using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties

Industry

CPC
G01N21/636

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/636using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties

Industries

Patents Grantslast 30 patents

Information Patent Grant
Device and method for analyzing a material
- Patent number 12,066,378
- Issue date Aug 20, 2024
- DiaMon Tech AG
- Alexander Bauer
- G01 - MEASURING TESTING
Information Patent Grant
Full-field brillouin microscopy systems and methods
- Patent number 12,019,018
- Issue date Jun 25, 2024
- University of Maryland, College Park
- Giuliano Scarcelli
- G02 - OPTICS
Information Patent Grant
Second Harmonic Generation (SHG) optical inspection system designs
- Patent number 11,946,863
- Issue date Apr 2, 2024
- FemtoMetrix, Inc.
- Ming Lei
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device and process
- Patent number 11,921,042
- Issue date Mar 5, 2024
- BioAxial SAS
- Gabriel Y Sirat
- G01 - MEASURING TESTING
Information Patent Grant
Bond-selective intensity diffraction tomography and uses thereof
- Patent number 11,913,881
- Issue date Feb 27, 2024
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Compact guided diffuse optical tomography system for imaging a lesi...
- Patent number 11,867,627
- Issue date Jan 9, 2024
- Washington University
- Quing Zhu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Theranostic methods and systems for diagnosis and treatment of malaria
- Patent number 11,859,177
- Issue date Jan 2, 2024
- William Marsh Rice University
- Dmitri Lapotko
- G01 - MEASURING TESTING
Information Patent Grant
Edge-computing with enhanced standoff sensors
- Patent number 11,855,697
- Issue date Dec 26, 2023
- UT-Battelle, LLC
- Ali Passian
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,821,911
- Issue date Nov 21, 2023
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 11,808,563
- Issue date Nov 7, 2023
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Optical systems and methods of characterizing high-k dielectrics
- Patent number 11,808,706
- Issue date Nov 7, 2023
- California Institute of Technology
- Philippe C. Adell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-invasive substance analysis
- Patent number 11,639,894
- Issue date May 2, 2023
- DiaMonTech AG
- Werner Mäntele
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Total internal reflection enabled wide-field Coherent anti-Stokes R...
- Patent number 11,604,144
- Issue date Mar 14, 2023
- UT-Battelle, LLC
- Benjamin L. Doughty
- G01 - MEASURING TESTING
Information Patent Grant
Method of analysing an aqueous fluid using 2D-IR spectroscopy
- Patent number 11,598,718
- Issue date Mar 7, 2023
- The University of York
- Matthew Baker
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining at least one thermal property o...
- Patent number 11,585,756
- Issue date Feb 21, 2023
- Brigham Young University
- Troy Munro
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for Brillouin spectroscopy and imaging of tissues
- Patent number 11,576,571
- Issue date Feb 14, 2023
- The General Hospital Corporation
- Seok-Hyun Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Systems and methods for label-free detection of analytes
- Patent number 11,573,233
- Issue date Feb 7, 2023
- University of Utah Research Foundation
- John Conboy
- G01 - MEASURING TESTING
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 11,473,903
- Issue date Oct 18, 2022
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for identification of phosphors
- Patent number 11,435,228
- Issue date Sep 6, 2022
- Intelligent Material Solutions, Inc.
- Joshua E. Collins
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining second order nonlinear susceptibi...
- Patent number 11,428,630
- Issue date Aug 30, 2022
- Nankai University
- Meng-Xin Ren
- G01 - MEASURING TESTING
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 11,415,617
