using compression techniques

Industry

CPC
G11C29/40

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/40using compression techniques

Industries

Patents Grantslast 30 patents

Information Patent Grant
Test systems configured to perform test mode operations for multipl...
- Patent number 12,159,681
- Issue date Dec 3, 2024
- SK hynix Inc.
- Sang Ah Hyun
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory system with secure detection of virgin memory c...
- Patent number 12,154,643
- Issue date Nov 26, 2024
- NXP B.V.
- Soenke Ostertun
- G11 - INFORMATION STORAGE
Information Patent Grant
Detect whether die or channel is defective to confirm temperature data
- Patent number 12,148,495
- Issue date Nov 19, 2024
- Micron Technology, Inc.
- Venkata Naga Lakshman Pasala
- G11 - INFORMATION STORAGE
Information Patent Grant
Error correction in a memory device having an error correction code...
- Patent number 12,142,333
- Issue date Nov 12, 2024
- Micron Technology, Inc.
- Mustafa N. Kaynak
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan chain compression for testing memory of a system on a chip
- Patent number 12,112,818
- Issue date Oct 8, 2024
- Synopsys, Inc.
- Harold Pilo
- G11 - INFORMATION STORAGE
Information Patent Grant
ECC buffer reduction in a memory device
- Patent number 12,040,033
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Amit Berman
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in memory repair with repair code compression
- Patent number 12,033,711
- Issue date Jul 9, 2024
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage device for generating identity code and identity code gener...
- Patent number 11,984,166
- Issue date May 14, 2024
- Macronix International Co., Ltd.
- Yu-Hsuan Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for processing memory repair information
- Patent number 11,961,576
- Issue date Apr 16, 2024
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device virtual blocks using half good blocks
- Patent number 11,776,655
- Issue date Oct 3, 2023
- Micron Technology, Inc.
- Sri Rama Namala
- G11 - INFORMATION STORAGE
Information Patent Grant
ECC buffer reduction in a memory device
- Patent number 11,636,912
- Issue date Apr 25, 2023
- Samsung Electronics Co., Ltd.
- Amit Berman
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in memory repair with repair code compression
- Patent number 11,631,472
- Issue date Apr 18, 2023
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Detect whether die or channel is defective to confirm temperature data
- Patent number 11,621,049
- Issue date Apr 4, 2023
- Micron Technology, Inc.
- Venkata Naga Lakshman Pasala
- G11 - INFORMATION STORAGE
Information Patent Grant
Remapping bad blocks in a memory sub-system
- Patent number 11,605,439
- Issue date Mar 14, 2023
- Micron Technology, Inc.
- Amit Bhardwaj
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device virtual blocks using half good blocks
- Patent number 11,475,974
- Issue date Oct 18, 2022
- Micron Technology, Inc.
- Sri Rama Namala
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system that includes a NAND flash memory and a memory contro...
- Patent number 11,424,002
- Issue date Aug 23, 2022
- Kioxia Corporation
- Naomi Takeda
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 11,295,829
- Issue date Apr 5, 2022
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 10,971,243
- Issue date Apr 6, 2021
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Secure device state apparatus and method and lifecycle management
- Patent number 10,872,154
- Issue date Dec 22, 2020
- Google LLC
- Marius Schilder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for evaluating and optimizing a signaling system
- Patent number 10,855,413
- Issue date Dec 1, 2020
- RAMBUS INC.
- Jared Zerbe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Software-based self-test and diagnosis using on-chip memory
- Patent number 10,845,416
- Issue date Nov 24, 2020
- Duke University
- Sergej Deutsch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Software-based self-test and diagnosis using on-chip memory
- Patent number 10,788,532
- Issue date Sep 29, 2020
- Duke University
- Sergej Deutsch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 10,692,584
- Issue date Jun 23, 2020
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and system including the same
- Patent number 10,650,908
- Issue date May 12, 2020
- SK hynix Inc.
- Young Mok Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Raid data loss prevention
- Patent number 10,635,537
- Issue date Apr 28, 2020
- International Business Machines Corporation
- Matthew G. Borlick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory test apparatus
- Patent number 10,636,509
- Issue date Apr 28, 2020
- TOSHIBA MEMORY CORPORATION
- Tetsuharu Kojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing content addressable memory and random access memory
- Patent number 10,593,420
- Issue date Mar 17, 2020
- International Business Machines Corporation
- Harry Barowski
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for logically removing defective pages in non-...
- Patent number 10,593,421
- Issue date Mar 17, 2020
- CNEX Labs, Inc.
- Yiren Ronnie Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 10,553,302
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and diagnosis method thereof
- Patent number 10,504,609
- Issue date Dec 10, 2019
- Renesas Electronics Corporation
- Yoichi Maeda
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION
- Publication number 20240321378
- Publication date Sep 26, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan VARADARAJAN
