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using interferometric methods using Schlieren methods
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Investigating or analysing materials by the use of optical means
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using interferometric methods using Schlieren methods
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last 30 patents
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Systems and methods for chemical and biological authentication
Patent number
12,234,462
Issue date
Feb 25, 2025
Salvus, LLC
Ron Levin
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
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Patent Grant
Optical imaging system
Patent number
12,228,508
Issue date
Feb 18, 2025
Oxford Nanoimaging Limited
Matthias Steiner
G01 - MEASURING TESTING
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Dynamic phase-shift interferometer utilizing a synchronous optical...
Patent number
12,216,051
Issue date
Feb 4, 2025
Onto Innovation Inc.
James Millerd
G01 - MEASURING TESTING
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Patent Grant
Interferometric gas sensor
Patent number
12,209,958
Issue date
Jan 28, 2025
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Hedser van Brug
G01 - MEASURING TESTING
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Method for analysing a biological sample with artefact masking
Patent number
12,209,959
Issue date
Jan 28, 2025
bioMerieux
Dominique Decaux
G01 - MEASURING TESTING
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Apparatuses, systems, and methods for sample testing
Patent number
12,196,672
Issue date
Jan 14, 2025
Hand Held Products, Inc.
Suresh Venkatarayalu
G01 - MEASURING TESTING
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Truncated nonlinear interferometer-based sensor system
Patent number
12,181,773
Issue date
Dec 31, 2024
UT-Battelle, LLC
Raphael C. Pooser
B82 - NANO-TECHNOLOGY
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Resolving absolute depth in circular-ranging optical coherence tomo...
Patent number
12,174,115
Issue date
Dec 24, 2024
The General Hospital Corporation
Benjamin Vakoc
G01 - MEASURING TESTING
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Holographic sensor
Patent number
12,163,883
Issue date
Dec 10, 2024
Cambridge Enterprise Limited
Gita Khalili Moghaddam
G01 - MEASURING TESTING
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Phase imaging apparatus, phase imaging method
Patent number
12,164,267
Issue date
Dec 10, 2024
The University of Tokyo
Takuro Ideguchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Interferometric detection and quantification system and methods of...
Patent number
12,146,829
Issue date
Nov 19, 2024
Salvus, LLC
Ron Levin
G01 - MEASURING TESTING
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Patent Grant
Miniature wireless concentration meter and method to determine dens...
Patent number
12,123,817
Issue date
Oct 22, 2024
The Government of the United States of America, as represented by the Secreta...
Jeffrey Barber
G01 - MEASURING TESTING
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Methods and apparatus for a self-aligned digital projection and ref...
Patent number
12,072,286
Issue date
Aug 27, 2024
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
Brett F. Bathel
G01 - MEASURING TESTING
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Quantum absorption spectroscopy system and quantum absorption spect...
Patent number
12,055,439
Issue date
Aug 6, 2024
Kyoto University
Shigeki Takeuchi
G01 - MEASURING TESTING
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Optical sensor of bio-molecules using interferometer
Patent number
12,055,486
Issue date
Aug 6, 2024
ACCESS MEDICAL SYSTEMS, LTD.
Hong Tan
G01 - MEASURING TESTING
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Detection of exosomes having surface markers
Patent number
12,038,439
Issue date
Jul 16, 2024
Unchained Labs
George Daaboul
G01 - MEASURING TESTING
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Fabry Perot interferometry for measuring cell viability
Patent number
12,031,908
Issue date
Jul 9, 2024
NIRRIN TECHNOLOGIES, INC.
Bryan A. Hassell
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
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Laser system for blood or tissue assessment
Patent number
12,019,011
Issue date
Jun 25, 2024
Board of Trustees of Michigan State University
Marcos Dantus
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Chopping board
Patent number
12,011,117
Issue date
Jun 18, 2024
Aurora Life Science GmbH
Philo Boras
A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
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Fluid sensing systems and methods
Patent number
12,013,385
Issue date
Jun 18, 2024
Cranfield University
James Andrew Bremner
G01 - MEASURING TESTING
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Deflectometry measurement system
Patent number
12,000,752
Issue date
Jun 4, 2024
LAMBDA-X OPHTHALMICS
Philippe Antoine
G01 - MEASURING TESTING
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Optical interference measuring apparatus and optical interference m...
Patent number
12,000,699
Issue date
Jun 4, 2024
Topcon Corporation
Homare Momiyama
G01 - MEASURING TESTING
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Optical detector
Patent number
12,000,779
Issue date
Jun 4, 2024
Hamamatsu Photonics K.K.
Wei Dong
G01 - MEASURING TESTING
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Patent Grant
Interferometric detection and quantification system and methods of...
Patent number
11,994,504
Issue date
May 28, 2024
Salvus, LLC
Ron Levin
G01 - MEASURING TESTING
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Data acquisition apparatus
Patent number
11,965,830
Issue date
Apr 23, 2024
EVIDENT CORPORATION
Mayumi Odaira
G01 - MEASURING TESTING
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Fourier spectrophotometer with polarization multiplexing optical sy...
Patent number
11,927,483
Issue date
Mar 12, 2024
Yokogawa Electric Corporation
Yasuyuki Suzuki
G01 - MEASURING TESTING
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Patent Grant
In situ determination of refractive index of materials
Patent number
11,911,104
Issue date
Feb 27, 2024
AMO Development, LLC
Javier Gonzalez
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Grant
Method for determining a state of a sphere
Patent number
11,893,728
Issue date
Feb 6, 2024
FUJIFILM Corporation
Sohichiro Nakamura
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Complex spatially-resolved reflectometry/refractometry
Patent number
11,867,626
Issue date
Jan 9, 2024
Regents of the Univ of Colorado, a body corporate
Christina Porter
G01 - MEASURING TESTING
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Patent Grant
Visualizing catheter irrigation using schlieren images
Patent number
11,867,924
Issue date
Jan 9, 2024
BIOSENSE WEBSTER (ISRAEL) LTD.
Assaf Govari
G02 - OPTICS
Patents Applications
last 30 patents
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Patent Application
SYSTEM AND METHOD FOR DETERMINING PARAMETERS OF PATTERNED STRUCTURE...
Publication number
20250067683
Publication date
Feb 27, 2025
NOVA LTD
Amir Shayari
G01 - MEASURING TESTING
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Patent Application
HOLOGRAPHIC SENSOR
Publication number
20250052679
Publication date
Feb 13, 2025
CAMBRIDGE ENTERPRISE LIMITED
Gita Khalili Moghaddam
G01 - MEASURING TESTING
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Patent Application
MODULE AND SYSTEM FOR, AND METHOD OF DETECTING DEFECTS IN ULTRA-THI...
Publication number
20250022120
Publication date
Jan 16, 2025
SAMSUNG DISPLAY CO., LTD.
YUNKU KANG
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
SYSTEM AND METHOD FOR OPEN-PATH SENSING OF A FLUID
Publication number
20250020585
Publication date
Jan 16, 2025
IMEC vzw
YanLu Li
G01 - MEASURING TESTING
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Patent Application
OBSERVATION DEVICE AND OBSERVATION METHOD
Publication number
20250003873
Publication date
Jan 2, 2025
Hamamatsu Photonics K.K.
Osamu YASUHIKO
G02 - OPTICS
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Patent Application
WHITE LIGHT INTERFEROMETRIC INSPECTION USING TILTED REFERENCE BEAM...
Publication number
20240426751
Publication date
Dec 26, 2024
ORBOTECH LTD.
Nir A. Turko
G01 - MEASURING TESTING
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Patent Application
OBSERVATION DEVICE AND OBSERVATION METHOD
Publication number
20240410825
Publication date
Dec 12, 2024
Hamamatsu Photonics K.K.
Osamu YASUHIKO
G01 - MEASURING TESTING
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Patent Application
MASK CHARACTERIZATION METHODS AND APPARATUSES
Publication number
20240385111
Publication date
Nov 21, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Chien-Cheng Chen
G01 - MEASURING TESTING
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Patent Application
HOLOGRAPHIC IMAGE PROCESSING AND DATA EXTRACTION
Publication number
20240377321
Publication date
Nov 14, 2024
Accelerate Diagnostics, Inc.
Landon K Prisbrey
G01 - MEASURING TESTING
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Patent Application
METHOD AND SYSTEM FOR SPECTRAL IMAGING
Publication number
20240369484
Publication date
Nov 7, 2024
Pentaomix Ltd.
Boaz BRILL
G01 - MEASURING TESTING
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Patent Application
INTERFEROMETRIC ELEMENT, DEVICE FOR DETECTING A COMPOUND COMPRISING...
Publication number
20240361237
Publication date
Oct 31, 2024
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Laurent DUSSOPT
G01 - MEASURING TESTING
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Patent Application
OPEN RESONATOR
Publication number
20240319092
Publication date
Sep 26, 2024
EM labs, Inc.
