using programmable devices

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CPC
G11C29/78

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/78using programmable devices

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Global column repair with local column decoder circuitry, and relat...
- Patent number 12,242,346
- Issue date Mar 4, 2025
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 12,230,350
- Issue date Feb 18, 2025
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and memory system including the same
- Patent number 12,205,661
- Issue date Jan 21, 2025
- Samsung Electronics Co., Ltd.
- Sung-Rae Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory and method with in-memory computing defect detection
- Patent number 12,198,775
- Issue date Jan 14, 2025
- Samsung Electronics Co., Ltd.
- Sungmeen Myung
- G11 - INFORMATION STORAGE
Information Patent Grant
Read window management in a memory system
- Patent number 12,198,777
- Issue date Jan 14, 2025
- Micron Technology, Inc.
- Li-Te Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array having error checking and correction circuit
- Patent number 12,190,981
- Issue date Jan 7, 2025
- Winbond Electronics Corp.
- Yao-Ting Tsai
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 12,148,497
- Issue date Nov 19, 2024
- Denso Corporation
- Tetsuro Takizawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Error correction in a memory device having an error correction code...
- Patent number 12,142,333
- Issue date Nov 12, 2024
- Micron Technology, Inc.
- Mustafa N. Kaynak
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device structure having multiple fuse elements
- Patent number 12,137,552
- Issue date Nov 5, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory and operation method of memory with repairing and random pul...
- Patent number 12,136,450
- Issue date Nov 5, 2024
- SK Hynix Inc.
- Woongrae Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Triple modular redundancy for fault-tolerant in-memory computing
- Patent number 12,131,793
- Issue date Oct 29, 2024
- Micron Technology, Inc.
- Agostino Pirovano
- G11 - INFORMATION STORAGE
Information Patent Grant
Single event effect mitigation with smart-redundancy
- Patent number 12,112,820
- Issue date Oct 8, 2024
- University of Utah Research Foundation
- Aurelien Alacchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-channel memory device capable of switching redundancy memory...
- Patent number 12,112,822
- Issue date Oct 8, 2024
- Winbond Electronics Corp.
- Chih-Feng Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for repairing faulty cells of memory device
- Patent number 12,112,823
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Helik Kanti Thacker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for testing redundant fuse latches in a memory...
- Patent number 12,100,467
- Issue date Sep 24, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Modular error correction code circuitry
- Patent number 12,094,551
- Issue date Sep 17, 2024
- Intel Corporation
- Hwa Chaw Law
- G11 - INFORMATION STORAGE
Information Patent Grant
Anti-fuse readout circuit, anti-fuse memory, and testing method
- Patent number 12,082,402
- Issue date Sep 3, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Rumin Ji
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory, memory system, operation method of the memory, and operatio...
- Patent number 12,073,902
- Issue date Aug 27, 2024
- SK Hynix Inc.
- Kyung Whan Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Preserving blocks experiencing program failure in memory devices
- Patent number 12,068,052
- Issue date Aug 20, 2024
- Micron Technology, Inc.
- Pranam Shetty
- G11 - INFORMATION STORAGE
Information Patent Grant
Redundancy managing method and apparatus for semiconductor memories
- Patent number 12,046,319
- Issue date Jul 23, 2024
- SK Hynix Inc.
- Jong Sun Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Buffer circuit with adaptive repair capability
- Patent number 12,040,035
- Issue date Jul 16, 2024
- RAMBUS INC.
- Scott C. Best
- G11 - INFORMATION STORAGE
Information Patent Grant
NPU capable of testing component including memory during runtime
- Patent number 12,040,040
- Issue date Jul 16, 2024
- DEEPX CO., LTD.
- Lok Won Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
NPU capable of testing component therein during runtime, the testin...
- Patent number 12,033,713
- Issue date Jul 9, 2024
- DEEPX CO., LTD.
- Lok Won Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device, apparatus and storage medium for repairing failed bits
- Patent number 12,027,223
- Issue date Jul 2, 2024
- Changxin Memory Technologies, Inc.
- Yui-Lang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for selectively operating multiple memory groups in d...
- Patent number 12,020,763
- Issue date Jun 25, 2024
- SK Hynix Inc.
- Hyung-Sik Won
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for selectively operating multiple memory groups in d...
- Patent number 12,020,764
- Issue date Jun 25, 2024
- SK Hynix Inc.
- Hyung-Sik Won
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory fault handling method and apparatus, device, and storage medium
- Patent number 12,014,791
- Issue date Jun 18, 2024
- Huawei Technologies Co., Ltd.
- Guangyi Qiao
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for detecting errors in a memory device
- Patent number 12,009,041
- Issue date Jun 11, 2024
- ARM Limited
- Siddharth Gupta
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and refresh method thereof
- Patent number 12,002,502
- Issue date Jun 4, 2024
- Samsung Electronics Co., Ltd.
- Seungki Hong
- G11 - INFORMATION STORAGE
Information Patent Grant
Neural processing unit capable of testing component therein during...
- Patent number 11,990,203
- Issue date May 21, 2024
- DEEPX CO., LTD.
- Lok Won Kim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUSES AND METHODS FOR GRANULAR SINGLE-PASS METADATA ACCESS OP...
- Publication number 20250111887
- Publication date Apr 3, 2025
- Micron Technology, Inc.
- Sujeet Ayyapureddi
- G11 - INFORMATION STORAGE
Information Patent Application
READ WINDOW MANAGEMENT IN A MEMORY SYSTEM
- Publication number 20250111886
- Publication date Apr 3, 2025
- Micron Technology, Inc.
- Li-Te Chang
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE, AND MEMORY SYSTEM AND OPERATION METHOD THEREOF
- Publication number 20250104795
- Publication date Mar 27, 2025
- Yangtze Memory Technologies Co., Ltd.
- Feiyang ZHANG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY ISOLATION TO IMPROVE SYSTEM RELIABILITY
- Publication number 20250104797
- Publication date Mar 27, 2025
- Intel Corporation
- Zhiguo Wei
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER FOR MANAGING BAD BLOCK, STORAGE DEVICE INCLUDING THE SAM...
- Publication number 20250104798
- Publication date Mar 27, 2025
- SK HYNIX INC.
- Se Joong KIM
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR CONDITION MONITORING IN MEMORY SYSTEMS
- Publication number 20250095765
- Publication date Mar 20, 2025
- SK HYNIX INC.
- Pengfei HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
STATIC RANDOM ACCESS MEMORY (SRAM) FAULT CORRECTION
- Publication number 20250087295
- Publication date Mar 13, 2025
- QUALCOMM Incorporated
- Darshan Kumar Nandanwar
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY REPAIRS
- Publication number 20250087294
- Publication date Mar 13, 2025
- Micron Technology, Inc.
- Sukneet S. Basuta
- G11 - INFORMATION STORAGE
Information Patent Application
Row Repair Circuitry
- Publication number 20250087296
- Publication date Mar 13, 2025
- ARM Limited
- Andy Wangkun Chen
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME
- Publication number 20250078947
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Sung-Rae KIM
- G11 - INFORMATION STORAGE
Information Patent Application
FLEXIBLE ADDRESS SWAP COLUMN REDUNDANCY
- Publication number 20250069683
- Publication date Feb 27, 2025
- Micron Technology, Inc.
- Luyen Vu
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH A STORAGE COMPONENT
- Publication number 20250061960
- Publication date Feb 20, 2025
- Micron Technology, Inc.
- Lingming Yang
- G11 - INFORMATION STORAGE
Information Patent Application
STACKED MEMORY AND MANUFACTURING METHOD THEREFOR
- Publication number 20250037785
- Publication date Jan 30, 2025
- UltraMemory Inc.
- Yasutoshi YAMADA
- G11 - INFORMATION STORAGE
Information Patent Application
TRIPLE MODULAR REDUNDANCY FOR FAULT-TOLERANT IN-MEMORY COMPUTING
- Publication number 20250037786
- Publication date Jan 30, 2025
- Micron Technology, Inc.
- Agostino Pirovano
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND CONTROL METHOD THEREFOR
- Publication number 20240428878
- Publication date Dec 26, 2024
- CXMT Corporation
- Zequn HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
BUFFER CIRCUIT WITH ADAPTIVE REPAIR CAPABILITY
- Publication number 20240420793
- Publication date Dec 19, 2024
- Rambus Inc.
- Scott C. Best
- G11 - INFORMATION STORAGE
Information Patent Application
DISTRIBUTED MRAM CONFIGURATION BIT AND METHOD OF REPAIR
- Publication number 20240420796
- Publication date Dec 19, 2024
- EVERSPIN TECHNOLOGIES, INC.
- Syed M. ALAM
- G11 - INFORMATION STORAGE
Information Patent Application
ONE-TIME-PROGRAMMABLE (OTP) MEMORY WITH ERROR DETECTION
- Publication number 20240420795
- Publication date Dec 19, 2024
- NXP USA, Inc.
- Nicholas Justin Mountford Spence
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...
- Publication number 20240412802
- Publication date Dec 12, 2024
- MimirIP LLC
- Kyung Whan KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR FORCING MEMORY CELL FAILURES IN A MEMOR...
- Publication number 20240395349
- Publication date Nov 28, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Application
Extending Dual Inline Memory Module (DIMM) Lifespans Based on Fault...
- Publication number 20240395350
- Publication date Nov 28, 2024
- Google LLC
- Fabrice Aidan
- G11 - INFORMATION STORAGE
Information Patent Application
Usage-Based Disturbance Counter Repair
- Publication number 20240363191
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Yang Lu
- G11 - INFORMATION STORAGE
Information Patent Application
PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES
- Publication number 20240363193
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Pranam Shetty
- G11 - INFORMATION STORAGE
Information Patent Application
NPU WITH CAPABILITY OF BUILT-IN SELF-TEST
- Publication number 20240321384
- Publication date Sep 26, 2024
- DEEPX CO., LTD.
- Lok Won KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NPU CAPABLE OF PERFORMING RUNTIME TEST
- Publication number 20240274224
- Publication date Aug 15, 2024
- DEEPX CO., LTD.
- Lok Won KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR STORING MEMORY METADATA
- Publication number 20240274223
- Publication date Aug 15, 2024
- Micron Technology, Inc.
- Sujeet Ayyapureddi
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR PERFORMING AGING TEST ON SEMICONDUCTOR USED FOR NEURAL N...
- Publication number 20240274225
- Publication date Aug 15, 2024
- DEEPX CO., LTD.
- Lok Won KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING FUSE ARRAY
- Publication number 20240265992
- Publication date Aug 8, 2024
- Micron Technology, Inc.
- YASUSHI MATSUBARA
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICES HAVING ENHANCED ERROR DETECTION AND MEMORY CELL REPAIR
- Publication number 20240257889
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Dong KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE HAVING FUSE ELEMENTS
- Publication number 20240260259
- Publication date Aug 1, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der YANG
- G11 - INFORMATION STORAGE

using programmable devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Global column repair with local column decoder circuitry, and relat...

Controller to detect malfunctioning address of memory device

Memory device and memory system including the same

Memory and method with in-memory computing defect detection

Read window management in a memory system

Memory array having error checking and correction circuit

Semiconductor memory device

Error correction in a memory device having an error correction code...

Semiconductor device structure having multiple fuse elements

Memory and operation method of memory with repairing and random pul...

Triple modular redundancy for fault-tolerant in-memory computing

Single event effect mitigation with smart-redundancy

Multi-channel memory device capable of switching redundancy memory...

Method and system for repairing faulty cells of memory device

Systems and methods for testing redundant fuse latches in a memory...

Modular error correction code circuitry

Anti-fuse readout circuit, anti-fuse memory, and testing method

Memory, memory system, operation method of the memory, and operatio...

Preserving blocks experiencing program failure in memory devices

Redundancy managing method and apparatus for semiconductor memories

Buffer circuit with adaptive repair capability

NPU capable of testing component including memory during runtime

NPU capable of testing component therein during runtime, the testin...

Method, device, apparatus and storage medium for repairing failed bits

Memory device for selectively operating multiple memory groups in d...

Memory device for selectively operating multiple memory groups in d...

Memory fault handling method and apparatus, device, and storage medium

Apparatus and method for detecting errors in a memory device

Memory device and refresh method thereof

Neural processing unit capable of testing component therein during...

Patents Applicationslast 30 patents

APPARATUSES AND METHODS FOR GRANULAR SINGLE-PASS METADATA ACCESS OP...

READ WINDOW MANAGEMENT IN A MEMORY SYSTEM

MEMORY DEVICE, AND MEMORY SYSTEM AND OPERATION METHOD THEREOF

MEMORY ISOLATION TO IMPROVE SYSTEM RELIABILITY

CONTROLLER FOR MANAGING BAD BLOCK, STORAGE DEVICE INCLUDING THE SAM...

ERROR CONDITION MONITORING IN MEMORY SYSTEMS

STATIC RANDOM ACCESS MEMORY (SRAM) FAULT CORRECTION

MEMORY REPAIRS

Row Repair Circuitry

MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME

FLEXIBLE ADDRESS SWAP COLUMN REDUNDANCY

MEMORY DEVICE WITH A STORAGE COMPONENT

STACKED MEMORY AND MANUFACTURING METHOD THEREFOR

TRIPLE MODULAR REDUNDANCY FOR FAULT-TOLERANT IN-MEMORY COMPUTING

MEMORY DEVICE AND CONTROL METHOD THEREFOR

BUFFER CIRCUIT WITH ADAPTIVE REPAIR CAPABILITY

DISTRIBUTED MRAM CONFIGURATION BIT AND METHOD OF REPAIR

ONE-TIME-PROGRAMMABLE (OTP) MEMORY WITH ERROR DETECTION

MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...

APPARATUSES AND METHODS FOR FORCING MEMORY CELL FAILURES IN A MEMOR...

Extending Dual Inline Memory Module (DIMM) Lifespans Based on Fault...

Usage-Based Disturbance Counter Repair

PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES

NPU WITH CAPABILITY OF BUILT-IN SELF-TEST

NPU CAPABLE OF PERFORMING RUNTIME TEST

APPARATUSES, SYSTEMS, AND METHODS FOR STORING MEMORY METADATA

METHOD FOR PERFORMING AGING TEST ON SEMICONDUCTOR USED FOR NEURAL N...

SEMICONDUCTOR DEVICE HAVING FUSE ARRAY

STORAGE DEVICES HAVING ENHANCED ERROR DETECTION AND MEMORY CELL REPAIR

SEMICONDUCTOR DEVICE STRUCTURE HAVING FUSE ELEMENTS