using a fuse hierarchy

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G11C29/787

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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/787using a fuse hierarchy

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatuses and methods for repairing defective memory cells based...
- Patent number 11,984,186
- Issue date May 14, 2024
- Micron Technology, Inc.
- David Hulton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Indicating a blocked repair operation
- Patent number 11,948,655
- Issue date Apr 2, 2024
- Micron Technology, Inc.
- Seth A. Eichmeyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for bad row mode
- Patent number 11,915,775
- Issue date Feb 27, 2024
- Micron Technology, Inc.
- Jack Riley
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and method of operating semiconductor m...
- Patent number 11,901,025
- Issue date Feb 13, 2024
- Samsung Electronics Co., Ltd.
- Seongjin Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit, memory and operation method of memory
- Patent number 11,837,311
- Issue date Dec 5, 2023
- SK Hynix Inc.
- Yun Gi Hong
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for sensing antifuse of DRAMs
- Patent number 11,830,540
- Issue date Nov 28, 2023
- NANYA TECHNOLOGY CORPORATION
- Chih-Jen Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory repair using optimized redundancy utilization
- Patent number 11,776,647
- Issue date Oct 3, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Chien-Hao Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Internal data availability for system debugging
- Patent number 11,710,534
- Issue date Jul 25, 2023
- Micron Technology, Inc.
- Christian N. Mohr
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and operating method thereof
- Patent number 11,682,470
- Issue date Jun 20, 2023
- Winbond Electronics Corp.
- Jun-Lin Yeh
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for refresh address masking
- Patent number 11,670,356
- Issue date Jun 6, 2023
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory devices, memory systems, and methods of operat...
- Patent number 11,626,185
- Issue date Apr 11, 2023
- Samsung Electronics Co., Ltd.
- Kyung-Ryun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Techniques to protect fuses against non-destructive attacks
- Patent number 11,620,398
- Issue date Apr 4, 2023
- Intel Corporation
- Neeraj S. Upasani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device capable of repairing defective word lines
- Patent number 11,600,356
- Issue date Mar 7, 2023
- Winbond Electronics Corp.
- Kan-Yuan Cheng
- G11 - INFORMATION STORAGE
Information Patent Grant
Fuse fault repair circuit
- Patent number 11,587,641
- Issue date Feb 21, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kejun Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Adjustable programming pulses for a multi-level cell
- Patent number 11,568,952
- Issue date Jan 31, 2023
- Micron Technology, Inc.
- Xuan-Anh Tran
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test circuit and device wafer
- Patent number 11,557,360
- Issue date Jan 17, 2023
- NANYA TECHNOLOGY CORPORATION
- Yan-De Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory repair using optimized redundancy utilization
- Patent number 11,495,314
- Issue date Nov 8, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Chien-Hao Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Adjustable column address scramble using fuses
- Patent number 11,488,685
- Issue date Nov 1, 2022
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Latch circuit and semiconductor memory device including the same
- Patent number 11,475,976
- Issue date Oct 18, 2022
- SK Hynix Inc.
- Jeong Jun Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and techniques for programming anti-fuses to repair a mem...
- Patent number 11,468,965
- Issue date Oct 11, 2022
- Micron Technology, Inc.
- Seth A. Eichmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory devices and methods of operating semiconductor...
- Patent number 11,450,396
- Issue date Sep 20, 2022
- Samsung Electronics Co., Ltd.
- Kyungryun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device capable of performing soft-post-package...
- Patent number 11,450,403
- Issue date Sep 20, 2022
- Micron Technology, Inc.
- Yasushi Matsubara
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device including redundancy mats
- Patent number 11,450,404
- Issue date Sep 20, 2022
- SK hynix Inc.
- Soo Hwan Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Mixed storage of data fields
- Patent number 11,379,580
- Issue date Jul 5, 2022
- Xilinx, Inc.
- James D. Wesselkamper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory devices, memory systems, and methods of operat...
- Patent number 11,335,431
- Issue date May 17, 2022
- Samsung Electronics Co., Ltd.
- Kyung-Ryun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Completing memory repair operations interrupted by power loss
- Patent number 11,334,458
- Issue date May 17, 2022
- Micron Technology, Inc.
- Alan J. Wilson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stacked memory apparatus using error correction code and repairing...
- Patent number 11,315,657
- Issue date Apr 26, 2022
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for post-package repair protection
- Patent number 11,309,057
- Issue date Apr 19, 2022
- Micron Technology, Inc.
- Takaaki Nakamura
- G11 - INFORMATION STORAGE
Information Patent Grant
Field recovery of graphics on-die memory
- Patent number 11,302,413
- Issue date Apr 12, 2022
- Intel Corporation
- Altug Koker
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and semiconductor memory apparatus including t...
- Patent number 11,232,826
- Issue date Jan 25, 2022
- SK hynix Inc.
- Ki Hyuk Sung
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE HAVING FUSE ARRAY
- Publication number 20240265992
- Publication date Aug 8, 2024
- Micron Technology, Inc.
- YASUSHI MATSUBARA
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE UNIT ACCESS METHOD, STORAGE UNIT REPAIR METHOD, DIE, AND ME...
- Publication number 20240055070
- Publication date Feb 15, 2024
- Huawei Technologies Co., Ltd
- Guoming SHEN
- G11 - INFORMATION STORAGE
Information Patent Application
INDICATING A BLOCKED REPAIR OPERATION
- Publication number 20230343409
- Publication date Oct 26, 2023
- Micron Technology, Inc.
- Seth A. Eichmeyer
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT, MEMORY AND OPERATION METHOD OF MEMORY
- Publication number 20230162811
- Publication date May 25, 2023
- SK HYNIX INC.
- Yun Gi HONG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING SEMICONDUCTOR M...
- Publication number 20230111467
- Publication date Apr 13, 2023
- Samsung Electronics Co., Ltd.
- SEONGJIN CHO
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR BAD ROW MODE
- Publication number 20230096291
- Publication date Mar 30, 2023
- Micron Technology, Inc.
- Jack Riley
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE CAPABLE OF REPAIRING DEFECTIVE WORD LINES
- Publication number 20230079020
- Publication date Mar 16, 2023
- WINBOND ELECTRONICS CORP.
- Kan-Yuan Cheng
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY REPAIR USING OPTIMIZED REDUNDANCY UTILIZATION
- Publication number 20230066482
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Chien-Hao HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR REFRESH ADDRESS MASKING
- Publication number 20230020753
- Publication date Jan 19, 2023
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Application
ADJUSTABLE PROGRAMMING PULSES FOR A MULTI-LEVEL CELL
- Publication number 20220392560
- Publication date Dec 8, 2022
- Micron Technology, Inc.
- Xuan-Anh Tran
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE INCLUDING REDUNDANCY MATS
- Publication number 20220319633
- Publication date Oct 6, 2022
- SK HYNIX INC.
- Soo Hwan KIM
- G11 - INFORMATION STORAGE
Information Patent Application
FUSE FAULT REPAIR CIRCUIT
- Publication number 20220277803
- Publication date Sep 1, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Kejun WANG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICES, MEMORY SYSTEMS, AND METHODS OF OPERAT...
- Publication number 20220238178
- Publication date Jul 28, 2022
- Samsung Electronics Co., Ltd.
- Kyung-Ryun KIM
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY REPAIR USING OPTIMIZED REDUNDANCY UTILIZATION
- Publication number 20220223218
- Publication date Jul 14, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Chien-Hao HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND OPERATING METHOD THEREOF
- Publication number 20220139493
- Publication date May 5, 2022
- WINBOND ELECTRONICS CORP.
- Jun-Lin Yeh
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR REPAIRING DEFECTIVE MEMORY CELLS BASED...
- Publication number 20220068430
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- DAVID HULTON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXECUTION METHOD OF FIRMWARE CODE, MEMORY STORAGE DEVICE AND MEMORY...
- Publication number 20220051748
- Publication date Feb 17, 2022
- PHISON ELECTRONICS CORP.
- Yi-Feng Li
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR...
- Publication number 20220020445
- Publication date Jan 20, 2022
- Samsung Electronics Co., Ltd.
- Kyungryun Kim
- G11 - INFORMATION STORAGE
Information Patent Application
LATCH CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME
- Publication number 20210375388
- Publication date Dec 2, 2021
- SK HYNIX INC.
- Jeong Jun LEE
- G11 - INFORMATION STORAGE
Information Patent Application
AREA-EFFICIENT DYNAMIC MEMORY REDUNDANCY SCHEME WITH PRIORITY DECODING
- Publication number 20210350865
- Publication date Nov 11, 2021
- QUALCOMM Incorporated
- Chulmin Jung
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR POST-PACKAGE REPAIR PROTECTION
- Publication number 20210335446
- Publication date Oct 28, 2021
- Micron Technology, Inc.
- TAKAAKI NAKAMURA
- G11 - INFORMATION STORAGE
Information Patent Application
ADJUSTABLE COLUMN ADDRESS SCRAMBLE USING FUSES
- Publication number 20210257043
- Publication date Aug 19, 2021
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICES, MEMORY SYSTEMS, AND METHODS OF OPERAT...
- Publication number 20210233604
- Publication date Jul 29, 2021
- Samsung Electronics Co., Ltd.
- Kyung-Ryun KIM
- G11 - INFORMATION STORAGE
Information Patent Application
AT-RISK MEMORY LOCATION IDENTIFICATION AND MANAGEMENT
- Publication number 20210183463
- Publication date Jun 17, 2021
- Microsoft Technology Licensing, LLC
- Timothy B. COWLES
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND TECHNIQUES FOR PROGRAMMING ANTI-FUSES TO REPAIR A MEM...
- Publication number 20210110881
- Publication date Apr 15, 2021
- Micron Technology, Inc.
- Seth A. Eichmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FIELD RECOVERY OF GRAPHICS ON-DIE MEMORY
- Publication number 20210050070
- Publication date Feb 18, 2021
- Intel Corporation
- Altug Koker
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR...
- Publication number 20210012849
- Publication date Jan 14, 2021
- Samsung Electronics Co., Ltd.
- Kyungryun Kim
- G11 - INFORMATION STORAGE
Information Patent Application
FAIL REDUNDANCY CIRCUITS
- Publication number 20200287544
- Publication date Sep 10, 2020
- SK HYNIX INC.
- Geun Ho CHOI
- G11 - INFORMATION STORAGE
Information Patent Application
STACKED MEMORY APPARATUS USING ERROR CORRECTION CODE AND REPAIRING...
- Publication number 20200243159
- Publication date Jul 30, 2020
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory Repair Scheme
- Publication number 20200227133
- Publication date Jul 16, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Yi-Chun Shih
- G06 - COMPUTING CALCULATING COUNTING

using a fuse hierarchy

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatuses and methods for repairing defective memory cells based...

Indicating a blocked repair operation

Apparatuses and methods for bad row mode

Semiconductor memory device and method of operating semiconductor m...

Integrated circuit, memory and operation method of memory

Circuit for sensing antifuse of DRAMs

Memory repair using optimized redundancy utilization

Internal data availability for system debugging

Memory device and operating method thereof

Apparatuses and methods for refresh address masking

Semiconductor memory devices, memory systems, and methods of operat...

Techniques to protect fuses against non-destructive attacks

Memory device capable of repairing defective word lines

Fuse fault repair circuit

Adjustable programming pulses for a multi-level cell

Memory test circuit and device wafer

Memory repair using optimized redundancy utilization

Adjustable column address scramble using fuses

Latch circuit and semiconductor memory device including the same

Apparatus and techniques for programming anti-fuses to repair a mem...

Semiconductor memory devices and methods of operating semiconductor...

Semiconductor memory device capable of performing soft-post-package...

Memory device including redundancy mats

Mixed storage of data fields

Semiconductor memory devices, memory systems, and methods of operat...

Completing memory repair operations interrupted by power loss

Stacked memory apparatus using error correction code and repairing...

Apparatuses and methods for post-package repair protection

Field recovery of graphics on-die memory

Semiconductor device and semiconductor memory apparatus including t...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE HAVING FUSE ARRAY

STORAGE UNIT ACCESS METHOD, STORAGE UNIT REPAIR METHOD, DIE, AND ME...

INDICATING A BLOCKED REPAIR OPERATION

INTEGRATED CIRCUIT, MEMORY AND OPERATION METHOD OF MEMORY

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING SEMICONDUCTOR M...

APPARATUSES AND METHODS FOR BAD ROW MODE

MEMORY DEVICE CAPABLE OF REPAIRING DEFECTIVE WORD LINES

MEMORY REPAIR USING OPTIMIZED REDUNDANCY UTILIZATION

APPARATUSES AND METHODS FOR REFRESH ADDRESS MASKING

ADJUSTABLE PROGRAMMING PULSES FOR A MULTI-LEVEL CELL

MEMORY DEVICE INCLUDING REDUNDANCY MATS

FUSE FAULT REPAIR CIRCUIT

SEMICONDUCTOR MEMORY DEVICES, MEMORY SYSTEMS, AND METHODS OF OPERAT...

MEMORY REPAIR USING OPTIMIZED REDUNDANCY UTILIZATION

MEMORY DEVICE AND OPERATING METHOD THEREOF

APPARATUSES AND METHODS FOR REPAIRING DEFECTIVE MEMORY CELLS BASED...

EXECUTION METHOD OF FIRMWARE CODE, MEMORY STORAGE DEVICE AND MEMORY...

SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR...

LATCH CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME

AREA-EFFICIENT DYNAMIC MEMORY REDUNDANCY SCHEME WITH PRIORITY DECODING

APPARATUSES AND METHODS FOR POST-PACKAGE REPAIR PROTECTION

ADJUSTABLE COLUMN ADDRESS SCRAMBLE USING FUSES

SEMICONDUCTOR MEMORY DEVICES, MEMORY SYSTEMS, AND METHODS OF OPERAT...

AT-RISK MEMORY LOCATION IDENTIFICATION AND MANAGEMENT

APPARATUS AND TECHNIQUES FOR PROGRAMMING ANTI-FUSES TO REPAIR A MEM...

FIELD RECOVERY OF GRAPHICS ON-DIE MEMORY

SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR...

FAIL REDUNDANCY CIRCUITS

STACKED MEMORY APPARATUS USING ERROR CORRECTION CODE AND REPAIRING...

Memory Repair Scheme