Yoshiyuki YANAGIMOTO
G01 - MEASURING TESTING
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Patent Application
METHOD OF DETERMINING THE IDENTITY OF A BIOMOLECULE
Publication number
20240319091
Publication date
Sep 26, 2024
REFEYN LTD
Matthias LANGHORST
G01 - MEASURING TESTING
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Patent Application
Fabry Perot Interferometry for Measuring Cell Viability
Publication number
20240319090
Publication date
Sep 26, 2024
Nirrin Technologies, Inc.
Bryan A. Hassell
G01 - MEASURING TESTING
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Patent Application
METHOD FOR THREE-DIMENSIONAL (3D) IMAGE CALIBRATION FOR A SPECTRAL...
Publication number
20240302274
Publication date
Sep 12, 2024
LEICA MICROSYSTEMS NC, INC.
Robert H. HART
G01 - MEASURING TESTING
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Patent Application
AN APPARATUS FOR OBTAINING AN IMAGE OF A SAMPLE AND METHODS FOR GEN...
Publication number
20240288366
Publication date
Aug 29, 2024
Emil B. Kromann
G01 - MEASURING TESTING
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Patent Application
INTERFEROMETRIC DETECTION AND QUANTIFICATION SYSTEM AND METHODS OF...
Publication number
20240280553
Publication date
Aug 22, 2024
Salvus, LLC
Ron LEVIN
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
DEFECT INSPECTION DEVICE
Publication number
20240280483
Publication date
Aug 22, 2024
Hitachi High-Tech Corporation
Takeru UTSUGI
G01 - MEASURING TESTING
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Patent Application
OPTICAL COMB MEASURING APPARATUS
Publication number
20240255423
Publication date
Aug 1, 2024
Advantest Corporation
Takao SAKURAI
G01 - MEASURING TESTING
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Patent Application
Device and Method for Optical Coherence Tomography In Laser Materia...
Publication number
20240230529
Publication date
Jul 11, 2024
II-VI Delaware, Inc.
Marcin Kozak
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Patent Application
OPTICAL MEASUREMENT APPARATUS AND METHOD OF RAPID MEASUREMENT
Publication number
20240230312
Publication date
Jul 11, 2024
Occuity Limited
James REYNOLDS
G01 - MEASURING TESTING
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Patent Application
CALCULATION DEVICE, CALCULATION METHOD, AND PROGRAM
Publication number
20240210373
Publication date
Jun 27, 2024
Riken Keiki Co., Ltd.
Tomoo ISHIGURO
G01 - MEASURING TESTING
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Patent Application
Pixel-Diversity Nanoparticle Detection by Interferometric Reflectan...
Publication number
20240201084
Publication date
Jun 20, 2024
Trustees of Boston University
M. Selim Ünlü
G01 - MEASURING TESTING
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Patent Application
SITU DETERMINATION OF REFRACTIVE INDEX OF MATERIALS
Publication number
20240172937
Publication date
May 30, 2024
AMO Development, LLC
Javier Gonzalez
G01 - MEASURING TESTING
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Patent Application
MINIATURE WIRELESS CONCENTRATION METER AND METHOD TO DETERMINE DENS...
Publication number
20240167929
Publication date
May 23, 2024
The Government of the United States of America, as represented by the Secreta...
Jeffrey Barber
G01 - MEASURING TESTING
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Patent Application
RESOLVING ABSOLUTE DEPTH IN CIRCULAR-RANGING OPTICAL COHERENCE TOMO...
Publication number
20240159668
Publication date
May 16, 2024
The General Hospital Corporation
Benjamin Vakoc
G01 - MEASURING TESTING
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Patent Application
Laser Interferometer
Publication number
20240151643
Publication date
May 9, 2024
SEIKO EPSON CORPORATION
Jun KITAGAWA
G01 - MEASURING TESTING
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Patent Application
PERACETIC ACID SENSING LAYER COMPOSITION AND RELATED SYSTEMS
Publication number
20240142373
Publication date
May 2, 2024
Georgia Tech Research Corporation
Jie XU
G01 - MEASURING TESTING
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Patent Application
VISUALIZING CATHETER IRRIGATION USING SCHLIEREN IMAGES
Publication number
20240142791
Publication date
May 2, 2024
BIOSENSE WEBSTER (ISRAEL) LTD.
Assaf GOVARI
G01 - MEASURING TESTING
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Patent Application
Boson Sampler and Neural Network for Data Generation
Publication number
20240135144
Publication date
Apr 25, 2024
ORCA Computing Limited
Hugo Wallner
G06 - COMPUTING CALCULATING COUNTING