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE FOR GENERATING IDENTITY CODE AND IDENTITY CODE GENER...
- Publication number 20240242767
- Publication date Jul 18, 2024
- Macronix International Co., Ltd.
- Yu-Hsuan LIN
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY SYSTEM WITH SECURE DETECTION OF VIRGIN MEMORY C...
- Publication number 20240203518
- Publication date Jun 20, 2024
- NXP B.V.
- Soenke Ostertun
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION
- Publication number 20230253062
- Publication date Aug 10, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan VARADARAJAN
- G11 - INFORMATION STORAGE
Information Patent Application
ECC BUFFER REDUCTION IN A MEMORY DEVICE
- Publication number 20230238074
- Publication date Jul 27, 2023
- Samsung Electronics Co., Ltd.
- AMIT BERMAN
- G11 - INFORMATION STORAGE
Information Patent Application
DETECT WHETHER DIE OR CHANNEL IS DEFECTIVE TO CONFIRM TEMPERATURE DATA
- Publication number 20230207042
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Venkata Naga Lakshman Pasala
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE VIRTUAL BLOCKS USING HALF GOOD BLOCKS
- Publication number 20230033870
- Publication date Feb 2, 2023
- Micron Technology, Inc.
- Sri Rama Namala
- G11 - INFORMATION STORAGE
Information Patent Application
SCAN CHAIN COMPRESSION FOR TESTING MEMORY OF A SYSTEM ON A CHIP
- Publication number 20230005562
- Publication date Jan 5, 2023
- Synopsys, Inc.
- Harold PILO
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE FOR GENERATING IDENTITY CODE AND IDENTITY CODE GENER...
- Publication number 20220359016
- Publication date Nov 10, 2022
- Macronix International Co., Ltd.
- Yu-Hsuan LIN
- G11 - INFORMATION STORAGE
Information Patent Application
REMAPPING BAD BLOCKS IN A MEMORY SUB-SYSTEM
- Publication number 20220319622
- Publication date Oct 6, 2022
- Micron Technology, Inc.
- Amit Bhardwaj
- G11 - INFORMATION STORAGE
Information Patent Application
ECC BUFFER REDUCTION IN A MEMORY DEVICE
- Publication number 20220319623
- Publication date Oct 6, 2022
- Samsung Electronics Co., Ltd.
- AMIT BERMAN
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING MEMORY REPAIR INFORMATION
- Publication number 20220215896
- Publication date Jul 7, 2022
- Siemens Industry Software Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE VIRTUAL BLOCKS USING HALF GOOD BLOCKS
- Publication number 20220199189
- Publication date Jun 23, 2022
- Micron Technology, Inc.
- Sri Rama Namala
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION
- Publication number 20220199188
- Publication date Jun 23, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan VARADARAJAN
- G11 - INFORMATION STORAGE
Information Patent Application
DETECT WHETHER DIE OR CHANNEL IS DEFECTIVE TO CONFIRM TEMPERATURE DATA
- Publication number 20220101940
- Publication date Mar 31, 2022
- Micron Technology, Inc.
- Venkata Naga Lakshman Pasala
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM
- Publication number 20220093198
- Publication date Mar 24, 2022
- KIOXIA Corporation
- Naomi TAKEDA
- G11 - INFORMATION STORAGE
Information Patent Application
TEST CIRCUIT AND MEMORY CHIP USING TEST CIRCUIT
- Publication number 20210174890
- Publication date Jun 10, 2021
- Changxin Memory Technologies, Inc.
- Jia WANG
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20200075119
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20190378587
- Publication date Dec 12, 2019
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
Secure Device State Apparatus and Method and Lifecycle Management
- Publication number 20190163909
- Publication date May 30, 2019
- Google LLC
- Marius SCHILDER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY TEST APPARATUS
- Publication number 20180240533
- Publication date Aug 23, 2018
- Toshiba Memory Corporation
- Tetsuharu KOJIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING CONTENT ADDRESSABLE MEMORY AND RANDOM ACCESS MEMORY
- Publication number 20180174666
- Publication date Jun 21, 2018
- International Business Machines Corporation
- Harry Barowski
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING CONTENT ADDRESSABLE MEMORY AND RANDOM ACCESS MEMORY
- Publication number 20180151248
- Publication date May 31, 2018
- International Business Machines Corporation
- Harry Barowski
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING CONTENT ADDRESSABLE MEMORY AND RANDOM ACCESS MEMORY
- Publication number 20180114585
- Publication date Apr 26, 2018
- International Business Machines Corporation
- Harry Barowski
- G11 - INFORMATION STORAGE
Information Patent Application
SOFTWARE-BASED SELF-TEST AND DIAGNOSIS USING ON-CHIP MEMORY
- Publication number 20180095128
- Publication date Apr 5, 2018
- DUKE UNIVERSITY
- SERGEJ DEUTSCH
- G01 - MEASURING TESTING
Information Patent Application
SOFTWARE-BASED SELF-TEST AND DIAGNOSIS USING ON-CHIP MEMORY
- Publication number 20180095129
- Publication date Apr 5, 2018
- DUKE UNIVERSITY
- SERGEJ DEUTSCH
- G01 - MEASURING TESTING
Information Patent Application
RAID DATA LOSS PREVENTION
- Publication number 20180067809
- Publication date Mar 8, 2018
- International Business Machines Corporation
- Matthew G. Borlick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20180061509
- Publication date Mar 1, 2018
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND WEAK CELL DETECTION METHOD THEREOF
- Publication number 20170337986
- Publication date Nov 23, 2017
- SK HYNIX INC.
- Youk-Hee KIM
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUIT
- Publication number 20160365157
- Publication date Dec 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- WEIWEI SANG
- G01 - MEASURING TESTING

