using a local oxidation of silicon

Industry

CPC
H01L21/76202

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Current Industry

H01L21/76202using a local oxidation of silicon

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and manufacturing method therefor
- Patent number 12,230,693
- Issue date Feb 18, 2025
- CSMC Technologies Fab2 Co., Ltd.
- Nailong He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
False collectors and guard rings for semiconductor devices
- Patent number 12,218,190
- Issue date Feb 4, 2025
- Texas Instruments Incorporated
- Alexei Sadovnikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shallow trench isolation processing with local oxidation of silicon
- Patent number 12,199,091
- Issue date Jan 14, 2025
- Texas Instruments Incorporated
- Robert Martin Higgins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming semiconductor device structure with metal-semico...
- Patent number 12,183,793
- Issue date Dec 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
LDMOS transistor and method for manufacturing the same
- Patent number 12,166,091
- Issue date Dec 10, 2024
- Silergy Semiconductor Technology (Hangzhou) Ltd.
- Meng Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power device and manufacturing method thereof
- Patent number 12,107,160
- Issue date Oct 1, 2024
- Richtek Technology Corporation
- Kuo-Hsuan Lo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low leakage FET
- Patent number 12,100,734
- Issue date Sep 24, 2024
- Murata Manufacturing Co., Ltd.
- Abhijeet Paul
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source/drain feature to contact interfaces
- Patent number 12,051,730
- Issue date Jul 30, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ding-Kang Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices and methods of manufacturing thereof
- Patent number 12,020,940
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ching-Hung Kao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device for high voltage applications
- Patent number 11,996,441
- Issue date May 28, 2024
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Bong Woong Mun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RFSOI semiconductor structures including a nitrogen-doped charge-tr...
- Patent number 11,984,477
- Issue date May 14, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Cheng-Ta Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect transistors with reduced leakage current
- Patent number 11,955,555
- Issue date Apr 9, 2024
- Newport Fab, LLC
- Rula Badarneh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced semiconductor wafer bow and warpage
- Patent number 11,942,359
- Issue date Mar 26, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Abbas Ali
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parasitic capacitance reduction in GaN devices
- Patent number 11,929,364
- Issue date Mar 12, 2024
- MACOM Technology Solutions Holdings, Inc.
- Gabriel R. Cueva
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure
- Patent number 11,916,079
- Issue date Feb 27, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Te-An Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laterally-diffused metal-oxide-semiconductor devices with a multipl...
- Patent number 11,908,930
- Issue date Feb 20, 2024
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Namchil Mun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for electrostatic discharge protection
- Patent number 11,749,672
- Issue date Sep 5, 2023
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Prantik Mahajan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laterally diffused metal oxide semiconductor device and method for...
- Patent number 11,742,206
- Issue date Aug 29, 2023
- Silergy Semiconductor Technology (Hangzhou) Ltd.
- Budong You
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor having source or drain formation assistance regions with...
- Patent number 11,735,480
- Issue date Aug 22, 2023
- International Business Machines Corporation
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device having buried gate ele...
- Patent number 11,670,537
- Issue date Jun 6, 2023
- Samsung Electronics Co., Ltd.
- Byung-jae Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photonics light signal transmission
- Patent number 11,635,568
- Issue date Apr 25, 2023
- The Research Foundation for the State University of New York
- Douglas Coolbaugh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drain extended transistor with trench gate
- Patent number 11,621,347
- Issue date Apr 4, 2023
- Texas Instruments Incorporated
- Christopher Boguslaw Kocon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including trench electrode structures
- Patent number 11,600,697
- Issue date Mar 7, 2023
- Infineon Technologies Austria AG
- Alim Karmous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structures for improving radiation hardness and eliminating latch-u...
- Patent number 11,587,822
- Issue date Feb 21, 2023
- Silicon Space Technology Corporation
- David R. Gifford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor packaging device comprising a shield structure
- Patent number 11,552,027
- Issue date Jan 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Yu Chien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection devices and methods of forming e...
- Patent number 11,527,528
- Issue date Dec 13, 2022
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Jie Zeng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low leakage FET
- Patent number 11,469,296
- Issue date Oct 11, 2022
- pSemi Corporation
- Abhijeet Paul
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for forming dielectric isolated FinFET with im...
- Patent number 11,430,879
- Issue date Aug 30, 2022
- Tessera, Inc.
- Kangguo Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin isolation structures of semiconductor devices
- Patent number 11,404,324
- Issue date Aug 2, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kuo-Cheng Chiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabricating photonics structure light signal transmission regions
- Patent number 11,378,739
- Issue date Jul 5, 2022
- The Research Foundation for the State University of New York
- Douglas Coolbaugh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE WITH NITROGEN DOPED FIELD RELIEF DIELECTRIC LAYER
- Publication number 20250006836
