using tomography

Industry

CPC
G01N23/046

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/046using tomography

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Dual-purpose system for collectible card authentication, identifica...
- Patent number 12,306,116
- Issue date May 20, 2025
- Aharon N. Wayne
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for automated x-ray inspection
- Patent number 12,298,258
- Issue date May 13, 2025
- Siemens Aktiengesellschaft
- Jochen Bönig
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for computed tomography system calibration
- Patent number 12,292,394
- Issue date May 6, 2025
- Baker Hughes Holdings LLC
- Alexander Suppes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parameterizing x-ray scattering measurement using slice-and-image t...
- Patent number 12,288,706
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identifying foil position in power storage device and me...
- Patent number 12,276,621
- Issue date Apr 15, 2025
- PRIME PLANET ENERGY & SOLUTIONS, INC.
- Hisataka Fujimaki
- G01 - MEASURING TESTING
Information Patent Grant
System and method for incorporating lidar-based techniques with a c...
- Patent number 12,263,024
- Issue date Apr 1, 2025
- GE Precision Healthcare LLC
- Arka Datta
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for peeling logs
- Patent number 12,263,616
- Issue date Apr 1, 2025
- Microtec S.R.L.
- Jöst Frank
- B27 - WORKING OR PRESERVING WOOD OR SIMILAR MATERIAL NAILING OR STAPLING MACH...
Information Patent Grant
Computed tomography scatter and crosstalk correction
- Patent number 12,266,036
- Issue date Apr 1, 2025
- General Electric Company
- Mingye Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Targeted collimation of detectors using rear collimators
- Patent number 12,259,341
- Issue date Mar 25, 2025
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Grant
High-energy x-ray imaging system
- Patent number 12,253,648
- Issue date Mar 18, 2025
- Smiths Detection Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector, radiation CT apparatus, and method of manufactu...
- Patent number 12,243,903
- Issue date Mar 4, 2025
- Canon Kabushiki Kaisha
- Takashi Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,235,227
- Issue date Feb 25, 2025
- JED CO., LTD
- Osamu Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Imaging environment testing fixture and methods thereof
- Patent number 12,222,302
- Issue date Feb 11, 2025
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for real-time monitoring of organic matter porosity evolu...
- Patent number 12,222,273
- Issue date Feb 11, 2025
- Saudi Arabian Oil Company
- Abrar Alabbad
- G01 - MEASURING TESTING
Information Patent Grant
Performance evaluation method for elastic material
- Patent number 12,203,904
- Issue date Jan 21, 2025
- Sumitomo Rubber Industries, Ltd.
- Ryo Mashita
- G01 - MEASURING TESTING
Information Patent Grant
Two-stage screening technique for prohibited objects at security ch...
- Patent number 12,205,359
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Mohamed Nooman Ahmed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for the additive manufacture of a workpiece
- Patent number 12,202,205
- Issue date Jan 21, 2025
- Intom GmbH
- Martin Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Industrial x-ray workpiece measuring system and method for operatin...
- Patent number 12,203,876
- Issue date Jan 21, 2025
- Intom GmbH
- Severin Ebner
- G01 - MEASURING TESTING
Information Patent Grant
CT system
- Patent number 12,203,877
- Issue date Jan 21, 2025
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Michael Salamon
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring and/or calibrating a device designed for the...
- Patent number 12,203,878
- Issue date Jan 21, 2025
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Felix Porsch
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for adaptive blending in computed tomography im...
- Patent number 12,205,253
- Issue date Jan 21, 2025
- GE Precision Healthcare LLC
- Brian Edward Nett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Battery module and method of manufacturing the same
- Patent number 12,191,462
- Issue date Jan 7, 2025
- LG ENERGY SOLUTION, LTD.
- Yongjin Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, system and method for radiation based imaging
- Patent number 12,186,118
- Issue date Jan 7, 2025
- Shanghai United Imaging Healthcare Co., Ltd.
- Hongjun Zhang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and device for controlling output beam of ray machine in ima...
- Patent number 12,188,882
- Issue date Jan 7, 2025
- Nuctech Company Limited
- Zhiqiang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus of stationary-source nonplanar-trajectory narr...
- Patent number 12,181,424
- Issue date Dec 31, 2024
- MALCOVA, INC.
- Peymon Mirsaeid Ghazi
- G01 - MEASURING TESTING
Information Patent Grant
Converter array, detector, and photodiode array
- Patent number 12,181,617
- Issue date Dec 31, 2024
- Canon Medical Systems Corporation
- Akira Nishijima
- G01 - MEASURING TESTING
Information Patent Grant
Method for computed tomography examination of fragments in gel block
- Patent number 12,174,213
- Issue date Dec 24, 2024
- The United States of America, as represented by the Secretary of the Navy
- Kyle D. Stoll
- F42 - AMMUNITION BLASTING
Information Patent Grant
X-ray tomography systems and methods for imaging an aircraft part
- Patent number 12,174,129
- Issue date Dec 24, 2024
- The Boeing Company
- Donald Duane Palmer
- G01 - MEASURING TESTING
Information Patent Grant
Transmission imaging detection device and its computerized tomograp...
- Patent number 12,169,181
- Issue date Dec 17, 2024
- Xiamen University
- Zheng Fang
- G01 - MEASURING TESTING
Information Patent Grant
Accelerated filtered back projection for computed tomography image...
- Patent number 12,169,883
- Issue date Dec 17, 2024
- SMART ENGINES SERVICE, LLC
- Dmitry Petrovich Nikolaev
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MATERIAL WEIGHTING OF PROJECTION BASED SPECTRAL X-RAY IMAGING
- Publication number 20250164416
- Publication date May 22, 2025
- GE Precision Healthcare LLC
- Johannes Loberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRIC WIRE FIXING JIG, CRIMPING DETERMINATION DEVICE, AND CRIMPI...
- Publication number 20250164417
- Publication date May 22, 2025
- Kabushiki Kaisha Toshiba
- Akira TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING ENVIRONMENT TESTING FIXTURE AND METHODS THEREOF
- Publication number 20250164418
- Publication date May 22, 2025
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING
Information Patent Application
X-RAY WELD INSPECTION
- Publication number 20250164420
- Publication date May 22, 2025
- Varex Imaging Sweden AB
- Tuomas Pantsar
- G01 - MEASURING TESTING
Information Patent Application
POROUS SAMPLE WETTABILITY PARAMETER DETERMINING METHOD AND RELATED...
- Publication number 20250155347
- Publication date May 15, 2025
- TOTALENERGIES ONETECH
- Mohamed REGAIEG
- G01 - MEASURING TESTING
Information Patent Application
FIDUCIALS FOR X-RAY DEVICE
- Publication number 20250146959
- Publication date May 8, 2025
- Lumafield, Inc.
- Adam P. Damiano
- G01 - MEASURING TESTING
Information Patent Application
COMPONENT CORROSION PROGNOSTICS USING COMPUTED TOMOGRAPHY (CT)-SCAN...
- Publication number 20250130182
- Publication date Apr 24, 2025
- RTX Corporation
- Lei Chen
- G01 - MEASURING TESTING
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20250124564
- Publication date Apr 17, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20250125431
- Publication date Apr 17, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING PARTS AT TARGET TEMPERATURES
- Publication number 20250116618
- Publication date Apr 10, 2025
- WEST PHARMACEUTICAL SERVICES, INC.
- Md Abu HASAN
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL DECOMPOSITION CALIBRATION FOR X-RAY IMAGING SYSTEMS
- Publication number 20250114052
- Publication date Apr 10, 2025
- GE Precision Healthcare LLC
- Changlyong Kim
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
IMAGING JIG AND INFORMATION PROCESSING APPARATUS
- Publication number 20250102450
- Publication date Mar 27, 2025
- FUJIFILM CORPORATION
- Eiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR ARRAY WITH STAGGERED DETECTOR MODULES
- Publication number 20250102449
- Publication date Mar 27, 2025
- REDLEN TECHNOLOGIES, INC.
- Michael K. JACKSON
- G01 - MEASURING TESTING
Information Patent Application
Multi-Scale and Multi-Parameter Collaborative Testing Device and Me...
- Publication number 20250085196
- Publication date Mar 13, 2025
- ANHUI UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Pingsong ZHANG
- G01 - MEASURING TESTING
Information Patent Application
CORRECTING AMBIENT CAPILLARY PRESSURE CURVES TO ACCOUNT FOR DOWNHOL...
- Publication number 20250076221
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Mohammed Fadhel Al-Hamad
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF
- Publication number 20250076222
- Publication date Mar 6, 2025
- UIH AMERICA, INC.
- Hongdi LI
- G01 - MEASURING TESTING
Information Patent Application
PDMS (POLY(DIMETHYL SILOXANE))-BASED ANALYSIS METHOD OF COSMETIC FI...
- Publication number 20250076223
- Publication date Mar 6, 2025
- AMOREPACIFIC CORPORATION
- Chaeyeon SONG
- G01 - MEASURING TESTING
Information Patent Application
SECURITY INSPECTION SYSTEM AND SECURITY INSPECTION METHOD
- Publication number 20250052702
- Publication date Feb 13, 2025
- HÖRMANN KLATT CONVEYORS GMBH
- Peter Klatt
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...
- Publication number 20250052701
- Publication date Feb 13, 2025
- GE Precision Healthcare LLC
- Norbert J. Pelc
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION ASSEMBLY, CALIBRATION PHANTOM AND CALIBRATION METHOD
- Publication number 20250045984
- Publication date Feb 6, 2025
- Nuctech Company Limited
- Li ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHASE-CONTRAST IMAGING METHOD FOR ESTIMATING THE LOCAL STOICHIOMETR...
- Publication number 20250044243
- Publication date Feb 6, 2025
- ECOLE POLYTECHNIQUE
- Philippe ZEITOUN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES
- Publication number 20250035562
- Publication date Jan 30, 2025
- SK On Co., Ltd.
- Hye Ju JANG
- G01 - MEASURING TESTING
Information Patent Application
RADIATION INSPECTION SYSTEM
- Publication number 20250035568
- Publication date Jan 30, 2025
- Nuctech Company Limited
- Qiangqiang WANG
- G01 - MEASURING TESTING
Information Patent Application
TOMOGRAPHIC ANALYSIS METHOD
- Publication number 20250035567
- Publication date Jan 30, 2025
- SAFRAN AIRCRAFT ENGINES
- Pierre Alfred Jean DUCHENE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY SHIELDING DEVICE
- Publication number 20250037891
- Publication date Jan 30, 2025
- Simon Edward Kozin
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20250027889
- Publication date Jan 23, 2025
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR MONITORING EVENTS RELATED TO X-RAY TUBES
- Publication number 20250024578
- Publication date Jan 16, 2025
- GE Precision Healthcare LLC
- Munish Vishwas lnamdar
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR THREE-DIMENSIONAL, IN-SITU IN...
- Publication number 20250020600
- Publication date Jan 16, 2025
- GENERAL ELECTRIC COMPANY
- Mohamed Rahmane
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION
- Publication number 20240420386
- Publication date Dec 19, 2024
- Baker Hughes Holdings LLC
- Alexander Suppes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIRECT ATTACH RADIATION DETECTOR STRUCTURES HAVING REDUCED CROSS-TALK
- Publication number 20240418877
- Publication date Dec 19, 2024
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING

using tomography

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Dual-purpose system for collectible card authentication, identifica...

Systems and methods for automated x-ray inspection

Apparatus and method for computed tomography system calibration

Parameterizing x-ray scattering measurement using slice-and-image t...

Method for identifying foil position in power storage device and me...

System and method for incorporating lidar-based techniques with a c...

Apparatus for peeling logs

Computed tomography scatter and crosstalk correction

Targeted collimation of detectors using rear collimators

High-energy x-ray imaging system

Radiation detector, radiation CT apparatus, and method of manufactu...

X-ray inspection apparatus

Imaging environment testing fixture and methods thereof

Apparatus for real-time monitoring of organic matter porosity evolu...

Performance evaluation method for elastic material

Two-stage screening technique for prohibited objects at security ch...

Device and method for the additive manufacture of a workpiece

Industrial x-ray workpiece measuring system and method for operatin...

CT system

Method for monitoring and/or calibrating a device designed for the...

Systems and methods for adaptive blending in computed tomography im...

Battery module and method of manufacturing the same

Apparatus, system and method for radiation based imaging

Method and device for controlling output beam of ray machine in ima...

Method and apparatus of stationary-source nonplanar-trajectory narr...

Converter array, detector, and photodiode array

Method for computed tomography examination of fragments in gel block

X-ray tomography systems and methods for imaging an aircraft part

Transmission imaging detection device and its computerized tomograp...

Accelerated filtered back projection for computed tomography image...

Patents Applicationslast 30 patents

MATERIAL WEIGHTING OF PROJECTION BASED SPECTRAL X-RAY IMAGING

ELECTRIC WIRE FIXING JIG, CRIMPING DETERMINATION DEVICE, AND CRIMPI...

IMAGING ENVIRONMENT TESTING FIXTURE AND METHODS THEREOF

X-RAY WELD INSPECTION

POROUS SAMPLE WETTABILITY PARAMETER DETERMINING METHOD AND RELATED...

FIDUCIALS FOR X-RAY DEVICE

COMPONENT CORROSION PROGNOSTICS USING COMPUTED TOMOGRAPHY (CT)-SCAN...

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

SCANNING PARTS AT TARGET TEMPERATURES

MATERIAL DECOMPOSITION CALIBRATION FOR X-RAY IMAGING SYSTEMS

IMAGING JIG AND INFORMATION PROCESSING APPARATUS

RADIATION DETECTOR ARRAY WITH STAGGERED DETECTOR MODULES

Multi-Scale and Multi-Parameter Collaborative Testing Device and Me...

CORRECTING AMBIENT CAPILLARY PRESSURE CURVES TO ACCOUNT FOR DOWNHOL...

EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF

PDMS (POLY(DIMETHYL SILOXANE))-BASED ANALYSIS METHOD OF COSMETIC FI...

SECURITY INSPECTION SYSTEM AND SECURITY INSPECTION METHOD

SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...

CALIBRATION ASSEMBLY, CALIBRATION PHANTOM AND CALIBRATION METHOD

PHASE-CONTRAST IMAGING METHOD FOR ESTIMATING THE LOCAL STOICHIOMETR...

METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES

RADIATION INSPECTION SYSTEM

TOMOGRAPHIC ANALYSIS METHOD

X-RAY SHIELDING DEVICE

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

METHODS AND SYSTEMS FOR MONITORING EVENTS RELATED TO X-RAY TUBES

APPARATUSES, SYSTEMS, AND METHODS FOR THREE-DIMENSIONAL, IN-SITU IN...

SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION

DIRECT ATTACH RADIATION DETECTOR STRUCTURES HAVING REDUCED CROSS-TALK