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G01N2223/073
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
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G01N2223/073
use of a laser
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Patents Grants
last 30 patents
Information
Patent Grant
Molecular imaging system
Patent number
5,272,338
Issue date
Dec 21, 1993
The Pennsylvania Research Corporation
Nicholas Winograd
G01 - MEASURING TESTING
Information
Patent Grant
Thermal wave microscopy using areal infrared detection
Patent number
4,578,584
Issue date
Mar 25, 1986
International Business Machines Corporation
Thomas Baumann
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for surface characterization and process contr...
Patent number
4,393,311
Issue date
Jul 12, 1983
Bell Telephone Laboratories, Incorporated
Leonard C. Feldman
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
3163754
Patent number
3,163,754
Issue date
Dec 29, 1964
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR IN-SITU U-Pb DATING OF HETEROGENEOUS MINERALS
Publication number
20240319137
Publication date
Sep 26, 2024
Zijin Mining Group Co., Ltd.
Youye ZHENG
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
Publication number
20220349848
Publication date
Nov 3, 2022
KEYENCE CORPORATION
Hayato OHBA
G01 - MEASURING TESTING