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G01J2003/064

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2003/064Use of other elements for scan

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Patents Grantslast 30 patents

Information Patent Grant
Spectral feature control apparatus
- Patent number 12,124,053
- Issue date Oct 22, 2024
- Cymer, LLC
- Eric Anders Mason
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quadrilateral common-path time-modulated interferometric spectral i...
- Patent number 11,971,303
- Issue date Apr 30, 2024
- WUHAN UNIVERSITY
- Ruyi Wei
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-invasive measurement of analytes in vivo
- Patent number 11,965,781
- Issue date Apr 23, 2024
- SANGUIS CORPORATION
- Jeffrey Owen Katz
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 11,874,167
- Issue date Jan 16, 2024
- METROHM SPECTRO, INC.
- Mark Watson
- G01 - MEASURING TESTING
Information Patent Grant
Multi-wavelength laser inspection
- Patent number 11,860,093
- Issue date Jan 2, 2024
- The Boeing Company
- Keith D. Humfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for high gain Raman spectroscopy
- Patent number 11,860,106
- Issue date Jan 2, 2024
- SANGUIS CORPORATION
- Jeffrey Owen Katz
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-invasive measurement of analytes in vivo
- Patent number 11,740,128
- Issue date Aug 29, 2023
- SANGUIS CORPORATION
- Jeffrey Owen Katz
- G01 - MEASURING TESTING
Information Patent Grant
Optical assembly for optical emission spectroscopy
- Patent number 11,725,988
- Issue date Aug 15, 2023
- Hitachi High-Tech Analytical Science Finland Oy
- Esa Räikkönen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectral feature control apparatus
- Patent number 11,561,407
- Issue date Jan 24, 2023
- Cymer, LLC
- Eric Anders Mason
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cubesat infrared atmospheric sounder (CIRAS)
- Patent number 11,378,453
- Issue date Jul 5, 2022
- California Institute of Technology
- Thomas S. Pagano
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 11,307,090
- Issue date Apr 19, 2022
- MKS TECHNOLOGY
- Mark Watson
- G01 - MEASURING TESTING
Information Patent Grant
Multi-wavelength laser inspection
- Patent number 11,262,302
- Issue date Mar 1, 2022
- The Boeing Company
- Keith D. Humfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single-axis rotary actuator
- Patent number 11,131,846
- Issue date Sep 28, 2021
- Mitsumi Electric Co., Ltd.
- Masahiro Saito
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for imaging a sample using Raman spectroscopy
- Patent number 11,105,682
- Issue date Aug 31, 2021
- Frederic Leblond
- G01 - MEASURING TESTING
Information Patent Grant
Transmission Raman spectroscopy
- Patent number 10,876,894
- Issue date Dec 29, 2020
- Renishaw plc
- Timothy Smith
- G02 - OPTICS
Information Patent Grant
Spectral feature control apparatus
- Patent number 10,845,610
- Issue date Nov 24, 2020
- Cymer, LLC
- Eric Anders Mason
- G02 - OPTICS
Information Patent Grant
Gas analysis system
- Patent number 10,753,864
- Issue date Aug 25, 2020
- General Electric Company
- Ansas Matthias Kasten
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Multi-wavelength laser inspection
- Patent number 10,705,019
- Issue date Jul 7, 2020
- The Boeing Company
- Keith D. Humfeld
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic assays and tagging
- Patent number 10,684,172
- Issue date Jun 16, 2020
- Keith Carron
- G01 - MEASURING TESTING
Information Patent Grant
Optical module and method of driving optical module
- Patent number 10,670,856
- Issue date Jun 2, 2020
- Seiko Epson Corporation
- Ryohei Kuri
- G01 - MEASURING TESTING
Information Patent Grant
Fourier transform type spectrophotometer to control a speed of a mo...
- Patent number 10,502,626
- Issue date Dec 10, 2019
- SHIMADZU CORPORATION
- Tadafumi Kamikake
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 10,473,522
- Issue date Nov 12, 2019
- MKS Technology
- Mark Watson
- G01 - MEASURING TESTING
Information Patent Grant
Spectral feature control apparatus
- Patent number 10,416,471
- Issue date Sep 17, 2019
- Cymer, LLC
- Eric Anders Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Delay line device and terahertz time-domain spectrometer system
- Patent number 10,161,790
- Issue date Dec 25, 2018
- Shenzhen Institute of Terahertz Technology and Innovation
- Qing Ding
- G01 - MEASURING TESTING
Information Patent Grant
Surface refractive index scanning system and method
- Patent number 10,088,428
- Issue date Oct 2, 2018
- Danmarks Tekniske Universitet
- Anders Kristensen
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic apparatus
- Patent number 9,829,380
- Issue date Nov 28, 2017
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Tatsuo Itoh
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry device and image forming apparatus
- Patent number 9,804,025
- Issue date Oct 31, 2017
- Seiko Epson Corporation
- Masashi Kanai
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 9,791,313
- Issue date Oct 17, 2017
- MKS Technology
- Mark Watson
- G01 - MEASURING TESTING
Information Patent Grant
Optimizing vision correction procedures
- Patent number 9,706,913
- Issue date Jul 18, 2017
- Clarity Medical Systems, Inc.
- Yan Zhou
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Spectrometer
- Patent number 9,523,610
- Issue date Dec 20, 2016
- MKS Technology
- Mark Watson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...
- Publication number 20250052691
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Youngsun CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROSCOPIC DEVICE
- Publication number 20250052611
- Publication date Feb 13, 2025
- Hamamatsu Photonics K.K.
- Makoto NOZAKI
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
- Publication number 20250013066
- Publication date Jan 9, 2025
- CYMER, LLC
- Eric Anders Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Spectrometer
- Publication number 20240410751
- Publication date Dec 12, 2024
- Metrohm Spectro, Inc. (d/b/a Metrohm Raman)
- Mark Watson
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING A SPECTROMETER DEVICE
- Publication number 20240393178
- Publication date Nov 28, 2024
- trinamiX GmbH
- Robert LOVRINCIC
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE METHOD FOR SPECTROMETER
- Publication number 20240319010
- Publication date Sep 26, 2024
- Thermo Electron Scientific Instruments LLC
- John Iverson
- G01 - MEASURING TESTING
Information Patent Application
WIDE-FIELD SPECTRAL IMAGING SYSTEM
- Publication number 20240230406
- Publication date Jul 11, 2024
- National Central University
- Fan-Ching Chien
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ANALYSIS SYSTEM AND SPECTROSCOPIC ANALYSIS METHOD
- Publication number 20240011833
- Publication date Jan 11, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Akihiro Nojima
- G01 - MEASURING TESTING
Information Patent Application
QUADRILATERAL COMMON-PATH TIME-MODULATED INTERFEROMETRIC SPECTRAL I...
- Publication number 20230408337
- Publication date Dec 21, 2023
- WUHAN UNIVERSITY
- Ruyi WEI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NON-INVASIVE MEASUREMENT OF ANALYTES IN VIVO
- Publication number 20230314220
- Publication date Oct 5, 2023
- Sanguis Corporation
- Jeffrey Owen Katz
- G01 - MEASURING TESTING
Information Patent Application
MOVABLE DEVICE, RANGE-FINDING APPARATUS, IMAGE DISPLAY APPARATUS, H...
- Publication number 20230305292
- Publication date Sep 28, 2023
- Masayuki FUJISHIMA
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
- Publication number 20230124587
- Publication date Apr 20, 2023
- CYMER, LLC
- Eric Anders Mason
- G02 - OPTICS
Information Patent Application
Spectrometer
- Publication number 20230075544
- Publication date Mar 9, 2023
- MKS TECHNOLOGY (D/B/A SNOWY RANGE INSTRUMENTS)
- Mark Watson
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ASSEMBLY FOR OPTICAL EMISSION SPECTROSCOPY
- Publication number 20220373393
- Publication date Nov 24, 2022
- Hitachi High-Tech Analytical Science Finland Oy
- Esa RÄIKKÖNEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR NON-INVASIVE MEASUREMENT OF ANALYTES IN VIVO
- Publication number 20210025758
- Publication date Jan 28, 2021
- Sanguis Corporation
- Jeffrey Owen Katz
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
- Publication number 20210011302
- Publication date Jan 14, 2021
- CYMER, LLC
- Eric Anders Mason
- G02 - OPTICS
Information Patent Application
SPECTROSCOPIC ASSAYS AND TAGGING
- Publication number 20200348179
- Publication date Nov 5, 2020
- MKS TECHNOLOGY, INC. (D/B/A SNOWY RANGE INSTRUMENT
- Keith Carron
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Imaging a Sample Using Raman Spectroscopy
- Publication number 20200284657
- Publication date Sep 10, 2020
- POLYVALOR, LIMITED PARTNERSHIP
- Frederic Leblond
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer
- Publication number 20200256724
- Publication date Aug 13, 2020
- MKS TECHNOLOGY, INC. (D/B/A SNOWY RANGE INSTRUMENT
- Mark Watson
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYSIS SYSTEM
- Publication number 20200182780
- Publication date Jun 11, 2020
- GENERAL ELECTRIC COMPANY
- Ansas Matthias Kasten
- G01 - MEASURING TESTING
Information Patent Application
CUBESAT INFRARED ATMOSPHERIC SOUNDER (CIRAS)
- Publication number 20200096388
- Publication date Mar 26, 2020
- California Institute of Technology
- Thomas S. Pagano
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
- Publication number 20190353920
- Publication date Nov 21, 2019
- CYMER, LLC
- Eric Anders Mason
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOICE COIL MOTOR, AND MOVABLE MIRROR UNIT AND INTERFERENCE SPECTROP...
- Publication number 20190186993
- Publication date Jun 20, 2019
- Shimadzu Corporation
- Hiromasa MARUNO
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SINGLE-AXIS ROTARY ACTUATOR
- Publication number 20190107712
- Publication date Apr 11, 2019
- MITSUMI ELECTRIC CO., LTD.
- Masahiro SAITO
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER
- Publication number 20180283941
- Publication date Oct 4, 2018
- MKS TECHNOLOGY (D/B/A SNOWY RANGE
- Mark Watson
- G01 - MEASURING TESTING
Information Patent Application
Delay Line Device And Terahertz Time-Domain Spectrometer System
- Publication number 20180274978
- Publication date Sep 27, 2018
- Shenzhen Institute of Terahertz Technology and Innovation
- Qing Ding
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION RAMAN SPECTROSCOPY
- Publication number 20180045570
- Publication date Feb 15, 2018
- RENISHAW PLC
- Timothy SMITH
- G01 - MEASURING TESTING
Information Patent Application
A SURFACE REFRACTIVE INDEX SCANNING SYSTEM AND METHOD
- Publication number 20170269002
- Publication date Sep 21, 2017
- DANMARKS TEKNISKE UNIVERSITET
- Anders Kristensen
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC MAPPING SYSTEM AND METHOD
- Publication number 20170010153
- Publication date Jan 12, 2017
- HORIBA INSTRUMENTS INCORPORATED
- Nicolas VEZARD
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZING VISION CORRECTION PROCEDURES
- Publication number 20140368794
- Publication date Dec 18, 2014
- YAN ZHOU
- G01 - MEASURING TESTING

