using programmable devices

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CPC
G11C29/78

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/78using programmable devices

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Memory device and memory system including the same
- Patent number 12,205,661
- Issue date Jan 21, 2025
- Samsung Electronics Co., Ltd.
- Sung-Rae Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory and method with in-memory computing defect detection
- Patent number 12,198,775
- Issue date Jan 14, 2025
- Samsung Electronics Co., Ltd.
- Sungmeen Myung
- G11 - INFORMATION STORAGE
Information Patent Grant
Read window management in a memory system
- Patent number 12,198,777
- Issue date Jan 14, 2025
- Micron Technology, Inc.
- Li-Te Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array having error checking and correction circuit
- Patent number 12,190,981
- Issue date Jan 7, 2025
- Winbond Electronics Corp.
- Yao-Ting Tsai
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 12,148,497
- Issue date Nov 19, 2024
- Denso Corporation
- Tetsuro Takizawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Error correction in a memory device having an error correction code...
- Patent number 12,142,333
- Issue date Nov 12, 2024
- Micron Technology, Inc.
- Mustafa N. Kaynak
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device structure having multiple fuse elements
- Patent number 12,137,552
- Issue date Nov 5, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory and operation method of memory with repairing and random pul...
- Patent number 12,136,450
- Issue date Nov 5, 2024
- SK Hynix Inc.
- Woongrae Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Triple modular redundancy for fault-tolerant in-memory computing
- Patent number 12,131,793
- Issue date Oct 29, 2024
- Micron Technology, Inc.
- Agostino Pirovano
- G11 - INFORMATION STORAGE
Information Patent Grant
Single event effect mitigation with smart-redundancy
- Patent number 12,112,820
- Issue date Oct 8, 2024
- University of Utah Research Foundation
- Aurelien Alacchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-channel memory device capable of switching redundancy memory...
- Patent number 12,112,822
- Issue date Oct 8, 2024
- Winbond Electronics Corp.
- Chih-Feng Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for repairing faulty cells of memory device
- Patent number 12,112,823
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Helik Kanti Thacker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for testing redundant fuse latches in a memory...
- Patent number 12,100,467
- Issue date Sep 24, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Modular error correction code circuitry
- Patent number 12,094,551
- Issue date Sep 17, 2024
- Intel Corporation
- Hwa Chaw Law
- G11 - INFORMATION STORAGE
Information Patent Grant
Anti-fuse readout circuit, anti-fuse memory, and testing method
- Patent number 12,082,402
- Issue date Sep 3, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Rumin Ji
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory, memory system, operation method of the memory, and operatio...
- Patent number 12,073,902
- Issue date Aug 27, 2024
- SK Hynix Inc.
- Kyung Whan Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Preserving blocks experiencing program failure in memory devices
- Patent number 12,068,052
- Issue date Aug 20, 2024
- Micron Technology, Inc.
- Pranam Shetty
- G11 - INFORMATION STORAGE
Information Patent Grant
Redundancy managing method and apparatus for semiconductor memories
- Patent number 12,046,319
- Issue date Jul 23, 2024
- SK Hynix Inc.
- Jong Sun Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Buffer circuit with adaptive repair capability
- Patent number 12,040,035
- Issue date Jul 16, 2024
- RAMBUS INC.
- Scott C. Best
- G11 - INFORMATION STORAGE
Information Patent Grant
NPU capable of testing component including memory during runtime
- Patent number 12,040,040
- Issue date Jul 16, 2024
- DEEPX CO., LTD.
- Lok Won Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
NPU capable of testing component therein during runtime, the testin...
- Patent number 12,033,713
- Issue date Jul 9, 2024
- DEEPX CO., LTD.
- Lok Won Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device, apparatus and storage medium for repairing failed bits
- Patent number 12,027,223
- Issue date Jul 2, 2024
- Changxin Memory Technologies, Inc.
- Yui-Lang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for selectively operating multiple memory groups in d...
- Patent number 12,020,763
- Issue date Jun 25, 2024
- SK Hynix Inc.
- Hyung-Sik Won
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for selectively operating multiple memory groups in d...
- Patent number 12,020,764
- Issue date Jun 25, 2024
- SK Hynix Inc.
- Hyung-Sik Won
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory fault handling method and apparatus, device, and storage medium
- Patent number 12,014,791
- Issue date Jun 18, 2024
- Huawei Technologies Co., Ltd.
- Guangyi Qiao
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for detecting errors in a memory device
- Patent number 12,009,041
- Issue date Jun 11, 2024
- ARM Limited
- Siddharth Gupta
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and refresh method thereof
- Patent number 12,002,502
- Issue date Jun 4, 2024
- Samsung Electronics Co., Ltd.
- Seungki Hong
- G11 - INFORMATION STORAGE
Information Patent Grant
Neural processing unit capable of testing component therein during...
- Patent number 11,990,203
- Issue date May 21, 2024
- DEEPX CO., LTD.
- Lok Won Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for zone-based soft post-package repair
- Patent number 11,984,185
- Issue date May 14, 2024
- Micron Technology, Inc.
- Alan J. Wilson
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for repairing defective memory cells based...
- Patent number 11,984,186
