE, ELECTRONIC APPARATUS AND COMPUTER READ...

Flash Device Endurance Test Method

ENVIRONMENT CONTROL APPARATUS

CLOCK FREQUENCY COUNTING DURING HIGH-VOLTAGE OPERATIONS FOR IMMEDIA...

System and Method for Receiver Equalization and Stressed Eye Testin...

DELAY FAULT TESTING OF PSEUDO STATIC CONTROLS

RECEIVER EQUALIZATION AND STRESSED EYE TESTING SYSTEM

TEST INTERFACE BOARDS, TEST SYSTEMS, AND METHODS OF OPERATING TEST...

SEMICONDUCTOR APPARATUS AND TEST SYSTEM INCLUDING THE SEMICONDUCTOR...

SEMICONDUCTOR APPARATUS AND SYSTEM RELATING TO PERFORMING A HIGH SP...

BURN-IN TEST DEVICE AND TEST METHOD USING INTERPOSER

DATA TRANSMISSION AND RECEPTION SYSTEM, DATA TRANSMISSION AND RECEP...

TRACKING ERRORS ASSOCIATED WITH MEMORY ACCESS OPERATIONS

Technique for Determining Performance Characteristics Of Electronic...

TEST MODE CONTROL CIRCUIT

APPARATUS AND METHOD FOR MEASURING ROUND-TRIP TIME OF TEST SIGNAL U...