Use of other elements for scan

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spectral feature control apparatus

Quadrilateral common-path time-modulated interferometric spectral i...

System and method for non-invasive measurement of analytes in vivo

Spectrometer

Multi-wavelength laser inspection

System and method for high gain Raman spectroscopy

System and method for non-invasive measurement of analytes in vivo

Optical assembly for optical emission spectroscopy

Spectral feature control apparatus

Cubesat infrared atmospheric sounder (CIRAS)

Spectrometer

Multi-wavelength laser inspection

Single-axis rotary actuator

Methods and systems for imaging a sample using Raman spectroscopy

Transmission Raman spectroscopy

Spectral feature control apparatus

Gas analysis system

Multi-wavelength laser inspection

Spectroscopic assays and tagging

Optical module and method of driving optical module

Fourier transform type spectrophotometer to control a speed of a mo...

Spectrometer

Spectral feature control apparatus

Delay line device and terahertz time-domain spectrometer system

Surface refractive index scanning system and method

Spectroscopic apparatus

Spectrometry device and image forming apparatus

Spectrometer

Optimizing vision correction procedures

Spectrometer

Patents Applicationslast 30 patents

SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...

SPECTROSCOPIC DEVICE

SPECTRAL FEATURE CONTROL APPARATUS

Spectrometer

METHOD FOR CALIBRATING A SPECTROMETER DEVICE

REFERENCE METHOD FOR SPECTROMETER

WIDE-FIELD SPECTRAL IMAGING SYSTEM

SPECTROSCOPIC ANALYSIS SYSTEM AND SPECTROSCOPIC ANALYSIS METHOD

QUADRILATERAL COMMON-PATH TIME-MODULATED INTERFEROMETRIC SPECTRAL I...

SYSTEM AND METHOD FOR NON-INVASIVE MEASUREMENT OF ANALYTES IN VIVO

MOVABLE DEVICE, RANGE-FINDING APPARATUS, IMAGE DISPLAY APPARATUS, H...

SPECTRAL FEATURE CONTROL APPARATUS

Spectrometer

OPTICAL ASSEMBLY FOR OPTICAL EMISSION SPECTROSCOPY

SYSTEM AND METHOD FOR NON-INVASIVE MEASUREMENT OF ANALYTES IN VIVO

SPECTRAL FEATURE CONTROL APPARATUS

SPECTROSCOPIC ASSAYS AND TAGGING

Methods and Systems for Imaging a Sample Using Raman Spectroscopy

Spectrometer

GAS ANALYSIS SYSTEM

CUBESAT INFRARED ATMOSPHERIC SOUNDER (CIRAS)

SPECTRAL FEATURE CONTROL APPARATUS

VOICE COIL MOTOR, AND MOVABLE MIRROR UNIT AND INTERFERENCE SPECTROP...

SINGLE-AXIS ROTARY ACTUATOR

SPECTROMETER

Delay Line Device And Terahertz Time-Domain Spectrometer System

TRANSMISSION RAMAN SPECTROSCOPY

A SURFACE REFRACTIVE INDEX SCANNING SYSTEM AND METHOD

SPECTROSCOPIC MAPPING SYSTEM AND METHOD

OPTIMIZING VISION CORRECTION PROCEDURES