using masks

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H01L21/266

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HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Current Industry

H01L21/266using masks

Industries

Patents Grantslast 30 patents

Information Patent Grant
Fabrication of a vertical fin field effect transistor with reduced...
- Patent number 12,136,573
- Issue date Nov 5, 2024
- Adeia Semiconductor Solutions LLC
- Kangguo Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low cost, high performance analog metal oxide semiconductor transistor
- Patent number 12,136,625
- Issue date Nov 5, 2024
- Texas Instruments Incorporated
- Pushpa Mahalingam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coupled guard rings for edge termination
- Patent number 12,136,645
- Issue date Nov 5, 2024
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Clifford Drowley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Negative-capacitance and ferroelectric field-effect transistor (NCF...
- Patent number 12,136,659
- Issue date Nov 5, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Te-Yang Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with reduced trap defect and method of forming...
- Patent number 12,119,389
- Issue date Oct 15, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chun Hsiung Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system of junction termination extension in high voltage...
- Patent number 12,113,101
- Issue date Oct 8, 2024
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Subhash Srinivas Pidaparthi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge-balance power device, and process for manufacturing the char...
- Patent number 12,113,103
- Issue date Oct 8, 2024
- STMicroelectronics S.r.l.
- Antonello Santangelo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power device and manufacturing method thereof
- Patent number 12,107,160
- Issue date Oct 1, 2024
- Richtek Technology Corporation
- Kuo-Hsuan Lo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with implant and method of manufacturing same
- Patent number 12,100,738
- Issue date Sep 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu-Chang Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Implantation mask formation
- Patent number 12,100,592
- Issue date Sep 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Chao Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active region array formation method
- Patent number 12,100,594
- Issue date Sep 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- ChihCheng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nitride semiconductor device
- Patent number 12,087,762
- Issue date Sep 10, 2024
- Panasonic Holdings Corporation
- Daisuke Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoresist patterning process
- Patent number 12,085,858
- Issue date Sep 10, 2024
- Applied Materials, Inc.
- Huixiong Dai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-temperature implant for buried layer formation
- Patent number 12,087,585
- Issue date Sep 10, 2024
- Applied Materials, Inc.
- Qintao Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for FinFET device with source/drain modulation
- Patent number 12,080,607
- Issue date Sep 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ta-Chun Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and semiconductor device manufacturing method
- Patent number 12,074,215
- Issue date Aug 27, 2024
- Lapis Semiconductor Co., Ltd.
- Tomomi Yamanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for FinFET LDD doping
- Patent number 12,068,371
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chun Hsiung Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, semiconductor device manufacturing method, in...
- Patent number 12,062,691
- Issue date Aug 13, 2024
- Kabushiki Kaisha Toshiba
- Tatsuo Shimizu
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 12,062,655
- Issue date Aug 13, 2024
- Rohm Co., Ltd.
- Jun Takaoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistor (FinFET) device having position-depende...
- Patent number 12,046,638
- Issue date Jul 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jhong-Sheng Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer and manufacturing method of wafer
- Patent number 12,046,474
- Issue date Jul 23, 2024
- GlobalWafers Co., Ltd.
- Chenghan Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabricating sub-micron contacts to buried well devices
- Patent number 12,040,366
- Issue date Jul 16, 2024
- The Boeing Company
- Kangmu Min Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor structure and manufacturing method thereof
- Patent number 12,027,584
- Issue date Jul 2, 2024
- Macronix International Co., Ltd.
- Jeng Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming an integrated circuit using a patterned mask layer
- Patent number 12,027,370
- Issue date Jul 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tzu-Yen Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 12,020,935
- Issue date Jun 25, 2024
- Mitsubishi Electric Corporation
- Koichi Nishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a buried channel array transistor st...
- Patent number 12,021,127
- Issue date Jun 25, 2024
- NANYA TECHNOLOGY CORPORATION
- Ching-Chia Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure and testing method thereof
- Patent number 12,020,993
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chun Hao Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 12,009,360
- Issue date Jun 11, 2024
- Mitsubishi Electric Corporation
- Munenori Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-rotation gate-edge diode leakage reduction for MOS transistors
- Patent number 12,009,423
- Issue date Jun 11, 2024
- Texas Instruments Incorporated
- Brian Edward Hornung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and manufacturing method thereof
- Patent number 12,002,707
- Issue date Jun 4, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Bingyu Zhu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for Reducing Line-End Space in Integrated Circuit Patterning
- Publication number 20240385526
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Co., LTD
- Jing-Huei Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPLANTATION MASK FORMATION
- Publication number 20240379357
- Publication date Nov 14, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY , LTD.
- Wei-Chao CHIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH REDUCED TRAP DEFECT AND METHOD OF FORMING...
- Publication number 20240371974
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- CHUN HSIUNG TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT WITH IMPROVED ISOLATION
- Publication number 20240363394
- Publication date Oct 31, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Dong Seup Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR FINFET DEVICE WITH SOURCE/DRAIN MODULATION
- Publication number 20240363435
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ta-Chun Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LDMOS TRANSISTOR DEVICE AND METHOD FOR FORMING THE SAME
- Publication number 20240347626
- Publication date Oct 17, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- TSUNG-HUA YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NITRIDE SEMICONDUCTOR DEVICE, NITRIDE SEMICONDUCTOR SUBSTRATE, AND...
- Publication number 20240347343
- Publication date Oct 17, 2024
- NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH...
- Manato DEKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SUPERJUNCTION TRENCH GATE MOSFET
- Publication number 20240332402
- Publication date Oct 3, 2024
- Hua Hong Semiconductor (Wuxi) Limited
- Zhaozhao XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NITRIDE SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF
- Publication number 20240313089
- Publication date Sep 19, 2024
- Fuji Electric Co., Ltd.
- Ryo TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCHING DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20240304665
- Publication date Sep 12, 2024
- DENSO CORPORATION
- MASAKAZU WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWO-ROTATION GATE-EDGE DIODE LEAKAGE REDUCTION FOR MOS
- Publication number 20240304723
- Publication date Sep 12, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Brian Edward Hornung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
- Publication number 20240297250
- Publication date Sep 5, 2024
- HON HAI PRECISION INDUSTRY CO., LTD.
- Chia-Lung HUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20240282818
- Publication date Aug 22, 2024
- Fuji Electric Co., Ltd.
- Naoki MITAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE
- Publication number 20240282579
- Publication date Aug 22, 2024
- Powerchip Semiconductor Manufacturing Corporation
- Mao-Teng Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
- Publication number 20240282582
- Publication date Aug 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Chao CHIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, RELATED CIRCUIT, CHIP, ELECTRONIC DEVICE, AND...
- Publication number 20240282767
- Publication date Aug 22, 2024
- Huawei Digital Power Technologies Co., Ltd.
- Wentao Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPER JUNCTION DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20240274658
- Publication date Aug 15, 2024
- Shanghai Huahong Grace Semiconductor Manufacturing Corporation
- Hao LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME
- Publication number 20240266391
- Publication date Aug 8, 2024
- Vanguard International Semiconductor Corporation
- Wen-Shan LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE INCLUDING 3D CAPACITOR AND METHOD FOR FORMI...
- Publication number 20240258304
- Publication date Aug 1, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- YI-TING CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR ARRANGEMENT AND METHOD OF MANUFACTURE
- Publication number 20240258374
- Publication date Aug 1, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Yun-Chi WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20240258306
- Publication date Aug 1, 2024
- Mitsubishi Electric Corporation
- Munenori IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH DOPED REGION BETWEEN GATE AND DRAIN
- Publication number 20240250170
- Publication date Jul 25, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Lian-Jie LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCE WELL DOPANT LOSS IN FINFETS THROUGH CO-IMPLANTATION
- Publication number 20240249944
- Publication date Jul 25, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sih-Jie Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATION OF A VERTICAL FIN FIELD EFFECT TRANSISTOR WITH REDUCED...
- Publication number 20240249980
- Publication date Jul 25, 2024
- Adeia Semiconductor Solutions LLC
- Kangguo Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED U...
- Publication number 20240241451
- Publication date Jul 18, 2024
- Samsung Electronics Co., Ltd.
- Daehee LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPER JUNCTION SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE...
- Publication number 20240243167
- Publication date Jul 18, 2024
- Magnachip Semiconductor, Ltd.
- Chanho PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240234494
- Publication date Jul 11, 2024
- POWER MASTER SEMICONDUCTOR CO., LTD.
- Chang Ju LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240234578
- Publication date Jul 11, 2024
- Semiconductor Energy Laboratory Co., Ltd.
- Kenichi OKAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lateral Transistor with Self-Aligned Body Implant
- Publication number 20240234149
- Publication date Jul 11, 2024
- Infineon Technologies Dresden GmbH & Co. KG
- Achim Gratz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240234413
- Publication date Jul 11, 2024
- RENESAS ELECTRONICS CORPORATION
- Natsumi IKEDA
- H01 - BASIC ELECTRIC ELEMENTS

using masks

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Fabrication of a vertical fin field effect transistor with reduced...

Low cost, high performance analog metal oxide semiconductor transistor

Coupled guard rings for edge termination

Negative-capacitance and ferroelectric field-effect transistor (NCF...

Semiconductor device with reduced trap defect and method of forming...

Method and system of junction termination extension in high voltage...

Charge-balance power device, and process for manufacturing the char...

Power device and manufacturing method thereof

Semiconductor device with implant and method of manufacturing same

Implantation mask formation

Active region array formation method

Nitride semiconductor device

Photoresist patterning process

Low-temperature implant for buried layer formation

Structure and method for FinFET device with source/drain modulation

Semiconductor device and semiconductor device manufacturing method

Method for FinFET LDD doping

Semiconductor device, semiconductor device manufacturing method, in...

Semiconductor device and method for manufacturing same

Fin field effect transistor (FinFET) device having position-depende...

Wafer and manufacturing method of wafer

Fabricating sub-micron contacts to buried well devices

Transistor structure and manufacturing method thereof

Method of forming an integrated circuit using a patterned mask layer

Method of manufacturing semiconductor device

Semiconductor device including a buried channel array transistor st...

Test structure and testing method thereof

Semiconductor device and method for manufacturing the same

Two-rotation gate-edge diode leakage reduction for MOS transistors

Semiconductor structure and manufacturing method thereof

Patents Applicationslast 30 patents

Method for Reducing Line-End Space in Integrated Circuit Patterning

IMPLANTATION MASK FORMATION

SEMICONDUCTOR DEVICE WITH REDUCED TRAP DEFECT AND METHOD OF FORMING...

INTEGRATED CIRCUIT WITH IMPROVED ISOLATION

STRUCTURE AND METHOD FOR FINFET DEVICE WITH SOURCE/DRAIN MODULATION

LDMOS TRANSISTOR DEVICE AND METHOD FOR FORMING THE SAME

NITRIDE SEMICONDUCTOR DEVICE, NITRIDE SEMICONDUCTOR SUBSTRATE, AND...

METHOD FOR MANUFACTURING SUPERJUNCTION TRENCH GATE MOSFET

NITRIDE SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF

SWITCHING DEVICE AND METHOD FOR MANUFACTURING THE SAME

TWO-ROTATION GATE-EDGE DIODE LEAKAGE REDUCTION FOR MOS

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE, RELATED CIRCUIT, CHIP, ELECTRONIC DEVICE, AND...

SUPER JUNCTION DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME

SEMICONDUCTOR STRUCTURE INCLUDING 3D CAPACITOR AND METHOD FOR FORMI...

SEMICONDUCTOR ARRANGEMENT AND METHOD OF MANUFACTURE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE WITH DOPED REGION BETWEEN GATE AND DRAIN

REDUCE WELL DOPANT LOSS IN FINFETS THROUGH CO-IMPLANTATION

FABRICATION OF A VERTICAL FIN FIELD EFFECT TRANSISTOR WITH REDUCED...

METHOD OF MEASURING OVERLAY AND SEMICONDUCTOR DEVICE MANUFACTURED U...

SUPER JUNCTION SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

Lateral Transistor with Self-Aligned Body Implant

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME