Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor

Industry

CPC
G01N2021/4716

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/4716Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detector and radiation detection apparatus
- Patent number 11,444,213
- Issue date Sep 13, 2022
- Fondazione Bruno Kessler
- Antonino Picciotto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal compensation
- Patent number 11,187,639
- Issue date Nov 30, 2021
- Malvern Panalytical Limited
- Rhys Poolman
- G01 - MEASURING TESTING
Information Patent Grant
Calibration insert, and mount of the same
- Patent number 10,801,947
- Issue date Oct 13, 2020
- Endress + Hauser Conducta GmbH + Co. KG
- Ralf Bernhard
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for recognizing material and method of recogniz...
- Patent number 10,451,547
- Issue date Oct 22, 2019
- DEEDIIM SENSORS INC.
- Jang-Il Ser
- G01 - MEASURING TESTING
Information Patent Grant
Thermal compensation
- Patent number 10,422,734
- Issue date Sep 24, 2019
- MALVERN PANALYTICAL LIMITED
- Rhys Poolman
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for recognizing material and method of recogniz...
- Patent number 10,161,865
- Issue date Dec 25, 2018
- DEEDIIM SENSORS INC.
- Jang-Il Ser
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device and optical measuring method
- Patent number 9,766,174
- Issue date Sep 19, 2017
- Sony Corporation
- Shunpei Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Subject observation apparatus and subject observation method
- Patent number 9,345,385
- Issue date May 24, 2016
- Olympus Corporation
- Kazuhiro Gono
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Light scattering flow cell device
- Patent number 9,222,876
- Issue date Dec 29, 2015
- Agilent Technologies, Inc.
- Jonathan Todd Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 8,934,092
- Issue date Jan 13, 2015
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device and optical measuring method
- Patent number 8,780,338
- Issue date Jul 15, 2014
- Sony Corporation
- Shunpei Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Friction-coefficient estimating device and friction-coefficient est...
- Patent number 8,508,750
- Issue date Aug 13, 2013
- PFU Limited
- Shigeharu Okano
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 8,400,629
- Issue date Mar 19, 2013
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Automatic sampling and dilution apparatus for use in a polymer anal...
- Patent number 8,322,199
- Issue date Dec 4, 2012
- The Administrators of the Tulane Educational Fund
- Wayne F. Reed
- G01 - MEASURING TESTING
Information Patent Grant
Instrument for measuring particle parameters
- Patent number 8,049,895
- Issue date Nov 1, 2011
- Board of Regents of the Nevada System of Higher Education, on Behalf of the D...
- Hans Moosmüller
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 8,035,808
- Issue date Oct 11, 2011
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Light scattering and imaging optical system
- Patent number 7,843,563
- Issue date Nov 30, 2010
- Honeywell International Inc.
- Bernard S. Fritz
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 7,710,557
- Issue date May 4, 2010
- Hitachi High-Technologies Corporation
- Yoshimasa Oshima
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer inspection device and method
- Patent number 7,576,852
- Issue date Aug 18, 2009
- Sumco Tech XIV Corporation
- Fumi Nabeshima
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor and method for optically inspecting surfaces
- Patent number 7,538,866
- Issue date May 26, 2009
- Siemens Aktiengesellschaft
- Wolfgang Heine
- G01 - MEASURING TESTING
Information Patent Grant
Methods for using light reflection patterns to determine diving ang...
- Patent number 7,499,171
- Issue date Mar 3, 2009
- Weyerhaeuser NR Company
- Chih-Lin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Grain angle sensor
- Patent number 7,466,403
- Issue date Dec 16, 2008
- Lucidyne Technologies, Inc.
- George M. Carman
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring, by diffraction, the sizes of substantially sp...
- Patent number 6,850,324
- Issue date Feb 1, 2005
- Commissariat a l'Energie Atomique
- Jean De Metz
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection beam
- Patent number 6,628,386
- Issue date Sep 30, 2003
- Pointsource Technologies, LLC
- Clay Davis
- G01 - MEASURING TESTING
Information Patent Grant
Detection of hazardous airborne fibres
- Patent number 6,606,157
- Issue date Aug 12, 2003
- University of Hertfordshire
- Paul Henry Kaye
- G01 - MEASURING TESTING
Information Patent Grant
Particle analyzer and composite lens formed by integrally joining p...
- Patent number 6,409,141
- Issue date Jun 25, 2002
- Nihon Kohden Corporation
- Masao Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Particle size distribution measuring apparatus, including an array...
- Patent number 6,236,458
- Issue date May 22, 2001
- Horiba, Ltd.
- Tatsuo Igushi
- G01 - MEASURING TESTING
Information Patent Grant
Particle analyzer and composite lens formed by integrally joining p...
- Patent number 6,157,500
- Issue date Dec 5, 2000
- Nihon Kohden Corporation