using compression techniques

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test systems configured to perform test mode operations for multipl...

Non-volatile memory system with secure detection of virgin memory c...

Detect whether die or channel is defective to confirm temperature data

Error correction in a memory device having an error correction code...

Scan chain compression for testing memory of a system on a chip

ECC buffer reduction in a memory device

Built-in memory repair with repair code compression

Storage device for generating identity code and identity code gener...

Method and apparatus for processing memory repair information

Memory device virtual blocks using half good blocks

ECC buffer reduction in a memory device

Built-in memory repair with repair code compression

Detect whether die or channel is defective to confirm temperature data

Remapping bad blocks in a memory sub-system

Memory device virtual blocks using half good blocks

Memory system that includes a NAND flash memory and a memory contro...

Built-in self-test (BIST) engine configured to store a per pattern...

Built-in self-test (BIST) engine configured to store a per pattern...

Secure device state apparatus and method and lifecycle management

Method and apparatus for evaluating and optimizing a signaling system

Software-based self-test and diagnosis using on-chip memory

Software-based self-test and diagnosis using on-chip memory

Built-in self-test (BIST) engine configured to store a per pattern...

Semiconductor device and system including the same

Raid data loss prevention

Memory test apparatus

Testing content addressable memory and random access memory

Method and apparatus for logically removing defective pages in non-...

Built-in self-test (BIST) engine configured to store a per pattern...

Semiconductor device and diagnosis method thereof

Patents Applicationslast 30 patents

BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION

STORAGE DEVICE FOR GENERATING IDENTITY CODE AND IDENTITY CODE GENER...

NON-VOLATILE MEMORY SYSTEM WITH SECURE DETECTION OF VIRGIN MEMORY C...

BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION

ECC BUFFER REDUCTION IN A MEMORY DEVICE

DETECT WHETHER DIE OR CHANNEL IS DEFECTIVE TO CONFIRM TEMPERATURE DATA

MEMORY DEVICE VIRTUAL BLOCKS USING HALF GOOD BLOCKS

SCAN CHAIN COMPRESSION FOR TESTING MEMORY OF A SYSTEM ON A CHIP

STORAGE DEVICE FOR GENERATING IDENTITY CODE AND IDENTITY CODE GENER...

REMAPPING BAD BLOCKS IN A MEMORY SUB-SYSTEM

ECC BUFFER REDUCTION IN A MEMORY DEVICE

METHOD AND APPARATUS FOR PROCESSING MEMORY REPAIR INFORMATION

MEMORY DEVICE VIRTUAL BLOCKS USING HALF GOOD BLOCKS

BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION

DETECT WHETHER DIE OR CHANNEL IS DEFECTIVE TO CONFIRM TEMPERATURE DATA

MEMORY SYSTEM

TEST CIRCUIT AND MEMORY CHIP USING TEST CIRCUIT

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

Secure Device State Apparatus and Method and Lifecycle Management

MEMORY TEST APPARATUS

TESTING CONTENT ADDRESSABLE MEMORY AND RANDOM ACCESS MEMORY

TESTING CONTENT ADDRESSABLE MEMORY AND RANDOM ACCESS MEMORY

TESTING CONTENT ADDRESSABLE MEMORY AND RANDOM ACCESS MEMORY

SOFTWARE-BASED SELF-TEST AND DIAGNOSIS USING ON-CHIP MEMORY

SOFTWARE-BASED SELF-TEST AND DIAGNOSIS USING ON-CHIP MEMORY

RAID DATA LOSS PREVENTION

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

SEMICONDUCTOR MEMORY DEVICE AND WEAK CELL DETECTION METHOD THEREOF

METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUIT