using a comparative method

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CPC
G01N21/95607

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/95607using a comparative method

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Image acquisition method and image acquisition apparatus
- Patent number 12,105,026
- Issue date Oct 1, 2024
- NuFlare Technology, Inc.
- Yasuhiro Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Printing solder point quality identification and maintenance sugges...
- Patent number 12,100,129
- Issue date Sep 24, 2024
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Meng Sun
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for characterizing defects in silicon crystal
- Patent number 12,092,588
- Issue date Sep 17, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- C30 - CRYSTAL GROWTH
Information Patent Grant
Systems and methods for synthesizing a diamond using machine learning
- Patent number 12,072,299
- Issue date Aug 27, 2024
- Fraunhofer USA, Inc.
- Rohan Reddy Mekala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle lamp system, foreign substance determination device, and fo...
- Patent number 12,065,109
- Issue date Aug 20, 2024
- Koito Manufacturing Co., Ltd.
- Hiroki Sumitani
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and system for diagnosing a semiconductor wafer
- Patent number 12,062,166
- Issue date Aug 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yen-Liang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing method and system for detection of deterioration of...
- Patent number 12,055,498
- Issue date Aug 6, 2024
- Top Technology Platform Co., Ltd.
- Chyuan-Ruey Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for inspecting a display panel for defects
- Patent number 12,046,167
- Issue date Jul 23, 2024
- Samsung Display Co., Ltd.
- Hoon Sohn
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Mask inspection apparatus and mask inspection method using the same
- Patent number 12,045,975
- Issue date Jul 23, 2024
- Samsung Display Co., Ltd.
- Ilha Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for evaluating defect in monoclinic gallium oxide
- Patent number 12,038,388
- Issue date Jul 16, 2024
- The Industry & Academic Cooperation in Chungnam National University (IAC)
- Soon-Ku Hong
- C30 - CRYSTAL GROWTH
Information Patent Grant
Effective cell approximation model for logic structures
- Patent number 12,013,350
- Issue date Jun 18, 2024
- Onto Innovation Inc.
- Kevin Eduard Heidrich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis of defects of at least one type from among a plurality of...
- Patent number 11,982,623
- Issue date May 14, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Patrick-Jeremy Dahan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for measuring a property of a substrate
- Patent number 11,977,034
- Issue date May 7, 2024
- ASML Netherlands B.V.
- Wouter Lodewijk Elings
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Inspection device and inspection method
- Patent number 11,971,367
- Issue date Apr 30, 2024
- JUKI CORPORATION
- Yasuyuki Nuriya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing overlay results with absolute reference for se...
- Patent number 11,966,171
- Issue date Apr 23, 2024
- Tokyo Electron Limited
- Anton J. deVilliers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photolithography method and photolithography system
- Patent number 11,959,864
- Issue date Apr 16, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Chi-Hung Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffraction based overlay metrology tool and method of diffraction...
- Patent number 11,953,450
- Issue date Apr 9, 2024
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus, method for inspecting defect, and meth...
- Patent number 11,940,391
- Issue date Mar 26, 2024
- Shin-Etsu Chemical Co., Ltd.
- Ryusei Terashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-destructive glass priming verification method for installed glass
- Patent number 11,933,733
- Issue date Mar 19, 2024
- FCA US LLC
- Gloria J Sheppard
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method for inspecting display device and method for fabricating dis...
- Patent number 11,854,445
- Issue date Dec 26, 2023
- Samsung Display Co., Ltd.
- Hyung Jin Lee
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Measuring and calculating apparatus and measuring and calculating p...
- Patent number 11,841,331
- Issue date Dec 12, 2023
- Kioxia Corporation
- Kentaro Kasa
- G01 - MEASURING TESTING
Information Patent Grant
Chemical mechanical planarization system and a method of using the...
- Patent number 11,806,833
- Issue date Nov 7, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Fang-Yi Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Die-to-multi-die wafer inspection
- Patent number 11,803,961
- Issue date Oct 31, 2023
- Applied Materials Israel Ltd.
- Ron Naftali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection layer to improve the detection of defects through optica...
- Patent number 11,761,905
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
RNA molecules, methods of producing circular RNA, and treatment met...
- Patent number 11,756,183
- Issue date Sep 12, 2023
- Cornell University
- Samie R. Jaffrey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer fault analysis system and operation method thereof
- Patent number 11,741,596
- Issue date Aug 29, 2023
- Samsung Electronics Co., Ltd.
- Min-Chul Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image acquiring method, image acquiring apparatus and wafer inspect...
- Patent number 11,740,186
- Issue date Aug 29, 2023
- Semes Co., Ltd.
- Myoung Hoon Woo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for estimating twin defect density
- Patent number 11,733,177
- Issue date Aug 22, 2023
- The Industry & Academic Cooperation in Chungnam National University (IAC)
- Soon-ku Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device and inspection method
- Patent number 11,733,180
- Issue date Aug 22, 2023
- JUKI CORPORATION
- Yasuyuki Nuriya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for synthesizing a diamond using machine learning
- Patent number 11,698,347
- Issue date Jul 11, 2023
- FRAUNHOFER USA, INC.
- Rohan Reddy Mekala
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL METROLOGY WITH INFLUENCE MAP OF UNKNOWN SECTION
- Publication number 20250012737
- Publication date Jan 9, 2025
- ONTO INNOVATION INC.
- Yiliang LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20240377335
- Publication date Nov 14, 2024
- NuFlare Technology, Inc.
- Masaya TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE SAMPLE FOR COATING DEFECTS AND METHOD FOR PRODUCING SAME
- Publication number 20240319103
- Publication date Sep 26, 2024
- Konica Minolta, Inc.
- RYUICHI YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD AND STORAGE MEDIUM, AND OPTICAL INSPECTIO...
- Publication number 20240319111
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTMENT METHOD OF INSPECTION APPARATUS FOCUS POSITION, AND PATTE...
- Publication number 20240280500
- Publication date Aug 22, 2024
- NuFlare Technology, Inc.
- Ryoichi HIRANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROCESSING DECORATIVE PAPER
- Publication number 20240269977
- Publication date Aug 15, 2024
- SWISS KRONO Tec AG
- Sabrina PFEIFFER
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
METHOD FOR DETECTING ABNORMAL DEFECT ON STEEL SURFACE BASED ON SEMI...
- Publication number 20240210329
- Publication date Jun 27, 2024
- Zhejiang University
- Haoji HU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BOARD TESTING APPARATUS AND BOARD TESTING METHOD
- Publication number 20240201106
- Publication date Jun 20, 2024
- CKD CORPORATION
- Kazuyoshi Kikuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VEHICLE LAMP SYSTEM, FOREIGN SUBSTANCE DETERMINATION DEVICE, AND FO...
- Publication number 20240101073
- Publication date Mar 28, 2024
- Koito Manufacturing Co., Ltd.
- Hiroki SUMITANI
- B60 - VEHICLES IN GENERAL
Information Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
- Publication number 20240085805
- Publication date Mar 14, 2024
- NOVA LTD
- Gilad BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RNA MOLECULES, METHODS OF PRODUCING CIRCULAR RNA, AND TREATMENT MET...
- Publication number 20240078661
- Publication date Mar 7, 2024
- Cornell University
- Samie R. JAFFREY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR ASSESSING THE RESULT OF A SURFACE TREATMENT PERFORMED ON...
- Publication number 20240068959
- Publication date Feb 29, 2024
- 3D.aero GmbH
- Anton JANSSEN
- B24 - GRINDING POLISHING
Information Patent Application
INSPECTION LAYER TO IMPROVE THE DETECTION OF DEFECTS THROUGH OPTICA...
- Publication number 20230366833
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR SYNTHESIZING A DIAMOND USING MACHINE LEARNING
- Publication number 20230349835
- Publication date Nov 2, 2023
- Fraunhofer USA, Inc.
- Rohan Reddy MEKALA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20230251207
- Publication date Aug 10, 2023
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT OBSERVATION METHOD, APPARATUS, AND PROGRAM
- Publication number 20230238290
- Publication date Jul 27, 2023
- HITACHI HIGH-TECH CORPORATION
- Naoaki KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EVALUATING SEMICONDUCTOR WAFER
- Publication number 20230194438
- Publication date Jun 22, 2023
- SUMCO CORPORATION
- Motoi KUROKAMI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ASSESSING CONTRASTS ON SURFACES
- Publication number 20230147881
- Publication date May 11, 2023
- 4Art Holding AG
- Kai Zeh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE-TO-MULTI-DIE WAFER INSPECTION
- Publication number 20230107630
- Publication date Apr 6, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ron Naftali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION
- Publication number 20230080151
- Publication date Mar 16, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ariel SHKALIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Photolithography Method and Photolithography System
- Publication number 20230080320
- Publication date Mar 16, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Chi-Hung Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Diffraction Based Overlay Metrology Tool and Method of Diffraction...
- Publication number 20230075781
- Publication date Mar 9, 2023
- ASML NETHERLANDS B.V.
- Arie Jeffrey DEN BOEF
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION LAYER TO IMPROVE THE DETECTION OF DEFECTS THROUGH OPTICA...
- Publication number 20230060557
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- I-Che LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20230018318
- Publication date Jan 19, 2023
- NuFlare Technology, Inc.
- Ryoichi HIRANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurement Method, Measurement System, and Non-Transitory Computer...
- Publication number 20230019371
- Publication date Jan 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Hiroshi FUKUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ACQUISITION METHOD AND IMAGE ACQUISITION APPARATUS
- Publication number 20230009656
- Publication date Jan 12, 2023
- NuFlare Technology, Inc.
- Yasuhiro YAMASHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-DESTRUCTIVE GLASS PRIMING VERIFICATION METHOD FOR INSTALLED GLASS
- Publication number 20230003659
- Publication date Jan 5, 2023
- Gloria J Sheppard
- B60 - VEHICLES IN GENERAL
Information Patent Application
MEASURING AND CALCULATING APPARATUS AND MEASURING AND CALCULATING P...
- Publication number 20220404292
- Publication date Dec 22, 2022
- KIOXIA Corporation
- Kentaro KASA
- G01 - MEASURING TESTING
Information Patent Application
Printing Solder Point Quality Identification And Maintenance Sugges...
- Publication number 20220398714
- Publication date Dec 15, 2022
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Meng Sun
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND SYSTEM FOR DIAGNOSING A SEMICONDUCTOR WAFER
- Publication number 20220383473
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yen-Liang CHEN
- G06 - COMPUTING CALCULATING COUNTING

using a comparative method

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Image acquisition method and image acquisition apparatus

Printing solder point quality identification and maintenance sugges...

Method for characterizing defects in silicon crystal

Systems and methods for synthesizing a diamond using machine learning

Vehicle lamp system, foreign substance determination device, and fo...

Method and system for diagnosing a semiconductor wafer

Data processing method and system for detection of deterioration of...

Apparatus for inspecting a display panel for defects

Mask inspection apparatus and mask inspection method using the same

Method for evaluating defect in monoclinic gallium oxide

Effective cell approximation model for logic structures

Analysis of defects of at least one type from among a plurality of...

Methods and apparatus for measuring a property of a substrate

Inspection device and inspection method

Method for producing overlay results with absolute reference for se...

Photolithography method and photolithography system

Diffraction based overlay metrology tool and method of diffraction...

Defect inspection apparatus, method for inspecting defect, and meth...

Non-destructive glass priming verification method for installed glass

Method for inspecting display device and method for fabricating dis...

Measuring and calculating apparatus and measuring and calculating p...

Chemical mechanical planarization system and a method of using the...

Die-to-multi-die wafer inspection

Inspection layer to improve the detection of defects through optica...

RNA molecules, methods of producing circular RNA, and treatment met...

Semiconductor wafer fault analysis system and operation method thereof

Image acquiring method, image acquiring apparatus and wafer inspect...

Method for estimating twin defect density

Inspection device and inspection method

Systems and methods for synthesizing a diamond using machine learning

Patents Applicationslast 30 patents

OPTICAL METROLOGY WITH INFLUENCE MAP OF UNKNOWN SECTION

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

REFERENCE SAMPLE FOR COATING DEFECTS AND METHOD FOR PRODUCING SAME

OPTICAL INSPECTION METHOD AND STORAGE MEDIUM, AND OPTICAL INSPECTIO...

ADJUSTMENT METHOD OF INSPECTION APPARATUS FOCUS POSITION, AND PATTE...

METHOD FOR PROCESSING DECORATIVE PAPER

METHOD FOR DETECTING ABNORMAL DEFECT ON STEEL SURFACE BASED ON SEMI...

BOARD TESTING APPARATUS AND BOARD TESTING METHOD

VEHICLE LAMP SYSTEM, FOREIGN SUBSTANCE DETERMINATION DEVICE, AND FO...

TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES

RNA MOLECULES, METHODS OF PRODUCING CIRCULAR RNA, AND TREATMENT MET...

METHOD FOR ASSESSING THE RESULT OF A SURFACE TREATMENT PERFORMED ON...

INSPECTION LAYER TO IMPROVE THE DETECTION OF DEFECTS THROUGH OPTICA...

SYSTEMS AND METHODS FOR SYNTHESIZING A DIAMOND USING MACHINE LEARNING

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

DEFECT OBSERVATION METHOD, APPARATUS, AND PROGRAM

METHOD OF EVALUATING SEMICONDUCTOR WAFER

METHOD FOR ASSESSING CONTRASTS ON SURFACES

DIE-TO-MULTI-DIE WAFER INSPECTION

MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION

Photolithography Method and Photolithography System

Diffraction Based Overlay Metrology Tool and Method of Diffraction...

INSPECTION LAYER TO IMPROVE THE DETECTION OF DEFECTS THROUGH OPTICA...

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

Measurement Method, Measurement System, and Non-Transitory Computer...

IMAGE ACQUISITION METHOD AND IMAGE ACQUISITION APPARATUS

NON-DESTRUCTIVE GLASS PRIMING VERIFICATION METHOD FOR INSTALLED GLASS

MEASURING AND CALCULATING APPARATUS AND MEASURING AND CALCULATING P...

Printing Solder Point Quality Identification And Maintenance Sugges...

METHOD AND SYSTEM FOR DIAGNOSING A SEMICONDUCTOR WAFER