using a hot fluid

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CPC
H01J49/0477

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/0477using a hot fluid

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Patents Grantslast 30 patents

Information Patent Grant
Ion source
- Patent number 11,749,517
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for minimizing electrical discharge during ESI operation
- Patent number 10,818,486
- Issue date Oct 27, 2020
- DH Technologies Development Pte. Ltd.
- John J. Corr
- G01 - MEASURING TESTING
Information Patent Grant
Low temperature plasma probe with auxiliary heated gas jet
- Patent number 10,629,424
- Issue date Apr 21, 2020
- Smiths Detection Inc.
- Vadym Berkout
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for hot plasma analysis of analytes using membr...
- Patent number 10,497,550
- Issue date Dec 3, 2019
- Elemental Scientific, Inc.
- Michael Paul Field
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for providing a dual curtain gas to a mass spectr...
- Patent number 8,779,356
- Issue date Jul 15, 2014
- DH Technologies Development Ptd. Ltd.
- Thomas R. Covey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric pressure ion source probe for a mass spectrometer
- Patent number 7,977,629
- Issue date Jul 12, 2011
- M&M Mass Spec Consulting, LLC
- Charles Nehemiah McEwen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample ionization at above-vacuum pressures
- Patent number 7,564,029
- Issue date Jul 21, 2009
- Varian, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 7,372,043
- Issue date May 13, 2008
- Agilent Technologies, Inc.
- Timothy H. Joyce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric pressure ionization with optimized drying gas flow
- Patent number 7,145,136
- Issue date Dec 5, 2006
- Varian, Inc.
- Zicheng Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 7,135,689
- Issue date Nov 14, 2006
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 7,132,670
- Issue date Nov 7, 2006
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 7,091,482
- Issue date Aug 15, 2006
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 7,078,682
- Issue date Jul 18, 2006
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Target support and method for ion production enhancement
- Patent number 6,858,841
- Issue date Feb 22, 2005
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 6,825,462
- Issue date Nov 30, 2004
- Agilent Technologies, Inc.
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric pressure ion sources
- Patent number 6,593,568
- Issue date Jul 15, 2003
- Craig M. Whitehouse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion spray with intersecting flow
- Patent number 5,412,208
- Issue date May 2, 1995
- MDS Health Group Limited
- Thomas R. Covey
- G01 - MEASURING TESTING
Information Patent Grant
Electrospray interface for mass spectrometer and method of supplyin...
- Patent number 5,349,186
- Issue date Sep 20, 1994
- The Governors of The University of Alberta
- Michael G. Ikonomou
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for liquid sample introduction
- Patent number 5,345,079
- Issue date Sep 6, 1994
- MDS Health Group Limited
- John B. French
- G01 - MEASURING TESTING
Information Patent Grant
Heating system for GC/MS instruments
- Patent number 4,804,839
- Issue date Feb 14, 1989
- Hewlett-Packard Company
- Carolyn C. Broadbent
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the mass spectrometric analysis of solutions
- Patent number 4,531,056
- Issue date Jul 23, 1985
- Yale University
- Michael J. Labowsky
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
IONIZATION DEVICE AND IONIZATION METHOD
- Publication number 20230420239
- Publication date Dec 28, 2023
- Shimadzu Corporation
- Keisuke ISO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN ATMOSPHERIC PRESSURE IONISATION SOURCE
- Publication number 20230215717
- Publication date Jul 6, 2023
- Micromass UK Ltd
- Arvind Rangan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN ATMOSPHERIC PRESSURE IONISATION SOURCE
- Publication number 20230178353
- Publication date Jun 8, 2023
- Micromass UK Ltd
- Nicola Lumley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE
- Publication number 20210358734
- Publication date Nov 18, 2021
- Hitachi High-Tech Corporation
- Hideki Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MICROARRAY DROPLET IONIZATION ANALYSIS
- Publication number 20210343515
- Publication date Nov 4, 2021
- Board of Regents, The University of Texas System
- Livia Schiavinato EBERLIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR PROVIDING A DUAL CURTAIN GAS TO A MASS SPECTR...
- Publication number 20130264493
- Publication date Oct 10, 2013
- DH Technologies Development Pte. Ltd.
- Thomas R. Covey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Atmospheric pressure ion source probe for a mass spectrometer
- Publication number 20110031392
- Publication date Feb 10, 2011
- M AND M MASS SPEC CONSULTING
- Charles Nehemiah McEwen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample ionization at above-vacuum pressures
- Publication number 20090045330
- Publication date Feb 19, 2009
- Varian, Inc.
- Mingda Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Atmospheric pressure ionization with optimized drying gas flow
- Publication number 20060131497
- Publication date Jun 22, 2006
- Varian, Inc.
- Zicheng Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050274905
- Publication date Dec 15, 2005
- Timothy H. Joyce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050161613
- Publication date Jul 28, 2005
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050151090
- Publication date Jul 14, 2005
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050151091
- Publication date Jul 14, 2005
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Target support and method for ion production enhancement
- Publication number 20050098722
- Publication date May 12, 2005
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050077464
- Publication date Apr 14, 2005
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050072918
- Publication date Apr 7, 2005
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Target support and method for ion production enhancement
- Publication number 20030160167
- Publication date Aug 28, 2003
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20030160165
- Publication date Aug 28, 2003
- Jean-Luc Truche
- H01 - BASIC ELECTRIC ELEMENTS

using a hot fluid

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Ion source

System for minimizing electrical discharge during ESI operation

Low temperature plasma probe with auxiliary heated gas jet

Systems and methods for hot plasma analysis of analytes using membr...

Method and system for providing a dual curtain gas to a mass spectr...

Atmospheric pressure ion source probe for a mass spectrometer

Sample ionization at above-vacuum pressures

Apparatus and method for ion production enhancement

Atmospheric pressure ionization with optimized drying gas flow

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Target support and method for ion production enhancement

Apparatus and method for ion production enhancement

Atmospheric pressure ion sources

Ion spray with intersecting flow

Electrospray interface for mass spectrometer and method of supplyin...

Apparatus and method for liquid sample introduction

Heating system for GC/MS instruments

Method and apparatus for the mass spectrometric analysis of solutions

Patents Applicationslast 30 patents

IONIZATION DEVICE AND IONIZATION METHOD

AN ATMOSPHERIC PRESSURE IONISATION SOURCE

AN ATMOSPHERIC PRESSURE IONISATION SOURCE

ION SOURCE

SYSTEMS AND METHODS FOR MICROARRAY DROPLET IONIZATION ANALYSIS

METHOD AND SYSTEM FOR PROVIDING A DUAL CURTAIN GAS TO A MASS SPECTR...

Atmospheric pressure ion source probe for a mass spectrometer

Sample ionization at above-vacuum pressures

Atmospheric pressure ionization with optimized drying gas flow

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Target support and method for ion production enhancement

Apparatus and method for ion production enhancement

Apparatus and method for ion production enhancement

Target support and method for ion production enhancement

Apparatus and method for ion production enhancement