Transmitted particle detectors

Industry

CPC
H01J2237/24455

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/24455Transmitted particle detectors

Industries

Patents Grantslast 30 patents

Information Patent Grant
System and method for simultaneous phase contrast imaging and elect...
- Patent number 11,211,223
- Issue date Dec 28, 2021
- FEI Company
- Ivan Lazić
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 11,024,481
- Issue date Jun 1, 2021
- FEI Company
- Karel Diederick Van Der Mast
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffraction pattern detection in a transmission charged particle mi...
- Patent number 11,004,655
- Issue date May 11, 2021
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
- Patent number 10,903,042
- Issue date Jan 26, 2021
- TECHNISCHE UNIVERSITEIT DELFT
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System of mobile charged particle detectors and methods of spent nu...
- Patent number 10,872,746
- Issue date Dec 22, 2020
- Decision Sciences International Corporation
- Konstantin Borozdin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Studying dynamic specimens in a transmission charged particle micro...
- Patent number 10,825,648
- Issue date Nov 3, 2020
- FEI Company
- Bastiaan Lambertus Martinus Hendriksen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,818,471
- Issue date Oct 27, 2020
- HITACHI HIGH-TECH CORPORATION
- Takahiro Jingu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,629,407
- Issue date Apr 21, 2020
- Jeol Ltd.
- Tomohisa Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Compressive scanning spectroscopy
- Patent number 10,580,614
- Issue date Mar 3, 2020
- Battelle Memorial Institute
- Andrew J. Stevens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temporal compressive sensing systems
- Patent number 10,571,675
- Issue date Feb 25, 2020
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Bryan Reed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
- Patent number 10,453,649
- Issue date Oct 22, 2019
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for characterizing two dimensional nanomaterial
- Patent number 10,297,417
- Issue date May 21, 2019
- Tsinghua University
- Peng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, sample observation method, sample pla...
- Patent number 10,241,062
- Issue date Mar 26, 2019
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Grant
Compressive transmission microscopy
- Patent number 10,224,175
- Issue date Mar 5, 2019
- Battelle Memorial Institute
- Andrew J. Stevens
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
TEM phase contrast imaging with image plane phase grating
- Patent number 10,170,274
- Issue date Jan 1, 2019
- Battelle Memorial Institute
- Andrew J. Stevens
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam masks for compressive sensors
- Patent number 10,109,453
- Issue date Oct 23, 2018
- Battelle Memorial Institute
- Andrew J. Stevens
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Temporal compressive sensing systems
- Patent number 10,018,824
- Issue date Jul 10, 2018
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Bryan W. Reed
- G02 - OPTICS
Information Patent Grant
Electron microscope and method of aberration measurement
- Patent number 10,014,153
- Issue date Jul 3, 2018
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for correlative scanning transmission electron microscopy (S...
- Patent number 9,966,223
- Issue date May 8, 2018
- Leibniz-Institut fuer neue Materialien Gemeinnuetzige GmbH
- Niels De Jonge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Temporal compressive sensing systems
- Patent number 9,841,592
- Issue date Dec 12, 2017
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Bryan W. Reed
- G02 - OPTICS
Information Patent Grant
Charged particle beam device, image generation method, observation...
- Patent number 9,824,854
- Issue date Nov 21, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and method of measuring aberrations
- Patent number 9,779,911
- Issue date Oct 3, 2017
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement method and electron microscope
- Patent number 9,728,372
- Issue date Aug 8, 2017
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample base, charged particle beam device and sample observation me...
- Patent number 9,508,527
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for simultaneous detection of secondary electrons...
- Patent number 9,494,516
- Issue date Nov 15, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample observation method
- Patent number 9,418,818
- Issue date Aug 16, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-speed multiframe dynamic transmission electron microscope imag...
- Patent number 9,373,479
- Issue date Jun 21, 2016
- Lawrence Livermore National Security, LLC
- Bryan W. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backscatter reduction in thin electron detectors
- Patent number 9,269,531
- Issue date Feb 23, 2016
- FEI Company
- Michael Alwin William Stekelenburg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement and endpointing of sample thickness
- Patent number 9,184,025
- Issue date Nov 10, 2015
- FEI Company
- Richard J. Young
- G01 - MEASURING TESTING
Information Patent Grant
System and method for simultaneous detection of secondary electrons...
- Patent number 9,040,909
- Issue date May 26, 2015
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROCHIPS FOR USE IN ELECTRON MICROSCOPES AND RELATED METHODS
- Publication number 20240120172
- Publication date Apr 11, 2024
- Northwestern University
- Vinayak P. Dravid
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20240014002
- Publication date Jan 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Takayasu IWATSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20200266027
- Publication date Aug 20, 2020
- Hitachi High-Technologies Corporation
- Takahiro JINGU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFRACTION PATTERN DETECTION IN A TRANSMISSION CHARGED PARTICLE MI...
- Publication number 20200144022
- Publication date May 7, 2020
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM OF MOBILE CHARGED PARTICLE DETECTORS AND METHODS OF SPENT NU...
- Publication number 20200144023
- Publication date May 7, 2020
- DECISION SCIENCES INTERNATIONAL CORPORATION
- Konstantin Borozdin
- G01 - MEASURING TESTING
Information Patent Application
STUDYING DYNAMIC SPECIMENS IN A TRANSMISSION CHARGED PARTICLE MICRO...
- Publication number 20190311882
- Publication date Oct 10, 2019
- FEI Comapny
- Bastiaan Lambertus Martinus Hendriksen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPORAL COMPRESSIVE SENSING SYSTEMS
- Publication number 20190204579
- Publication date Jul 4, 2019
- Integrated Dynamic Electron Solutions, Inc.
- Bryan Reed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPORAL COMPRESSIVE SENSING SYSTEMS
- Publication number 20180136449
- Publication date May 17, 2018
- Integrated Dynamic Electron Solutions, Inc.
- Bryan W. Reed
- G02 - OPTICS
Information Patent Application
METHOD FOR CHARACTERIZING TWO DIMENSIONAL NANOMATERIAL
- Publication number 20170358420
- Publication date Dec 14, 2017
- TSINGHUA UNIVERSITY
- PENG LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPORAL COMPRESSIVE SENSING SYSTEMS
- Publication number 20170146787
- Publication date May 25, 2017
- Integrated Dynamic Electron Solutions, Inc.
- Bryan W. Reed
- G02 - OPTICS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, IMAGE GENERATION METHOD, OBSERVATION...
- Publication number 20160329188
- Publication date Nov 10, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement Method and Electron Microscope
- Publication number 20160254118
- Publication date Sep 1, 2016
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Backscatter Reduction in Thin Electron Detectors
- Publication number 20140166879
- Publication date Jun 19, 2014
- FEI Company
- Michael Alwin William Stekelenburg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SIMULTANEOUS DETECTION OF SECONDARY ELECTRONS...
- Publication number 20140131573
- Publication date May 15, 2014
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...
- Publication number 20140007307
- Publication date Jan 2, 2014
- Brian Roberts Routh
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method of protecting a radiation detector in a charged particle ins...
- Publication number 20120256085
- Publication date Oct 11, 2012
- FEI Company
- Maximus Theodorus Otten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Localization of Large Numbers of Fluorescent...
- Publication number 20120193530
- Publication date Aug 2, 2012
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS
- Publication number 20120187285
- Publication date Jul 26, 2012
- FEI Company
- RICHARD J. YOUNG
- G01 - MEASURING TESTING
Information Patent Application
HIGH COLLECTION EFFICIENCY X-RAY SPECTROMETER SYSTEM WITH INTEGRATE...
- Publication number 20120160999
- Publication date Jun 28, 2012
- UChicago Argonne, LLC
- Nestor J. Zaluzec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTORS
- Publication number 20120068068
- Publication date Mar 22, 2012
- CARL ZEISS NTS, LLC.
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector System for Use with Transmission Electron Microscope Spect...
- Publication number 20120049060
- Publication date Mar 1, 2012
- FEI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED PARTICLE RADIATION DEVICE
- Publication number 20120043463
- Publication date Feb 23, 2012
- Toshihide Agemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Backscatter Reduction in Thin Electron Detectors
- Publication number 20120032078
- Publication date Feb 9, 2012
- FEI Company
- Michael Alwin William Stekelenburg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR PREPARING A SAMPLE
- Publication number 20120006786
- Publication date Jan 12, 2012
- CAMTEK LTD
- Dimitry BOGUSLAVSKY
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20110297827
- Publication date Dec 8, 2011
- Suyo Asai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DISCRIMINATION OF BACKSCATTERED FROM INCOMING ELECTRONS...
- Publication number 20100327161
- Publication date Dec 30, 2010
- GATAN, INC.
- Paul Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-BEAM MICROSCOPE
- Publication number 20100258719
- Publication date Oct 14, 2010
- CARL ZEISS NTS GMBH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DARK FIELD DETECTOR FOR USE IN AN ELECTRON MICROSCOPE
- Publication number 20100258721
- Publication date Oct 14, 2010
- FEI Company
- CORNELIS SANDER KOOIJMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF HIGH-ENERGY PARTICLE IMAGING BY COMPUTING A DIFFERENCE BE...
- Publication number 20100237252
- Publication date Sep 23, 2010
- Liang Jin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS
- Publication number 20100116977
- Publication date May 13, 2010
- FEI Company
- Richard J. Young
- G01 - MEASURING TESTING

Transmitted particle detectors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for simultaneous phase contrast imaging and elect...

Scanning electron microscope

Diffraction pattern detection in a transmission charged particle mi...

Apparatus and method for inspecting a sample using a plurality of c...

System of mobile charged particle detectors and methods of spent nu...

Studying dynamic specimens in a transmission charged particle micro...

Charged particle beam device

Charged particle beam device

Compressive scanning spectroscopy

Temporal compressive sensing systems

Apparatus and method for inspecting a sample using a plurality of c...

Method for characterizing two dimensional nanomaterial

Charged particle beam device, sample observation method, sample pla...

Compressive transmission microscopy

TEM phase contrast imaging with image plane phase grating

Electron beam masks for compressive sensors

Temporal compressive sensing systems

Electron microscope and method of aberration measurement

Device for correlative scanning transmission electron microscopy (S...

Temporal compressive sensing systems

Charged particle beam device, image generation method, observation...

Electron microscope and method of measuring aberrations

Measurement method and electron microscope

Sample base, charged particle beam device and sample observation me...

System and method for simultaneous detection of secondary electrons...

Charged particle beam device and sample observation method

High-speed multiframe dynamic transmission electron microscope imag...

Backscatter reduction in thin electron detectors

Measurement and endpointing of sample thickness

System and method for simultaneous detection of secondary electrons...

Patents Applicationslast 30 patents

MICROCHIPS FOR USE IN ELECTRON MICROSCOPES AND RELATED METHODS

CHARGED PARTICLE BEAM APPARATUS

Charged Particle Beam Device

DIFFRACTION PATTERN DETECTION IN A TRANSMISSION CHARGED PARTICLE MI...

SYSTEM OF MOBILE CHARGED PARTICLE DETECTORS AND METHODS OF SPENT NU...

STUDYING DYNAMIC SPECIMENS IN A TRANSMISSION CHARGED PARTICLE MICRO...

TEMPORAL COMPRESSIVE SENSING SYSTEMS

TEMPORAL COMPRESSIVE SENSING SYSTEMS

METHOD FOR CHARACTERIZING TWO DIMENSIONAL NANOMATERIAL

TEMPORAL COMPRESSIVE SENSING SYSTEMS

CHARGED PARTICLE BEAM DEVICE, IMAGE GENERATION METHOD, OBSERVATION...

Measurement Method and Electron Microscope

Backscatter Reduction in Thin Electron Detectors

SYSTEM AND METHOD FOR SIMULTANEOUS DETECTION OF SECONDARY ELECTRONS...

METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...

Method of protecting a radiation detector in a charged particle ins...

System and Method for Localization of Large Numbers of Fluorescent...

MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS

HIGH COLLECTION EFFICIENCY X-RAY SPECTROMETER SYSTEM WITH INTEGRATE...

CHARGED PARTICLE DETECTORS

Detector System for Use with Transmission Electron Microscope Spect...

COMPOSITE CHARGED PARTICLE RADIATION DEVICE

Backscatter Reduction in Thin Electron Detectors

METHOD AND SYSTEM FOR PREPARING A SAMPLE

CHARGED PARTICLE BEAM DEVICE

METHOD FOR DISCRIMINATION OF BACKSCATTERED FROM INCOMING ELECTRONS...

PARTICLE-BEAM MICROSCOPE

DARK FIELD DETECTOR FOR USE IN AN ELECTRON MICROSCOPE

METHOD OF HIGH-ENERGY PARTICLE IMAGING BY COMPUTING A DIFFERENCE BE...

MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS