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G01J2003/068
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/068
tuned to preselected wavelengths
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last 30 patents
Information
Patent Grant
Portable substance analysis based on computer vision, spectroscopy,...
Patent number
10,664,716
Issue date
May 26, 2020
VISPEK INC.
Wei Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dual fiber optic spectrophotometer
Patent number
5,184,193
Issue date
Feb 2, 1993
Guided Wave
David A. LeFebre
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength calibration method and apparatus
Patent number
4,971,439
Issue date
Nov 20, 1990
Beckman Instruments, Inc.
James R. Brown
G01 - MEASURING TESTING
Information
Patent Grant
Optical instrument calibration system
Patent number
4,866,644
Issue date
Sep 12, 1989
John S. Shenk
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPECTROSCOPIC ANALYSIS SYSTEM AND SPECTROSCOPIC ANALYSIS METHOD
Publication number
20240011833
Publication date
Jan 11, 2024
HITACHI HIGH-TECH SCIENCE CORPORATION
Akihiro Nojima
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE SUBSTANCE ANALYSIS BASED ON COMPUTER VISION, SPECTROSCOPY,...
Publication number
20190026586
Publication date
Jan 24, 2019
VISPEK INC.
Wei Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Multi channel Raman spectroscopy system and method
Publication number
20050264808
Publication date
Dec 1, 2005
Axsun Technologies, Inc.
Xiaomei Wang
G01 - MEASURING TESTING