using domain transforms

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CPC
H03M1/1085

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Parent Industries

HELECTRICITY H03Electronic circuits H03MCODING DECODING CODE CONVERSION IN GENERAL H03M1/00Analogue/digital conversion Digital/analogue conversion

Current Industry

H03M1/1085using domain transforms

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Failure determination device, control device, and failure determina...
- Patent number 11,909,412
- Issue date Feb 20, 2024
- Honda Motor Co., Ltd.
- Yasunari Sato
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
System and method of performing discrete frequency transform for re...
- Patent number 11,601,133
- Issue date Mar 7, 2023
- Silicon Laboratories Inc.
- Anant Verma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transform domain analytics-based channel design
- Patent number 11,218,159
- Issue date Jan 4, 2022
- Seagate Technology LLC
- Mehmet Fatih Erden
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Transform domain analytics-based channel design
- Patent number 11,211,939
- Issue date Dec 28, 2021
- Seagate Technology LLC
- Mehmet Fatih Erden
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digital-to-analog converter waveform generator
- Patent number 11,018,681
- Issue date May 25, 2021
- Analog Devices International Unlimited Company
- David James Hamilton
- G01 - MEASURING TESTING
Information Patent Grant
Transform domain analytics-based channel design
- Patent number 10,931,293
- Issue date Feb 23, 2021
- Seagate Technology LLC
- Mehmet Fatih Erden
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method for measuring frequency of signal
- Patent number 10,931,294
- Issue date Feb 23, 2021
- Agency for Defense Development
- Sang Won Kim
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus to determine non linearity in analog-to-digit...
- Patent number 10,897,262
- Issue date Jan 19, 2021
- Texas Instruments Incorporated
- Akhilesh Kesavanunnithan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Low noise and low distortion test method and system for analog-to-d...
- Patent number 10,892,768
- Issue date Jan 12, 2021
- Texas Instruments Incorporated
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and system for spectral leakage removal in DAC testing
- Patent number 10,630,306
- Issue date Apr 21, 2020
- Advantest Corporation
- Ming Lu
- G01 - MEASURING TESTING
Information Patent Grant
Equalization of sub-DAC frequency response misalignments in time-in...
- Patent number 10,355,706
- Issue date Jul 16, 2019
- Guzik Technical Enterprises
- Anatoli B. Stein
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Frequency-domain ADC flash calibration
- Patent number 10,056,914
- Issue date Aug 21, 2018
- Analog Devices Global
- Zhao Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digital-to-analog converter waveform generator
- Patent number 9,998,133
- Issue date Jun 12, 2018
- Analog Devices, Inc.
- David Hamilton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method of self-healing data converters
- Patent number 9,813,075
- Issue date Nov 7, 2017
- Yuan-Ju Chao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Built in self-test
- Patent number 9,705,523
- Issue date Jul 11, 2017
- Ateeda Limited
- David Hamilton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method of self-healing data converters
- Patent number 9,667,263
- Issue date May 30, 2017
- Yuan-Ju Chao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Built in self-test
- Patent number 9,246,503
- Issue date Jan 26, 2016
- ATEEDA LTD.
- David Hamilton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and device for angular measurement with compensation of non-...
- Patent number 9,207,080
- Issue date Dec 8, 2015
- Sagem Defense Securite
- Vincent Ragot
- G01 - MEASURING TESTING
Information Patent Grant
Close-in tones
- Patent number 9,160,358
- Issue date Oct 13, 2015
- Texas Instruments Incorporated
- Sthanunathan Ramakrishnan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing system
- Patent number 8,386,209
- Issue date Feb 26, 2013
- University Of Limerick
- Brendan Mullane
- G01 - MEASURING TESTING
Information Patent Grant
Residual Fourier-padding interpolation for instrumentation and meas...
- Patent number 8,046,396
- Issue date Oct 25, 2011
- Teradyne, Inc.
- Fang Xu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Fast fourier transformation-based analog-to-digital converter calib...
- Patent number 7,864,089
- Issue date Jan 4, 2011
- National Chung Cheng University
- Shuenn-Yuh Lee
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test apparatus for digitized test responses, method for testing sem...
- Patent number 7,720,645
- Issue date May 18, 2010
- Infineon Technologies AG
- Stephane Kirmser
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating a digital signal that is representative of mat...
- Patent number 7,425,908
- Issue date Sep 16, 2008
- Thales
- Patrick Gremillet
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Time-interleaved samplers
- Patent number 7,049,984
- Issue date May 23, 2006
- BAE Systems plc
- John M Wood
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
High-speed DAC linearity measurement
- Patent number 7,009,538
- Issue date Mar 7, 2006
- Tektronix, Inc.
- Kevin M. Ferguson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for the recovery of signals acquired by an int...
- Patent number 6,819,279
- Issue date Nov 16, 2004
- LeCroy Corporation
- Peter J. Pupalaikis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Evaluation system for analog-digital or digital-analog converter
- Patent number 6,476,742
- Issue date Nov 5, 2002
- Advantest Corporation
- Takahiro Yamaguchi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Evaluation system for analog-digital or digital-analog converter
- Patent number 6,326,909
- Issue date Dec 4, 2001
- Advantest Corporation
- Takahiro Yamaguchi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Evaluation system and method for AD converter
- Patent number 6,177,894
- Issue date Jan 23, 2001
- Advantest Corporation
- Takahiro Yamaguchi
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE AND WIDEBAND REAL-TIME SPECTRUM A...
- Publication number 20240313795
- Publication date Sep 19, 2024
- Tektronix, Inc.
- Kan TAN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM AND METHOD OF PERFORMING DISCRETE FREQUENCY TRANSFORM FOR RE...
- Publication number 20220131548
- Publication date Apr 28, 2022
- Anant Verma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRANSFORM DOMAIN ANALYTICS-BASED CHANNEL DESIGN
- Publication number 20210203342
- Publication date Jul 1, 2021
- SEAGATE TECHNOLOGY LLC
- Mehmet Fatih Erden
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TRANSFORM DOMAIN ANALYTICS-BASED CHANNEL DESIGN
- Publication number 20210203341
- Publication date Jul 1, 2021
- SEAGATE TECHNOLOGY LLC
- Mehmet Fatih Erden
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR MEASURING FREQUENCY OF SIGNAL
- Publication number 20210013897
- Publication date Jan 14, 2021
- AGENCY FOR DEFENSE DEVELOPMENT
- Sang Won KIM
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LOW NOISE AND LOW DISTORTION TEST METHOD AND SYSTEM FOR ANALOG-TO-D...
- Publication number 20190081634
- Publication date Mar 14, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS AND APPARATUS TO DETERMINE NON-LINEARITY IN ANALOG-TO-DIGIT...
- Publication number 20180269889
- Publication date Sep 20, 2018
- TEXAS INSTRUMENTS INCORPORATED
- AKHILESH KESAVANUNNITHAN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BUILT IN SELF-TEST
- Publication number 20170324422
- Publication date Nov 9, 2017
- Analog Devices, Inc.
- David Hamilton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BUILT IN SELF-TEST
- Publication number 20160218730
- Publication date Jul 28, 2016
- Ateeda Limited
- David Hamilton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CLOSE-IN TONES
- Publication number 20150263747
- Publication date Sep 17, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Sthanunathan Ramakrishnan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND DEVICE FOR ANGULAR MEASUREMENT WITH COMPENSATION OF NON-...
- Publication number 20120324999
- Publication date Dec 27, 2012
- Vincent Ragot
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM
- Publication number 20110098964
- Publication date Apr 28, 2011
- Brendan Mullane
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
FAST FOURIER TRANSFORMATION-BASED ANALOG-TO-DIGITAL CONVERTER CALIB...
- Publication number 20100103007
- Publication date Apr 29, 2010
- Shuenn-Yuh LEE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Residual Fourier-Padding Interpolation for Instrumentation and Meas...
- Publication number 20080243983
- Publication date Oct 2, 2008
- Fang Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Generating a Digital Signal that is Representative of Mat...
- Publication number 20070247344
- Publication date Oct 25, 2007
- Patrick Gremillet
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Test apparatus for digitized test responses, method for testing sem...
- Publication number 20070089010
- Publication date Apr 19, 2007
- Stephane Kirmser
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Test method and test apparatus for digital-analog converter
- Publication number 20060116834
- Publication date Jun 1, 2006
- Advantest Corporation
- Shigeki Orisaka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Time-interleaved samplers
- Publication number 20050219091
- Publication date Oct 6, 2005
- John Mi. Wood
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR THE RECOVERY OF SIGNALS ACQUIRED BY AN INT...
- Publication number 20040174284
- Publication date Sep 9, 2004
- Peter J. Pupalaikis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and apparatus for use in DSP-based testing
- Publication number 20040161028
- Publication date Aug 19, 2004
- Gordon Roberts
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Evaluation system for analog-digital or digital-analog converter
- Publication number 20020005794
- Publication date Jan 17, 2002
- Takahiro Yamaguchi
- H03 - BASIC ELECTRONIC CIRCUITRY

using domain transforms

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Failure determination device, control device, and failure determina...

System and method of performing discrete frequency transform for re...

Transform domain analytics-based channel design

Transform domain analytics-based channel design

Digital-to-analog converter waveform generator

Transform domain analytics-based channel design

Apparatus and method for measuring frequency of signal

Methods and apparatus to determine non linearity in analog-to-digit...

Low noise and low distortion test method and system for analog-to-d...

Method and system for spectral leakage removal in DAC testing

Equalization of sub-DAC frequency response misalignments in time-in...

Frequency-domain ADC flash calibration

Digital-to-analog converter waveform generator

Apparatus and method of self-healing data converters

Built in self-test

Apparatus and method of self-healing data converters

Built in self-test

Method and device for angular measurement with compensation of non-...

Close-in tones

Testing system

Residual Fourier-padding interpolation for instrumentation and meas...

Fast fourier transformation-based analog-to-digital converter calib...

Test apparatus for digitized test responses, method for testing sem...

Method of generating a digital signal that is representative of mat...

Time-interleaved samplers

High-speed DAC linearity measurement

Method and apparatus for the recovery of signals acquired by an int...

Evaluation system for analog-digital or digital-analog converter

Evaluation system for analog-digital or digital-analog converter

Evaluation system and method for AD converter

Patents Applicationslast 30 patents

REAL-EQUIVALENT-TIME OSCILLOSCOPE AND WIDEBAND REAL-TIME SPECTRUM A...

SYSTEM AND METHOD OF PERFORMING DISCRETE FREQUENCY TRANSFORM FOR RE...

TRANSFORM DOMAIN ANALYTICS-BASED CHANNEL DESIGN

TRANSFORM DOMAIN ANALYTICS-BASED CHANNEL DESIGN

APPARATUS AND METHOD FOR MEASURING FREQUENCY OF SIGNAL

LOW NOISE AND LOW DISTORTION TEST METHOD AND SYSTEM FOR ANALOG-TO-D...

METHODS AND APPARATUS TO DETERMINE NON-LINEARITY IN ANALOG-TO-DIGIT...

BUILT IN SELF-TEST

BUILT IN SELF-TEST

CLOSE-IN TONES

METHOD AND DEVICE FOR ANGULAR MEASUREMENT WITH COMPENSATION OF NON-...

TESTING SYSTEM

FAST FOURIER TRANSFORMATION-BASED ANALOG-TO-DIGITAL CONVERTER CALIB...

Residual Fourier-Padding Interpolation for Instrumentation and Meas...

Method of Generating a Digital Signal that is Representative of Mat...

Test apparatus for digitized test responses, method for testing sem...

Test method and test apparatus for digital-analog converter

Time-interleaved samplers

METHOD AND APPARATUS FOR THE RECOVERY OF SIGNALS ACQUIRED BY AN INT...

Method and apparatus for use in DSP-based testing

Evaluation system for analog-digital or digital-analog converter