using non-volatile cells or latches

Industry

CPC
G11C29/789

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/789using non-volatile cells or latches

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Triple modular redundancy for fault-tolerant in-memory computing
- Patent number 12,131,793
- Issue date Oct 29, 2024
- Micron Technology, Inc.
- Agostino Pirovano
- G11 - INFORMATION STORAGE
Information Patent Grant
Single event effect mitigation with smart-redundancy
- Patent number 12,112,820
- Issue date Oct 8, 2024
- University of Utah Research Foundation
- Aurelien Alacchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for repairing faulty cells of memory device
- Patent number 12,112,823
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Helik Kanti Thacker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for testing redundant fuse latches in a memory...
- Patent number 12,100,467
- Issue date Sep 24, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Anti-fuse readout circuit, anti-fuse memory, and testing method
- Patent number 12,082,402
- Issue date Sep 3, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Rumin Ji
- G11 - INFORMATION STORAGE
Information Patent Grant
Preserving blocks experiencing program failure in memory devices
- Patent number 12,068,052
- Issue date Aug 20, 2024
- Micron Technology, Inc.
- Pranam Shetty
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for zone-based soft post-package repair
- Patent number 11,984,185
- Issue date May 14, 2024
- Micron Technology, Inc.
- Alan J. Wilson
- G11 - INFORMATION STORAGE
Information Patent Grant
Repair system and repair method for semiconductor structure, storag...
- Patent number 11,984,182
- Issue date May 14, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Zhi Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Logic module for use with encoded instructions
- Patent number 11,971,828
- Issue date Apr 30, 2024
- PURE STORAGE, INC.
- Brian T. Gold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Concurrent compensation in a memory system
- Patent number 11,942,171
- Issue date Mar 26, 2024
- Micron Technology, Inc.
- Harish V. Gadamsetty
- G11 - INFORMATION STORAGE
Information Patent Grant
Fuse recipe update mechanism
- Patent number 11,940,944
- Issue date Mar 26, 2024
- Intel Corporation
- Bharat Pillilli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for preparing semiconductor device including an electronic f...
- Patent number 11,935,605
- Issue date Mar 19, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for column repair
- Patent number 11,901,033
- Issue date Feb 13, 2024
- Samsung Electronics Co., Ltd.
- Jooyong Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Self-repair for sequential SRAM
- Patent number 11,869,617
- Issue date Jan 9, 2024
- Meta Platforms Technologies, LLC
- Huichu Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for determining repaired line and repairing line...
- Patent number 11,862,279
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Bo Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device, testing method and using method thereof, and memory...
- Patent number 11,854,640
- Issue date Dec 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device, semiconductor device, and electronic device each inc...
- Patent number 11,823,733
- Issue date Nov 21, 2023
- Semiconductor Energy Laboratory Co., Ltd.
- Hitoshi Kunitake
- G11 - INFORMATION STORAGE
Information Patent Grant
Programming a memory device
- Patent number 11,798,640
- Issue date Oct 24, 2023
- Macronix International Co., Ltd.
- Yi-Chun Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for fail bit repairing
- Patent number 11,791,010
- Issue date Oct 17, 2023
- Changxin Memory Technologies, Inc.
- Yui-Lang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 11,783,910
- Issue date Oct 10, 2023
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Quick configurable universal register for a configurable integrated...
- Patent number 11,749,368
- Issue date Sep 5, 2023
- Intel Corporation
- Bee Yee Ng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Repair circuit and memory
- Patent number 11,715,548
- Issue date Aug 1, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Liang Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with a memory repair mechanism and methods for operat...
- Patent number 11,694,762
- Issue date Jul 4, 2023
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Grant
Modifying subsets of memory bank operating parameters
- Patent number 11,669,447
- Issue date Jun 6, 2023
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus performing repair operation
- Patent number 11,626,186
- Issue date Apr 11, 2023
- SK hynix Inc.
- Dong Beom Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for refreshing memories with redundancy
- Patent number 11,605,442
- Issue date Mar 14, 2023
- Micron Technology, Inc.
- Bin Du
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for column repair
- Patent number 11,574,700
- Issue date Feb 7, 2023
- Samsung Electronics Co., Ltd.
- Jooyong Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Programming memory cells with concurrent storage of multi-level dat...
- Patent number 11,551,781
- Issue date Jan 10, 2023
- SanDisk Technologies LLC
- Xiang Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 11,501,848
- Issue date Nov 15, 2022
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Configurable built-in self-repair chain for fast repair data loading
- Patent number 11,495,315
- Issue date Nov 8, 2022
- SIEMENS INDUSTRY SOFTWARE INC.
- Wei Zou
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
STACKED MEMORY AND MANUFACTURING METHOD THEREFOR
- Publication number 20250037785
- Publication date Jan 30, 2025
- UltraMemory Inc.
- Yasutoshi YAMADA
- G11 - INFORMATION STORAGE
Information Patent Application
TRIPLE MODULAR REDUNDANCY FOR FAULT-TOLERANT IN-MEMORY COMPUTING
- Publication number 20250037786
- Publication date Jan 30, 2025
- Micron Technology, Inc.
- Agostino Pirovano
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND CONTROL METHOD THEREFOR
- Publication number 20240428878
- Publication date Dec 26, 2024
- CXMT Corporation
- Zequn HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR FORCING MEMORY CELL FAILURES IN A MEMOR...
- Publication number 20240395349
- Publication date Nov 28, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Application
Usage-Based Disturbance Counter Repair
- Publication number 20240363191
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Yang Lu
- G11 - INFORMATION STORAGE
Information Patent Application
PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES
- Publication number 20240363193
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Pranam Shetty
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR STORING MEMORY METADATA
- Publication number 20240274223
- Publication date Aug 15, 2024
- Micron Technology, Inc.
- Sujeet Ayyapureddi
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICES HAVING ENHANCED ERROR DETECTION AND MEMORY CELL REPAIR
- Publication number 20240257889
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Dong KIM
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND REPAIR METHOD OF THE MEMORY DEVICE
- Publication number 20240257898
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Taehong KWON
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Repair Device
- Publication number 20240233853
- Publication date Jul 11, 2024
- Magnachip Semiconductor, Ltd.
- Jun Soo KWACK
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING SEMICONDUCTOR M...
- Publication number 20240221860
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Jongcheol Kim
- G11 - INFORMATION STORAGE
Information Patent Application
LOGIC MODULE FOR USE WITH ENCODED INSTRUCTIONS
- Publication number 20240220419
- Publication date Jul 4, 2024
- PURE STORAGE, INC.
- Brian T. Gold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE
- Publication number 20240177793
- Publication date May 30, 2024
- SK HYNIX INC.
- Jin Ho JEONG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE PERFORMING TARGET REFRESH OPERATION AND OPERATING MET...
- Publication number 20240161861
- Publication date May 16, 2024
- SK HYNIX INC.
- Jung Taek YOU
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Repair Device
- Publication number 20240136007
- Publication date Apr 25, 2024
- Magnachip Semiconductor, Ltd.
- Jun Soo KWACK
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR DETECTION, CORRECTION, AND MEDIA MANAGEMENT ON A DRAM DEVICE
- Publication number 20240096438
- Publication date Mar 21, 2024
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY...
- Publication number 20240071560
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20240071559
- Publication date Feb 29, 2024
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR DETECTION FOR A SEMICONDUCTOR DEVICE
- Publication number 20230395183
- Publication date Dec 7, 2023
- Micron Technology, Inc.
- Matthew Young
- G11 - INFORMATION STORAGE
Information Patent Application
REPAIR SYSTEM AND REPAIR METHOD FOR SEMICONDUCTOR STRUCTURE, STORAG...
- Publication number 20230290424
- Publication date Sep 14, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Zhi YANG
- G11 - INFORMATION STORAGE
Information Patent Application
CONCURRENT COMPENSATION IN A MEMORY SYSTEM
- Publication number 20230207033
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Harish V. Gadamsetty
- G11 - INFORMATION STORAGE
Information Patent Application
ANTI-FUSE READOUT CIRCUIT, ANTI-FUSE MEMORY, AND TESTING METHOD
- Publication number 20230209815
- Publication date Jun 29, 2023
- Changxin Memory Technologies, Inc.
- Rumin JI
- G11 - INFORMATION STORAGE
Information Patent Application
PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES
- Publication number 20230197186
- Publication date Jun 22, 2023
- Micron Technology, Inc.
- Pranam Shetty
- G11 - INFORMATION STORAGE
Information Patent Application
Single Event Effect Mitigation with Smart-Redundancy
- Publication number 20230170038
- Publication date Jun 1, 2023
- University of Utah Research Foundation
- Aurelien Alacchi
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR PREPARING SEMICONDUCTOR DEVICE INCLUDING AN ELECTRONIC F...
- Publication number 20230139833
- Publication date May 4, 2023
- NANYA TECHNOLOGY CORPORATION
- Wu-Der YANG
- G11 - INFORMATION STORAGE
Information Patent Application
SELF-REPAIR FOR SEQUENTIAL SRAM
- Publication number 20230065591
- Publication date Mar 2, 2023
- Meta Platforms Technologies, LLC
- Huichu LIU
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND DEVICE FOR DETERMINING REPAIRED LINE AND REPAIRING LINE...
- Publication number 20230031361
- Publication date Feb 2, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Bo YANG
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND SYSTEM FOR REPAIRING FAULTY CELLS OF MEMORY DEVICE
- Publication number 20230019575
- Publication date Jan 19, 2023
- Samsung Electronics Co., Ltd.
- Helik Kanti Thacker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FUSE RECIPE UPDATE MECHANISM
- Publication number 20220405231
- Publication date Dec 22, 2022
- Intel Corporation
- Bharat Pillilli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROGRAMMING MEMORY CELLS WITH CONCURRENT STORAGE OF MULTI-LEVEL DAT...
- Publication number 20220406398
- Publication date Dec 22, 2022
- SANDISK TECHNOLOGIES LLC
- Xiang Yang
- G11 - INFORMATION STORAGE