- Issue date May 14, 2024
- Micron Technology, Inc.
- David Hulton
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TRIPLE MODULAR REDUNDANCY FOR FAULT-TOLERANT IN-MEMORY COMPUTING
- Publication number 20250037786
- Publication date Jan 30, 2025
- Micron Technology, Inc.
- Agostino Pirovano
- G11 - INFORMATION STORAGE
Information Patent Application
STACKED MEMORY AND MANUFACTURING METHOD THEREFOR
- Publication number 20250037785
- Publication date Jan 30, 2025
- UltraMemory Inc.
- Yasutoshi YAMADA
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND CONTROL METHOD THEREFOR
- Publication number 20240428878
- Publication date Dec 26, 2024
- CXMT Corporation
- Zequn HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
BUFFER CIRCUIT WITH ADAPTIVE REPAIR CAPABILITY
- Publication number 20240420793
- Publication date Dec 19, 2024
- Rambus Inc.
- Scott C. Best
- G11 - INFORMATION STORAGE
Information Patent Application
DISTRIBUTED MRAM CONFIGURATION BIT AND METHOD OF REPAIR
- Publication number 20240420796
- Publication date Dec 19, 2024
- EVERSPIN TECHNOLOGIES, INC.
- Syed M. ALAM
- G11 - INFORMATION STORAGE
Information Patent Application
ONE-TIME-PROGRAMMABLE (OTP) MEMORY WITH ERROR DETECTION
- Publication number 20240420795
- Publication date Dec 19, 2024
- NXP USA, Inc.
- Nicholas Justin Mountford Spence
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...
- Publication number 20240412802
- Publication date Dec 12, 2024
- MimirIP LLC
- Kyung Whan KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR FORCING MEMORY CELL FAILURES IN A MEMOR...
- Publication number 20240395349
- Publication date Nov 28, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Application
Extending Dual Inline Memory Module (DIMM) Lifespans Based on Fault...
- Publication number 20240395350
- Publication date Nov 28, 2024
- Google LLC
- Fabrice Aidan
- G11 - INFORMATION STORAGE
Information Patent Application
Usage-Based Disturbance Counter Repair
- Publication number 20240363191
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Yang Lu
- G11 - INFORMATION STORAGE
Information Patent Application
PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES
- Publication number 20240363193
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Pranam Shetty
- G11 - INFORMATION STORAGE
Information Patent Application
NPU WITH CAPABILITY OF BUILT-IN SELF-TEST
- Publication number 20240321384
- Publication date Sep 26, 2024
- DEEPX CO., LTD.
- Lok Won KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NPU CAPABLE OF PERFORMING RUNTIME TEST
- Publication number 20240274224
- Publication date Aug 15, 2024
- DEEPX CO., LTD.
- Lok Won KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR STORING MEMORY METADATA
- Publication number 20240274223
- Publication date Aug 15, 2024
- Micron Technology, Inc.
- Sujeet Ayyapureddi
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR PERFORMING AGING TEST ON SEMICONDUCTOR USED FOR NEURAL N...
- Publication number 20240274225
- Publication date Aug 15, 2024
- DEEPX CO., LTD.
- Lok Won KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING FUSE ARRAY
- Publication number 20240265992
- Publication date Aug 8, 2024
- Micron Technology, Inc.
- YASUSHI MATSUBARA
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICES HAVING ENHANCED ERROR DETECTION AND MEMORY CELL REPAIR
- Publication number 20240257889
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Dong KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE HAVING FUSE ELEMENTS
- Publication number 20240260259
- Publication date Aug 1, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der YANG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND REPAIR METHOD OF THE MEMORY DEVICE
- Publication number 20240257898
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Taehong KWON
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Repair Device
- Publication number 20240233853
- Publication date Jul 11, 2024
- Magnachip Semiconductor, Ltd.
- Jun Soo KWACK
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULE PROVIDING DISTINCT SIGNALING INTERFACES VIA AN OPEN-D...
- Publication number 20240232105
- Publication date Jul 11, 2024
- Netlist, Inc.
- Hyun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING SEMICONDUCTOR M...
- Publication number 20240221860
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Jongcheol Kim
- G11 - INFORMATION STORAGE
Information Patent Application
LOGIC MODULE FOR USE WITH ENCODED INSTRUCTIONS
- Publication number 20240220419
- Publication date Jul 4, 2024
- PURE STORAGE, INC.
- Brian T. Gold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Logical Memory Repair with a Shared Physical Memory
- Publication number 20240203517
- Publication date Jun 20, 2024
- Google LLC
- Wilson Pradeep
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE HAVING MEMORY CELL ARRAY DIVIDED INTO PLURAL M...
- Publication number 20240203520
- Publication date Jun 20, 2024
- Micron Technology, Inc.
- Susumu Takahashi
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY APPARATUS AND SEMICONDUCTOR SYSTEM INCLUDING THE SAME
- Publication number 20240194285
- Publication date Jun 13, 2024
- SK HYNIX INC.
- HEEEUN CHOI
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE
- Publication number 20240177793
- Publication date May 30, 2024
- SK HYNIX INC.
- Jin Ho JEONG
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR SEPARATE WRITE ENABLE FOR SINGLE-PASS A...
- Publication number 20240161859
- Publication date May 16, 2024
- Micron Technology, Inc.
- Sujeet Ayyapureddi
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE PERFORMING TARGET REFRESH OPERATION AND OPERATING MET...
- Publication number 20240161861
- Publication date May 16, 2024
- SK HYNIX INC.
- Jung Taek YOU
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Testing Techniques
- Publication number 20240136006
- Publication date Apr 25, 2024
- ARM Limited
- Andy Wangkun Chen
- G06 - COMPUTING CALCULATING COUNTING