- Publication date Jan 2, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Jackson Bauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Source/Drain Feature to Contact Interfaces
- Publication number 20240347611
- Publication date Oct 17, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ding-Kang Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF
- Publication number 20240312785
- Publication date Sep 19, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ching-Hung Kao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RFSOI SEMICONDUCTOR STRUCTURES INCLUDING A NITROGEN-DOPED CHARGE-TR...
- Publication number 20240274659
- Publication date Aug 15, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Cheng-Ta Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCED SEMICONDUCTOR WAFER BOW AND WARPAGE
- Publication number 20240194519
- Publication date Jun 13, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Abbas Ali
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARASITIC CAPACITANCE REDUCTION IN GAN-ON-SILICON DEVICES
- Publication number 20240178220
- Publication date May 30, 2024
- MACOM Technology Solutions Holdings, Inc.
- Gabriel R. Cueva
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Field Effect Transistors with Reduced Leakage Current
- Publication number 20230395722
- Publication date Dec 7, 2023
- Newport Fab, LLC dba Tower Semiconductor Newport Beach
- Rula BADARNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL-OXIDE SEMICONDUCTOR FIELD-EFFECT TRANSISTOR HAVING ENHANCED H...
- Publication number 20230343869
- Publication date Oct 26, 2023
- SHANGHAI BRIGHT POWER SEMICONDUCTOR CO., LTD.
- Shuming XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FALSE COLLECTORS AND GUARD RINGS FOR SEMICONDUCTOR DEVICES
- Publication number 20230317775
- Publication date Oct 5, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Alexei SADOVNIKOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENHANCED CAPACITOR FOR INTEGRATION WITH METAL-OXIDE SEMICONDUCTOR F...
- Publication number 20230238458
- Publication date Jul 27, 2023
- SHANGHAI BRIGHT POWER SEMICONDUCTOR CO., LTD.
- Shuming Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE FOR HIGH VOLTAGE APPLICATIONS
- Publication number 20230187483
- Publication date Jun 15, 2023
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Bong Woong MUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR BONDING SEMICONDUCTOR ELEMENTS
- Publication number 20230187264
- Publication date Jun 15, 2023
- ADEIA SEMICONDUCTOR TECHNOLOGIES LLC
- Cyprian Emeka Uzoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCED SEMICONDUCTOR WAFER BOW AND WARPAGE
- Publication number 20230170248
- Publication date Jun 1, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Abbas Ali
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF BONDING THIN SUBSTRATES
- Publication number 20230115122
- Publication date Apr 13, 2023
- ADEIA SEMICONDUCTOR BONDING TECHNOLOGIES INC.
- Cyprian Emeka Uzoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Low Leakage FET
- Publication number 20230094494
- Publication date Mar 30, 2023
- pSemi Corporation
- Abhijeet Paul
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR ELECTROSTATIC DISCHARGE PROTECTION
- Publication number 20230085420
- Publication date Mar 16, 2023
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Prantik MAHAJAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERALLY-DIFFUSED METAL-OXIDE-SEMICONDUCTOR DEVICES WITH A MULTIPL...
- Publication number 20230059226
- Publication date Feb 23, 2023
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Namchil Mun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF
- Publication number 20230016468
- Publication date Jan 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ching-Hung Kao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Power Device and Manufacturing Method Thereof
- Publication number 20220376110
- Publication date Nov 24, 2022
- RICHTEK TECHNOLOGY CORPORATION
- Kuo-Hsuan Lo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHALLOW TRENCH ISOLATION PROCESSING WITH LOCAL OXIDATION OF SILICON
- Publication number 20220367444
- Publication date Nov 17, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Robert Martin Higgins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
- Publication number 20220367682
- Publication date Nov 17, 2022
- CSMC TECHNOLOGIES FAB2 CO., LTD.
- Nailong HE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN ISOLATION STRUCTURES OF SEMICONDUCTOR DEVICES
- Publication number 20220367288
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kuo-Cheng CHIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTONICS LIGHT SIGNAL TRANSMISSION
- Publication number 20220350076
- Publication date Nov 3, 2022
- The Research Foundation for the State University of New York
- Douglas COOLBAUGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RFSOI SEMICONDUCTOR STRUCTURES INCLUDING A NITROGEN-DOPED CHARGE-TR...
- Publication number 20220320277
- Publication date Oct 6, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Cheng-Ta WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MAKING DEEP TRENCH ISOLATION OF CIS DEVICE, AND SEMICOND...
- Publication number 20220230909
- Publication date Jul 21, 2022
- Hua Hong Semiconductor (Wuxi) Limited
- Jialong LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR HAVING SOURCE OR DRAIN FORMATION ASSISTANCE REGIONS WITH...
- Publication number 20220181213
- Publication date Jun 9, 2022
- International Business Machines Corporation
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RUGGED LDMOS WITH DRAIN-TIED FIELD PLATE
- Publication number 20220149186
- Publication date May 12, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED SCHOTTKY DIODE WITH GUARD RING
- Publication number 20220140129
- Publication date May 5, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Sheldon Douglas Haynie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LDMOS TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220130967
- Publication date Apr 28, 2022
- SILERGY SEMICONDUCTOR TECHNOLOGY (HANGZHOU) LTD
- Meng Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARASITIC CAPACITANCE REDUCTION IN GAN-ON-SILICON DEVICES
- Publication number 20220005764
- Publication date Jan 6, 2022
- MACOM Technology Solutions Holdings, Inc.
- Gabriel R. Cueva
- H01 - BASIC ELECTRIC ELEMENTS

