using STM

Industry

CPC
H01J2237/31747

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/31747using STM

Industries

Patents Grantslast 30 patents

Information Patent Grant
Tomography-assisted TEM prep with requested intervention automation...
- Patent number 11,004,651
- Issue date May 11, 2021
- FEI Company
- Roger Louis Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for sample orientation for TEM lamella preparation
- Patent number 10,504,689
- Issue date Dec 10, 2019
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tomography-assisted TEM prep with requested intervention automation...
- Patent number 10,453,646
- Issue date Oct 22, 2019
- FEI Company
- Roger Louis Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bulk nanofabrication with single atomic plane precision via atomic-...
- Patent number 10,400,351
- Issue date Sep 3, 2019
- UT-Battelle, LLC
- Albina Y. Borisevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for reducing charged particle contamination
- Patent number 6,894,294
- Issue date May 17, 2005
- Applied Materials Israel, Ltd.
- Dror Shemesh
- B08 - CLEANING
Information Patent Grant
Method for etching metal layer on a scale of nanometers
- Patent number 6,664,123
- Issue date Dec 16, 2003
- Samsung Electronics Co., Ltd.
- Byong-man Kim
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Technique and process for the imaging and formation of various devi...
- Patent number 6,262,426
- Issue date Jul 17, 2001
- S&F Technological Development and Solutions Partners
- Spyridon Zafiratos
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Etching of nanoscale structures
- Patent number 5,210,425
- Issue date May 11, 1993
- E. I. Du Pont de Nemours and Company
- Edward J. Delawski
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for writing or etching narrow linewidth patter...
- Patent number 5,047,649
- Issue date Sep 10, 1991
- International Business Machines Corporation
- Rodney T. Hodgson
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
TOMOGRAPHY-ASSISTED TEM PREP WITH REQUESTED INTERVENTION AUTOMATION...
- Publication number 20200027692
- Publication date Jan 23, 2020
- FEI Company
- Roger Louis Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SAMPLE ORIENTATION FOR TEM LAMELLA PREPARATION
- Publication number 20190198287
- Publication date Jun 27, 2019
- FEI Company
- Tomás Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOMOGRAPHY-ASSISTED TEM PREP WITH REQUESTED INTERVENTION AUTOMATION...
- Publication number 20190139735
- Publication date May 9, 2019
- FEI Company
- Roger Louis Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BULK NANOFABRICATION WITH SINGLE ATOMIC PLANE PRECISION VIA ATOMIC-...
- Publication number 20180066376
- Publication date Mar 8, 2018
- UT-Battelle, LLC
- Albina Y. Borisevich
- C30 - CRYSTAL GROWTH
Information Patent Application
System and method for reducing charged particle contamination
- Publication number 20040046131
- Publication date Mar 11, 2004
- Applied Materials Israel Ltd.
- Dror Shemesh
- B08 - CLEANING
Information Patent Application
Method for etching metal layer on a scale of nanometers
- Publication number 20020168825
- Publication date Nov 14, 2002
- Byong-man Kim
- B82 - NANO-TECHNOLOGY

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Tomography-assisted TEM prep with requested intervention automation...

Method for sample orientation for TEM lamella preparation

Tomography-assisted TEM prep with requested intervention automation...

Bulk nanofabrication with single atomic plane precision via atomic-...

System and method for reducing charged particle contamination

Method for etching metal layer on a scale of nanometers

Technique and process for the imaging and formation of various devi...

Etching of nanoscale structures

Method and apparatus for writing or etching narrow linewidth patter...

Patents Applicationslast 30 patents

TOMOGRAPHY-ASSISTED TEM PREP WITH REQUESTED INTERVENTION AUTOMATION...

METHOD FOR SAMPLE ORIENTATION FOR TEM LAMELLA PREPARATION

TOMOGRAPHY-ASSISTED TEM PREP WITH REQUESTED INTERVENTION AUTOMATION...

BULK NANOFABRICATION WITH SINGLE ATOMIC PLANE PRECISION VIA ATOMIC-...

System and method for reducing charged particle contamination

Method for etching metal layer on a scale of nanometers