- Issue date Aug 16, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated delay line alignment
- Patent number 11,359,964
- Issue date Jun 14, 2022
- ULTRAFAST SYSTEMS LLC
- Alexander Sobolev
- G01 - MEASURING TESTING
Information Patent Grant
Applications of optical detection of low-level chemical and biologi...
- Patent number 11,333,667
- Issue date May 17, 2022
- San Diego State University Foundation
- William G. Tong
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Scanning probe microscope
- Patent number 11,320,456
- Issue date May 3, 2022
- GTHERANOSTICS CO., LTD.
- Hidemi Shigekawa
- G01 - MEASURING TESTING
Information Patent Grant
Methods, arrangements and systems for obtaining information associa...
- Patent number 11,319,357
- Issue date May 3, 2022
- The General Hospital Corporation
- Seok-Hyun Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System and method for shaping incoherent light for control of chemi...
- Patent number 11,320,308
- Issue date May 3, 2022
- The Trustees of Princeton University
- François Laforge
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology technologies
- Patent number 11,293,965
- Issue date Apr 5, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for analyzing a material
- Patent number 11,280,728
- Issue date Mar 22, 2022
- DiaMonTech AG
- Alexander Bauer
- G01 - MEASURING TESTING
Information Patent Grant
Laser speckle reduction and photo-thermal speckle spectroscopy
- Patent number 11,262,241
- Issue date Mar 1, 2022
- The Government of the United States of America, as represented by the Secreta...
- Robert Furstenberg
- G01 - MEASURING TESTING
Information Patent Grant
Recording dynamics of cellular processes
- Patent number 11,255,837
- Issue date Feb 22, 2022
- University of Vienna
- Alipasha Vaziri
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
Fluorescence-Detected Mid-Infrared Photothermal Microscopy
- Publication number 20240328949
- Publication date Oct 3, 2024
- Purdue Research Foundation
- Garth Jason Simpson
- G01 - MEASURING TESTING
Information Patent Application
FULL-FIELD BRILLOUIN MICROSCOPY SYSTEMS AND METHODS
- Publication number 20240319094
- Publication date Sep 26, 2024
- University of Maryland, College Park
- Giuliano SCARCELLI
- G01 - MEASURING TESTING
Information Patent Application
VERSATILE MULTIMODAL OPTICAL MODALITY BASED ON BRILLOUIN LIGHT SCAT...
- Publication number 20240272073
- Publication date Aug 15, 2024
- Wayne State University
- Jitao ZHANG
- G01 - MEASURING TESTING
Information Patent Application
BOND-SELECTIVE INTENSITY DIFFRACTION TOMOGRAPHY AND USES THEREOF
- Publication number 20240272074
- Publication date Aug 15, 2024
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PRECISION NONLINEAR MICROSCOPY
- Publication number 20240255424
- Publication date Aug 1, 2024
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Kayvan Forouhesh Tehrani
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR SUPER-RESOLUTION BRILLOUIN MICROSCOPY
- Publication number 20240230532
- Publication date Jul 11, 2024
- Wayne State University
- Jitao ZHANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR QUANTITATIVELY DETECTING ISOTOPOLOGUE OF CARBON DIOXI...
- Publication number 20240175815
- Publication date May 30, 2024
- UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
- Shuiming Hu
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE-BASED THIN FILM METROLOGY USING SECOND HARMONIC GENERATION
- Publication number 20240176206
- Publication date May 30, 2024
- KLA Corporation
- Qiang Zhao
- G02 - OPTICS
Information Patent Application
DEVICE AND SPECTROMETER FOR QUANTITATIVELY DETECTING CARBON 14 ISOT...
- Publication number 20240167945
- Publication date May 23, 2024
- UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
- Shuiming Hu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATI...
- Publication number 20240085345
- Publication date Mar 14, 2024
- FemtoMetrix, Inc.
- Timothy M. Wong
