using capacitive means

Industry

CPC
G01B7/08

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B7/00Measuring arrangements characterised by the use of electric or magnetic means

Current Industry

G01B7/08using capacitive means

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Capacitance-based quality monitoring and control in battery manufac...
- Patent number 12,040,461
- Issue date Jul 16, 2024
- GM Global Technology Operations LLC
- Erik Damon Huemiller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for detecting antimicrobial surface coatings
- Patent number 12,000,696
- Issue date Jun 4, 2024
- B/E Aerospace, Inc.
- Katherine Urena Pimentel
- G01 - MEASURING TESTING
Information Patent Grant
Determining plastic or cellulose levels in composites
- Patent number 11,965,737
- Issue date Apr 23, 2024
- Continuus Materials Intellectual Property, LLC
- Victoria L. Wan
- G01 - MEASURING TESTING
Information Patent Grant
Thickness detection device, method and system
- Patent number 11,946,739
- Issue date Apr 2, 2024
- Weihai Hualing Opto-Electronics Co., Ltd.
- Yonghui Lin
- G01 - MEASURING TESTING
Information Patent Grant
Wafer temperature measurement in an ion implantation system
- Patent number 11,942,343
- Issue date Mar 26, 2024
- Advanced Ion Beam Technology, Inc.
- Chien-Li Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring device and method of obtaining thickness of sheath
- Patent number 11,898,840
- Issue date Feb 13, 2024
- Tokyo Electron Limited
- Shinji Kubota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for monitoring internal pipe deposit accumulation
- Patent number 11,815,351
- Issue date Nov 14, 2023
- KING FAISAL UNIVERSITY
- Chawki Awada
- G01 - MEASURING TESTING
Information Patent Grant
Size detection
- Patent number 11,796,302
- Issue date Oct 24, 2023
- Cirque Corporation
- Jared Bytheway
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for calculating capacitance and method for calculating thick...
- Patent number 11,774,231
- Issue date Oct 3, 2023
- Samsung Display Co., Ltd.
- Jungho Choi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for controlling edge ring variation
- Patent number 11,668,553
- Issue date Jun 6, 2023
- Applied Materials Inc.
- Sathyendra Ghantasala
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods providing enhanced material thickness sensing with capaciti...
- Patent number 11,614,317
- Issue date Mar 28, 2023
- Tyrata, Inc.
- Steven Cummer
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Thickness measuring device
- Patent number 11,549,796
- Issue date Jan 10, 2023
- TECO IMAGE SYSTEMS CO., LTD
- Chien-Ying Chen
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring thickness of dielectric layer in ci...
- Patent number 11,408,720
- Issue date Aug 9, 2022
- Unimicron Technology Corporation
- Cheng-Jui Chang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring process kit centering
- Patent number 11,387,122
- Issue date Jul 12, 2022
- Applied Materials, Inc.
- Charles Potter
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum pump, main sensor, and thread groove stator
- Patent number 11,346,349
- Issue date May 31, 2022
- Edwards Japan Limited
- Takashi Kabasawa
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Flexible three-dimensional sensing input device
- Patent number 11,168,973
- Issue date Nov 9, 2021
- Cirque Corporation
- Jared Bytheway
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring device and operation method of system for inspecting focu...
- Patent number 11,164,729
- Issue date Nov 2, 2021
- Tokyo Electron Limited
- Kippei Sugita
- G01 - MEASURING TESTING
Information Patent Grant
Device for locating studs on a surface
- Patent number 11,156,736
- Issue date Oct 26, 2021
- Jesus De La Torre
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Displacement measuring device
- Patent number 11,150,072
- Issue date Oct 19, 2021
- Mitutoyo Corporation
- Masaki Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
Device and methods for accounting for environmental capacitances ca...
- Patent number 11,067,377
- Issue date Jul 20, 2021
- EDTM, Inc.
- Jeffrey A. Simpson
- G01 - MEASURING TESTING
Information Patent Grant
Height measuring apparatus, health care device, and rotary gate
- Patent number 11,006,855
- Issue date May 18, 2021
- Renesas Electronics Corporation
- Kakeru Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Thickness measurement device and methods of use
- Patent number 10,976,147
- Issue date Apr 13, 2021
- American University of Beirut
- Imad H. Elhajj
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing insulated electric wire, method for inspecting...
- Patent number 10,962,498
- Issue date Mar 30, 2021
- Sumitomo Electric Industries, Ltd.
- Shinya Ota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor device
- Patent number 10,921,276
- Issue date Feb 16, 2021
- ABLIC INC.
- Yuji Wakabayashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test structures for measuring silicon thickness in fully depleted s...
- Patent number 10,852,337
- Issue date Dec 1, 2020
- PDF Solutions, Inc.
- Sharad Saxena
- G01 - MEASURING TESTING
Information Patent Grant
Method for obtaining a height of a material stacked in a coke oven
- Patent number 10,844,284
- Issue date Nov 24, 2020
- Arcelormittal
- José Lopez Fresno
- C10 - PETROLEUM, GAS OR COKE INDUSTRIES TECHNICAL GASES CONTAINING CARBON MON...
Information Patent Grant
Method and apparatus for measuring process kit centering
- Patent number 10,847,393
- Issue date Nov 24, 2020
- Applied Materials, Inc.
- Charles G. Potter
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Probe systems and methods for calibrating capacitive height sensing...
- Patent number 10,809,048
- Issue date Oct 20, 2020
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Long range capacitive gap measurement in a wafer form sensor system
- Patent number 10,794,681
- Issue date Oct 6, 2020
- Applied Materials, Inc.
- Charles G. Potter
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Capacitive-sensing paint borer
- Patent number 10,746,525
- Issue date Aug 18, 2020
- The Boeing Company
- David M. Konyndyk
- G08 - SIGNALLING

Patents Applicationslast 30 patents

Information Patent Application
CAPACITATIVE SENSING DEVICE FOR IN-SITU MONITORING OF COATINGS
- Publication number 20240344818
- Publication date Oct 17, 2024
- Halliburton Energy Services, Inc.
- James Martin PRICE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING ANTIMICROBIAL SURFACE COATINGS
- Publication number 20240280356
- Publication date Aug 22, 2024
- B/E Aerospace, Inc.
- KATHERINE URENA PIMENTEL
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
DETERMINING PLASTIC OR CELLULOSE LEVELS IN COMPOSITES
- Publication number 20240240927
- Publication date Jul 18, 2024
- CONTINUUS MATERIALS INTELLECTUAL PROPERTY, LLC
- Victoria L. Wan
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC...
- Publication number 20240230710
- Publication date Jul 11, 2024
- MSSCORPS CO., LTD.
- MAO-NAN CHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING GATE OXIDE THICKNESS
- Publication number 20240234217
- Publication date Jul 11, 2024
- Shanghai Huali Integrated Circuit Corporation
- Haibo LEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC...
- Publication number 20240133918
- Publication date Apr 25, 2024
- MSSCORPS CO., LTD.
- MAO-NAN CHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING GATE OXIDE THICKNESS
- Publication number 20240136233
- Publication date Apr 25, 2024
- Shanghai Huali Integrated Circuit Corporation
- Haibo LEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD FOR DETECTING AND TRACKING A FEATURE OF A WEB OF PACKAGING...
- Publication number 20240017867
- Publication date Jan 18, 2024
- Tetra Laval Holdings & Finance S.A.
- Gabriele BORELLI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING EDGE RING VARIATION
- Publication number 20230280150
- Publication date Sep 7, 2023
- Applied Materials, Inc.
- Sathyendra GHANTASALA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MONITORING THE FILM THICKNESS OF A LUBRICANT...
- Publication number 20230251075
- Publication date Aug 10, 2023
- Aktiebolaget SKF
- Pramod SHETTY
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Electrode Assembly Comprising Anode Sheet and Anode Having Improved...
- Publication number 20230223509
- Publication date Jul 13, 2023
- LG ENERGY SOLUTION, LTD.
- Tai Joon Seo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITANCE-BASED QUALITY MONITORING AND CONTROL IN BATTERY MANUFAC...
- Publication number 20230198034
- Publication date Jun 22, 2023
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Erik Damon Huemiller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER TEMPERATURE MEASUREMENT IN AN ION IMPLANTATION SYSTEM
- Publication number 20230054419
- Publication date Feb 23, 2023
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Chien-Li CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUITS AND METHODS TO CALIBRATE MIRROR DISPLACEMENT
- Publication number 20220342202
- Publication date Oct 27, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Robert Floyd Payne
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING ANTIMICROBIAL SURFACE COATINGS
- Publication number 20220299305
- Publication date Sep 22, 2022
- B/E Aerospace, Inc.
- KATHERINE URENA PIMENTEL
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Device and Method for Measuring Thickness of Dielectric Layer in Ci...
- Publication number 20220221262
- Publication date Jul 14, 2022
- UNIMICRON TECHNOLOGY CORPORATION
- Cheng-Jui Chang
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING PLASTIC OR CELLULOSE LEVELS IN COMPOSITES
- Publication number 20220205774
- Publication date Jun 30, 2022
- CONTINUUS MATERIALS INTELLECTUAL PROPERTY, LLC
- Victoria L. Wan
- G01 - MEASURING TESTING
Information Patent Application
Thickness Detection Device, Method and System
- Publication number 20220178675
- Publication date Jun 9, 2022
- WEIHAI HUALING OPTO-ELECTRONICS CO.,LTD.
- Yonghui LIN
- G01 - MEASURING TESTING
Information Patent Application
THICKNESS MEASURING DEVICE
- Publication number 20220113123
- Publication date Apr 14, 2022
- Teco Image Systems Co., Ltd.
- Chien-Ying Chen
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND METHOD OF OBTAINING THICKNESS OF SHEATH
- Publication number 20210396506
- Publication date Dec 23, 2021
- TOKYO ELECTRON LIMITED
- Shinji KUBOTA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALCULATING CAPACITANCE AND METHOD FOR CALCULATING THICK...
- Publication number 20210389113
- Publication date Dec 16, 2021
- SAMSUNG DISPLAY CO., LTD.
- Jungho CHOI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING EDGE RING VARIATION
- Publication number 20210254957
- Publication date Aug 19, 2021
- Applied Materials, Inc.
- Sathyendra GHANTASALA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Size Detection
- Publication number 20210223021
- Publication date Jul 22, 2021
- Cirque Corporation
- Jared Bytheway
- G01 - MEASURING TESTING
Information Patent Application
Capacitance Sensor in a Battery
- Publication number 20210226269
- Publication date Jul 22, 2021
- Cirque Corporation
- Jared Bytheway
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING
- Publication number 20210035832
- Publication date Feb 4, 2021
- Charles Potter
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
METHODS PROVIDING ENHANCED MATERIAL THICKNESS SENSING WITH CAPACITI...
- Publication number 20200400420
- Publication date Dec 24, 2020
- Tyrata, Inc.
- Steven CUMMER
- B60 - VEHICLES IN GENERAL
Information Patent Application
Device and Method for Detecting Film Thickness
- Publication number 20200318941
- Publication date Oct 8, 2020
- WEIHAI HUALING OPTO-ELECTRONICS CO.,LTD.
- Li JIANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS FOR CALIBRATING CAPACITIVE HEIGHT SENSING...
- Publication number 20200217638
- Publication date Jul 9, 2020
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBTAINING A HEIGHT OF A MATERIAL STACKED IN A COKE OVEN
- Publication number 20200181496
- Publication date Jun 11, 2020
- ARCELORMITTAL
- José LOPEZ FRESNO
- G01 - MEASURING TESTING
Information Patent Application
VACUUM PUMP, MAIN SENSOR, AND THREAD GROOVE STATOR
- Publication number 20200095998
- Publication date Mar 26, 2020
- Edwards Japan Limited
- Takashi Kabasawa
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...

using capacitive means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Capacitance-based quality monitoring and control in battery manufac...

Systems and methods for detecting antimicrobial surface coatings

Determining plastic or cellulose levels in composites

Thickness detection device, method and system

Wafer temperature measurement in an ion implantation system

Measuring device and method of obtaining thickness of sheath

Device for monitoring internal pipe deposit accumulation

Size detection

Method for calculating capacitance and method for calculating thick...

Apparatus and method for controlling edge ring variation

Methods providing enhanced material thickness sensing with capaciti...

Thickness measuring device

Device and method for measuring thickness of dielectric layer in ci...

Method and apparatus for measuring process kit centering

Vacuum pump, main sensor, and thread groove stator

Flexible three-dimensional sensing input device

Measuring device and operation method of system for inspecting focu...

Device for locating studs on a surface

Displacement measuring device

Device and methods for accounting for environmental capacitances ca...

Height measuring apparatus, health care device, and rotary gate

Thickness measurement device and methods of use

Method for producing insulated electric wire, method for inspecting...

Sensor device

Test structures for measuring silicon thickness in fully depleted s...

Method for obtaining a height of a material stacked in a coke oven

Method and apparatus for measuring process kit centering

Probe systems and methods for calibrating capacitive height sensing...

Long range capacitive gap measurement in a wafer form sensor system

Capacitive-sensing paint borer

Patents Applicationslast 30 patents

CAPACITATIVE SENSING DEVICE FOR IN-SITU MONITORING OF COATINGS

SYSTEMS AND METHODS FOR DETECTING ANTIMICROBIAL SURFACE COATINGS

DETERMINING PLASTIC OR CELLULOSE LEVELS IN COMPOSITES

METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC...

METHOD FOR MONITORING GATE OXIDE THICKNESS

METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC...

METHOD FOR MONITORING GATE OXIDE THICKNESS

A METHOD FOR DETECTING AND TRACKING A FEATURE OF A WEB OF PACKAGING...

APPARATUS AND METHOD FOR CONTROLLING EDGE RING VARIATION

METHOD AND SYSTEM FOR MONITORING THE FILM THICKNESS OF A LUBRICANT...

Electrode Assembly Comprising Anode Sheet and Anode Having Improved...

CAPACITANCE-BASED QUALITY MONITORING AND CONTROL IN BATTERY MANUFAC...

WAFER TEMPERATURE MEASUREMENT IN AN ION IMPLANTATION SYSTEM

CIRCUITS AND METHODS TO CALIBRATE MIRROR DISPLACEMENT

SYSTEMS AND METHODS FOR DETECTING ANTIMICROBIAL SURFACE COATINGS

Device and Method for Measuring Thickness of Dielectric Layer in Ci...

DETERMINING PLASTIC OR CELLULOSE LEVELS IN COMPOSITES

Thickness Detection Device, Method and System

THICKNESS MEASURING DEVICE

MEASURING DEVICE AND METHOD OF OBTAINING THICKNESS OF SHEATH

METHOD FOR CALCULATING CAPACITANCE AND METHOD FOR CALCULATING THICK...

APPARATUS AND METHOD FOR CONTROLLING EDGE RING VARIATION

Size Detection

Capacitance Sensor in a Battery

METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING

METHODS PROVIDING ENHANCED MATERIAL THICKNESS SENSING WITH CAPACITI...

Device and Method for Detecting Film Thickness

PROBE SYSTEMS AND METHODS FOR CALIBRATING CAPACITIVE HEIGHT SENSING...

METHOD FOR OBTAINING A HEIGHT OF A MATERIAL STACKED IN A COKE OVEN

VACUUM PUMP, MAIN SENSOR, AND THREAD GROOVE STATOR