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G01J2003/1247

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2003/1247Tuning

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Linear temperature calibration compensation for spectrometer systems
- Patent number 12,163,835
- Issue date Dec 10, 2024
- ams Sensors Singapore Pte. Ltd.
- Javier Miguel Sánchez
- G01 - MEASURING TESTING
Information Patent Grant
Trace microanalysis microscope systems and methods
- Patent number 12,025,498
- Issue date Jul 2, 2024
- SPECTRICON IKE
- Konstantinos Balas
- G01 - MEASURING TESTING
Information Patent Grant
Hydrogen sulfide imaging system
- Patent number 11,846,619
- Issue date Dec 19, 2023
- Rebellion Photonics, Inc.
- Robert Timothy Kester
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Tunable notch filter
- Patent number 11,788,887
- Issue date Oct 17, 2023
- Nanohmics, Inc.
- Chris W. Mann
- G02 - OPTICS
Information Patent Grant
Methods for spectral mapping
- Patent number 11,435,230
- Issue date Sep 6, 2022
- Nanohmics, Inc.
- Mark E. Lucente
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and method for producing an interferometer
- Patent number 11,391,629
- Issue date Jul 19, 2022
- Robert Bosch GmbH
- Ralf Noltemeyer
- G01 - MEASURING TESTING
Information Patent Grant
Hydrogen sulfide imaging system
- Patent number 11,287,409
- Issue date Mar 29, 2022
- Rebellion Photonics, Inc.
- Robert Timothy Kester
- G01 - MEASURING TESTING
Information Patent Grant
Optical module and electronic apparatus
- Patent number 11,269,235
- Issue date Mar 8, 2022
- Seiko Epson Corporation
- Kei Kudo
- G01 - MEASURING TESTING
Information Patent Grant
Multichromatic calibration method and device
- Patent number 11,226,232
- Issue date Jan 18, 2022
- Ecole Polytechnique Federale de Lausanne (EPFL)
- Dragos Constantin
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable interference
- Patent number 11,143,931
- Issue date Oct 12, 2021
- International Business Machines Corporation
- Johannes Gooth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Xenon suppression filter for spectrometry
- Patent number 11,060,910
- Issue date Jul 13, 2021
- Ocean Optics, Inc.
- Paul W. Ave
- G01 - MEASURING TESTING
Information Patent Grant
Tunable optical filter based upon liquid crystal cell and wavelengt...
- Patent number 11,009,398
- Issue date May 18, 2021
- Samsung Electronics Co., Ltd.
- Aleksey Dmitrievitch Lantsov
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensor comprising a rotatable Fabry-Perot multilayer etalon
- Patent number 10,955,336
- Issue date Mar 23, 2021
- Innovative Micro Technology
- Christopher S. Gudeman
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength locker
- Patent number 10,670,939
- Issue date Jun 2, 2020
- Elenion Technologies, LLC
- Yang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Hydrogen sulfide imaging system
- Patent number 10,648,960
- Issue date May 12, 2020
- Rebellion Photonics, Inc.
- Robert Timothy Kester
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Spectral imaging method and system
- Patent number 10,605,660
- Issue date Mar 31, 2020
- Technology Innovation Momentum Fund (Israel) Limited Partnership
- Ariel Raz
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for chemical analysis using Fabry-Perot tunable...
- Patent number 10,451,480
- Issue date Oct 22, 2019
- Big Sur Scientific, LLC
- Brian Charles Smith
- G01 - MEASURING TESTING
Information Patent Grant
Colorimetry method, colorimetry device, spectral measurement method...
- Patent number 10,063,785
- Issue date Aug 28, 2018
- Seiko Epson Corporation
- Danjun Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a slab of material
- Patent number 9,915,564
- Issue date Mar 13, 2018
- APPLEJACK 199, L.P.
- Wojciech Jan Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Multiplex tunable filter spectrometer
- Patent number 9,651,422
- Issue date May 16, 2017
- MKS Instruments, Inc.
- Vidi A. Saptari
- G01 - MEASURING TESTING
Information Patent Grant
Light measurement device with identifiable detection elements
- Patent number 9,404,803
- Issue date Aug 2, 2016
- Seiko Epson Corporation
- Tatsuo Urushidani
- G01 - MEASURING TESTING
Information Patent Grant
Variable-wavelength interference filter, optical filter device, opt...
- Patent number 9,389,412
- Issue date Jul 12, 2016
- Seiko Epson Corporation
- Tomonori Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for chemical composition measurement and monito...
- Patent number 9,250,132
- Issue date Feb 2, 2016
- Pason Systems Corp.
- David Bonyuet
- G01 - MEASURING TESTING
Information Patent Grant
Multiplex tunable filter spectrometer
- Patent number 8,896,839
- Issue date Nov 25, 2014
- Pason Systems Corp.
- Vidi A. Saptari
- G01 - MEASURING TESTING
Information Patent Grant
Optical filter, optical filter module, and photometric analyzer
- Patent number 8,817,268
- Issue date Aug 26, 2014
- Seiko Epson Corporation
- Akira Sano
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for chemical composition measurement and monito...
- Patent number 8,502,981
- Issue date Aug 6, 2013
- Pason Systems Corp.
- David Bonyuet
- G01 - MEASURING TESTING
Information Patent Grant
All reflective apparatus for injecting excitation light and collect...
- Patent number 8,355,125
- Issue date Jan 15, 2013
- C8 Medisensors Inc.
- Jan Lipson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optical filtering with two passbands
- Patent number 8,294,990
- Issue date Oct 23, 2012
- Raytheon Canada Limited
- Douglas J. Brown
- G01 - MEASURING TESTING
Information Patent Grant
Scanning spectroscopy modulation for frequency domain spectral anal...
- Patent number 8,223,339
- Issue date Jul 17, 2012
- The United States of America as represented by the Secretary of the Navy
- Mark Fralick
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for chemical composition measurement and monito...
- Patent number 8,184,293
- Issue date May 22, 2012
- Pason Systems Corp.
- David Bonyuet
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELIMINATION OF OPTICAL GHOSTS IN OPTICAL SPECTRAL ANALYZERS THROUGH...
- Publication number 20250003798
- Publication date Jan 2, 2025
- VIAVI SOLUTIONS INC.
- Driss TOUAHRI
- G01 - MEASURING TESTING
Information Patent Application
HYDROGEN SULFIDE IMAGING SYSTEM
- Publication number 20240151700
- Publication date May 9, 2024
- REBELLION PHOTONICS, INC.
- Robert Timothy Kester
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR DEVICE AND METHOD FOR THE REMOTE ANALYSIS OF MATERIALS, AN...
- Publication number 20220333991
- Publication date Oct 20, 2022
- DEUTSCHES ZENTRUM FÜR LUFT- UND RAUMFAHRT E.V.
- Christoph KÖLBL
- G01 - MEASURING TESTING
Information Patent Application
HYDROGEN SULFIDE IMAGING SYSTEM
- Publication number 20220229033
- Publication date Jul 21, 2022
- REBELLION PHOTONICS, INC.
- Robert Timothy Kester
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Mirror Device for an Interferometer Device, Interferometer Device a...
- Publication number 20220221709
- Publication date Jul 14, 2022
- ROBERT BOSCH GmbH
- Christoph Schelling
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR SPECTRAL MAPPING
- Publication number 20220099491
- Publication date Mar 31, 2022
- Nanohmics, Inc.
- Mark E. Lucente
- G01 - MEASURING TESTING
Information Patent Application
LINEAR TEMPERATURE CALIBRATION COMPENSATION FOR SPECTROMETER SYSTEMS
- Publication number 20220026273
- Publication date Jan 27, 2022
- ams Sensors Singapore Pte. Ltd.
- Javier Miguel Sánchez
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION METHOD
- Publication number 20210381955
- Publication date Dec 9, 2021
- SEIKO EPSON CORPORATION
- Ryoki WATANABE
- G01 - MEASURING TESTING
Information Patent Application
TUNABLE NOTCH FILTER
- Publication number 20210302231
- Publication date Sep 30, 2021
- Nanohmics, Inc.
- Chris W. Mann
- G01 - MEASURING TESTING
Information Patent Application
Interferometer and Method for Producing an Interferometer
- Publication number 20210262858
- Publication date Aug 26, 2021
- ROBERT BOSCH GmbH
- Ralf Noltemeyer
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH LOCKER