using programmable devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Memory device and memory system including the same

Memory and method with in-memory computing defect detection

Read window management in a memory system

Memory array having error checking and correction circuit

Semiconductor memory device

Error correction in a memory device having an error correction code...

Semiconductor device structure having multiple fuse elements

Memory and operation method of memory with repairing and random pul...

Triple modular redundancy for fault-tolerant in-memory computing

Single event effect mitigation with smart-redundancy

Multi-channel memory device capable of switching redundancy memory...

Method and system for repairing faulty cells of memory device

Systems and methods for testing redundant fuse latches in a memory...

Modular error correction code circuitry

Anti-fuse readout circuit, anti-fuse memory, and testing method

Memory, memory system, operation method of the memory, and operatio...

Preserving blocks experiencing program failure in memory devices

Redundancy managing method and apparatus for semiconductor memories

Buffer circuit with adaptive repair capability

NPU capable of testing component including memory during runtime

NPU capable of testing component therein during runtime, the testin...

Method, device, apparatus and storage medium for repairing failed bits

Memory device for selectively operating multiple memory groups in d...

Memory device for selectively operating multiple memory groups in d...

Memory fault handling method and apparatus, device, and storage medium

Apparatus and method for detecting errors in a memory device

Memory device and refresh method thereof

Neural processing unit capable of testing component therein during...

Apparatuses and methods for zone-based soft post-package repair

Apparatuses and methods for repairing defective memory cells based...

Patents Applicationslast 30 patents

TRIPLE MODULAR REDUNDANCY FOR FAULT-TOLERANT IN-MEMORY COMPUTING

STACKED MEMORY AND MANUFACTURING METHOD THEREFOR

MEMORY DEVICE AND CONTROL METHOD THEREFOR

BUFFER CIRCUIT WITH ADAPTIVE REPAIR CAPABILITY

DISTRIBUTED MRAM CONFIGURATION BIT AND METHOD OF REPAIR

ONE-TIME-PROGRAMMABLE (OTP) MEMORY WITH ERROR DETECTION

MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATIO...

APPARATUSES AND METHODS FOR FORCING MEMORY CELL FAILURES IN A MEMOR...

Extending Dual Inline Memory Module (DIMM) Lifespans Based on Fault...

Usage-Based Disturbance Counter Repair

PRESERVING BLOCKS EXPERIENCING PROGRAM FAILURE IN MEMORY DEVICES

NPU WITH CAPABILITY OF BUILT-IN SELF-TEST

NPU CAPABLE OF PERFORMING RUNTIME TEST

APPARATUSES, SYSTEMS, AND METHODS FOR STORING MEMORY METADATA

METHOD FOR PERFORMING AGING TEST ON SEMICONDUCTOR USED FOR NEURAL N...

SEMICONDUCTOR DEVICE HAVING FUSE ARRAY

STORAGE DEVICES HAVING ENHANCED ERROR DETECTION AND MEMORY CELL REPAIR

SEMICONDUCTOR DEVICE STRUCTURE HAVING FUSE ELEMENTS

MEMORY DEVICE AND REPAIR METHOD OF THE MEMORY DEVICE

Memory Repair Device

MEMORY MODULE PROVIDING DISTINCT SIGNALING INTERFACES VIA AN OPEN-D...

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING SEMICONDUCTOR M...

LOGIC MODULE FOR USE WITH ENCODED INSTRUCTIONS

Logical Memory Repair with a Shared Physical Memory

SEMICONDUCTOR DEVICE HAVING MEMORY CELL ARRAY DIVIDED INTO PLURAL M...

MEMORY APPARATUS AND SEMICONDUCTOR SYSTEM INCLUDING THE SAME

MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE

APPARATUSES AND METHODS FOR SEPARATE WRITE ENABLE FOR SINGLE-PASS A...

MEMORY DEVICE PERFORMING TARGET REFRESH OPERATION AND OPERATING MET...

Memory Testing Techniques