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G01R33/0041
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R33/00
Arrangements or instruments for measuring magnetic variables
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G01R33/0041
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Patents Grants
last 30 patents
Information
Patent Grant
Robust signal path plausibility check for functional safety of a se...
Patent number
12,146,895
Issue date
Nov 19, 2024
Infineon Technologies AG
Johannes Guettinger
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field detection device and magnetic field detection device...
Patent number
12,117,506
Issue date
Oct 15, 2024
TDK Corporation
Takato Fukui
G01 - MEASURING TESTING
Information
Patent Grant
Stray field rejection in magnetic sensors
Patent number
12,078,689
Issue date
Sep 3, 2024
Melexis Technologies SA
Gael Close
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring a magnetic field, associated system and method
Patent number
12,061,245
Issue date
Aug 13, 2024
Centre National de la Recherche Scientifique
Christophe Dolabdjian
G01 - MEASURING TESTING
Information
Patent Grant
Real time monitoring and prediction of motion in MRI
Patent number
12,050,257
Issue date
Jul 30, 2024
Washington University
Nico Dosenbach
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Hall electromotive force signal detection circuit having a differen...
Patent number
11,946,987
Issue date
Apr 2, 2024
Asahi Kasei Microdevices Corporation
Shigeki Okatake
G01 - MEASURING TESTING
Information
Patent Grant
Structure, method, and electronic device for multi-coil handheld ma...
Patent number
11,927,652
Issue date
Mar 12, 2024
Beijing University of Aeronautics and Astronautics
Jie Tian
G01 - MEASURING TESTING
Information
Patent Grant
Processes, apparatuses and system for measuring a measured variable
Patent number
11,921,070
Issue date
Mar 5, 2024
Carl Zeiss AG
Nils Trautmann
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for providing bias current to hall sensor
Patent number
11,914,170
Issue date
Feb 27, 2024
SAMSUNG ELECTRO-MECHANICS CO., LTD.
Yo Sub Moon
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Reduced area magnetic field sensor topology
Patent number
11,892,524
Issue date
Feb 6, 2024
ALLEGRO MICROSYSTEMS, LLC
Ezequiel Rubinsztain
G01 - MEASURING TESTING
Information
Patent Grant
Storage battery inspection device and storage battery inspection me...
Patent number
11,828,811
Issue date
Nov 28, 2023
INTEGRAL GEOMETRY SCIENCE INC.
Yuki Mima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multichannel magnetic field sensor with multiplexed signal path
Patent number
11,768,259
Issue date
Sep 26, 2023
ALLEGRO MICROSYSTEMS, LLC
Ezequiel Rubinsztain
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Stray field rejection in magnetic sensors
Patent number
11,719,763
Issue date
Aug 8, 2023
Melexis Technologies SA
Gael Close
G01 - MEASURING TESTING
Information
Patent Grant
Hall device
Patent number
11,678,588
Issue date
Jun 13, 2023
Infineon Technologies AG
Udo Ausserlechner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic field sensor arrangement and method for processing a magne...
Patent number
11,650,267
Issue date
May 16, 2023
Infineon Technologies AG
Tobias Werth
G01 - MEASURING TESTING
Information
Patent Grant
Reducing stray magnetic-field effects using a magnetic-field closed...
Patent number
11,624,791
Issue date
Apr 11, 2023
ALLEGRO MICROSYSTEMS, LLC
Hernan D. Romero
G01 - MEASURING TESTING
Information
Patent Grant
Reducing stray magnetic-field effects using a magnetic-field closed...
Patent number
11,555,872
Issue date
Jan 17, 2023
ALLEGRO MICROSYSTEMS, LLC
Hernan D. Romero
G01 - MEASURING TESTING
Information
Patent Grant
Real time monitoring and prediction of motion in MRI
Patent number
11,543,483
Issue date
Jan 3, 2023
Washington University
Nico Dosenbach
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Digital phase tracking filter for position sensing
Patent number
11,536,587
Issue date
Dec 27, 2022
Melexis Technologies SA
Eric Sachse
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Electromagnetic noise position sensing
Patent number
11,536,589
Issue date
Dec 27, 2022
Toyota Motor Engineering & Manufacturing North America, Inc.
Xiaopeng Li
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic gradiometers
Patent number
11,525,870
Issue date
Dec 13, 2022
The Charles Stark Draper Laboratory, Inc.
James A. Bickford
G01 - MEASURING TESTING
Information
Patent Grant
Hall electromotive force signal detection circuit having a differen...
