TREA

using the steady or oscillatory displacement of a light beam by an electromechanical measuring system

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  • G01R13/38
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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

Current Industry

G01R13/38using the steady or oscillatory displacement of a light beam by an electromechanical measuring system
Industries

Patents Grantslast 30 patents

  • Information Patent Grant

    Voltage detecting device and battery pack monitoring system
    • Patent number 10,094,883
    • Issue date Oct 9, 2018
    • Denso Corporation
    • Shunya Yamamoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Vibrating coil assembly
    • Patent number 4,203,068
    • Issue date May 13, 1980
    • Siemens Aktiengesellschaft
    • Matthaus Ebensberger
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Real time grating clock for galvanometer scanners in laser scanning...
    • Patent number 4,178,064
    • Issue date Dec 11, 1979
    • Xerox Corporation
    • Peter Mrdjen
    • G02 - OPTICS
  • Information Patent Grant

    Light beam scanning device
    • Patent number 4,084,881
    • Issue date Apr 18, 1978
    • Canon Kabushiki Kaisha
    • Yoichi Hirabayashi
    • G02 - OPTICS
  • Information Patent Grant

    Method and apparatus for linearizing a mirror galvanometer
    • Patent number 4,044,248
    • Issue date Aug 23, 1977
    • Eastman Kodak Company
    • David M. Glassman
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Light deflection apparatus
    • Patent number 4,012,694
    • Issue date Mar 15, 1977
    • Bell & Howell Company
    • Winfield Sample
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Light emitting diode display apparatus and system
    • Patent number 3,958,235
    • Issue date May 18, 1976
    • Francis A. Duffy
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3891921
    • Patent number 3,891,921
    • Issue date Jun 24, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3642344
    • Patent number 3,642,344
    • Issue date Feb 15, 1972
    • G02 - OPTICS
  • Information Patent Grant

    3635541
    • Patent number 3,635,541
    • Issue date Jan 18, 1972
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3365724
    • Patent number 3,365,724
    • Issue date Jan 23, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3317836
    • Patent number 3,317,836
    • Issue date May 2, 1967
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3238454
    • Patent number 3,238,454
    • Issue date Mar 1, 1966
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2950164
    • Patent number 2,950,164
    • Issue date Aug 23, 1960
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2950162
    • Patent number 2,950,162
    • Issue date Aug 23, 1960
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2889503
    • Patent number 2,889,503
    • Issue date Jun 2, 1959
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2692370
    • Patent number 2,692,370
    • Issue date Oct 19, 1954
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2485829
    • Patent number 2,485,829
    • Issue date Oct 25, 1949
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    2234430
    • Patent number 2,234,430
    • Issue date Mar 11, 1941
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2150398
    • Patent number 2,150,398
    • Issue date Mar 14, 1939
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2149442
    • Patent number 2,149,442
    • Issue date Mar 7, 1939
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2131028
    • Patent number 2,131,028
    • Issue date Sep 27, 1938
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2125608
    • Patent number 2,125,608
    • Issue date Aug 2, 1938
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2116110
    • Patent number 2,116,110
    • Issue date May 3, 1938
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2107936
    • Patent number 2,107,936
    • Issue date Feb 8, 1938
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2101203
    • Patent number 2,101,203
    • Issue date Dec 7, 1937
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2077451
    • Patent number 2,077,451
    • Issue date Apr 20, 1937
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1996783
    • Patent number 1,996,783
    • Issue date Apr 9, 1935
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1940411
    • Patent number 1,940,411
    • Issue date Dec 19, 1933
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1936833
    • Patent number 1,936,833
    • Issue date Nov 28, 1933
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents