using plasma burners or torches

Industry

CPC
G01N21/73

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/73using plasma burners or torches

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Sliding door assembly for an ICP torch box
- Patent number 12,146,791
- Issue date Nov 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Tobias Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for element identification via optical emission s...
- Patent number 12,140,478
- Issue date Nov 12, 2024
- Agilent Technologies, Inc.
- Daniel Finn McCarthy
- G01 - MEASURING TESTING
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 12,094,738
- Issue date Sep 17, 2024
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multivariate optimization of microwave digestion for determining of...
- Patent number 12,092,580
- Issue date Sep 17, 2024
- KING FAISAL UNIVERSITY
- Abuzer Ebead Awad Elkarim Albadri
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for ICPMS instrument stability control with strong acid resi...
- Patent number 12,040,172
- Issue date Jul 16, 2024
- Elemental Scientific, Inc.
- Kevin Wiederin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for handling small samples with multiple vacuum c...
- Patent number 11,927,508
- Issue date Mar 12, 2024
- Elemental Scientific, Inc.
- Kevin Wiederin
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for inline, dual-stage sample dilution
- Patent number 11,911,759
- Issue date Feb 27, 2024
- Elemental Scientific Inc.
- Daniel R. Wiederin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser ablation device and analysis apparatus
- Patent number 11,892,428
- Issue date Feb 6, 2024
- S.T. Japan Inc.
- Takao Nakagawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device and method for detecting concentration of specimen
- Patent number 11,860,107
- Issue date Jan 2, 2024
- Seoul National University R&DB Foundation
- Jai Ick Yoh
- G01 - MEASURING TESTING
Information Patent Grant
Detecting method and detecting device of gas components and process...
- Patent number 11,835,465
- Issue date Dec 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi Ogawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Nebulizer, sample introduction unit, and analysis device
- Patent number 11,826,770
- Issue date Nov 28, 2023
- National Institute of Advanced Industrial Science and Technology
- Kazumi Inagaki
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,804,390
- Issue date Oct 31, 2023
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,705,351
- Issue date Jul 18, 2023
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,694,914
- Issue date Jul 4, 2023
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector protection in an optical emission spectrometer
- Patent number 11,609,118
- Issue date Mar 21, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Eike Jasper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample introduction device, inductively coupled plasma analyzing de...
- Patent number 11,579,092
- Issue date Feb 14, 2023
- Sumco Corporation
- Taisuke Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Inductively coupled plasma spectrometric system and inductively cou...
- Patent number 11,538,672
- Issue date Dec 27, 2022
- National Institute of Advanced Industrial Science and Technology
- Yoshiyuki Teramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for prioritization of collecting and analyzing liquid samples
- Patent number 11,531,038
- Issue date Dec 20, 2022
- Elemental Scientific Inc.
- Daniel R. Wiederin
- G01 - MEASURING TESTING
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,476,134
- Issue date Oct 18, 2022
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of geochemical characterization, production allocation, and...
- Patent number 11,460,408
- Issue date Oct 4, 2022
- University of Houston System
- John F. Casey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic evaporative sample preparation
- Patent number 11,441,978
- Issue date Sep 13, 2022
- Elemental Scientific, Inc.
- Daniel R. Wiederin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining weight-average molecular weight and content...
- Patent number 11,366,086
- Issue date Jun 21, 2022
- SHANGHAI GREEN VALLEY PHARMACEUTICAL CO., LTD.
- Zhenqing Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for ICPMS matrix offset calibration
- Patent number 11,348,773
- Issue date May 31, 2022
- Elemental Scientific, Inc.
- Daniel R. Wiederin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hydride generation system
- Patent number 11,316,462
- Issue date Apr 26, 2022
- Elemental Scientific, Inc.
- Daniel R. Wiederin
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Systems and methods for inline, dual-stage sample dilution
- Patent number 11,285,473
- Issue date Mar 29, 2022
- Elemental Scientific, Inc.
- Daniel R. Wiederin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling dry etch process characteristics using waferless dry cl...
- Patent number 11,273,469
- Issue date Mar 15, 2022
- Tokyo Electron Limited
- Brian J. Coppa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for collecting liquid samples
- Patent number 11,249,101
- Issue date Feb 15, 2022
- Elemental Scientific, Inc.
- David Diaz
- G01 - MEASURING TESTING
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 11,244,841
- Issue date Feb 8, 2022
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometers and instruments including them
- Patent number 11,221,254
- Issue date Jan 11, 2022
- PerkinElmer Health Sciences, Inc.
- Mahsa Farsad
- G01 - MEASURING TESTING
Information Patent Grant
Auto-sampling system with inline preparation of concentrated sulfur...
- Patent number 11,156,629
- Issue date Oct 26, 2021
- Elemental Scientific, Inc.
- Daniel R. Wiederin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC BEAD AND MAGNETIC BEAD REAGENT
- Publication number 20240376575
- Publication date Nov 14, 2024
