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using a physical effect not covered by other subgroups of G01J1/42
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CPC
G01J2001/4295
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J2001/4295
using a physical effect not covered by other subgroups of G01J1/42
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Patents Grants
last 30 patents
Information
Patent Grant
Optical detector
Patent number
11,573,125
Issue date
Feb 7, 2023
University of Wyoming
William D. Rice
G01 - MEASURING TESTING
Information
Patent Grant
High sensitivity optoelectronic device for detecting chemical speci...
Patent number
11,171,255
Issue date
Nov 9, 2021
STMicroelectronics S.r.l.
Massimo Cataldo Mazzillo
G01 - MEASURING TESTING
Information
Patent Grant
Fast detector of electromagnetic radiation
Patent number
11,067,434
Issue date
Jul 20, 2021
LASER POINT S.R.L.
Davide Scorticati
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of interrupt control and electronic system using the same
Patent number
9,677,930
Issue date
Jun 13, 2017
Dyna Image Corporation
Peng-Han Zhan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Motion sensor and packaging method thereof
Patent number
9,377,354
Issue date
Jun 28, 2016
Dyna Image Corporation
Ming-Hsun Hsieh
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for measuring scattered light and apparatus for measuring sc...
Patent number
9,329,082
Issue date
May 3, 2016
Postnova Analytics GmbH
Roland Welz
G01 - MEASURING TESTING
Information
Patent Grant
Motion sensing device and packaging method thereof
Patent number
9,297,695
Issue date
Mar 29, 2016
Dyna Image Corporation
Ming-Hsun Hsieh
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Motion sensing device
Patent number
9,006,850
Issue date
Apr 14, 2015
Dyna Image Corporation
Ming-Hsun Hsieh
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Wavelength-conversion system with a heated or cooled wavelength-con...
Patent number
7,910,889
Issue date
Mar 22, 2011
Raytheon Company
William Conrad Stenton
G01 - MEASURING TESTING
Information
Patent Grant
Wide-band antenna coupled spectrometer using CMOS transistor
Patent number
7,548,053
Issue date
Jun 16, 2009
International Business Machines Corporation
Thomas E. Morf
G01 - MEASURING TESTING
Information
Patent Grant
High-efficiency photon detector
Patent number
5,095,212
Issue date
Mar 10, 1992
The United States of America as represented by the Secretary of the Air Force
Richard J. Cook
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for sensing the wavelength of a laser beam
Patent number
4,926,428
Issue date
May 15, 1990
Kabushiki Kaisha Komatsu Seisakucho
Koichi Kajiyama
G01 - MEASURING TESTING
Information
Patent Grant
Photoionization optical filter and detector
Patent number
4,879,468
Issue date
Nov 7, 1989
TRW Inc.
John C. Brock
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FAST DETECTOR OF ELECTROMAGNETIC RADIATION
Publication number
20210156737
Publication date
May 27, 2021
LASER POINT s.r.l.
Davide SCORTICATI
G01 - MEASURING TESTING
Information
Patent Application
HIGH SENSITIVITY OPTOELECTRONIC DEVICE FOR DETECTING CHEMICAL SPECI...
Publication number
20190319159
Publication date
Oct 17, 2019
STMicroelectronics S.r.l.
Massimo Cataldo MAZZILLO
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ WAVE DETECTING DEVICE, CAMERA, IMAGING APPARATUS, AND MEA...
Publication number
20160084702
Publication date
Mar 24, 2016
SEIKO EPSON CORPORATION
Hiroto TOMIOKA
G01 - MEASURING TESTING
Information
Patent Application
INFRARED LIGHT DIRECTOR FOR GESTURE OR SCENE SENSING FSC DISPLAY
Publication number
20150083917
Publication date
Mar 26, 2015
QUALCOMM Incorporated
John Michael Wyrwas
G02 - OPTICS
Information
Patent Application
Method and Apparatus for Scanning 3D Dosimeters
Publication number
20150036141
Publication date
Feb 5, 2015
John Adamovics
G01 - MEASURING TESTING
Information
Patent Application
Method For Measuring Scattered Light And Apparatus For Measuring Sc...
Publication number
20140354990
Publication date
Dec 4, 2014
Roland Welz
G01 - MEASURING TESTING
Information
Patent Application
Motion Sensing Device and Motion Sensing System thereof
Publication number
20140320407
Publication date
Oct 30, 2014
LITE-ON SEMICONDUCTOR CORPORATION
Chih-Neng Lin
G01 - MEASURING TESTING
Information
Patent Application
MOTION SENSOR AND PACKAGING METHOD THEREOF
Publication number
20140319328
Publication date
Oct 30, 2014
LITE-ON SEMICONDUCTOR CORPORATION
Ming-Hsun Hsieh
G01 - MEASURING TESTING
Information
Patent Application
Motion Sensing Device and Packaging Method thereof
Publication number
20140319348
Publication date
Oct 30, 2014
LITE-ON SEMICONDUCTOR CORPORATION
Ming-Hsun Hsieh
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SENSING MODULE AND SYSTEM
Publication number
20140321700
Publication date
Oct 30, 2014
LITE-ON SEMICONDUCTOR CORPORATION
Peng-Han Zhan
G01 - MEASURING TESTING
Information
Patent Application
Motion Sensing Device
Publication number
20140319636
Publication date
Oct 30, 2014
LITE-ON SEMICONDUCTOR CORPORATION
Ming-Hsun Hsieh
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF INTERRUPT CONTROL AND ELECTRONIC SYSTEM USING THE SAME
Publication number
20140325108
Publication date
Oct 30, 2014
LITE-ON SEMICONDUCTOR CORPORATION
Peng-Han Zhan
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF INTERRUPT CONTROL AND ELECTRONIC SYSTEM USING THE SAME
Publication number
20140325109
Publication date
Oct 30, 2014
LITE-ON SEMICONDUCTOR CORPORATION
Peng-Han Zhan
G01 - MEASURING TESTING
Information
Patent Application
Wavelength-conversion system with a heated or cooled wavelength-con...
Publication number
20090014656
Publication date
Jan 15, 2009
Raytheon Company
William Conrad Stenton
G01 - MEASURING TESTING
Information
Patent Application
WIDE-BAND ANTENNA COUPLED SPECTROMETER USING CMOS TRANSISTOR
Publication number
20090009154
Publication date
Jan 8, 2009
International Business Machines Corporation
Thomas E. Morf
G01 - MEASURING TESTING