- Masao Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Particle analyzer and composite lens formed by integrally joining p...
- Patent number 6,084,670
- Issue date Jul 4, 2000
- Nihon Kohden Corporation
- Masao Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for optimizing a compressed air system
- Patent number 5,976,612
- Issue date Nov 2, 1999
- Concurrent Technologies Corporation
- James E. Tardoni
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR PERFORMING DIFFUSE OPTICAL IMAGING
- Publication number 20230118120
- Publication date Apr 20, 2023
- VOTIS Subdermal Imaging Technologies, Ltd.
- Steven M. Ebstein
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZ...
- Publication number 20190120759
- Publication date Apr 25, 2019
- DeeDiim Sensors Inc.
- Jang-Il SER
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION INSERT, AND MOUNT OF THE SAME
- Publication number 20190049363
- Publication date Feb 14, 2019
- Endress + Hauser Conducta GmbH + Co. KG
- Ralf Bernhard
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZ...
- Publication number 20180017486
- Publication date Jan 18, 2018
- Jang-Il SER
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD
- Publication number 20140293273
- Publication date Oct 2, 2014
- SONY CORPORATION
- Shunpei Suzuki
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20140176943
- Publication date Jun 26, 2014
- Hitachi High-Technologies Corporation
- Yoshimasa OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20130208271
- Publication date Aug 15, 2013
- Hitachi High-Technologies Corporation
- Yoshimasa OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SCATTERING FLOW CELL DEVICE
- Publication number 20120250023
- Publication date Oct 4, 2012
- Jonathan Todd Bartlett
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20120008138
- Publication date Jan 12, 2012
- Yoshimasa OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
FRICTION-COEFFICIENT ESTIMATING DEVICE AND FRICTION-COEFFICIENT EST...
- Publication number 20110310398
- Publication date Dec 22, 2011
- PFU Limited
- Shigeharu OKANO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD
- Publication number 20110222050
- Publication date Sep 15, 2011
- SONY CORPORATION
- Shunpei Suzuki
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20100265494
- Publication date Oct 21, 2010
- Yoshimasa OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
SUBJECT OBSERVATION APPARATUS AND SUBJECT OBSERVATION METHOD
- Publication number 20100022858
- Publication date Jan 28, 2010
- OLYMPUS MEDICAL SYSTEMS CORP.
- Kazuhiro GONO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INSTRUMENT FOR MEASURING PARTICLE PARAMETERS
- Publication number 20100020323
- Publication date Jan 28, 2010
- Hans Moosmüller
- G02 - OPTICS
Information Patent Application
Light Scattering Methods and Systems Using Supercritical Fluid Solv...
- Publication number 20090046274
- Publication date Feb 19, 2009
- Mark A. McHugh
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wafer inspection device and method
- Publication number 20090040512
- Publication date Feb 12, 2009
- KOMATSU ELECTRONIC METALS CO., LTD.
- Fumi Nabeshima
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20080304055
- Publication date Dec 11, 2008
- Yoshimasa OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
Methods For Using Light Reflection Patterns To Determine Diving Ang...
- Publication number 20080246971
- Publication date Oct 9, 2008
- Weyerhaeuser Co.
- Chih-Lin Huang
- G01 - MEASURING TESTING
Information Patent Application
GRAIN ANGLE SENSOR
- Publication number 20080074670
- Publication date Mar 27, 2008
- Lucidyne Technologies, Inc.
- George M. Carman
- G01 - MEASURING TESTING
Information Patent Application
Automatic sampling and dilution apparatus for use in a polymer anal...
- Publication number 20080008623
- Publication date Jan 10, 2008
- The Administrators of the Tulane Educational Fund
- Wayne F. Reed
- G01 - MEASURING TESTING
Information Patent Application
Optical sensor and method for optically inspecting surfaces
- Publication number 20070252976
- Publication date Nov 1, 2007
- Siemens Aktiengesellschaft
- Wolfgang Heine
- G01 - MEASURING TESTING
Information Patent Application
PHOTOSENSITIVE DIAGNOSTIC DEVICE
- Publication number 20070176105
- Publication date Aug 2, 2007
- Igor Trofimov
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
INSTRUMENT FOR MEASURING PARTICLE PARAMETERS
- Publication number 20070146841
- Publication date Jun 28, 2007
- Board of Regents of the Nevada System of Higher Education on behalf of the De...
- Hans Moosmuller
- G02 - OPTICS
Information Patent Application
A LIGHT SCATTERING AND IMAGING OPTICAL SYSTEM
- Publication number 20070041013
- Publication date Feb 22, 2007
- Honeywell International Inc.
- Bernard S. Fritz
- G01 - MEASURING TESTING
Information Patent Application
Automatic mixing and dilution methods and apparatus for online char...
- Publication number 20040004717
- Publication date Jan 8, 2004
- Wayne F. Reed
- G01 - MEASURING TESTING
Information Patent Application
Particle detection beam
- Publication number 20030107734
- Publication date Jun 12, 2003
- Clay Davis
- G01 - MEASURING TESTING

Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Radiation detector and radiation detection apparatus

Thermal compensation

Calibration insert, and mount of the same

Illumination system for recognizing material and method of recogniz...

Thermal compensation

Illumination system for recognizing material and method of recogniz...

Optical measuring device and optical measuring method

Subject observation apparatus and subject observation method

Light scattering flow cell device

Surface defect inspection method and apparatus

Optical measuring device and optical measuring method

Friction-coefficient estimating device and friction-coefficient est...

Surface defect inspection method and apparatus

Automatic sampling and dilution apparatus for use in a polymer anal...

Instrument for measuring particle parameters

Surface defect inspection method and apparatus

Light scattering and imaging optical system

Surface defect inspection method and apparatus

Semiconductor wafer inspection device and method

Optical sensor and method for optically inspecting surfaces

Methods for using light reflection patterns to determine diving ang...

Grain angle sensor

Device for measuring, by diffraction, the sizes of substantially sp...

Particle detection beam

Detection of hazardous airborne fibres

Particle analyzer and composite lens formed by integrally joining p...

Particle size distribution measuring apparatus, including an array...

Particle analyzer and composite lens formed by integrally joining p...

Particle analyzer and composite lens formed by integrally joining p...

Apparatus and method for optimizing a compressed air system

Patents Applicationslast 30 patents

METHODS AND APPARATUS FOR PERFORMING DIFFUSE OPTICAL IMAGING

ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZ...

CALIBRATION INSERT, AND MOUNT OF THE SAME

ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZ...

OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

LIGHT SCATTERING FLOW CELL DEVICE

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

FRICTION-COEFFICIENT ESTIMATING DEVICE AND FRICTION-COEFFICIENT EST...

OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

SUBJECT OBSERVATION APPARATUS AND SUBJECT OBSERVATION METHOD

INSTRUMENT FOR MEASURING PARTICLE PARAMETERS

Light Scattering Methods and Systems Using Supercritical Fluid Solv...

Semiconductor wafer inspection device and method

SURFACE DEFECT INSPECTION METHOD AND APPARATUS

Methods For Using Light Reflection Patterns To Determine Diving Ang...

GRAIN ANGLE SENSOR

Automatic sampling and dilution apparatus for use in a polymer anal...

Optical sensor and method for optically inspecting surfaces

PHOTOSENSITIVE DIAGNOSTIC DEVICE

INSTRUMENT FOR MEASURING PARTICLE PARAMETERS

A LIGHT SCATTERING AND IMAGING OPTICAL SYSTEM

Automatic mixing and dilution methods and apparatus for online char...

Particle detection beam