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR MAIN DETECTOR SYNCHRONIZATION OF OPTICALLY...
- Publication number 20240085324
- Publication date Mar 14, 2024
- FemtoMetrix, Inc.
- Anatoly A. Shtykov
- G01 - MEASURING TESTING
Information Patent Application
BOND-SELECTIVE INTENSITY DIFFRACTION TOMOGRAPHY AND USES THEREOF
- Publication number 20240019369
- Publication date Jan 18, 2024
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Application
Surface Sensing Systems and Methods for Imaging a Scanned Surface o...
- Publication number 20240019243
- Publication date Jan 18, 2024
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
Gram-Stain Differentiation with Nonlinear Light Scattering
- Publication number 20230417669
- Publication date Dec 28, 2023
- Temple University - Of The Commonwealth System of Higher Education
- Hai-Lung Dai
- G01 - MEASURING TESTING
Information Patent Application
MULTI-DIMENSIONAL RYDBERG FINGERPRINT SPECTROSCOPY
- Publication number 20230408447
- Publication date Dec 21, 2023
- Brown University
- Peter Weber
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CREATING A MICROSCOPIC SAMPLE IMAGE OF A M...
- Publication number 20230266248
- Publication date Aug 24, 2023
- Hanieh FATTAHI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR LABEL-FREE DETECTION OF ANALYTES
- Publication number 20230160898
- Publication date May 25, 2023
- University of Utah Research Foundation
- JOHN CONBOY
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASUREMENT SYSTEM AND SHAPE MEASUREMENT METHOD
- Publication number 20230147800
- Publication date May 11, 2023
- Nippon Telegraph and Telephone Corporation
- Nobutomo HANZAWA
- G01 - MEASURING TESTING
Information Patent Application
Light Detecting Device and Light Detecting Method
- Publication number 20230100591
- Publication date Mar 30, 2023
- National University Corporation Tokyo University Of Agriculture And Technology
- Kazuhiko Misawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface Sensing Systems and Methods for Imaging a Scanned Surface o...
- Publication number 20230003515
- Publication date Jan 5, 2023
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20220413029
- Publication date Dec 29, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR OBTAINING INFORMATION ABOUT A SAMPLE
- Publication number 20220381689
- Publication date Dec 1, 2022
- LAVCHIEFF Analytics GmbH
- Ventsislav LAVCHIEV
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND METHOD OF FORMING THE SAME
- Publication number 20220326151
- Publication date Oct 13, 2022
- Agency for Science, Technology and Research
- Leonid KRIVITSKIY
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR STIMULATED BRILLOUIN MICROSCOPY
- Publication number 20220326080
- Publication date Oct 13, 2022
- The General Hospital Corporation
- Seok-Hyun Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20220260626
- Publication date Aug 18, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for Analyzing a Material
- Publication number 20220205909
- Publication date Jun 30, 2022
- DiaMonTech AG
- Alexander Bauer
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
TEMPORALLY-RESOLVED AND SPATIALLY-RESOLVED PUMP-PROBE CONTROL SYSTE...
- Publication number 20220163448
- Publication date May 26, 2022
- BEIJING JIAOTONG UNIVERSITY
- Dawei HE
- G01 - MEASURING TESTING
Information Patent Application
FULL-FIELD BRILLOUIN MICROSCOPY SYSTEMS AND METHODS
- Publication number 20220042908
- Publication date Feb 10, 2022
- University of Maryland, College Park
- Giuliano SCARCELLI
- G01 - MEASURING TESTING
Information Patent Application
EDGE-COMPUTING WITH ENHANCED STANDOFF SENSORS
- Publication number 20220038185
- Publication date Feb 3, 2022
- UT-Battelle, LLC
- Ali Passian
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND METHODS OF CHARACTERIZING HIGH-K DIELECTRICS
- Publication number 20220003678
- Publication date Jan 6, 2022
- California Institute of Technology
- Philippe C. Adell
- H01 - BASIC ELECTRIC ELEMENTS

