Membership
Tour
Register
Log in
using magnetic analysers
Follow
Industry
CPC
H01J49/30
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J49/00
Particle spectrometer or separator tubes
Current Industry
H01J49/30
using magnetic analysers
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Methods for de novo protein sequencing
Patent number
12,000,840
Issue date
Jun 4, 2024
REGENERON PHARMACEUTICALS, INC.
Yuan Mao
G01 - MEASURING TESTING
Information
Patent Grant
Low-power mass interrogation system and assay for determining Vitam...
Patent number
11,967,495
Issue date
Apr 23, 2024
Leidos, Inc.
Noah Peter Christian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Voltage control for ion mobility separation
Patent number
11,670,495
Issue date
Jun 6, 2023
MOBILion Systems, Inc.
John Daniel DeBord
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of evaluating performance of an atmospheric pressure ioniza...
Patent number
11,610,767
Issue date
Mar 21, 2023
PharmaCadence Analytical Services, LLC
Richard C. King
G01 - MEASURING TESTING
Information
Patent Grant
Carbonic anhydrase-catalyzed isotope equilibrium between CO2—H2O fo...
Patent number
11,543,398
Issue date
Jan 3, 2023
McMaster University
Sang-Tae Kim
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Mass separator using retractable magnetic yoke on a beam bending path
Patent number
11,322,342
Issue date
May 3, 2022
Nissin Ion Equipment Co., Ltd.
Daiki Takashima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low-power mass interrogation system and assay for determining vitam...
Patent number
11,227,754
Issue date
Jan 18, 2022
Leidos, Inc.
Noah Peter Christian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods, apparatus, and system for mass spectrometry
Patent number
11,120,983
Issue date
Sep 14, 2021
Massachusetts Institute of Technology
Ian W. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of evaluating performance of an atmospheric pressure ioniza...
Patent number
11,049,703
Issue date
Jun 29, 2021
PharmaCadence Analytical Services, LLC
Richard C. King
G01 - MEASURING TESTING
Information
Patent Grant
Methods for de novo protein sequencing
Patent number
11,047,863
Issue date
Jun 29, 2021
REGENERON PHARMACEUTICALS, INC.
Yuan Mao
G01 - MEASURING TESTING
Information
Patent Grant
Low power mass analyzer and system integrating same for chemical an...
Patent number
10,998,181
Issue date
May 4, 2021
Leidos, Inc.
Noah Christian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low power mass analyzer and system integrating same for chemical an...
Patent number
10,872,755
Issue date
Dec 22, 2020
Leidos, Inc.
Noah Christian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion implanter and method of controlling ion implanter
Patent number
10,854,418
Issue date
Dec 1, 2020
Sumitomo Heavy Industries Ion Technology Co., Ltd.
Haruka Sasaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Accelerator mass spectrometry system and associated method
Patent number
10,748,753
Issue date
Aug 18, 2020
High Voltage Engineering Europa B.V.
Dirk Jozef Willem Mous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Control of magnetic sector mass spectrometer magnet
Patent number
10,685,826
Issue date
Jun 16, 2020
Thermo Fisher Scientific (Bremen) GmbH
Jürgen Jaeschke
G01 - MEASURING TESTING
Information
Patent Grant
Methods, apparatus, and system for mass spectrometry
Patent number
10,658,169
Issue date
May 19, 2020
Massachusetts Institute of Technology
Ian W. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasmas for extraterrestrial resources and applied technologies (PE...
Patent number
10,626,479
Issue date
Apr 21, 2020
Christian Daniel Assoun
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Accelerator mass spectrometry device for simultaneously measuring i...
