using a combination of at least two kinds of measurements, each one being of a secondary emission kind

Industry

CPC
G01N23/2208

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/2208using a combination of at least two kinds of measurements, each one being of a secondary emission kind

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,906,451
- Issue date Feb 20, 2024
- Nova Ltd.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of calculating thickness of graphene layer and method of mea...
- Patent number 11,906,291
- Issue date Feb 20, 2024
- Samsung Electronics Co., Ltd.
- Eunkyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,782,000
- Issue date Oct 10, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,698,353
- Issue date Jul 11, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,668,663
- Issue date Jun 6, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzer
- Patent number 11,609,191
- Issue date Mar 21, 2023
- Jeol Ltd.
- Kazunori Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Systems, devices, and methods for x-ray fluorescence analysis of ge...
- Patent number 11,592,407
- Issue date Feb 28, 2023
- Enersoft Inc.
- Yannai Z. R. Segal
- G01 - MEASURING TESTING
Information Patent Grant
Graphene-based electro-microfluidic devices and methods for protein...
- Patent number 11,175,244
- Issue date Nov 16, 2021
- University of Massachusetts
- Sarah L. Perry
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Particle measuring device and particle measuring method
- Patent number 11,143,606
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
System and process for in-process electron beam profile and locatio...
- Patent number 11,117,195
- Issue date Sep 14, 2021
- The University Of Liverpool
- Christopher J. Sutcliffe
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Nondestructive inspection system
- Patent number 10,705,243
- Issue date Jul 7, 2020
- Korea Atomic Energy Research Institute
- Byeongno Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 10,533,961
- Issue date Jan 14, 2020
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- G01 - MEASURING TESTING
Information Patent Grant
Combined handheld XRF and OES systems and methods
- Patent number 10,012,603
- Issue date Jul 3, 2018
- SciAps, Inc.
- Donald W. Sackett
- G01 - MEASURING TESTING
Information Patent Grant
Cross-section processing and observation method and cross-section p...
- Patent number 9,966,226
- Issue date May 8, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection device including a counter electrode with...
- Patent number 9,846,133
- Issue date Dec 19, 2017
- Hitachi, Ltd.
- Yoshinobu Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for non-intrusive chemical assaying of hydrogen...
- Patent number 9,678,024
- Issue date Jun 13, 2017
- Passport Systems, Inc.
- Cody M. Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Silicon germanium thickness and composition determination using com...
- Patent number 9,594,035
- Issue date Mar 14, 2017
- ReVera, Incorporated
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Grant
Method for rapid analysis of gold
- Patent number 9,528,951
- Issue date Dec 27, 2016
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- James Tickner
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for determining the performance of a photolithographic mask
- Patent number 9,431,212
- Issue date Aug 30, 2016
- Carl Zeiss SMS GmbH
- Markus Waiblinger
- G01 - MEASURING TESTING
Information Patent Grant
Cross-section processing and observation method and cross-section p...
- Patent number 9,080,945
- Issue date Jul 14, 2015
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 9,024,280
- Issue date May 5, 2015
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device, position specification method used fo...
- Patent number 8,912,487
- Issue date Dec 16, 2014
- Hitachi High-Technologies Corporation
- Kunio Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection methods, systems and components
- Patent number 8,669,525
- Issue date Mar 11, 2014
- Carl Zeiss Microscopy, LLC
- Sybren Sijbrandij
- G01 - MEASURING TESTING
Information Patent Grant
Variable rate scanning in an electron microscope
- Patent number 8,207,499
- Issue date Jun 26, 2012
- Applied Materials Israel, Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for solid surface analysis using X-ray spectroscopy
- Patent number 5,369,275
- Issue date Nov 29, 1994
- International Superconductivity Technology Center
- Toshio Usui
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 5,142,149
- Issue date Aug 25, 1992
- Hitachi, Ltd.
- Shigeto Isakozawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Direct Sampling from Phase-Separated Sample for Hydrophobicity Asse...
- Publication number 20240272101
- Publication date Aug 15, 2024
- DH Technologies Development Pte. Ltd.
- Thomas COVEY
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...
- Publication number 20240151522
- Publication date May 9, 2024
- Samsung Electronics Co., Ltd.
- Eunkyu LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20230408430
- Publication date Dec 21, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
- Publication number 20230258587
- Publication date Aug 17, 2023
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Simon BURGESS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GEOLOGICAL ANALYSIS SYSTEM, DEVICES AND METHODS USING X-RAY FLUORES...
- Publication number 20230175992
- Publication date Jun 8, 2023
- Enersoft Inc.
- Yannai Z. R. Segal
- G01 - MEASURING TESTING
Information Patent Application
Phase Analyzer, Sample Analyzer, and Analysis Method
- Publication number 20230137130
- Publication date May 4, 2023
- JEOL Ltd.
- Kouta Itoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
QUANTITATIVE ANALYSIS METHOD, QUANTITATIVE ANALYSIS PROGRAM, AND X-...
- Publication number 20230060446
- Publication date Mar 2, 2023
- Rigaku Corporation
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20220074878
- Publication date Mar 10, 2022
- NOVA LTD
- Wei Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...
- Publication number 20210372786
- Publication date Dec 2, 2021
- Samsung Electronics Co., Ltd.
- Eunkyu LEE
- G01 - MEASURING TESTING
Information Patent Application
Analyzer
- Publication number 20210025838
- Publication date Jan 28, 2021
- JEOL Ltd.
- Kazunori Tsukamoto
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20200191734
- Publication date Jun 18, 2020
- Nova Measuring Instruments, Inc.
- Wei Ti Lee
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTION SYSTEM
- Publication number 20190235124
- Publication date Aug 1, 2019
- Korea Atomic Energy Research Institute
- Byeongno LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20180328871
- Publication date Nov 15, 2018
- Nova Measuring Instruments, Inc.
- Wei Ti Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20180172609
- Publication date Jun 21, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Wei Ti LEE
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING AN OBJECT USING A PARTICLE BEAM APPARATUS
- Publication number 20170038321
- Publication date Feb 9, 2017
- CARL ZEISS MICROSCOPY GMBH
- Richard Schillinger
- G01 - MEASURING TESTING
Information Patent Application
Quantitative X-ray Analysis - Multi optical path instrument
- Publication number 20160258892
- Publication date Sep 8, 2016
- PANALYTICAL B.V.
- Petronella Emerentiana Hegeman
- G01 - MEASURING TESTING
Information Patent Application
SILICON GERMANIUM THICKNESS AND COMPOSITION DETERMINATION USING COM...
- Publication number 20150308969
- Publication date Oct 29, 2015
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Application
CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20140131575
- Publication date May 15, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE PERFORMANCE OF A PHOTOLITHOGRAPHIC MASK
- Publication number 20130126728
- Publication date May 23, 2013
- CARL ZEISS SMS GMBH
- Markus Waiblinger
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130075606
- Publication date Mar 28, 2013
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MATERIAL ANALYSIS BY A FOCUSED ELECTRON BE...
- Publication number 20130054153
- Publication date Feb 28, 2013
- TESCAN, a.s.
- David MOTL
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device, Position Specification Method Used fo...
- Publication number 20120211652
- Publication date Aug 23, 2012
- Kunio Sakamoto
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INSPECTION METHODS, SYSTEMS AND COMPONENTS
- Publication number 20110121176
- Publication date May 26, 2011
- CARL ZEISS NTS, LLC.
- Sybren Sijbrandij
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE RATE SCANNING IN AN ELECTRON MICROSCOPE
- Publication number 20100072365
- Publication date Mar 25, 2010
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Application
Section image acquiring method using combined charge particle beam...
- Publication number 20090283677
- Publication date Nov 19, 2009
- Yutaka IKKU
- G01 - MEASURING TESTING

using a combination of at least two kinds of measurements, each one being of a secondary emission kind

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for non-destructive metrology of thin layers

Patterned x-ray emitting target

Method and system for non-destructive metrology of thin layers

Method of calculating thickness of graphene layer and method of mea...

Quantitative analysis method, quantitative analysis program, and X-...

Quantitative analysis method, quantitative analysis program, and X-...

Method and system for non-destructive metrology of thin layers

Analyzer

Systems, devices, and methods for x-ray fluorescence analysis of ge...

Graphene-based electro-microfluidic devices and methods for protein...

Particle measuring device and particle measuring method

System and process for in-process electron beam profile and locatio...

Nondestructive inspection system

Method and system for non-destructive metrology of thin layers

Combined handheld XRF and OES systems and methods

Cross-section processing and observation method and cross-section p...

Semiconductor inspection device including a counter electrode with...

Methods and systems for non-intrusive chemical assaying of hydrogen...

Silicon germanium thickness and composition determination using com...

Method for rapid analysis of gold

Method for determining the performance of a photolithographic mask

Cross-section processing and observation method and cross-section p...

Composite charged particle beam apparatus

Charged particle beam device, position specification method used fo...

Sample inspection methods, systems and components

Variable rate scanning in an electron microscope

Apparatus for solid surface analysis using X-ray spectroscopy

Electron microscope

Patents Applicationslast 30 patents

Direct Sampling from Phase-Separated Sample for Hydrophobicity Asse...

METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

MATERIAL ANALYSIS WITH MULTIPLE DETECTORS

GEOLOGICAL ANALYSIS SYSTEM, DEVICES AND METHODS USING X-RAY FLUORES...

Phase Analyzer, Sample Analyzer, and Analysis Method

QUANTITATIVE ANALYSIS METHOD, QUANTITATIVE ANALYSIS PROGRAM, AND X-...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...

Analyzer

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

NONDESTRUCTIVE INSPECTION SYSTEM

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

ANALYZING AN OBJECT USING A PARTICLE BEAM APPARATUS

Quantitative X-ray Analysis - Multi optical path instrument

SILICON GERMANIUM THICKNESS AND COMPOSITION DETERMINATION USING COM...

CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...

METHOD FOR DETERMINING THE PERFORMANCE OF A PHOTOLITHOGRAPHIC MASK

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

METHOD AND APPARATUS FOR MATERIAL ANALYSIS BY A FOCUSED ELECTRON BE...

Charged Particle Beam Device, Position Specification Method Used fo...

SAMPLE INSPECTION METHODS, SYSTEMS AND COMPONENTS

VARIABLE RATE SCANNING IN AN ELECTRON MICROSCOPE

Section image acquiring method using combined charge particle beam...