Membership
Tour
Register
Log in
Type of detector
Follow
Industry
CPC
G01J2001/4446
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J2001/4446
Type of detector
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Single photon detector, electronic device, and LiDAR device
Patent number
12,099,146
Issue date
Sep 24, 2024
TRUPIXEL INC.
Myung-Jae Lee
G01 - MEASURING TESTING
Information
Patent Grant
Photoconductor readout circuit
Patent number
12,072,238
Issue date
Aug 27, 2024
trinamiX GmbH
Bernd Scherwath
G01 - MEASURING TESTING
Information
Patent Grant
Self-triaging photon detector
Patent number
11,994,428
Issue date
May 28, 2024
PSIQUANTUM CORP.
Faraz Najafi
G01 - MEASURING TESTING
Information
Patent Grant
Photoconductor readout device and method of using same for determin...
Patent number
11,988,552
Issue date
May 21, 2024
trinamiX GmbH
Bertram Feuerstein
G01 - MEASURING TESTING
Information
Patent Grant
Photon number resolving superconducting detector
Patent number
11,988,554
Issue date
May 21, 2024
PSIQUANTUM CORP.
Faraz Najafi
G01 - MEASURING TESTING
Information
Patent Grant
Stray-light testing station
Patent number
11,933,666
Issue date
Mar 19, 2024
Waymo LLC
Chen David Lu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Systems and methods for biasing light detectors
Patent number
11,921,237
Issue date
Mar 5, 2024
Waymo LLC
Pierre-yves Droz
G01 - MEASURING TESTING
Information
Patent Grant
Device including photoconductor readout circuit for measuring diffe...
Patent number
11,791,424
Issue date
Oct 17, 2023
trinamiX GmbH
Celal Mohan Oeguen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photon detection device
Patent number
11,656,122
Issue date
May 23, 2023
National University Corporation Yokohama National University
Naoki Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Stray-light testing station
Patent number
11,635,326
Issue date
Apr 25, 2023
Waymo LLC
Chen David Lu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Photon number resolving superconducting detector
Patent number
11,629,995
Issue date
Apr 18, 2023
PSIQUANTUM CORP.
Faraz Najafi
G01 - MEASURING TESTING
Information
Patent Grant
Self-triaging photon detector
Patent number
11,585,695
Issue date
Feb 21, 2023
PSIQUANTUM CORP.
Faraz Najafi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Systems and methods for biasing light detectors
Patent number
11,378,663
Issue date
Jul 5, 2022
Waymo LLC
Pierre-yves Droz
G01 - MEASURING TESTING
Information
Patent Grant
Photon number resolving superconducting detector
Patent number
11,313,719
Issue date
Apr 26, 2022
PSIQUANTUM CORP.
Faraz Najafi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor film and phototube light detector
Patent number
11,313,718
Issue date
Apr 26, 2022
Carrier Corporation
Marcin Piech
G01 - MEASURING TESTING
Information
Patent Grant
Image sensor incorporating an array of optically switchable magneti...
Patent number
11,226,231
Issue date
Jan 18, 2022
GLOBALFOUNDRIES U.S. Inc.
Akhilesh R. Jaiswal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for counting photons by means of a photomultiplier
Patent number
11,215,503
Issue date
Jan 4, 2022
Leica Microsystems CMS GmbH
Holger Birk
G01 - MEASURING TESTING
Information
Patent Grant
Superconducting element, particle detection device, and particle de...
Patent number
11,211,541
Issue date
Dec 28, 2021
TOSHIBA MEMORY CORPORATION
Takeshi Yamane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Infrared detector and infrared sensor including the same
Patent number
11,069,738
Issue date
Jul 20, 2021
Samsung Electronics Co., Ltd.
Changyoung Park
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Gated superconducting photon detector
Patent number
11,029,203
Issue date
Jun 8, 2021
PSIQUANTUM CORP.
Faraz Najafi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and driving method thereof
Patent number
10,916,573
Issue date
Feb 9, 2021
Semiconductor Energy Laboratory Co., Ltd.
Yoshiyuki Kurokawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electromagnetic wave detecting apparatus and method of setting acqu...
Patent number
10,914,631
Issue date
Feb 9, 2021
Pioneer Corporation
Hiroyuki Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for hybrid superconducting medium comprising fi...
Patent number
10,847,706
Issue date
Nov 24, 2020
Massachusetts Institute of Technology
Yachin Ivry
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for camera-based ambient light estimation
Patent number
10,775,235
Issue date
Sep 15, 2020
SIGNIFY HOLDING B.V.
Ruben Rajagopalan
G01 - MEASURING TESTING
Information
Patent Grant
Distributed nanowire sensor for single photon imaging
Patent number
10,665,634
Issue date
May 26, 2020
Massachusetts Institute of Technology
Qingyuan Zhao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical power monitoring device, laser device, and laser system
Patent number
10,658,809
Issue date
May 19, 2020
Fujikura Ltd.
Yoshitaka Yokoyama
G01 - MEASURING TESTING
Information
Patent Grant
Photon detection device and photon detection method
Patent number
10,605,655
Issue date
Mar 31, 2020
National Insititute of Advanced Industrial Science & Technology
Nobuyuki Zen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Summation for multi-channel photomultiplier array signals
Patent number
10,605,656
Issue date
Mar 31, 2020
Universitat de Barcelona
David Gascon Fora
G05 - CONTROLLING REGULATING
Information
Patent Grant
Semiconductor device and driving method thereof
Patent number
10,535,689
Issue date
Jan 14, 2020
Semiconductor Energy Laboratory Co., Ltd.
Yoshiyuki Kurokawa
G01 - MEASURING TESTING
Information
Patent Grant
Arc light sensor and arc light detection method
Patent number
10,520,357
Issue date
Dec 31, 2019
Siemens Aktiengesellschaft
Xing Yi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Integrated Optical Field Sampling Platform
Publication number
20240369407
Publication date
Nov 7, 2024
Massachusetts Institute of Technology
Marco Turchetti
B82 - NANO-TECHNOLOGY
Information
Patent Application
Photon Detector System with Distance Control
Publication number
20240337796
Publication date
Oct 10, 2024
Single Quantum B.V.
John VAN DER ENDE
G01 - MEASURING TESTING
Information
Patent Application
SINGLE PHOTON DETECTOR, ELECTRONIC DEVICE, AND LiDAR DEVICE
Publication number
20240241229
Publication date
Jul 18, 2024
TRUPIXEL INC.
Myung-Jae LEE
G01 - MEASURING TESTING
Information
Patent Application
STRAY-LIGHT TESTING STATION
Publication number
20240183707
Publication date
Jun 6, 2024
WAYMO LLC
Chen David Lu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
DETECTOR OF TERAHERTZ BAND, RECEIVER HAVING THE SAME, AND IMAGING S...
Publication number
20230400352
Publication date
Dec 14, 2023
Research Cooperation Foundation of Yeungnam University
Jong Ryul YANG
G01 - MEASURING TESTING
Information
Patent Application
DESIGN FOR REDUCING DARK COUNT RATE OF SNSPD BASED ON TWO-WIRE STRU...
Publication number
20230304857
Publication date
Sep 28, 2023
NANJING UNIVERSITY
Labao ZHANG
G01 - MEASURING TESTING
Information
Patent Application
STRAY-LIGHT TESTING STATION
Publication number
20230213379
Publication date
Jul 6, 2023
WAYMO LLC
Chen David Lu
G01 - MEASURING TESTING
Information
Patent Application
Photon Number Resolving Superconducting Detector
Publication number
20230175887
Publication date
Jun 8, 2023
PsiQuantum Corp.
Faraz Najafi
G01 - MEASURING TESTING
Information
Patent Application
Photoconductor Readout Circuit
Publication number
20220333981
Publication date
Oct 20, 2022
trinamiX GmbH
Bertram FEUERSTEIN
G01 - MEASURING TESTING
Information
Patent Application
Photoconductor Readout Circuit
Publication number
20220326075
Publication date
Oct 13, 2022
trinamiX GmbH
Bernd SCHERWATH
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Biasing Light Detectors
Publication number
20220291356
Publication date
Sep 15, 2022
WAYMO LLC
Pierre-yves Droz
G01 - MEASURING TESTING
Information
Patent Application
Photon Number Resolving Superconducting Detector
Publication number
20220214214
Publication date
Jul 7, 2022
PsiQuantum Corp.
Faraz NAJAFI
G01 - MEASURING TESTING
Information
Patent Application
PHOTON DETECTION DEVICE
Publication number
20220136895
Publication date
May 5, 2022
National University Corporation Yokohama National University
Naoki TAKEUCHI
G01 - MEASURING TESTING
Information
Patent Application
IMAGE SENSOR INCORPORATING AN ARRAY OF OPTICALLY SWITCHABLE MAGNETI...
Publication number
20210404867
Publication date
Dec 30, 2021
GLOBALFOUNDRIES U.S. Inc.
Akhilesh R. Jaiswal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Systems and Methods for Biasing Light Detectors
Publication number
20210156972
Publication date
May 27, 2021
WAYMO LLC
Pierre-yves Droz
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC DETECTOR
Publication number
20210143293
Publication date
May 13, 2021
TSINGHUA UNIVERSITY
JIN ZHANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR COUNTING PHOTONS BY MEANS OF A PHOTOMULTIPLIER
Publication number
20200386616
Publication date
Dec 10, 2020
Leica Microsystems CMS GmbH
Holger Birk
G01 - MEASURING TESTING
Information
Patent Application
STRAY-LIGHT TESTING STATION
Publication number
20200319022
Publication date
Oct 8, 2020
WAYMO LLC
Chen David Lu
G01 - MEASURING TESTING
Information
Patent Application
PHOTON NUMBER RESOLVING SUPERCONDUCTING DETECTOR
Publication number
20200256722
Publication date
Aug 13, 2020
PsiQuantum Corp.
Faraz NAJAFI
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR FILM AND PHOTOTUBE LIGHT DETECTOR
Publication number
20200200598
Publication date
Jun 25, 2020
Carrier Corporation
Marcin Piech
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTING APPARATUS AND METHOD OF SETTING ACQU...
Publication number
20200182691
Publication date
Jun 11, 2020
Pioneer Corporation
Hiroyuki TANAKA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND DRIVING METHOD THEREOF
Publication number
20200152680
Publication date
May 14, 2020
Semiconductor Energy Laboratory Co., Ltd.
Yoshiyuki Kurokawa
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Gated Superconducting Photon Detector
Publication number
20200080890
Publication date
Mar 12, 2020
PsiQuantum Corp.
Faraz Najafi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SUPERCONDUCTING ELEMENT, PARTICLE DETECTION DEVICE, AND PARTICLE DE...
Publication number
20200013943
Publication date
Jan 9, 2020
Toshiba Memory Corporation
Takeshi YAMANE
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL POWER MONITORING DEVICE, LASER DEVICE, AND LASER SYSTEM
Publication number
20190296515
Publication date
Sep 26, 2019
FUJIKURA LTD.
Yoshitaka Yokoyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INFRARED DETECTOR AND INFRARED SENSOR INCLUDING THE SAME
Publication number
20190245001
Publication date
Aug 8, 2019
Samsung Electronics Co., Ltd.
Changyoung Park
B82 - NANO-TECHNOLOGY
Information
Patent Application
METHODS AND SYSTEMS FOR CAMERA-BASED AMBIENT LIGHT ESTIMATION
Publication number
20190178711
Publication date
Jun 13, 2019
PHILIPS LIGHTING HOLDING B.V.
RUBEN RAJAGOPALAN
G01 - MEASURING TESTING
Information
Patent Application
INFRARED DETECTOR AND INFRARED SENSOR INCLUDING THE SAME
Publication number
20190067362
Publication date
Feb 28, 2019
Samsung Electronics Co., Ltd.
Changyoung PARK
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
GATED SUPERCONDUCTING PHOTON DETECTOR
Publication number
20180335343
Publication date
Nov 22, 2018
PsiQuantum Corp.
Faraz Najafi
G01 - MEASURING TESTING
Information
Patent Application
SUMMATION FOR MULTI-CHANNEL PHOTOMULTIPLIER ARRAY SIGNALS
Publication number
20180283938
Publication date
Oct 4, 2018
Universitat De Barcelona
David GASCON FORA
G01 - MEASURING TESTING