Patent number
10,395,910
Issue date
Aug 27, 2019
China Institute of Atomic Energy
Shan Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dynamic range improvement for isotope ratio mass spectrometry
Patent number
10,312,071
Issue date
Jun 4, 2019
Thermo Fisher Scientific (Bremen) GmbH
Jens Radke
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Methods, apparatus, and system for mass spectrometry
Patent number
10,236,172
Issue date
Mar 19, 2019
Massachusetts Institute of Technology
Ian W. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for static gas mass spectrometry
Patent number
10,192,729
Issue date
Jan 29, 2019
Thermo Fisher Scientific (Bremen) GmbH
Johannes Schwieters
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Control of magnetic sector mass spectrometer magnet
Patent number
10,176,978
Issue date
Jan 8, 2019
Thermo Fisher Scientific (Bremen) GmbH
Jürgen Jaeschke
G01 - MEASURING TESTING
Information
Patent Grant
Methods, apparatus, and system for mass spectrometry
Patent number
9,735,000
Issue date
Aug 15, 2017
Massachusetts Institute of Technology
Ian W. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass analyzing electromagnet and ion beam irradiation apparatus
Patent number
9,728,390
Issue date
Aug 8, 2017
Nissin ION Equipment Co., Ltd.
Junichi Tatemichi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer with improved magnetic sector
Patent number
9,564,306
Issue date
Feb 7, 2017
Luxembourg Institute of Science and Technology (LIST)
Hung Quang Hoang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer with optimized magnetic shunt
Patent number
9,401,268
Issue date
Jul 26, 2016
Luxembourg Institute of Science and Technology (LIST)
Hung Quang Hoang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods, apparatus, and system for mass spectrometry
Patent number
9,312,117
Issue date
Apr 12, 2016
The Massachusetts Institute of Technology
Ian W. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Broadband ion beam analyzer
Patent number
9,123,522
Issue date
Sep 1, 2015
BEIJING ZHONGKEXIN ELECTRONICS EQUIPMENT CO., LTD.
Libo Peng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods, apparatus, and system for mass spectrometry
Patent number
8,754,371
Issue date
Jun 17, 2014
The Massachusetts Institute of Technology
Ian W. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion gauge, a monitoring system and a method for determining a total...
Patent number
8,749,245
Issue date
Jun 10, 2014
Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO
Norbertus Benedictus Koster
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
Improved Low-Power Mass Interrogation System and Assay For Determin...
Publication number
20240347330
Publication date
Oct 17, 2024
Leidos, Inc.
Noah Peter Christian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC SECTOR WITH A SHUNT FOR A MASS SPECTROMETER
Publication number
20240014026
Publication date
Jan 11, 2024
LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
Hung Quang Hoang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Voltage Control for Ion Mobility Separation
Publication number
20230268169
Publication date
Aug 24, 2023
MOBILion Systems, Inc.
John Daniel DeBord
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COLLISION CELL HAVING AN AXIAL FIELD
Publication number
20230230822
Publication date
Jul 20, 2023
Thermo Fisher Scientific (Bremen) GmbH
Johannes Schwieters
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NOVEL METHODS OF EVALUATING PERFORMANCE OF AN ATMOSPHERIC PRESSURE...
Publication number
20220139688
Publication date
May 5, 2022
RICHARD C. KING
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Low-Power Mass Interrogation System and Assay For Determining Vitam...
Publication number
20220093376
Publication date
Mar 24, 2022
Leidos, Inc.
Noah Peter Christian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS FOR DE NOVO PROTEIN SEQUENCING
Publication number
20210278414
Publication date
Sep 9, 2021
Regeneron Pharmaceuticals, Inc.
Yuan Mao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Low Power Mass Analyzer and System Integrating Same For Chemical An...
Publication number
20210013018
Publication date
Jan 14, 2021
Leidos, Inc.
Noah Christian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS, APPARATUS, AND SYSTEM FOR MASS SPECTROMETRY
Publication number
20200388479
Publication date
Dec 10, 2020
Massachusetts Institute of Technology
Ian W. HUNTER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Voltage Control for Ion Mobility Separation
Publication number
20200373139
Publication date
Nov 26, 2020
MOBILion Systems, Inc.
John Daniel DeBord
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SEPARATOR
Publication number
20200312651
Publication date
Oct 1, 2020
NISSIN ION EQUIPMENT CO., LTD.
Daiki Takashima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CARBONIC ANHYDRASE-CATALYZED ISOTOPE EQUILIBRIUM BETWEEN CO2-H2O FO...
Publication number
20200132652
Publication date
Apr 30, 2020
McMaster University
Sang-Tae Kim
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
Methods for De Novo Protein Sequencing
Publication number
20200057073
Publication date
Feb 20, 2020
Yuan Mao
C07 - ORGANIC CHEMISTRY
Information
Patent Application
ACCELERATOR MASS SPECTROMETRY SYSTEM AND ASSOCIATED METHOD
Publication number
20190385830
Publication date
Dec 19, 2019
High Voltage Engineering Europa B.V.
Dirk Jozef Willem MOUS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NOVEL METHODS OF EVALUATING PERFORMANCE OF AN ATMOSPHERIC PRESSURE...
Publication number
20190237314
Publication date
Aug 1, 2019
PharmaCadence Analytical Services, LLC
RICHARD C. KING
G01 - MEASURING TESTING
Information
Patent Application
METHODS, APPARATUS, AND SYSTEM FOR MASS SPECTROMETRY
Publication number
20190214243
Publication date
Jul 11, 2019
Massachusetts Institute of Technology
Ian W. HUNTER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONTROL OF MAGNETIC SECTOR MASS SPECTROMETER MAGNET
Publication number
20190157063
Publication date
May 23, 2019
Thermo Fisher Scientific (Bremen) GmbH
Jürgen JAESCHKE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONTROL OF MAGNETIC SECTOR MASS SPECTROMETER MAGNET
Publication number
20180269053
Publication date
Sep 20, 2018
Thermo Fisher Scientific (Bremen) GmbH
Jürgen JAESCHKE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COLLISION CELL HAVING AN AXIAL FIELD
Publication number
20180240657
Publication date
Aug 23, 2018
Johannes SCHWIETERS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ACCELERATOR MASS SPECTROMETRY DEVICE FOR SIMULTANEOUSLY MEASURING I...
Publication number
20180082828
Publication date
Mar 22, 2018
CHINA INSTITUTE OF ATOMIC ENERGY
Shan JIANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for static gas mass spectrometry
Publication number
20170352528
Publication date
Dec 7, 2017
Thermo Fisher Scientific (Bremen) GmbH
Johannes SCHWIETERS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS, APPARATUS, AND SYSTEM FOR MASS SPECTROMETRY
Publication number
20170316928
Publication date
Nov 2, 2017
Ian W. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Dynamic Range Improvement for Isotope Ratio Mass Spectrometry
Publication number
20170047217
Publication date
Feb 16, 2017
Thermo Fisher Scientific (Bremen) GmbH
Jens RADKE
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
METHODS, APPARATUS, AND SYSTEM FOR MASS SPECTROMETRY
Publication number
20160172180
Publication date
Jun 16, 2016
The Massachusetts Institute of Technology
Ian W. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS ANALYZING ELECTROMAGNET AND ION BEAM IRRADIATION APPARATUS
Publication number
20160126082
Publication date
May 5, 2016
NISSIN ION EQUIPMENT CO., LTD.
Junichi TATEMICHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass Spectrometer With Optimized Magnetic Shunt
Publication number
20150348770
Publication date
Dec 3, 2015
Hung Quang Hoang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS, APPARATUS, AND SYSTEM FOR MASS SPECTROMETRY
Publication number
20140326866
Publication date
Nov 6, 2014
Ian W. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BROADBAND ION BEAM ANALYZER
Publication number
20140312223
Publication date
Oct 23, 2014
Libo Peng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System and Method for Ion Implantation with Improved Productivity a...
Publication number
20130026356
Publication date
Jan 31, 2013
Axcelis Technologies Inc.
Bo H. Vanderberg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR PRODUCING A MASS ANALYZED ION BEAM FOR HIGH T...
Publication number
20130001414
Publication date
Jan 3, 2013
Varian Semiconductor Equipment Associates, Inc.
Victor M. Benveniste
H01 - BASIC ELECTRIC ELEMENTS