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using photo-electric detection circuits for computing concentration
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G01N21/27
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PHYSICS
G01
Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/00
Investigating or analysing materials by the use of optical means
Current Industry
G01N21/27
using photo-electric detection circuits for computing concentration
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Patents Grants
last 30 patents
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Patent Grant
Optical sensor, paper sheet identification device, paper sheet proc...
Patent number
12,354,429
Issue date
Jul 8, 2025
Glory Ltd.
Daiki Takehara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Enhanced evanescent prism coupling systems and methods for characte...
Patent number
12,345,629
Issue date
Jul 1, 2025
Corning Incorporated
Rostislav Vatchev Roussev
G01 - MEASURING TESTING
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Patent Grant
Method for manufacturing carbon quantum dots showing discoloration...
Patent number
12,344,755
Issue date
Jul 1, 2025
Pukyong National University Industry—University Cooperation Foundation
Hyun Kyoung Yang
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
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Patent Grant
Optical measurement device and optical measurement method
Patent number
12,345,628
Issue date
Jul 1, 2025
Sekisui Medical Co., Ltd.
Motoki Morita
G01 - MEASURING TESTING
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Patent Grant
Communication system, monitoring system and related methods
Patent number
12,339,164
Issue date
Jun 24, 2025
trinamiX GmbH
Christoph Lungenschmied
G01 - MEASURING TESTING
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Patent Grant
QCL spectroscopy system and applications therefor
Patent number
12,339,225
Issue date
Jun 24, 2025
Block Engineering, LLC
Petros Kotidis
B82 - NANO-TECHNOLOGY
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Patent Grant
Dual resolution spectrometer, and spectrometric measurement apparat...
Patent number
12,332,164
Issue date
Jun 17, 2025
Samsung Electronics Co., Ltd.
Sunhong Jun
G01 - MEASURING TESTING
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Patent Grant
Medical spectroscopy and imaging analysis
Patent number
12,335,652
Issue date
Jun 17, 2025
Genetic Innovations, Inc.
Jeffrey N. Yu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Inspection method and inspection system
Patent number
12,326,399
Issue date
Jun 10, 2025
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Takanobu Ojima
G01 - MEASURING TESTING
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Patent Grant
Automatic two-component type resin inspection device, automatic two...
Patent number
12,327,346
Issue date
Jun 10, 2025
LG ENERGY SOLUTION, LTD.
Hyoung Bae Park
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cross-validation based calibration of a spectroscopic model
Patent number
12,320,743
Issue date
Jun 3, 2025
Viavi Solutions, Inc.
Chang Meng Hsiung
G01 - MEASURING TESTING
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Patent Grant
System level calibration
Patent number
12,320,752
Issue date
Jun 3, 2025
Ventana Medical Systems, Inc.
Karl Garsha
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detector wavelength calibration
Patent number
12,320,699
Issue date
Jun 3, 2025
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
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Patent Grant
Reference sample for a microscope, methods and uses
Patent number
12,320,744
Issue date
Jun 3, 2025
Carl Zeiss Microscopy GmbH
Volker Doering
G01 - MEASURING TESTING
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Patent Grant
Methods for detecting hook effect(s) associated with anaylte(s) of...
Patent number
12,313,626
Issue date
May 27, 2025
Siemens Healthcare Diagnostics Inc.
Julie Chaney
G01 - MEASURING TESTING
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Patent Grant
Cuvette for analysis of liquids
Patent number
12,313,528
Issue date
May 27, 2025
Cobio Smart Healthcare Technology Co., Ltd.
Yu Yin
G01 - MEASURING TESTING
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Patent Grant
Fluid analyzer with self-check, leak detection, and adjustable gain
Patent number
12,313,529
Issue date
May 27, 2025
Daylight Solutions, Inc.
H. T. Stinson
G01 - MEASURING TESTING
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Patent Grant
Cuttings imaging for determining geological properties
Patent number
12,315,137
Issue date
May 27, 2025
Schlumberger Technology Corporation
Simone Di Santo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dual beam single spatial mode laser for handheld libs instruments a...
Patent number
12,316,066
Issue date
May 27, 2025
SciAps, Inc.
David Welford
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Refractory anchor device and system
Patent number
12,305,925
Issue date
May 20, 2025
Brand Shared Services, LLC
Eduardo Fernando D'Oracio De Almeida
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Detection method
Patent number
12,298,230
Issue date
May 13, 2025
Biosurfit, S.A.
José Pedro Santos Manso Côrte-Real
G01 - MEASURING TESTING
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Patent Grant
Biological sample analysis device
Patent number
12,299,947
Issue date
May 13, 2025
HITACHI HIGH-TECH CORPORATION
Mayu Sao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fluorescent spectrum correcting method and fluorescent spectrum mea...
Patent number
12,298,231
Issue date
May 13, 2025
Sony Group Corporation
Masaya Kakuta
G01 - MEASURING TESTING
Information
Patent Grant
Method for recalibrating an electronic nose
Patent number
12,287,282
Issue date
Apr 29, 2025
ARYBALLE
Cyril Herrier
G01 - MEASURING TESTING
Information
Patent Grant
Substrate measurement subsystem
Patent number
12,283,503
Issue date
Apr 22, 2025
Applied Materials, Inc.
Upendra V. Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for detecting foodborne pathogens using spectra...
Patent number
12,276,600
Issue date
Apr 15, 2025
Hyperspectral Corp.
Euan Mowat
G01 - MEASURING TESTING
Information
Patent Grant
Compositional multispectral and hyperspectral imaging systems for m...
Patent number
12,270,185
Issue date
Apr 8, 2025
MineSense Technologies Ltd.
Daniel Thomsson
B60 - VEHICLES IN GENERAL
Information
Patent Grant
System and method for focusing color Schlieren diagnostics
Patent number
12,265,027
Issue date
Apr 1, 2025
Board of Supervisors of Louisiana State University and Agricultural and Mecha...
Ingmar Schoegl
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Comparing gemstone signatures using angular spectrum information
Patent number
12,259,333
Issue date
Mar 25, 2025
The RealReal, Inc.
Loretta Catherine Castoro
G01 - MEASURING TESTING
Information
Patent Grant
In-situ monitoring of chemical fingerprints in oilfield applications
Patent number
12,253,459
Issue date
Mar 18, 2025
Saudi Arabian Oil Company
Adrian Cesar Cavazos Sepulveda
E21 - EARTH DRILLING MINING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL APPARATUS
Publication number
20250234096
Publication date
Jul 17, 2025
Panasonic Intellectual Property Management Co., Ltd.
Yusuke KITAGAWA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SUBSTRATE MEASUREMENT SUBSYSTEM
Publication number
20250218829
Publication date
Jul 3, 2025
Applied Materials, Inc.
Upendra V. Ummethala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BEVERAGE FLAVORING CONTROL SYSTEM
Publication number
20250216372
Publication date
Jul 3, 2025
Christopher Singleton
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
CALIBRATION LIGHT SOURCE AND METHOD OF CALIBRATING SPECTROMETERS
Publication number
20250216256
Publication date
Jul 3, 2025
Endress+Hauser Optical Analysis, Inc.
Darren Schipper
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE COMPRISING A FITTING WITH A FLOW CHANNEL AND A MET...
Publication number
20250208081
Publication date
Jun 26, 2025
Endress + Hauser Conducta GmbH + Co. KG
Lukas Graf
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE FOR LASER EMISSION SPECTROSCOPIC ANALYSIS, LASER EMI...
Publication number
20250208030
Publication date
Jun 26, 2025
NIPPON STEEL CORPORATION
Norihiro TSUJI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING ONE OR MORE PROPERTIES OF AN OBJECT
Publication number
20250208032
Publication date
Jun 26, 2025
Northeastern University
Kristen Dorsey
G01 - MEASURING TESTING
Information
Patent Application
Food condition tracking method based on spectral images, food manag...
Publication number
20250180534
Publication date
Jun 5, 2025
SK PLANET CO., LTD.
Yeonghyeon PARK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Methods to Register and Interpret Lateral Flow Test Strip Assay Mea...
Publication number
20250172554
Publication date
May 29, 2025
Xtrava, Inc.
Sameh Sarhan
G01 - MEASURING TESTING
Information
Patent Application
TIME-RESOLVED SPECTRUM RAPID MEASUREMENT SYSTEM AND METHOD
Publication number
20250172489
Publication date
May 29, 2025
GBA BRANCH OF AEROSPACE INFORMATION RESEARCH INSTITUTE, CHINESE ACADEMY OF SC...
Zhenyou WANG
G01 - MEASURING TESTING
Information
Patent Application
Method and device for non-invasive tomographic characterisation of...
Publication number
20250164388
Publication date
May 22, 2025
INESC TEC - Instituto de Engenharia de Sistemas e Computadores Tecnologia e C...
Rui Miguel DA COSTA MARTINS
G01 - MEASURING TESTING
Information
Patent Application
Calibration Method and System
Publication number
20250164389
Publication date
May 22, 2025
PRECISION PLANTING LLC
Michael Molter
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR DETECTION OF A TARGET ANALYTE VIA SELF-TESTING, OBJECT S...
Publication number
20250146947
Publication date
May 8, 2025
Logicink Corporation
Carlos Edel OLGUIN ALVAREZ
G01 - MEASURING TESTING
Information
Patent Application
Method for Calibrating an Analysis System for Lab-on-a-Chip Cartridges
Publication number
20250146929
Publication date
May 8, 2025
ROBERT BOSCH GmbH
Ingo Ramsteiner
G01 - MEASURING TESTING
Information
Patent Application
SHOULDER MOUNTABLE REAL-TIME AIR QUALITY MEASUREMENT DEVICE AND AIR...
Publication number
20250146991
Publication date
May 8, 2025
Yale University
Drew Gentner
G01 - MEASURING TESTING
Information
Patent Application
Per-frequency correction of spectroscopic interference
Publication number
20250137921
Publication date
May 1, 2025
Picarro, Inc.
Chris W. Rella
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
Publication number
20250137993
Publication date
May 1, 2025
HITACHI HIGH-TECH CORPORATION
Michiko FUKUYAMA
G01 - MEASURING TESTING
Information
Patent Application
HEALTH TRACKING DEVICE
Publication number
20250125031
Publication date
Apr 17, 2025
VIAVI SOLUTIONS INC.
Nada A. O'BRIEN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS INCLUDING LIGHT RECEIVING DEVICE AND...
Publication number
20250126924
Publication date
Apr 17, 2025
ASM IP HOLDING B.V.
Kazuhiro Nishiwaki
G01 - MEASURING TESTING
Information
Patent Application
COAL ANALYZER, COAL ANALYSIS METHOD, MIXED COAL PREPARATION METHOD,...
Publication number
20250116602
Publication date
Apr 10, 2025
JFE STEEL CORPORATION
Toshiki TSUBOI
C10 - PETROLEUM, GAS OR COKE INDUSTRIES TECHNICAL GASES CONTAINING CARBON MON...
Information
Patent Application
MULTIPLEXED BIOLOGICAL ASSAY DEVICE WITH ELECTRONIC READOUT
Publication number
20250114789
Publication date
Apr 10, 2025
Pfizer Inc.
Frank B. Myers
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
SYSTEMS AND METHODS FOR CALIBRATING INSTRUMENTS THAT MEASURE TEMPER...
Publication number
20250102423
Publication date
Mar 27, 2025
Becton, Dickinson and Company
James R. Petisce
G01 - MEASURING TESTING
Information
Patent Application
LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPAR...
Publication number
20250093261
Publication date
Mar 20, 2025
Samsung Electronics Co., Ltd.
Unjeong Kim
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE PROCESSING DEVICE AND SUBSTRATE PROCESSING METHOD
Publication number
20250095974
Publication date
Mar 20, 2025
Samsung Electronics Co., Ltd.
Yongseok LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEGRADATION STATE DETERMINATION METHOD, DEGRADATION STATE DETERMINA...
Publication number
20250078321
Publication date
Mar 6, 2025
BRIDGESTONE CORPORATION
Taku YAMAMOTO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR EVALUATING FINGERPRINT RESISTANCE, LAMINATE, PRODUCTION...
Publication number
20250076187
Publication date
Mar 6, 2025
Japan Aviation Electronics Industry, Ltd.
Shingo TAKATA
G01 - MEASURING TESTING
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Patent Application
METHOD FOR EVALUATING FINGERPRINT RESISTANCE, LAMINATE, PRODUCTION...
Publication number
20250076188
Publication date
Mar 6, 2025
Japan Aviation Electronics Industry, Ltd.
Shingo TAKATA
G01 - MEASURING TESTING
Information
Patent Application
DIFFERENTIAL MEASUREMENT OF IR ABSORPTION IN PLASMONIC MEMS SENSORS
Publication number
20250076190
Publication date
Mar 6, 2025
TEXAS INSTRUMENTS INCORPORATED
Jeronimo Segovia Fernandez
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PROCESSES AND SYSTEMS FOR MONITORING ONE OR MORE GASES DISSOLVED IN...
Publication number
20250076274
Publication date
Mar 6, 2025
SCHLUMBERGER TECHNOLOGY CORPORATION
Richa Sharma
G01 - MEASURING TESTING
Information
Patent Application
LIGHT INTENSITY CONTROLLER AND LASER WAVELENGTH SCANNING DOUBLE-BEA...
Publication number
20250076186
Publication date
Mar 6, 2025
Government of the United States of America, as Represented by the Secretary o...
Young Jong Lee
G01 - MEASURING TESTING