using non-volatile cells or latches

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Triple modular redundancy for fault-tolerant in-memory computing

Single event effect mitigation with smart-redundancy

Method and system for repairing faulty cells of memory device

Systems and methods for testing redundant fuse latches in a memory...

Anti-fuse readout circuit, anti-fuse memory, and testing method

Preserving blocks experiencing program failure in memory devices

Apparatuses and methods for zone-based soft post-package repair

Repair system and repair method for semiconductor structure, storag...

Logic module for use with encoded instructions

Concurrent compensation in a memory system

Fuse recipe update mechanism

Method for preparing semiconductor device including an electronic f...

Memory device for column repair

Self-repair for sequential SRAM

Method and device for determining repaired line and repairing line...

Memory device, testing method and using method thereof, and memory...

Memory device, semiconductor device, and electronic device each inc...

Programming a memory device

Method and device for fail bit repairing

Controller to detect malfunctioning address of memory device

Quick configurable universal register for a configurable integrated...

Repair circuit and memory

Memory device with a memory repair mechanism and methods for operat...

Modifying subsets of memory bank operating parameters

Apparatus performing repair operation

Apparatuses and methods for refreshing memories with redundancy

Memory device for column repair

Programming memory cells with concurrent storage of multi-level dat...

Controller to detect malfunctioning address of memory device

Configurable built-in self-repair chain for fast repair data loading

Patents Applicationslast 30 patents

STACKED MEMORY AND MANUFACTURING METHOD THEREFOR

TRIPLE MODULAR REDUNDANCY FOR FAULT-TOLERANT IN-MEMORY COMPUTING

MEMORY DEVICE AND CONTROL METHOD THEREFOR

APPARATUSES AND METHODS FOR FORCING MEMORY CELL FAILURES IN A MEMOR...

Usage-Based Disturbance Counter Repair

PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES

APPARATUSES, SYSTEMS, AND METHODS FOR STORING MEMORY METADATA

STORAGE DEVICES HAVING ENHANCED ERROR DETECTION AND MEMORY CELL REPAIR

MEMORY DEVICE AND REPAIR METHOD OF THE MEMORY DEVICE

Memory Repair Device

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING SEMICONDUCTOR M...

LOGIC MODULE FOR USE WITH ENCODED INSTRUCTIONS

MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE

MEMORY DEVICE PERFORMING TARGET REFRESH OPERATION AND OPERATING MET...

Memory Repair Device

ERROR DETECTION, CORRECTION, AND MEDIA MANAGEMENT ON A DRAM DEVICE

SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY...

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

ERROR DETECTION FOR A SEMICONDUCTOR DEVICE

REPAIR SYSTEM AND REPAIR METHOD FOR SEMICONDUCTOR STRUCTURE, STORAG...

CONCURRENT COMPENSATION IN A MEMORY SYSTEM

ANTI-FUSE READOUT CIRCUIT, ANTI-FUSE MEMORY, AND TESTING METHOD

PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES

Single Event Effect Mitigation with Smart-Redundancy

METHOD FOR PREPARING SEMICONDUCTOR DEVICE INCLUDING AN ELECTRONIC F...

SELF-REPAIR FOR SEQUENTIAL SRAM

METHOD AND DEVICE FOR DETERMINING REPAIRED LINE AND REPAIRING LINE...

METHOD AND SYSTEM FOR REPAIRING FAULTY CELLS OF MEMORY DEVICE

FUSE RECIPE UPDATE MECHANISM

PROGRAMMING MEMORY CELLS WITH CONCURRENT STORAGE OF MULTI-LEVEL DAT...