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G01N23/202
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
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G01N23/202
using neutrons
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Patents Grants
last 30 patents
Information
Patent Grant
Nondestructive test system comprising a neutron emission unit for e...
Patent number
11,754,516
Issue date
Sep 12, 2023
Topcon Corporation
Hisashi Tsukada
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating crosslink concentration in crosslinked rubber
Patent number
10,168,289
Issue date
Jan 1, 2019
Sumitomo Rubber Industries, Ltd.
Tomomi Masui
G01 - MEASURING TESTING
Information
Patent Grant
Radiation imaging device capable of matter-element information acqu...
Patent number
9,784,697
Issue date
Oct 10, 2017
Korea Atomic Energy Research Institute
Jang Ho Ha
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for analysis of samples
Patent number
9,562,865
Issue date
Feb 7, 2017
Anton Paar GmbH
Heimo Schnablegger
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating modulus of repulsion elasticity, hardness and...
Patent number
9,528,950
Issue date
Dec 27, 2016
SUMITOMO RUBBER INDUSTRIES, LTD.
Ryo Mashita
G01 - MEASURING TESTING
Information
Patent Grant
Method of evaluating neutron scattering length density
Patent number
9,395,314
Issue date
Jul 19, 2016
SUMITOMO RUBBER INDUSTRIES, LTD.
Ryo Mashita
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating energy loss, chipping resistance and abrasion...
Patent number
9,291,581
Issue date
Mar 22, 2016
SUMITOMO RUBBER INDUSTRIES, LTD.
Ryo Mashita
G01 - MEASURING TESTING
Information
Patent Grant
Non-intrusive method for detection of chemical elements
Patent number
8,748,837
Issue date
Jun 10, 2014
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Cedric Carasco
G01 - MEASURING TESTING
Information
Patent Grant
Double crystal analyzer linkage
Patent number
7,099,437
Issue date
Aug 29, 2006
The Johns Hopkins University
Timothy D. Pike
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for generating parallel beam with high flux
Patent number
6,863,409
Issue date
Mar 8, 2005
Korea Atomic Energy Research Institute
Sang Jin Cho
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Thermal neutron porosity measurement apparatus and method using an...
Patent number
5,789,752
Issue date
Aug 4, 1998
Western Atlas International, Inc.
Medhat W. Mickael
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring a flowstream
Patent number
4,924,099
Issue date
May 8, 1990
Exxon Production Research Company
Git B. Lim
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measurement of moisture
Patent number
4,362,939
Issue date
Dec 7, 1982
Hitachi, Ltd.
Shoichi Horiuchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HIGH-THROUGHPUT HIGH-PRESSURE SMALL-ANGLE NEUTRON SCATTERING SAMPLE...
Publication number
20240272096
Publication date
Aug 15, 2024
STF Technologies LLC
Norman J. Wagner
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF EVALUATING CONCENTRATION OF SULFUR
Publication number
20240183803
Publication date
Jun 6, 2024
Sumitomo Rubber Industries, Ltd.
Tomomi SHIOZAWA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR AND METHOD FOR DETECTING HEAVY METALS USING CARBON NANOTUBES
Publication number
20220373529
Publication date
Nov 24, 2022
MORGAN STATE UNIVERSITY
Dereje Seifu
C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information
Patent Application
METHOD FOR EVALUATING CROSSLINK CONCENTRATION IN CROSSLINKED RUBBER
Publication number
20160349196
Publication date
Dec 1, 2016
Sumitomo Rubber Industries, Ltd.
Tomomi MASUI
G01 - MEASURING TESTING
Information
Patent Application
RADIATION IMAGING DEVICE CAPABLE OF MATTER-ELEMENT INFORMATION ACQU...
Publication number
20150241367
Publication date
Aug 27, 2015
Korea Atomic Energy Research Institute
Jang Ho Ha
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF EVALUATING NEUTRON SCATTERING LENGTH DENSITY
Publication number
20140341354
Publication date
Nov 20, 2014
Sumitomo Rubber Industries, Ltd.
Ryo MASHITA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR EVALUATING MODULUS OF REPULSION ELASTICITY, HARDNESS AND...
Publication number
20140205068
Publication date
Jul 24, 2014
SUMITOMO RUBBER INDUSTRIES, LTD.
Ryo Mashita
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ANALYSIS OF SAMPLES
Publication number
20140151569
Publication date
Jun 5, 2014
ANTON PAAR GMBH
HEIMO SCHNABLEGGER
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR EVALUATING ENERGY LOSS, CHIPPING RESISTANCE AND ABRASION...
Publication number
20140140483
Publication date
May 22, 2014
Sumitomo Rubber Industries, Ltd.
Ryo MASHITA
G01 - MEASURING TESTING
Information
Patent Application
NON-INTRUSIVE METHOD FOR DETECTION OF CHEMICAL ELEMENTS
Publication number
20110243306
Publication date
Oct 6, 2011
Cedric Carasco
G01 - MEASURING TESTING
Information
Patent Application
Double crystal analyzer linkage
Publication number
20060126787
Publication date
Jun 15, 2006
Timothy D. Pike
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for generating parallel beam with high flux
Publication number
20040136102
Publication date
Jul 15, 2004
Sang Jin Cho
G01 - MEASURING TESTING