using electro-optic elements

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CPC
G01R13/347

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

Current Industry

G01R13/347using electro-optic elements

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Photocurrent scanning system
- Patent number 11,190,132
- Issue date Nov 30, 2021
- Tsinghua University
- Ke Zhang
- G01 - MEASURING TESTING
Information Patent Grant
High input impedance electro-optic sensor
- Patent number 10,684,311
- Issue date Jun 16, 2020
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Integration of current measurement in wiring structure of an electr...
- Patent number 9,140,735
- Issue date Sep 22, 2015
- Infineon Technologies AG
- Martin Gruber
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Scanning temporal ultrafast delay and methods and apparatuses therefor
- Patent number 8,630,321
- Issue date Jan 14, 2014
- IMRA America, Inc.
- Gregg D. Sucha
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring terahertz wave and apparatus therefor
- Patent number 8,513,940
- Issue date Aug 20, 2013
- Canon Kabushiki Kaisha
- Takeaki Itsuji
- G01 - MEASURING TESTING
Information Patent Grant
Scanning temporal ultrafast delay and methods and apparatuses therefor
- Patent number 8,265,105
- Issue date Sep 11, 2012
- IMRA America, Inc.
- Gregg D. Sucha
- G01 - MEASURING TESTING
Information Patent Grant
Optical switching method and optical switch
- Patent number 7,978,319
- Issue date Jul 12, 2011
- Fujitsu Limited
- Ryou Okabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device for measuring the profile of very short single pulses
- Patent number 7,728,981
- Issue date Jun 1, 2010
- Commissariat a l'Energie Atomique
- Alain Jolly
- G01 - MEASURING TESTING
Information Patent Grant
Sampling of optical signals
- Patent number 7,705,993
- Issue date Apr 27, 2010
- Telefonaktiebolaget LM Ericsson (publ)
- Antonella Bogoni
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Scanning temporal ultrafast delay methods and apparatuses therefor
- Patent number 7,580,432
- Issue date Aug 25, 2009
- IMRA America, Inc.
- Gregg D. Sucha
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam generating apparatus and optical sampling apparatus u...
- Patent number 7,307,432
- Issue date Dec 11, 2007
- Yokogawa Electric Corporation
- Kentaro Tezuka
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition probing and voltage measurement systems using an...
- Patent number 7,221,813
- Issue date May 22, 2007
- Tektronix, Inc.
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Grant
Photoconductive-sampling voltage measurement
- Patent number 6,737,853
- Issue date May 18, 2004
- NPTest, LLC
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
Electrical sampler for non-simultaneous sampling
- Patent number 6,680,606
- Issue date Jan 20, 2004
- Commissariat a l'Energie Atomique
- Anne Ghis
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electromagnetic-field imager with optical-fiber-based elec...
- Patent number 6,677,769
- Issue date Jan 13, 2004
- The Regents of the University of Michigan
- John Firman Whitaker
- G01 - MEASURING TESTING
Information Patent Grant
Sampling element controlled by photoconductive switch-generated sam...
- Patent number 6,614,214
- Issue date Sep 2, 2003
- Agilent Technologies, Inc.
- Akira Mizuhara
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling oscilloscope
- Patent number 6,567,760
- Issue date May 20, 2003
- Ando Electric Co., Ltd.
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe
- Patent number 6,410,906
- Issue date Jun 25, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Waveform measuring apparatus
- Patent number 6,407,686
- Issue date Jun 18, 2002
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Grant
Scanning temporal ultrafast delay methods and apparatuses therefor
- Patent number 6,396,856
- Issue date May 28, 2002
- IRMA America, Inc.
- Gregg D. Sucha
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling prober
- Patent number 6,388,454
- Issue date May 14, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Light receiving circuit for use in electro-optic sampling oscilloscope
- Patent number 6,384,590
- Issue date May 7, 2002
- Ando Electric Co., Ltd.
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical probe for oscilloscope measuring signal waveform
- Patent number 6,369,562
- Issue date Apr 9, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electrooptic probe
- Patent number 6,348,787
- Issue date Feb 19, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Device for analyzing a single pulse with variable step
- Patent number 6,320,367
- Issue date Nov 20, 2001
- Commissariat a l'Energie Atomique
- Marc Cuzin
- G01 - MEASURING TESTING
Information Patent Grant
Timing generation circuit for electro-optic sampling oscilloscope
- Patent number 6,310,507
- Issue date Oct 30, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical sampler
- Patent number 6,303,926
- Issue date Oct 16, 2001
- Advantest Corporation
- Toshiyuki Okayasu
- G01 - MEASURING TESTING
Information Patent Grant
Probe for electro-optic sampling oscilloscope
- Patent number 6,288,531
- Issue date Sep 11, 2001
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Timing generation circuit for an electro-optic oscilloscope
- Patent number 6,288,529
- Issue date Sep 11, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electrooptic voltage waveform measuring method employing light samp...
- Patent number 6,259,244
- Issue date Jul 10, 2001
- Fujitsu Limited
- Shin-ichi Wakana
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TERMINATION TRIGGER PICK-OFF FOR REMOTE HEAD SAMPLER
- Publication number 20230213556
- Publication date Jul 6, 2023
- Tektronix, Inc.
- Pavel R. Zivny
- G01 - MEASURING TESTING
Information Patent Application
PHOTOCURRENT SCANNING SYSTEM
- Publication number 20190245484
- Publication date Aug 8, 2019
- TSINGHUA UNIVERSITY
- KE ZHANG
- G01 - MEASURING TESTING
Information Patent Application
High Input Impedance Electro-Optic Sensor
- Publication number 20180328964
- Publication date Nov 15, 2018
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A CORRELATED WAVEFORM ON A REAL TIME OSCILLO...
- Publication number 20160018443
- Publication date Jan 21, 2016
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
Integration of current measurement in wiring structure of an electr...
- Publication number 20140327458
- Publication date Nov 6, 2014
- Martin GRUBER
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TEMPORAL ULTRAFAST DELAY AND METHODS AND APPARATUSES THEREFOR
- Publication number 20130010818
- Publication date Jan 10, 2013
- IMRA AMERICA, INC.
- Gregg D. SUCHA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING TERAHERTZ WAVE AND APPARATUS THEREFOR
- Publication number 20110285383
- Publication date Nov 24, 2011
- Canon Kabushiki Kaisha
- TAKEAKI ITSUJI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TEMPORAL ULTRAFAST DELAY AND METHODS AND APPARATUSES THEREFOR
- Publication number 20090296749
- Publication date Dec 3, 2009
- IMRA AMERICA, INC.
- Gregg D. Sucha
- G01 - MEASURING TESTING
Information Patent Application
Device For Measuring the Profile of Very Short Single Pulses
- Publication number 20080205883
- Publication date Aug 28, 2008
- COMMISSARIAT A L'ENERGIE ATOMIQUE
- Alain Jolly
- G01 - MEASURING TESTING
Information Patent Application
Sampling of Optical Signals
- Publication number 20080164863
- Publication date Jul 10, 2008
- Antonella Bogoni
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Optical switching method and optical switch
- Publication number 20080151244
- Publication date Jun 26, 2008
- FUJITSU LIMITED
- Ryou Okabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Signal acquisition probing and voltage measurement systems using an...
- Publication number 20050200362
- Publication date Sep 15, 2005
- Christopher P. Yakymyshyn
- G01 - MEASURING TESTING
Information Patent Application
Electron beam generating apparatus and optical sampling apparatus u...
- Publication number 20050134297
- Publication date Jun 23, 2005
- Kentaro Tezuka
- G01 - MEASURING TESTING
Information Patent Application
Photoconductive-sampling voltage measurement
- Publication number 20030076122
- Publication date Apr 24, 2003
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Application
Scanning temporal ultrafast delay methods and apparatuses therefor
- Publication number 20020097761
- Publication date Jul 25, 2002
- IMRA AMERICA, INC.
- Gregg D. Sucha
- G01 - MEASURING TESTING
Information Patent Application
Sampling element controlled by photoconductive switch-generated sam...
- Publication number 20020074982
- Publication date Jun 20, 2002
- Akira Mizuhara
- G01 - MEASURING TESTING
Information Patent Application
Scanning electromagnetic-field imager with optical-fiber-based elec...
- Publication number 20020036491
- Publication date Mar 28, 2002
- John Firman Whitaker
- G01 - MEASURING TESTING
Information Patent Application
Waveform measuring apparatus
- Publication number 20020024458
- Publication date Feb 28, 2002
- Anritsu Corporation
- Akihito Otani
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTICAL PROBE FOR OSCILLOSCOPE MEASURING SIGNAL WAVEFORM
- Publication number 20020011830
- Publication date Jan 31, 2002
- AKISHIGE ITO
- G01 - MEASURING TESTING

using electro-optic elements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Photocurrent scanning system

High input impedance electro-optic sensor

Integration of current measurement in wiring structure of an electr...

Scanning temporal ultrafast delay and methods and apparatuses therefor

Method of measuring terahertz wave and apparatus therefor

Scanning temporal ultrafast delay and methods and apparatuses therefor

Optical switching method and optical switch

Device for measuring the profile of very short single pulses

Sampling of optical signals

Scanning temporal ultrafast delay methods and apparatuses therefor

Electron beam generating apparatus and optical sampling apparatus u...

Signal acquisition probing and voltage measurement systems using an...

Photoconductive-sampling voltage measurement

Electrical sampler for non-simultaneous sampling

Scanning electromagnetic-field imager with optical-fiber-based elec...

Sampling element controlled by photoconductive switch-generated sam...

Electro-optic sampling oscilloscope

Electro-optic probe

Waveform measuring apparatus

Scanning temporal ultrafast delay methods and apparatuses therefor

Electro-optic sampling prober

Light receiving circuit for use in electro-optic sampling oscilloscope

Electro-optical probe for oscilloscope measuring signal waveform

Electrooptic probe

Device for analyzing a single pulse with variable step

Timing generation circuit for electro-optic sampling oscilloscope

Optical sampler

Probe for electro-optic sampling oscilloscope

Timing generation circuit for an electro-optic oscilloscope

Electrooptic voltage waveform measuring method employing light samp...

Patents Applicationslast 30 patents

TERMINATION TRIGGER PICK-OFF FOR REMOTE HEAD SAMPLER

PHOTOCURRENT SCANNING SYSTEM

High Input Impedance Electro-Optic Sensor

METHOD FOR DETERMINING A CORRELATED WAVEFORM ON A REAL TIME OSCILLO...

Integration of current measurement in wiring structure of an electr...

SCANNING TEMPORAL ULTRAFAST DELAY AND METHODS AND APPARATUSES THEREFOR

METHOD OF MEASURING TERAHERTZ WAVE AND APPARATUS THEREFOR

SCANNING TEMPORAL ULTRAFAST DELAY AND METHODS AND APPARATUSES THEREFOR

Device For Measuring the Profile of Very Short Single Pulses

Sampling of Optical Signals

Optical switching method and optical switch

Signal acquisition probing and voltage measurement systems using an...

Electron beam generating apparatus and optical sampling apparatus u...

Photoconductive-sampling voltage measurement

Scanning temporal ultrafast delay methods and apparatuses therefor

Sampling element controlled by photoconductive switch-generated sam...

Scanning electromagnetic-field imager with optical-fiber-based elec...

Waveform measuring apparatus

ELECTRO-OPTICAL PROBE FOR OSCILLOSCOPE MEASURING SIGNAL WAVEFORM