- Publication number 20200272019
- Publication date Aug 27, 2020
- Elenion Technologies, LLC
- Yang Liu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
HYDROGEN SULFIDE IMAGING SYSTEM
- Publication number 20200264149
- Publication date Aug 20, 2020
- REBELLION PHOTONICS, INC.
- Robert Timothy Kester
- G01 - MEASURING TESTING
Information Patent Application
MULTICHROMATIC CALIBRATION METHOD AND DEVICE
- Publication number 20200264046
- Publication date Aug 20, 2020
- ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
- Dragos CONSTANTIN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE AND ELECTRONIC APPARATUS
- Publication number 20200192178
- Publication date Jun 18, 2020
- SEIKO EPSON CORPORATION
- Kei KUDO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CHEMICAL ANALYSIS USING FABRY-PEROT TUNABLE...
- Publication number 20190226912
- Publication date Jul 25, 2019
- Big Sur Scientific, LLC
- Brian Charles Smith
- G01 - MEASURING TESTING
Information Patent Application
MICROCAVITY ARRAY FOR SPECTRAL IMAGING
- Publication number 20170276996
- Publication date Sep 28, 2017
- Montana State University
- Russell J. BARBOUR
- G02 - OPTICS
Information Patent Application
LIGHT MEASUREMENT DEVICE WITH IDENTIFIABLE DETECTION ELEMENTS
- Publication number 20140375996
- Publication date Dec 25, 2014
- Tatsuo URUSHIDANI
- G02 - OPTICS
Information Patent Application
SPECTROSCOPIC APPARATUS AND SPECTROSCOPIC LIGHT SOURCE
- Publication number 20140125981
- Publication date May 8, 2014
- YOKOGAWA ELECTRIC CORPORATION
- Mitsuhiro IGA
- G02 - OPTICS
Information Patent Application
VARIABLE-WAVELENGTH INTERFERENCE FILTER, OPTICAL FILTER DEVICE, OPT...
- Publication number 20130306838
- Publication date Nov 21, 2013
- SEIKO EPSON CORPORATION
- Tomonori MATSUSHITA
- G02 - OPTICS
Information Patent Application
METHODS AND SYSTEMS FOR CHEMICAL COMPOSITION MEASUREMENT AND MONITO...
- Publication number 20130293893
- Publication date Nov 7, 2013
- David Bonyuet
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILTER, OPTICAL FILTER MODULE, AND PHOTOMETRIC ANALYZER
- Publication number 20120300208
- Publication date Nov 29, 2012
- SEIKO EPSON CORPORATION
- Akira SANO
- G02 - OPTICS
Information Patent Application
Methods and Systems for Chemical Composition Measurement and Monito...
- Publication number 20120200855
- Publication date Aug 9, 2012
- Pason Systems Corp.
- David Bonyuet
- G01 - MEASURING TESTING
Information Patent Application
LIGHT MEASUREMENT DEVICE
- Publication number 20120109584
- Publication date May 3, 2012
- SEIKO EPSON CORPORATION
- Tatsuo URUSHIDANI
- G02 - OPTICS
Information Patent Application
OPTICAL SENSOR FOR PROXIMITY AND COLOR DETECTION
- Publication number 20110261370
- Publication date Oct 27, 2011
- QUALCOMM MEMS TECHNOLOGIES, INC.
- Philip Floyd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Optical Filtering with Two Passbands
- Publication number 20110058256
- Publication date Mar 10, 2011
- Raytheon Company
- Douglas J. Brown
- G02 - OPTICS
Information Patent Application
All Reflective Apparatus for Injecting Excitation Light and Collect...
- Publication number 20100302535
- Publication date Dec 2, 2010
- C8 MEDISENSORS INC.
- Jan Lipson
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLEX TUNABLE FILTER SPECTROMETER
- Publication number 20100290045
- Publication date Nov 18, 2010
- Vidi A. Saptari
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR CHEMICAL COMPOSITION MEASUREMENT AND MONITO...
- Publication number 20100027004
- Publication date Feb 4, 2010
- Precisive, LLC
- David Bonyuet
- G01 - MEASURING TESTING
Information Patent Application
Optical microscope and spectrum measuring method
- Publication number 20070132994
- Publication date Jun 14, 2007
- Nanophoton Corp.
- Minoru Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Hyperspectral sensor using tunable filter
- Publication number 20070045545
- Publication date Mar 1, 2007
- David O. Light
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Linear temperature calibration compensation for spectrometer systems

Trace microanalysis microscope systems and methods

Hydrogen sulfide imaging system

Tunable notch filter

Methods for spectral mapping

Interferometer and method for producing an interferometer

Hydrogen sulfide imaging system

Optical module and electronic apparatus

Multichromatic calibration method and device

Reconfigurable interference

Xenon suppression filter for spectrometry

Tunable optical filter based upon liquid crystal cell and wavelengt...

Gas sensor comprising a rotatable Fabry-Perot multilayer etalon

Wavelength locker

Hydrogen sulfide imaging system

Spectral imaging method and system

Systems and methods for chemical analysis using Fabry-Perot tunable...

Colorimetry method, colorimetry device, spectral measurement method...

Inspecting a slab of material

Multiplex tunable filter spectrometer

Light measurement device with identifiable detection elements

Variable-wavelength interference filter, optical filter device, opt...

Methods and systems for chemical composition measurement and monito...

Multiplex tunable filter spectrometer

Optical filter, optical filter module, and photometric analyzer

Methods and systems for chemical composition measurement and monito...

All reflective apparatus for injecting excitation light and collect...

Method and apparatus for optical filtering with two passbands

Scanning spectroscopy modulation for frequency domain spectral anal...

Methods and systems for chemical composition measurement and monito...

Patents Applicationslast 30 patents

ELIMINATION OF OPTICAL GHOSTS IN OPTICAL SPECTRAL ANALYZERS THROUGH...

HYDROGEN SULFIDE IMAGING SYSTEM

DETECTOR DEVICE AND METHOD FOR THE REMOTE ANALYSIS OF MATERIALS, AN...

HYDROGEN SULFIDE IMAGING SYSTEM

Mirror Device for an Interferometer Device, Interferometer Device a...

METHODS FOR SPECTRAL MAPPING

LINEAR TEMPERATURE CALIBRATION COMPENSATION FOR SPECTROMETER SYSTEMS

DETERMINATION METHOD

TUNABLE NOTCH FILTER

Interferometer and Method for Producing an Interferometer

WAVELENGTH LOCKER

HYDROGEN SULFIDE IMAGING SYSTEM

MULTICHROMATIC CALIBRATION METHOD AND DEVICE

OPTICAL MODULE AND ELECTRONIC APPARATUS

SYSTEMS AND METHODS FOR CHEMICAL ANALYSIS USING FABRY-PEROT TUNABLE...

MICROCAVITY ARRAY FOR SPECTRAL IMAGING

LIGHT MEASUREMENT DEVICE WITH IDENTIFIABLE DETECTION ELEMENTS

SPECTROSCOPIC APPARATUS AND SPECTROSCOPIC LIGHT SOURCE

VARIABLE-WAVELENGTH INTERFERENCE FILTER, OPTICAL FILTER DEVICE, OPT...

METHODS AND SYSTEMS FOR CHEMICAL COMPOSITION MEASUREMENT AND MONITO...

OPTICAL FILTER, OPTICAL FILTER MODULE, AND PHOTOMETRIC ANALYZER

Methods and Systems for Chemical Composition Measurement and Monito...

LIGHT MEASUREMENT DEVICE

OPTICAL SENSOR FOR PROXIMITY AND COLOR DETECTION

Method and Apparatus for Optical Filtering with Two Passbands

All Reflective Apparatus for Injecting Excitation Light and Collect...

MULTIPLEX TUNABLE FILTER SPECTROMETER

METHODS AND SYSTEMS FOR CHEMICAL COMPOSITION MEASUREMENT AND MONITO...

Optical microscope and spectrum measuring method

Hyperspectral sensor using tunable filter