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Using reference pulsed source
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G01N2201/0698
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
Current Industry
G01N2201/0698
Using reference pulsed source
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Patents Grants
last 30 patents
Information
Patent Grant
Method of tracking a plurality of point-shaped objects in a three-d...
Patent number
10,890,521
Issue date
Jan 12, 2021
LaVision GmbH
Bernhard Wieneke
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for the spectroscopic detection of low concent...
Patent number
10,761,020
Issue date
Sep 1, 2020
California Institute of Technology
Ramabhadran Vasudev
G01 - MEASURING TESTING
Information
Patent Grant
Gas detection using gas modulation
Patent number
10,352,848
Issue date
Jul 16, 2019
Inficon GmbH
Fredrik Enquist
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting a propellant gas
Patent number
9,970,864
Issue date
May 15, 2018
Wilco AG
Lukas Emmenegger
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection apparatus and method thereof
Patent number
9,360,434
Issue date
Jun 7, 2016
Hitachi, Ltd.
Kenji Nakahira
G01 - MEASURING TESTING
Information
Patent Grant
Optical-path-difference compensation mechanism for acquiring wave f...
Patent number
7,705,311
Issue date
Apr 27, 2010
Japan Science and Technology Agency
Seizi Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
Optical-path-difference compensation mechanism for acquiring wave f...
Patent number
7,507,966
Issue date
Mar 24, 2009
Japan Science and Technology Agency
Seizi Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
Two light source reference system for a fluorometer
Patent number
4,802,768
Issue date
Feb 7, 1989
Sclavo, Inc.
Charles R. Gifford
G01 - MEASURING TESTING
Information
Patent Grant
Fluorometer with reference light source
Patent number
4,750,837
Issue date
Jun 14, 1988
Sclavo Inc.
Charles R. Gifford
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LIGHT SCATTERING MEASUREMENT BASED ON SKIP LIGHT PULSES
Publication number
20240361238
Publication date
Oct 31, 2024
TEXAS INSTRUMENTS INCORPORATED
Pulak SARANGI
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for the Spectroscopic Detection of Low Concent...
Publication number
20180252641
Publication date
Sep 6, 2018
California Institute of Technology
Ramabhadran Vasudev
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DETECTING A PROPELLANT GAS
Publication number
20150083918
Publication date
Mar 26, 2015
Lukas Emmenegger
G01 - MEASURING TESTING
Information
Patent Application
Optical Inspection Apparatus and Method Thereof
Publication number
20150015893
Publication date
Jan 15, 2015
Hitachi, Ltd
Kenji Nakahira
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL-PATH-DIFFERENCE COMPENSATION MECHANISM FOR ACQUIRING WAVE F...
Publication number
20090152469
Publication date
Jun 18, 2009
Seizi Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
Optical path difference compensation mechanism for acquiring wave f...
Publication number
20060278830
Publication date
Dec 14, 2006
Seizi Nishizawa
G01 - MEASURING TESTING