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CPC
H01J37/2955

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

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H01J37/2955using scanning ray

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for acquiring electron backscatter diffraction...
- Patent number 11,114,275
- Issue date Sep 7, 2021
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING
Information Patent Grant
Electron diffraction imaging system for determining molecular struc...
- Patent number 10,784,078
- Issue date Sep 22, 2020
- Roger D. Durst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for enhancing SE detection in mirror-based lig...
- Patent number 10,692,694
- Issue date Jun 23, 2020
- FEI Company
- Galen Gledhill
- G02 - OPTICS
Information Patent Grant
Method of performing electron diffraction pattern analysis upon a s...
- Patent number 10,663,414
- Issue date May 26, 2020
- Oxford Instruments Nanotechnology Tools Limited
- Frank Willi Bauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope
- Patent number 10,636,622
- Issue date Apr 28, 2020
- Tescan Orsay Holding, A.S.
- Petras Stanislav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining the deflection of an electron beam resulting...
- Patent number 10,593,511
- Issue date Mar 17, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Benedikt Haas
- G01 - MEASURING TESTING
Information Patent Grant
LEED for SEM
- Patent number 9,576,770
- Issue date Feb 21, 2017
- OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY SCHOOL CORPORATION
- Tsumoru Shintake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and process for measuring strain in materials at high spatia...
- Patent number 9,274,070
- Issue date Mar 1, 2016
- APPFIVE, LLC
- Jon Karl Weiss
- G01 - MEASURING TESTING
Information Patent Grant
SACP method and particle optical system for performing the method
- Patent number 9,093,246
- Issue date Jul 28, 2015
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system of evaluating distribution of lattice strain on c...
- Patent number 8,859,965
- Issue date Oct 14, 2014
- PS4 Luxco S.A.R.L.
- Kazuhiro Nojima
- G01 - MEASURING TESTING
Information Patent Grant
Sample preparation apparatus and sample preparation method
- Patent number 8,803,111
- Issue date Aug 12, 2014
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using a direct electron detector for a TEM
- Patent number 8,592,762
- Issue date Nov 26, 2013
- FEI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system of evaluating distribution of lattice strain on c...
- Patent number 8,552,372
- Issue date Oct 8, 2013
- Elpida Memory, Inc.
- Kazuhiro Nojima
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for high throughput crystal structure analysis...
- Patent number 8,253,099
- Issue date Aug 28, 2012
- NanoMegas SPRL
- Stavros Nicolopoulos
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for e-beam dark imaging with perspective control
- Patent number 7,838,833
- Issue date Nov 23, 2010
- KLA-Tencor Technologies Corporation
- Matthew Lent
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring the physical properties of micro...
- Patent number 7,385,198
- Issue date Jun 10, 2008
- Hitachi, Ltd.
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning transmission electron microscope and scanning transmission...
- Patent number 7,372,029
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and scanning transmission...
- Patent number 7,227,144
- Issue date Jun 5, 2007
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring physical properties of micro region
- Patent number 7,022,988
- Issue date Apr 4, 2006
- Hitachi, Ltd.
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining lattice constant, method of evaluating materi...
- Patent number 6,844,551
- Issue date Jan 18, 2005
- Kabushiki Kaisha Toshiba
- Shiro Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation apparatus and observation method using an electron beam
- Patent number 6,750,451
- Issue date Jun 15, 2004
- Hitachi, Ltd.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High energy electron diffraction apparatus
- Patent number 6,677,581
- Issue date Jan 13, 2004
- Japan Science and Technology Corporation
- Hideomi Koinuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for correcting magnetic field distortions in e...
- Patent number 6,555,817
- Issue date Apr 29, 2003
- Thermo Noran Inc.
- David Rohde
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Arrangement and method for using electron channeling patterns to de...
- Patent number 6,452,176
- Issue date Sep 17, 2002
- Advanced Micro Devices, Inc.
- Brennan V. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystal phase identification
- Patent number 6,326,619
- Issue date Dec 4, 2001
- Sandia Corporation
- Joseph R. Michael
- G01 - MEASURING TESTING
Information Patent Grant
Scanning reflection electron diffraction microscope
- Patent number 5,675,148
- Issue date Oct 7, 1997
- Shimadzu Corporation
- Takao Marui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for diffracted electrons
- Patent number 5,387,794
- Issue date Feb 7, 1995
- Shimadzu Corporation
- Takao Marui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reflection electron diffractometer and method for observing microsc...
- Patent number 5,093,573
- Issue date Mar 3, 1992
- Nobuo Mikoshiba
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for generating electron channeling patterns
- Patent number 5,013,914
- Issue date May 7, 1991
- Hitachi, Ltd.
- Tadashi Otaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for surface temperature measurement with picosecond time res...
- Patent number 5,010,250
- Issue date Apr 23, 1991
- The University of Rochester
- Hani E. Elsayed-Ali
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS
- Publication number 20240355577
- Publication date Oct 24, 2024
- Eldico Scientific AG
- Gunther STEINFELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS
- Publication number 20230395350
- Publication date Dec 7, 2023
- Oxford Instruments Nanotechnology Tools Limited
- Patrick Trimby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ENERGY SELECTIVE DIRECT ELECTRON IMAGING
- Publication number 20230145436
- Publication date May 11, 2023
- DIRECT ELECTRON, LP
- Benjamin BAMMES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Gun, Charged Particle Beam System, and Lock Nut
- Publication number 20230126658
- Publication date Apr 27, 2023
- Hitachi High-Tech Corporation
- Teruaki HASEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...
- Publication number 20210005420
- Publication date Jan 7, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIRROR-BASED LIGHT IMAGING CHARGED PARTICLE MICROSCOPES
- Publication number 20190198289
- Publication date Jun 27, 2019
- FEI Company
- Galen Gledhill
- G02 - OPTICS
Information Patent Application
METHOD OF PERFORMING ELECTRON DIFFRACTION PATTERN ANALYSIS UPON A S...
- Publication number 20160356729
- Publication date Dec 8, 2016
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Frank Willi BAUER
- G01 - MEASURING TESTING
Information Patent Application
LEED FOR SEM
- Publication number 20160071690
- Publication date Mar 10, 2016
- OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY SCHOOL CORPORATION
- Tsumoru SHINTAKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF EVALUATING DISTRIBUTION OF LATTICE STRAIN ON C...
- Publication number 20140008535
- Publication date Jan 9, 2014
- Elpida Memory, Inc.
- KAZUHIRO NOJIMA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PREPARATION APPARATUS AND SAMPLE PREPARATION METHOD
- Publication number 20130241091
- Publication date Sep 19, 2013
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF EVALUATING DISTRIBUTION OF LATTICE STRAIN ON C...
- Publication number 20120292504
- Publication date Nov 22, 2012
- Elpida Memory, Inc.
- KAZUHIRO NOJIMA
- G01 - MEASURING TESTING
Information Patent Application
Method of Using a Direct Electron Detector for a TEM
- Publication number 20110266439
- Publication date Nov 3, 2011
- FEI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND DEVICES FOR HIGH THROUGHPUT CRYSTAL STRUCTURE ANALYSIS...
- Publication number 20110220796
- Publication date Sep 15, 2011
- NanoMegas SPRL
- Stavros Nicolopoulos
- G01 - MEASURING TESTING
Information Patent Application
SACP Method and Particle Optical System for Performing the Method
- Publication number 20110108736
- Publication date May 12, 2011
- CARL ZEISS NTS GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning transmission electron microscope and scanning transmission...
- Publication number 20070228277
- Publication date Oct 4, 2007
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for measuring physical parameters of at least one micrometri...
- Publication number 20060288797
- Publication date Dec 28, 2006
- Jean-Luc Rouviere
- G01 - MEASURING TESTING
Information Patent Application
Scanning transmission electron microscope and scanning transmission...
- Publication number 20060151701
- Publication date Jul 13, 2006
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for measuring the physical properties of micro...
- Publication number 20060113473
- Publication date Jun 1, 2006
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Application
Method of determining lattice constant, method of evaluating materi...
- Publication number 20040094714
- Publication date May 20, 2004
- Kabushiki Kaisha Toshiba
- Shiro Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for measuring physical properties of micro region
- Publication number 20040061053
- Publication date Apr 1, 2004
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Application
Observation apparatus and observation method using an electron beam
- Publication number 20030006373
- Publication date Jan 9, 2003
- HITACHI LTD.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS

using scanning ray

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and systems for acquiring electron backscatter diffraction...

Electron diffraction imaging system for determining molecular struc...

Method and apparatus for enhancing SE detection in mirror-based lig...

Method of performing electron diffraction pattern analysis upon a s...

Scanning transmission electron microscope

Method of determining the deflection of an electron beam resulting...

LEED for SEM

System and process for measuring strain in materials at high spatia...

SACP method and particle optical system for performing the method

Method and system of evaluating distribution of lattice strain on c...

Sample preparation apparatus and sample preparation method

Method of using a direct electron detector for a TEM

Method and system of evaluating distribution of lattice strain on c...

Methods and devices for high throughput crystal structure analysis...

Apparatus and method for e-beam dark imaging with perspective control

Method and apparatus for measuring the physical properties of micro...

Scanning transmission electron microscope and scanning transmission...

Scanning transmission electron microscope and scanning transmission...

Method and apparatus for measuring physical properties of micro region

Method of determining lattice constant, method of evaluating materi...

Observation apparatus and observation method using an electron beam

High energy electron diffraction apparatus

Method and apparatus for correcting magnetic field distortions in e...

Arrangement and method for using electron channeling patterns to de...

Crystal phase identification

Scanning reflection electron diffraction microscope

Detector for diffracted electrons

Reflection electron diffractometer and method for observing microsc...

Method and apparatus for generating electron channeling patterns

System for surface temperature measurement with picosecond time res...

Patents Applicationslast 30 patents

CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS

METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS

METHOD AND APPARATUS FOR ENERGY SELECTIVE DIRECT ELECTRON IMAGING

Charged Particle Gun, Charged Particle Beam System, and Lock Nut

METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...

MIRROR-BASED LIGHT IMAGING CHARGED PARTICLE MICROSCOPES

METHOD OF PERFORMING ELECTRON DIFFRACTION PATTERN ANALYSIS UPON A S...

LEED FOR SEM

METHOD AND SYSTEM OF EVALUATING DISTRIBUTION OF LATTICE STRAIN ON C...

SAMPLE PREPARATION APPARATUS AND SAMPLE PREPARATION METHOD

METHOD AND SYSTEM OF EVALUATING DISTRIBUTION OF LATTICE STRAIN ON C...

Method of Using a Direct Electron Detector for a TEM

METHODS AND DEVICES FOR HIGH THROUGHPUT CRYSTAL STRUCTURE ANALYSIS...

SACP Method and Particle Optical System for Performing the Method

Scanning transmission electron microscope and scanning transmission...

Method for measuring physical parameters of at least one micrometri...

Scanning transmission electron microscope and scanning transmission...

Method and apparatus for measuring the physical properties of micro...

Method of determining lattice constant, method of evaluating materi...

Method and apparatus for measuring physical properties of micro region

Observation apparatus and observation method using an electron beam