using avalanche in a gas

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CPC
H01J2237/24445

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/24445using avalanche in a gas

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Patents Grantslast 30 patents

Information Patent Grant
Method for detector equalization during the imaging of objects with...
- Patent number 11,645,740
- Issue date May 9, 2023
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 11,276,547
- Issue date Mar 15, 2022
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,861,670
- Issue date Dec 8, 2020
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,522,321
- Issue date Dec 31, 2019
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam-induced etching
- Patent number 10,304,658
- Issue date May 28, 2019
- FEI Company
- Aiden Martin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam processing using process gas and cooled surface
- Patent number 9,799,490
- Issue date Oct 24, 2017
- FEI Company
- Aiden Martin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,466,458
- Issue date Oct 11, 2016
- B-NANO LTD.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam-induced etching
- Patent number 9,123,506
- Issue date Sep 1, 2015
- FEI Company
- Aiden Martin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle detector system comprising a conversion electrode
- Patent number 8,952,328
- Issue date Feb 10, 2015
- FEI Company
- Albertus Aemillius Seyno Sluijterman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope using gas amplification
- Patent number 8,299,432
- Issue date Oct 30, 2012
- FEI Company
- Milos Toth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,097,848
- Issue date Jan 17, 2012
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multistage gas cascade amplifier
- Patent number 7,791,020
- Issue date Sep 7, 2010
- FEI Company
- Marek Uncovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,755,045
- Issue date Jul 13, 2010
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-vacuum scanning electron microscope
- Patent number 6,686,590
- Issue date Feb 3, 2004
- Jeol Ltd.
- Kouji Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 6,365,898
- Issue date Apr 2, 2002
- LEO Electron Microscopy Limited
- Pierre Sudraud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 5,677,531
- Issue date Oct 14, 1997
- Nikon Corporation
- Yasumichi Miyazaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTOR EQUALIZATION DURING THE IMGAGING OF OBJECTS WIT...
- Publication number 20210192700
- Publication date Jun 24, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20210050178
- Publication date Feb 18, 2021
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20200135425
- Publication date Apr 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20180342368
- Publication date Nov 29, 2018
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam-Induced Etching
- Publication number 20140363978
- Publication date Dec 11, 2014
- Aiden Martin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Environmental SEM Gas Injection System
- Publication number 20140034830
- Publication date Feb 6, 2014
- FEI Company
- Marc Castagna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Detector System Comprising a Conversion Electrode
- Publication number 20130056634
- Publication date Mar 7, 2013
- FEI Company
- Albertus Aemillius Seyno Sluijterman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING TRANSMISSION ELECTRON MICROSCOPE USING GAS AMPLIFICATION
- Publication number 20100108881
- Publication date May 6, 2010
- FEI Company
- MILOS TOTH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTISTAGE GAS CASCADE AMPLIFIER
- Publication number 20090242758
- Publication date Oct 1, 2009
- FEI Company
- MAREK UNCOVSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20090230304
- Publication date Sep 17, 2009
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope
- Publication number 20080035843
- Publication date Feb 14, 2008
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Low-vacuum scanning electron microscope
- Publication number 20020166966
- Publication date Nov 14, 2002
- JEOL Ltd.
- Kouji Ogawa
- G01 - MEASURING TESTING

using avalanche in a gas

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for detector equalization during the imaging of objects with...

Charged particle optical apparatus for through-the-lens detection o...

Charged particle optical apparatus for through-the-lens detection o...

Charged particle optical apparatus for through-the-lens detection o...

Electron beam-induced etching

Charged particle beam processing using process gas and cooled surface

Scanning electron microscope

Electron beam-induced etching

Charged particle detector system comprising a conversion electrode

Scanning transmission electron microscope using gas amplification

Scanning electron microscope

Multistage gas cascade amplifier

Scanning electron microscope

Low-vacuum scanning electron microscope

Scanning electron microscope

Scanning electron microscope

Patents Applicationslast 30 patents

METHOD FOR DETECTOR EQUALIZATION DURING THE IMGAGING OF OBJECTS WIT...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

Electron Beam-Induced Etching

Environmental SEM Gas Injection System

Charged Particle Detector System Comprising a Conversion Electrode

SCANNING TRANSMISSION ELECTRON MICROSCOPE USING GAS AMPLIFICATION

MULTISTAGE GAS CASCADE AMPLIFIER

SCANNING ELECTRON MICROSCOPE

Scanning Electron Microscope

Low-vacuum scanning electron microscope