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using electrical contact making or breaking devices

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  • G01K5/465
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Parent Industries

GPHYSICS G01Measuring instruments G01KMEASURING TEMPERATURE MEASURING QUANTITY OF HEAT THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR G01K5/00Measuring temperature based on the expansion or contraction of a material

Current Industry

G01K5/465using electrical contact making or breaking devices
Industries

Patents Grantslast 30 patents

  • Information Patent Grant

    Temperature indicator
    • Patent number 11,994,434
    • Issue date May 28, 2024
    • Shock Watch, Inc.
    • Anthony N. Fonk
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pressure-biased, temperature sensor
    • Patent number 4,706,063
    • Issue date Nov 10, 1987
    • Borg-Warner Corporation
    • Robert R. Kelly
    • G08 - SIGNALLING
  • Information Patent Grant

    Pressure-biased, temperature sensor
    • Patent number 4,652,854
    • Issue date Mar 24, 1987
    • Borg-Warner Corporation
    • Robert R. Kelly
    • G08 - SIGNALLING
  • Information Patent Grant

    3680022
    • Patent number 3,680,022
    • Issue date Jul 25, 1972
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3529770
    • Patent number 3,529,770
    • Issue date Sep 22, 1970
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3391367
    • Patent number 3,391,367
    • Issue date Jul 2, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3180956
    • Patent number 3,180,956
    • Issue date Apr 27, 1965
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3159033
    • Patent number 3,159,033
    • Issue date Dec 1, 1964
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3153847
    • Patent number 3,153,847
    • Issue date Oct 27, 1964
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3153846
    • Patent number 3,153,846
    • Issue date Oct 27, 1964
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3132518
    • Patent number 3,132,518
    • Issue date May 12, 1964
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3131275
    • Patent number 3,131,275
    • Issue date Apr 28, 1964
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3112382
    • Patent number 3,112,382
    • Issue date Nov 26, 1963
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3064245
    • Patent number 3,064,245
    • Issue date Nov 13, 1962
    • B82 - NANO-TECHNOLOGY
  • Information Patent Grant

    2944423
    • Patent number 2,944,423
    • Issue date Jul 12, 1960
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2752457
    • Patent number 2,752,457
    • Issue date Jun 26, 1956
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2745925
    • Patent number 2,745,925
    • Issue date May 15, 1956
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2526679
    • Patent number 2,526,679
    • Issue date Oct 24, 1950
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2497025
    • Patent number 2,497,025
    • Issue date Feb 7, 1950
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2471840
    • Patent number 2,471,840
    • Issue date May 31, 1949
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2429572
    • Patent number 2,429,572
    • Issue date Oct 21, 1947
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2196442
    • Patent number 2,196,442
    • Issue date Apr 9, 1940
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2196443
    • Patent number 2,196,443
    • Issue date Apr 9, 1940
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1809898
    • Patent number 1,809,898
    • Issue date Jun 16, 1931
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    1731937
    • Patent number 1,731,937
    • Issue date Oct 15, 1929
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1704370
    • Patent number 1,704,370
    • Issue date Mar 5, 1929
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1563279
    • Patent number 1,563,279
    • Issue date Nov 24, 1925
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    TEMPERATURE INDICATOR
    • Publication number 20240310221
    • Publication date Sep 19, 2024
    • ShockWatch, Inc.
    • Anthony N. Fonk
    • H01 - BASIC ELECTRIC ELEMENTS