using crossed electric and magnetic fields perpendicular to the beam

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CPC
H01J49/466

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/466using crossed electric and magnetic fields perpendicular to the beam

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Patents Grantslast 30 patents

Information Patent Grant
Extraction system for charged secondary particles for use in a mass...
- Patent number 11,101,123
- Issue date Aug 24, 2021
- Luxembourg Institute of Science and Technology (LIST)
- David Dowsett
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution auger electron spectrometer
- Patent number 7,560,691
- Issue date Jul 14, 2009
- KLA-Tencor Technologies Corporation
- Alexander J. Gubbens
- G01 - MEASURING TESTING
Information Patent Grant
Single stage charged particle beam energy width reduction system fo...
- Patent number 7,468,517
- Issue date Dec 23, 2008
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiternruftechnik mbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter for use in a scanning electron microscope or the like
- Patent number 6,593,578
- Issue date Jul 15, 2003
- Schlumberger Technologies, Inc.
- Paul J. Duval
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter
- Patent number 6,452,169
- Issue date Sep 17, 2002
- Technische Universiteit Delft
- Hindrik Willem Mook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filtered focused ion beam column
- Patent number 6,410,924
- Issue date Jun 25, 2002
- Schlumberger Technologies, Inc.
- Li Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter apparatus with hyperbolic surfaces
- Patent number 5,444,243
- Issue date Aug 22, 1995
- Hitachi, Ltd.
- Teruo Kohhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron imaging band pass analyser for a photoelectron spectromicr...
- Patent number 5,321,262
- Issue date Jun 14, 1994
- Kratos Analytical Limited
- David W. Turner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion scattering spectrometer
- Patent number 5,182,453
- Issue date Jan 26, 1993
- Shimadzu Corporation
- Shigeki Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Electron imaging band pass analyser for a photoelectron spectromicr...
- Patent number 5,166,519
- Issue date Nov 24, 1992
- David W. Turner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter
- Patent number 4,019,989
- Issue date Apr 26, 1977
- U.S. Philips Corporation
- Nicolaas Hazewindus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3585383
- Patent number 3,585,383
- Issue date Jun 15, 1971
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3532918
- Patent number 3,532,918
- Issue date Oct 6, 1970
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3499142
- Patent number 3,499,142
- Issue date Mar 3, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3096438
- Patent number 3,096,438
- Issue date Jul 2, 1963
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3087056
- Patent number 3,087,056
- Issue date Apr 23, 1963
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Single stage charged particle beam energy width reduction system fo...
- Publication number 20070158561
- Publication date Jul 12, 2007
- Jurgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS

using crossed electric and magnetic fields perpendicular to the beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Extraction system for charged secondary particles for use in a mass...

High-resolution auger electron spectrometer

Single stage charged particle beam energy width reduction system fo...

Wien filter for use in a scanning electron microscope or the like

Wien filter

Energy filtered focused ion beam column

Wien filter apparatus with hyperbolic surfaces

Electron imaging band pass analyser for a photoelectron spectromicr...

Ion scattering spectrometer

Electron imaging band pass analyser for a photoelectron spectromicr...

Wien filter

3585383

3532918

3499142

3096438

3087056

Patents Applicationslast 30 patents

Single stage charged particle beam energy width reduction system fo...