Patent number
11,493,569
Issue date
Nov 8, 2022
Asahi Kasei Microdevices Corporation
Shigeki Okatake
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field measurement systems and methods employing feedback l...
Patent number
11,480,632
Issue date
Oct 25, 2022
HI LLC
Micah Ledbetter
G01 - MEASURING TESTING
Information
Patent Grant
Reducing interference between Electromagnetic Tracking systems
Patent number
11,454,810
Issue date
Sep 27, 2022
Northern Digital Inc.
Thomas Koole
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for self-calibrating multiple field sensors having three or...
Patent number
11,442,118
Issue date
Sep 13, 2022
Korea Institute of Science and Technology
Ig Jae Kim
G01 - MEASURING TESTING
Information
Patent Grant
Stray field rejection in magnetic sensors
Patent number
11,435,413
Issue date
Sep 6, 2022
Melexis Technologies SA
Gael Close
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor with stacked transducers and capacitive summi...
Patent number
11,408,945
Issue date
Aug 9, 2022
ALLEGRO MICROSYSTEMS, LLC
Craig S. Petrie
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field measuring device, magnetic field measurement method,...
Patent number
11,391,792
Issue date
Jul 19, 2022
Asahi Kasei Microdevices Corporation
Kazuhiro Ishida
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field measuring apparatus and flux quantum calculating method
Patent number
11,385,304
Issue date
Jul 12, 2022
Ricoh Company, Ltd.
Takashi Yasui
G01 - MEASURING TESTING
Information
Patent Grant
Updating a default switching level
Patent number
11,366,180
Issue date
Jun 21, 2022
Infineon Technologies AG
Tobias Werth
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
REAL TIME MONITORING AND PREDICTION OF MOTION IN MRI
Publication number
20240337718
Publication date
Oct 10, 2024
Washington University
Nico Dosenbach
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
MAGNETIC DETECTION DEVICE
Publication number
20240288514
Publication date
Aug 29, 2024
AICHI STEEL CORPORATION
Takeshi KAWANO
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS
Publication number
20240085497
Publication date
Mar 14, 2024
NEC Corporation
Kenta Matsumoto
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR SUPPRESSING LOW FREQUENCY MAGNETIC NOISE IN M...
Publication number
20230366955
Publication date
Nov 16, 2023
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Aurélie SOLIGNAC
G01 - MEASURING TESTING
Information
Patent Application
STRAY FIELD REJECTION IN MAGNETIC SENSORS
Publication number
20230341479
Publication date
Oct 26, 2023
Melexis Technologies SA
Gael CLOSE
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR MEASURING A MAGNETIC FIELD, ASSOCIATED SYSTEM AND METHOD
Publication number
20230341482
Publication date
Oct 26, 2023
Centre National de la Recherche Scientifique
Christophe DOLABDJIAN
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD DETECTION DEVICE AND MAGNETIC FIELD DETECTION DEVICE...
Publication number
20230204686
Publication date
Jun 29, 2023
TDK Corporation
Takato FUKUI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD CLOSED LOOP SENSORS WITH OFFSET REDUCTION
Publication number
20230204693
Publication date
Jun 29, 2023
ALLEGRO MICROSYSTEMS, LLC
Hernan D. Romero
G01 - MEASURING TESTING
Information
Patent Application
REAL TIME MONITORING AND PREDICTION OF MOTION IN MRI
Publication number
20230121804
Publication date
Apr 20, 2023
Washington University
Nico Dosenbach
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC GRADIOMETERS
Publication number
20230097313
Publication date
Mar 30, 2023
The Charles Stark Draper Laboratory, Inc.
James A. Bickford
G01 - MEASURING TESTING
Information
Patent Application
REDUCING STRAY MAGNETIC-FIELD EFFECTS USING A MAGNETIC-FIELD CLOSED...
Publication number
20230027608
Publication date
Jan 26, 2023
ALLEGRO MICROSYSTEMS, LLC
Hernan D. Romero
G01 - MEASURING TESTING
Information
Patent Application
HALL ELECTROMOTIVE FORCE SIGNAL DETECTION CIRCUIT HAVING A DIFFEREN...
Publication number
20230017847
Publication date
Jan 19, 2023
ASAHI KASEI MICRODEVICES CORPORATION
Shigeki OKATAKE
G01 - MEASURING TESTING
Information
Patent Application
STRAY FIELD REJECTION IN MAGNETIC SENSORS
Publication number
20220365147
Publication date
Nov 17, 2022
Melexis Technologies SA
Gael CLOSE
G01 - MEASURING TESTING
Information
Patent Application
PROCESSES, APPARATUSES AND SYSTEM FOR MEASURING A MEASURED VARIABLE
Publication number
20220365012
Publication date
Nov 17, 2022
Carl-Zeiss AG
Nils TRAUTMANN
G01 - MEASURING TESTING
Information
Patent Application
STORAGE BATTERY INSPECTION DEVICE AND STORAGE BATTERY INSPECTION ME...
Publication number
20220349943
Publication date
Nov 3, 2022
Integral Geometry Science Inc.
Yuki MIMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROMAGNETIC NOISE POSITION SENSING
Publication number
20220291023
Publication date
Sep 15, 2022
Toyota Motor Engineering & Manufacturing North America, Inc.
Xiaopeng Li
G01 - MEASURING TESTING
Information
Patent Application
REDUCING STRAY MAGNETIC-FIELD EFFECTS USING A MAGNETIC-FIELD CLOSED...
Publication number
20220214410
Publication date
Jul 7, 2022
ALLEGRO MICROSYSTEMS, LLC
Hernan D. Romero
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD SENSOR WITH STACKED TRANSDUCERS AND CAPACITIVE SUMMI...
Publication number
20220155387
Publication date
May 19, 2022
ALLEGRO MICROSYSTEMS, LLC
Craig S. Petrie
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SELF-CALIBRATING MULTIPLE FIELD SENSORS HAVING THREE OR...
Publication number
20220120827
Publication date
Apr 21, 2022
Korea Institute of Science and Technology
Ig Jae KIM
G01 - MEASURING TESTING
Information
Patent Application
REAL TIME MONITORING AND PREDICTION OF MOTION IN MRI
Publication number
20220034986
Publication date
Feb 3, 2022
Washington University
Nico Dosenbach
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
MAGNETIC SENSOR DEVICE
Publication number
20210302510
Publication date
Sep 30, 2021
ABLIC Inc.
Hiroyuki YONETANI
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL PHASE TRACKING FILTER FOR POSITION SENSING
Publication number
20210302200
Publication date
Sep 30, 2021
Melexis Technologies SA
Eric SACHSE
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
UPDATING A DEFAULT SWITCHING LEVEL
Publication number
20210247467
Publication date
Aug 12, 2021
INFINEON TECHNOLOGIES AG
Tobias WERTH
G01 - MEASURING TESTING
Information
Patent Application
NEURAL FEEDBACK LOOP FOR ENHANCED DYNAMIC RANGE MAGNETOENCEPHALOGRA...
Publication number
20210239772
Publication date
Aug 5, 2021
HI LLC
Micah Ledbetter
G01 - MEASURING TESTING
Information
Patent Application
HALL ELECTROMOTIVE FORCE SIGNAL DETECTION CIRCUIT HAVING A DIFFEREN...
Publication number
20210199732
Publication date
Jul 1, 2021
ASAHI KASEI MICRODEVICES CORPORATION
Shigeki OKATAKE
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD MEASURING DEVICE, MAGNETIC FIELD MEASUREMENT METHOD,...
Publication number
20210181269
Publication date
Jun 17, 2021
ASAHI KASEI MICRODEVICES CORPORATION
Kazuhiro ISHIDA
G01 - MEASURING TESTING
Information
Patent Application
THREE-AXIS UPSTREAM-MODULATED LOW-NOISE MAGNETORESISTIVE SENSOR
Publication number
20210103009
Publication date
Apr 8, 2021
Multidimension Technology Co., Ltd
James Geza Deak
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD SENSOR ARRANGEMENT AND METHOD FOR PROCESSING A MAGNE...
Publication number
20210088602
Publication date
Mar 25, 2021
INFINEON TECHNOLOGIES AG
Tobias WERTH
G01 - MEASURING TESTING
Information
Patent Application
STRAY FIELD REJECTION IN MAGNETIC SENSORS
Publication number
20200408853
Publication date
Dec 31, 2020
Melexis Technologies SA
Gael CLOSE
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD SENSOR FOR ANGLE DETECTION WITH A PHASE-LOCKED LOOP
Publication number
20200408857
Publication date
Dec 31, 2020
ALLEGRO MICROSYSTEMS, LLC
Steven Daubert
G01 - MEASURING TESTING