- SEIKO EPSON CORPORATION
- Fumio TAKAGI
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
Non-Intrusive Method for 2D/3D Mapping Plasma Parameters
- Publication number 20240377331
- Publication date Nov 14, 2024
- TOKYO ELECTRON LIMITED
- Qiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA TORCH DEVICE COMPONENT MONITORING
- Publication number 20240381519
- Publication date Nov 14, 2024
- Edwards Limited
- Gary Peter Knight
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MATERIAL CHARACTERIZATION USING COLD ATMOSPHERIC PLASMA
- Publication number 20240344996
- Publication date Oct 17, 2024
- SirenOpt Inc.
- Ali MESBAH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR INLINE, DUAL-STAGE SAMPLE DILUTION
- Publication number 20240299928
- Publication date Sep 12, 2024
- ELEMENTAL SCIENTIFIC, INC.
- Daniel R. Wiederin
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
PLASMA CONTROL FOR SPARK OPTICAL EMISSION SPECTROSCOPY
- Publication number 20240284581
- Publication date Aug 22, 2024
- THERMO FISHER SCIENTIFIC (ECUBLENS) SARL
- Patrick LANCUBA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR QUALITY EXAMINATION OF CATHODE MATERIALS FOR LITHIUM-ION...
- Publication number 20240222590
- Publication date Jul 4, 2024
- Advanced Lithium Electrochemistry Co., Ltd.
- Yung-Tsung Liao
- G01 - MEASURING TESTING
Information Patent Application
Simulating Dissolution of Scale in Wells
- Publication number 20240167997
- Publication date May 23, 2024
- Saudi Arabian Oil Company
- Mohammed Sayed
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR ANALYZING A SAMPLE
- Publication number 20240118212
- Publication date Apr 11, 2024
- Analytik Jena GmbH+Co. KG
- Marcus Großmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR ELEMENT IDENTIFICATION VIA OPTICAL EMISSION S...
- Publication number 20240053201
- Publication date Feb 15, 2024
- Daniel Finn McCarthy
- G01 - MEASURING TESTING
Information Patent Application
GENERATING INDUCTIVELY COUPLED PLASMA
- Publication number 20240032181
- Publication date Jan 25, 2024
- PERKINELMER U.S. LLC
- Peter Morrisroe
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
- Publication number 20240006201
- Publication date Jan 4, 2024
- ELEMENTAL SCIENTIFIC, INC.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPARK STAND ASSEMBLY FOR AN OPTICAL EMISSION SPECTROSCOPY INSTRUMENT
- Publication number 20240003817
- Publication date Jan 4, 2024
- Hitachi High-Tech Analytical Science GmbH
- André PETERS
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
- Publication number 20230395406
- Publication date Dec 7, 2023
- ELEMENTAL SCIENTIFIC, INC.
- Tyler Yost
- G01 - MEASURING TESTING
Information Patent Application
Method for Analyzing Content and Distribution of Boron Introduced I...
- Publication number 20230324304
- Publication date Oct 12, 2023
- LG CHEM, LTD.
- Jung Hye Won
- G01 - MEASURING TESTING
Information Patent Application
Direct Single Particle Compositional Analysis
- Publication number 20230197431
- Publication date Jun 22, 2023
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Chady Stephan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR PRIORITIZATION OF COLLECTING AND ANALYZING LIQUID SAMPLES
- Publication number 20230152340
- Publication date May 18, 2023
- ELEMENTAL SCIENTIFIC, INC.
- Daniel R. Wiederin
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
- Publication number 20230111929
- Publication date Apr 13, 2023
- ELEMENTAL SCIENTIFIC, INC.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE TRANSMISSION APERTURE
- Publication number 20220349750
- Publication date Nov 3, 2022
- Agilent Technologies, Inc.
- Mark Junker
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVELY COUPLED PLASMA TORCH STRUCTURE WITH PROTECTED INJECTOR
- Publication number 20220346215
- Publication date Oct 27, 2022
- ELEMENTAL SCIENTIFIC, INC.
- Daniel R. Wiederin
- G01 - MEASURING TESTING
Information Patent Application
A SLIDING DOOR ASSEMBLY FOR AN ICP TORCH BOX
- Publication number 20220260498
- Publication date Aug 18, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Tobias Wolf
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR COLLECTING LIQUID SAMPLES
- Publication number 20220252630
- Publication date Aug 11, 2022
- ELEMENTAL SCIENTIFIC, INC.
- David Diaz
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR INLINE, DUAL-STAGE SAMPLE DILUTION
- Publication number 20220250052
- Publication date Aug 11, 2022
- ELEMENTAL SCIENTIFIC, INC.
- Daniel R. Wiederin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
- Publication number 20220189794
- Publication date Jun 16, 2022
- ELEMENTAL SCIENTIFIC, INC.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA SOURCE CHAMBER FOR A SPECTROMETER
- Publication number 20220187212
- Publication date Jun 16, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Norbert QUAAS
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD FOR DETERMINING FREE RADICALS IN CaO-Al2O3 SERIES OXIDE MELTS
- Publication number 20220178800
- Publication date Jun 9, 2022
- WUHAN UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Ao HUANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTING CONCENTRATION OF SPECIMEN
- Publication number 20220136975
- Publication date May 5, 2022
- Seoul National University R&DB Foundation
- Jai Ick YOH
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVELY COUPLED PLASMA TORCH WITH REVERSE VORTEX FLOW AND METHO...
- Publication number 20210404968
- Publication date Dec 30, 2021
- Fluidigm Canada Inc.
- Alexander V. Loboda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...
- Publication number 20210384047
- Publication date Dec 9, 2021
- ELEMENTAL SCIENTIFIC, INC.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE INTRODUCTION DEVICE, INDUCTIVELY COUPLED PLASMA ANALYZING DE...
- Publication number 20210333212
- Publication date Oct 28, 2021
- SUMCO CORPORATION
- Taisuke Mizuno
- G01 - MEASURING TESTING

using plasma burners or torches

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sliding door assembly for an ICP torch box

Method and system for element identification via optical emission s...

Systems for integrated decomposition and scanning of a semiconducti...

Multivariate optimization of microwave digestion for determining of...

Method for ICPMS instrument stability control with strong acid resi...

System and method for handling small samples with multiple vacuum c...

Systems and methods for inline, dual-stage sample dilution

Laser ablation device and analysis apparatus

Device and method for detecting concentration of specimen

Detecting method and detecting device of gas components and process...

Nebulizer, sample introduction unit, and analysis device

Systems for integrated decomposition and scanning of a semiconducti...

Systems for integrated decomposition and scanning of a semiconducti...

Systems for integrated decomposition and scanning of a semiconducti...

Detector protection in an optical emission spectrometer

Sample introduction device, inductively coupled plasma analyzing de...

Inductively coupled plasma spectrometric system and inductively cou...

System for prioritization of collecting and analyzing liquid samples

Systems for integrated decomposition and scanning of a semiconducti...

Method of geochemical characterization, production allocation, and...

Automatic evaporative sample preparation

Method for determining weight-average molecular weight and content...

Systems and methods for ICPMS matrix offset calibration

Hydride generation system

Systems and methods for inline, dual-stage sample dilution

Controlling dry etch process characteristics using waferless dry cl...

System for collecting liquid samples

Systems for integrated decomposition and scanning of a semiconducti...

Spectrometers and instruments including them

Auto-sampling system with inline preparation of concentrated sulfur...

Patents Applicationslast 30 patents

MAGNETIC BEAD AND MAGNETIC BEAD REAGENT

Non-Intrusive Method for 2D/3D Mapping Plasma Parameters

PLASMA TORCH DEVICE COMPONENT MONITORING

MATERIAL CHARACTERIZATION USING COLD ATMOSPHERIC PLASMA

SYSTEMS AND METHODS FOR INLINE, DUAL-STAGE SAMPLE DILUTION

PLASMA CONTROL FOR SPARK OPTICAL EMISSION SPECTROSCOPY

METHOD FOR QUALITY EXAMINATION OF CATHODE MATERIALS FOR LITHIUM-ION...

Simulating Dissolution of Scale in Wells

SYSTEM FOR ANALYZING A SAMPLE

METHOD AND SYSTEM FOR ELEMENT IDENTIFICATION VIA OPTICAL EMISSION S...

GENERATING INDUCTIVELY COUPLED PLASMA

SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...

SPARK STAND ASSEMBLY FOR AN OPTICAL EMISSION SPECTROSCOPY INSTRUMENT

SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...

Method for Analyzing Content and Distribution of Boron Introduced I...

Direct Single Particle Compositional Analysis

SYSTEM FOR PRIORITIZATION OF COLLECTING AND ANALYZING LIQUID SAMPLES

SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...

VARIABLE TRANSMISSION APERTURE

INDUCTIVELY COUPLED PLASMA TORCH STRUCTURE WITH PROTECTED INJECTOR

A SLIDING DOOR ASSEMBLY FOR AN ICP TORCH BOX

SYSTEM FOR COLLECTING LIQUID SAMPLES

SYSTEMS AND METHODS FOR INLINE, DUAL-STAGE SAMPLE DILUTION

SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...

PLASMA SOURCE CHAMBER FOR A SPECTROMETER

METHOD FOR DETERMINING FREE RADICALS IN CaO-Al2O3 SERIES OXIDE MELTS

DEVICE AND METHOD FOR DETECTING CONCENTRATION OF SPECIMEN

INDUCTIVELY COUPLED PLASMA TORCH WITH REVERSE VORTEX FLOW AND METHO...

SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTI...

SAMPLE INTRODUCTION DEVICE, INDUCTIVELY COUPLED PLASMA ANALYZING DE...