using a local oxidation of silicon

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor device and manufacturing method therefor

False collectors and guard rings for semiconductor devices

Shallow trench isolation processing with local oxidation of silicon

Method for forming semiconductor device structure with metal-semico...

LDMOS transistor and method for manufacturing the same

Power device and manufacturing method thereof

Low leakage FET

Source/drain feature to contact interfaces

Semiconductor devices and methods of manufacturing thereof

Semiconductor device for high voltage applications

RFSOI semiconductor structures including a nitrogen-doped charge-tr...

Field effect transistors with reduced leakage current

Reduced semiconductor wafer bow and warpage

Parasitic capacitance reduction in GaN devices

Semiconductor structure

Laterally-diffused metal-oxide-semiconductor devices with a multipl...

Device for electrostatic discharge protection

Laterally diffused metal oxide semiconductor device and method for...

Transistor having source or drain formation assistance regions with...

Method of manufacturing semiconductor device having buried gate ele...

Photonics light signal transmission

Drain extended transistor with trench gate

Semiconductor device including trench electrode structures

Structures for improving radiation hardness and eliminating latch-u...

Semiconductor packaging device comprising a shield structure

Electrostatic discharge protection devices and methods of forming e...

Low leakage FET

Method and structure for forming dielectric isolated FinFET with im...

Fin isolation structures of semiconductor devices

Fabricating photonics structure light signal transmission regions

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE WITH NITROGEN DOPED FIELD RELIEF DIELECTRIC LAYER

Source/Drain Feature to Contact Interfaces

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF

RFSOI SEMICONDUCTOR STRUCTURES INCLUDING A NITROGEN-DOPED CHARGE-TR...

REDUCED SEMICONDUCTOR WAFER BOW AND WARPAGE

PARASITIC CAPACITANCE REDUCTION IN GAN-ON-SILICON DEVICES

Field Effect Transistors with Reduced Leakage Current

METAL-OXIDE SEMICONDUCTOR FIELD-EFFECT TRANSISTOR HAVING ENHANCED H...

FALSE COLLECTORS AND GUARD RINGS FOR SEMICONDUCTOR DEVICES

ENHANCED CAPACITOR FOR INTEGRATION WITH METAL-OXIDE SEMICONDUCTOR F...

SEMICONDUCTOR DEVICE FOR HIGH VOLTAGE APPLICATIONS

METHODS FOR BONDING SEMICONDUCTOR ELEMENTS

REDUCED SEMICONDUCTOR WAFER BOW AND WARPAGE

METHOD OF BONDING THIN SUBSTRATES

Low Leakage FET

DEVICE FOR ELECTROSTATIC DISCHARGE PROTECTION

LATERALLY-DIFFUSED METAL-OXIDE-SEMICONDUCTOR DEVICES WITH A MULTIPL...

SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THEREOF

Power Device and Manufacturing Method Thereof

SHALLOW TRENCH ISOLATION PROCESSING WITH LOCAL OXIDATION OF SILICON

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR

FIN ISOLATION STRUCTURES OF SEMICONDUCTOR DEVICES

PHOTONICS LIGHT SIGNAL TRANSMISSION

RFSOI SEMICONDUCTOR STRUCTURES INCLUDING A NITROGEN-DOPED CHARGE-TR...

METHOD FOR MAKING DEEP TRENCH ISOLATION OF CIS DEVICE, AND SEMICOND...

TRANSISTOR HAVING SOURCE OR DRAIN FORMATION ASSISTANCE REGIONS WITH...

RUGGED LDMOS WITH DRAIN-TIED FIELD PLATE

INTEGRATED SCHOTTKY DIODE WITH GUARD RING

LDMOS TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME

PARASITIC CAPACITANCE REDUCTION IN GAN-ON-SILICON DEVICES