using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for analyzing a material

Full-field brillouin microscopy systems and methods

Second Harmonic Generation (SHG) optical inspection system designs

Optical measuring device and process

Bond-selective intensity diffraction tomography and uses thereof

Compact guided diffuse optical tomography system for imaging a lesi...

Theranostic methods and systems for diagnosis and treatment of malaria

Edge-computing with enhanced standoff sensors

Pump and probe type second harmonic generation metrology

Surface sensing systems and methods for imaging a scanned surface o...

Optical systems and methods of characterizing high-k dielectrics

Non-invasive substance analysis

Total internal reflection enabled wide-field Coherent anti-Stokes R...

Method of analysing an aqueous fluid using 2D-IR spectroscopy

Methods and systems for determining at least one thermal property o...

Systems and methods for Brillouin spectroscopy and imaging of tissues

Systems and methods for label-free detection of analytes

Surface sensing systems and methods for imaging a scanned surface o...

Method and system for identification of phosphors

System and method for determining second order nonlinear susceptibi...

Field-biased second harmonic generation metrology

Automated delay line alignment

Applications of optical detection of low-level chemical and biologi...

Scanning probe microscope

Methods, arrangements and systems for obtaining information associa...

System and method for shaping incoherent light for control of chemi...

Wafer metrology technologies

Device and method for analyzing a material

Laser speckle reduction and photo-thermal speckle spectroscopy

Recording dynamics of cellular processes

Patents Applicationslast 30 patents

Fluorescence-Detected Mid-Infrared Photothermal Microscopy

FULL-FIELD BRILLOUIN MICROSCOPY SYSTEMS AND METHODS

VERSATILE MULTIMODAL OPTICAL MODALITY BASED ON BRILLOUIN LIGHT SCAT...

BOND-SELECTIVE INTENSITY DIFFRACTION TOMOGRAPHY AND USES THEREOF

SYSTEMS AND METHODS FOR PRECISION NONLINEAR MICROSCOPY

APPARATUS AND METHOD FOR SUPER-RESOLUTION BRILLOUIN MICROSCOPY

APPARATUS FOR QUANTITATIVELY DETECTING ISOTOPOLOGUE OF CARBON DIOXI...

INTERFACE-BASED THIN FILM METROLOGY USING SECOND HARMONIC GENERATION

DEVICE AND SPECTROMETER FOR QUANTITATIVELY DETECTING CARBON 14 ISOT...

METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATI...

METHOD AND APPARATUS FOR MAIN DETECTOR SYNCHRONIZATION OF OPTICALLY...

BOND-SELECTIVE INTENSITY DIFFRACTION TOMOGRAPHY AND USES THEREOF

Surface Sensing Systems and Methods for Imaging a Scanned Surface o...

Gram-Stain Differentiation with Nonlinear Light Scattering

MULTI-DIMENSIONAL RYDBERG FINGERPRINT SPECTROSCOPY

METHOD AND APPARATUS FOR CREATING A MICROSCOPIC SAMPLE IMAGE OF A M...

SYSTEMS AND METHODS FOR LABEL-FREE DETECTION OF ANALYTES

SHAPE MEASUREMENT SYSTEM AND SHAPE MEASUREMENT METHOD

Light Detecting Device and Light Detecting Method

Surface Sensing Systems and Methods for Imaging a Scanned Surface o...

WAFER METROLOGY TECHNOLOGIES

MEASUREMENT SYSTEM AND METHOD FOR OBTAINING INFORMATION ABOUT A SAMPLE

OPTICAL SYSTEM AND METHOD OF FORMING THE SAME

SYSTEMS AND METHODS FOR STIMULATED BRILLOUIN MICROSCOPY

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

Device and Method for Analyzing a Material

TEMPORALLY-RESOLVED AND SPATIALLY-RESOLVED PUMP-PROBE CONTROL SYSTE...

FULL-FIELD BRILLOUIN MICROSCOPY SYSTEMS AND METHODS

EDGE-COMPUTING WITH ENHANCED STANDOFF SENSORS

OPTICAL SYSTEMS AND METHODS OF CHARACTERIZING HIGH-K DIELECTRICS