using slant illumination, using internally reflected light

Industry

CPC
G01N2021/8965

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8965using slant illumination, using internally reflected light

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Angle independent optical surface inspector
- Patent number 12,130,243
- Issue date Oct 29, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for producing a polarized resin film
- Patent number 10,084,292
- Issue date Sep 25, 2018
- Daikin Industries, Ltd.
- Tetsuhiro Kodani
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Polarized resin film and process for producing same
- Patent number 9,865,996
- Issue date Jan 9, 2018
- Daikin Industries, Ltd.
- Tetsuhiro Kodani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for particle detection on flexible substrates
- Patent number 9,588,056
- Issue date Mar 7, 2017
- Corning Incorporated
- Norman Henry Fontaine
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for inspecting wound optical fiber
- Patent number 9,581,521
- Issue date Feb 28, 2017
- Corning Incorporated
- Igor Rafaelyevich Mejouev
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Shape measuring device, shape measuring method, and glass plate man...
- Patent number 9,086,384
- Issue date Jul 21, 2015
- Asahi Glass Company, Limited
- Kimiaki Ohto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Evaluation method for crystal defect in silicon single crystal wafer
- Patent number 7,718,446
- Issue date May 18, 2010
- Shin-Etsu Handotai Co., Ltd.
- Hisayuki Saito
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting defect in optical fiber, and pla...
- Patent number 7,372,553
- Issue date May 13, 2008
- FUJIFILM Corporation
- Shinsuke Aoshima
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting ununiformity of transparent material, apparatu...
- Patent number 6,861,659
- Issue date Mar 1, 2005
- Hoya Corporation
- Masaru Tanabe
- G01 - MEASURING TESTING
Information Patent Grant
Method of checking unevenness of light-transmitting substance, appa...
- Patent number 6,610,994
- Issue date Aug 26, 2003
- Hoya Corporation
- Masaru Tanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION SYSTEM
- Publication number 20240118219
- Publication date Apr 11, 2024
- FUJIFILM Business Innovation Corp.
- Kiyofumi AIKAWA
- G01 - MEASURING TESTING
Information Patent Application
ANGLE INDEPENDENT OPTICAL SURFACE INSPECTOR
- Publication number 20220187218
- Publication date Jun 16, 2022
- Steven W. Meeks
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR PRODUCING A POLARIZED RESIN FILM
- Publication number 20180097338
- Publication date Apr 5, 2018
- DAIKIN INDUSTRIES, LTD.
- Tetsuhiro KODANI
- G01 - MEASURING TESTING
Information Patent Application
POLARIZED RESIN FILM AND PROCESS FOR PRODUCING SAME
- Publication number 20150349500
- Publication date Dec 3, 2015
- DAIKIN INDUSTRIES, LTD.
- Tetsuhiro KODANI
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING DEVICE, SHAPE MEASURING METHOD, AND GLASS PLATE MAN...
- Publication number 20130098109
- Publication date Apr 25, 2013
- ASAHI GLASS COMPANY, LIMITED
- Kimiaki OHTO
- G01 - MEASURING TESTING
Information Patent Application
Evaluation Method for Crystal Defect in Silicon Single Crystal Wafer
- Publication number 20080153186
- Publication date Jun 26, 2008
- Hisayuki Saito
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting defect in optical fiber, and pla...
- Publication number 20070188739
- Publication date Aug 16, 2007
- Shinsuke Aoshima
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting defects using focus compensation
- Publication number 20070109539
- Publication date May 17, 2007
- Lewis S. Damer
- G02 - OPTICS
Information Patent Application
Method of inspecting ununiformity of transparent material, apparatu...
- Publication number 20030218145
- Publication date Nov 27, 2003
- Hoya Corporation
- Masaru Tanabe
- G01 - MEASURING TESTING
Information Patent Application
Method of inspecting an edge of a glass disk for anomalies in an ed...
- Publication number 20020154298
- Publication date Oct 24, 2002
- International Business Machines Corporation
- John Patrick Hagen
- G01 - MEASURING TESTING

using slant illumination, using internally reflected light

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Angle independent optical surface inspector

Method and apparatus for producing a polarized resin film

Polarized resin film and process for producing same

Method for particle detection on flexible substrates

Systems and methods for inspecting wound optical fiber

Shape measuring device, shape measuring method, and glass plate man...

Evaluation method for crystal defect in silicon single crystal wafer

Apparatus and method for detecting defect in optical fiber, and pla...

Method of inspecting ununiformity of transparent material, apparatu...

Method of checking unevenness of light-transmitting substance, appa...

Patents Applicationslast 30 patents

INSPECTION APPARATUS AND INSPECTION SYSTEM

ANGLE INDEPENDENT OPTICAL SURFACE INSPECTOR

METHOD AND APPARATUS FOR PRODUCING A POLARIZED RESIN FILM

POLARIZED RESIN FILM AND PROCESS FOR PRODUCING SAME

SHAPE MEASURING DEVICE, SHAPE MEASURING METHOD, AND GLASS PLATE MAN...

Evaluation Method for Crystal Defect in Silicon Single Crystal Wafer

Apparatus and method for detecting defect in optical fiber, and pla...

Method and apparatus for detecting defects using focus compensation

Method of inspecting ununiformity of transparent material, apparatu...

Method of inspecting an edge of a glass disk for anomalies in an ed...