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G01J2009/028
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J2009/028
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Organizations
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Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Optical sensor module including an interferometric sensor and exten...
Patent number
12,209,890
Issue date
Jan 28, 2025
Apple Inc.
Tong Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Interferometer with at least one dispersive element
Patent number
11,988,562
Issue date
May 21, 2024
SYSTEMS & TECHNOLOGY RESEARCH, LLC
Scott Bloom
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for and method of sensing alignment marks
Patent number
11,899,380
Issue date
Feb 13, 2024
ASML Holding N.V.
Krishanu Shome
G01 - MEASURING TESTING
Information
Patent Grant
Refractive scanning interferometer
Patent number
11,668,603
Issue date
Jun 6, 2023
Rapid Phenotyping Pty Limited
Selene Rodd-Routley
G01 - MEASURING TESTING
Information
Patent Grant
Multi-channel optical phase detector, multi-channel sensing system...
Patent number
11,469,848
Issue date
Oct 11, 2022
Korea Advanced Institute of Science and Technology
Jungwon Kim
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Laser detection system
Patent number
11,169,030
Issue date
Nov 9, 2021
Aston University
David Benton
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating the quality of the measurement of a wavefront...
Patent number
11,047,741
Issue date
Jun 29, 2021
Imagine Optic
Xavier Levecq
G01 - MEASURING TESTING
Information
Patent Grant
Compact wavelength meter and laser output measurement device
Patent number
10,578,494
Issue date
Mar 3, 2020
Lockheed Martin Coherent Technologies, Inc.
Bruce Gregory Tiemann
G01 - MEASURING TESTING
Information
Patent Grant
Imaging apparatus including image sensor, optical system, control c...
Patent number
10,412,319
Issue date
Sep 10, 2019
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Kenji Narumi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Interferometric technique for measuring upper atmospheric Doppler w...
Patent number
10,184,841
Issue date
Jan 22, 2019
The United States of America, as represented by the Secretary of the Navy
Christoph R. Englert
G02 - OPTICS
Information
Patent Grant
Optical pulse-generator and optical pulse-generating method
Patent number
9,570,879
Issue date
Feb 14, 2017
Sumitomo Osaka Cement Co., Ltd.
Tokutaka Hara
G02 - OPTICS
Information
Patent Grant
Mach-Zehnder interferometer having a doubly-corrugated spoofed surf...
Patent number
9,557,223
Issue date
Jan 31, 2017
The Regents of the University of Michigan
Pinaki Mazumder
G02 - OPTICS
Information
Patent Grant
Polarization beam splitter and optical device
Patent number
9,459,406
Issue date
Oct 4, 2016
NEC Corporation
Takashi Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Apolarized interferometric system, and apolarized interferometric m...
Patent number
8,953,169
Issue date
Feb 10, 2015
IXBLUE
Herve Lefevre
G01 - MEASURING TESTING
Information
Patent Grant
Optical switch using a michelson interferometer
Patent number
8,917,960
Issue date
Dec 23, 2014
Access Optical Networks, Inc.
Paul Prucnal
G11 - INFORMATION STORAGE
Information
Patent Grant
Restoration of Fizeau FTS spectral data using low and/or zero spati...
Patent number
7,436,518
Issue date
Oct 14, 2008
Lockheed Martin Corporation
Eric H. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic radiation detector utilizing an electromagnetic rad...
Patent number
5,349,437
Issue date
Sep 20, 1994
The United States of America as represented by the Secretary of the Navy
Lloyd C. Bobb
G01 - MEASURING TESTING
Information
Patent Grant
Passive quadrature phase detection system for coherent fiber optic...
Patent number
5,200,795
Issue date
Apr 6, 1993
The Board of Trustees of the Leland Stanford Junior University
Byoung Y. Kim
G02 - OPTICS
Information
Patent Grant
Coded-fringe interferometric method and device for wavefront detect...
Patent number
5,192,982
Issue date
Mar 9, 1993
Office Galileo S.p.A.
Antonio Lapucci
G01 - MEASURING TESTING
Information
Patent Grant
Optical fiber sensor for measuring physical properties of fluids
Patent number
5,115,127
Issue date
May 19, 1992
The United States of America as represented by the Secretary of the Navy
Lloyd C. Bobb
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring the duration of single optical radiation pu...
Patent number
5,068,525
Issue date
Nov 26, 1991
Max-Planck-Gesellschaft zur Foerderung der Wissenschaften E.V.
Fritz P. Schaefer
G01 - MEASURING TESTING
Information
Patent Grant
Optical fiber sensor for measuring physical properties of liquids
Patent number
5,047,626
Issue date
Sep 10, 1991
The United States of America as represented by the Secretary of the Navy
Lloyd C. Bobb
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength-independent interferometer for optical signal processing
Patent number
4,991,963
Issue date
Feb 12, 1991
The Secretary of State for Defence in Her Britannic Majesty's Government of t...
Philip Sutton
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DISPERSION MEASUREMENT DEVICE AND METHOD BASED ON FRANSON SECOND-OR...
Publication number
20250035490
Publication date
Jan 30, 2025
NATIONAL TIME SERVICE CENTER, THE CHINESE ACADEMY OF SCIENCES
Ruifang DONG
G01 - MEASURING TESTING
Information
Patent Application
PHOTONIC WAVEGUIDE POWER AND PHASE MONITOR
Publication number
20240385243
Publication date
Nov 21, 2024
IMEC vzw
Wim BOGAERTS
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DETECTION SYSTEM
Publication number
20240361185
Publication date
Oct 31, 2024
ULTRA DISPLAY TECHNOLOGY CORP.
Hsien-Te CHEN
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MEASURING THE CARRIER-ENVELOPE PHASE OFFSET O...
Publication number
20240344892
Publication date
Oct 17, 2024
Sphere Ultrafast Photonics, SA
Chen Guo
G01 - MEASURING TESTING
Information
Patent Application
Integrated High-Extinction Ratio Unbalanced Mach Zehnder Interferom...
Publication number
20240344891
Publication date
Oct 17, 2024
The Regents of the University of California
Kaikai Liu
G02 - OPTICS
Information
Patent Application
METHOD AND SYSTEM FOR EXPANDING THE DYNAMIC RANGE OF MACH-ZEHNDER S...
Publication number
20240019310
Publication date
Jan 18, 2024
Shanghai Haina Data Technology Company Ltd.
Rui YIN
G01 - MEASURING TESTING
Information
Patent Application
REFRACTIVE SCANNING INTERFEROMETER
Publication number
20230375409
Publication date
Nov 23, 2023
Rapid Phenotyping Pty Limited
Selene Rodd-Routley
G01 - MEASURING TESTING
Information
Patent Application
Optical Sensor Module Including an Interferometric Sensor and Exten...
Publication number
20230314185
Publication date
Oct 5, 2023
Apple Inc.
Tong Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Entanglement-Enhanced Interferometers
Publication number
20220373397
Publication date
Nov 24, 2022
The Regents of the University of Colorado, a Body Corporate
Juliet T. Gopinath
G02 - OPTICS
Information
Patent Application
APPARATUS FOR AND METHOD OF SENSING ALIGNMENT MARKS
Publication number
20220291598
Publication date
Sep 15, 2022
ASML Holding N.V.
Krishanu SHOME
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
REFRACTIVE SCANNING INTERFEROMETER
Publication number
20210293624
Publication date
Sep 23, 2021
Rapid Phenotyping Pty Limited
Selene Rodd-Routley
G01 - MEASURING TESTING
Information
Patent Application
LASER DETECTION SYSTEM
Publication number
20200278258
Publication date
Sep 3, 2020
ASTON UNIVERSITY
David Benton
G01 - MEASURING TESTING
Information
Patent Application
MULTI-CHANNEL OPTICAL PHASE DETECTOR, MULTI-CHANNEL SENSING SYSTEM...
Publication number
20200266913
Publication date
Aug 20, 2020
Korea Advanced Institute of Science and Technology
Jungwon KIM
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR EVALUATING THE QUALITY OF THE MEASUREMENT OF A WAVEFRONT...
Publication number
20190391020
Publication date
Dec 26, 2019
IMAGINE OPTIC
Xavier LEVECQ
G01 - MEASURING TESTING
Information
Patent Application
POLARIZATION BEAM SPLITTER AND OPTICAL DEVICE
Publication number
20150378098
Publication date
Dec 31, 2015
NEC Corporation
Takashi MATSUMOTO
G02 - OPTICS
Information
Patent Application
APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC M...
Publication number
20130222810
Publication date
Aug 29, 2013
Herve Lefevre
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SWITCH USING A MICHELSON INTERFEROMETER
Publication number
20100321769
Publication date
Dec 23, 2010
PAUL PRUCNAL
G02 - OPTICS
Information
Patent Application
Truncated series-based resonant cavity interferometer
Publication number
20030098982
Publication date
May 29, 2003
JDS Uniphase Corporation
Robert R. McLeod
H04 - ELECTRIC COMMUNICATION TECHNIQUE