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G01N21/39
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/00
Investigating or analysing materials by the use of optical means
Current Industry
G01N21/39
using tunable lasers
Industries
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Patents Grants
last 30 patents
Information
Patent Grant
Mounting system for a sensor in a ductwork
Patent number
11,965,652
Issue date
Apr 23, 2024
Valmet AB
Mikhail Y. Shekhter
D06 - TREATMENT OF TEXTILES OR THE LIKE LAUNDERING FLEXIBLE MATERIALS NOT OTH...
Information
Patent Grant
Light emitting apparatus, light emitting method, light detection ap...
Patent number
11,965,822
Issue date
Apr 23, 2024
MEGA CRYSTAL BIOTECHNOLOGY SINGAPORE PTE. LTD
Yi-Sheng Ting
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic devices, systems, and methods for optical sensing of...
Patent number
11,953,434
Issue date
Apr 9, 2024
SHELL OIL COMPNY
Mark Zondlo
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring multiple analyte concentrations in...
Patent number
11,953,437
Issue date
Apr 9, 2024
Endress+Hauser Optical Analysis, Inc.
Marc Winter
G01 - MEASURING TESTING
Information
Patent Grant
Reconstruction of frequency registration for quantitative spectroscopy
Patent number
11,953,427
Issue date
Apr 9, 2024
Endress+Hauser Optical Analysis, Inc.
Alfred Feitisch
G01 - MEASURING TESTING
Information
Patent Grant
System and method for frequency matching a resonance cavity to a li...
Patent number
11,946,857
Issue date
Apr 2, 2024
PICOMOLE INC.
Sébastien Noël
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photonic sensor using a fixed-wavelength laser
Patent number
11,940,386
Issue date
Mar 26, 2024
The University of British Columbia
Lukas Chrostowski
G01 - MEASURING TESTING
Information
Patent Grant
Furnace control method
Patent number
11,926,527
Issue date
Mar 12, 2024
Johnson Matthey Public Limited Company
Matthew John Cousins
G01 - MEASURING TESTING
Information
Patent Grant
Gas absorbance spectrum measurement device frequency locking method...
Patent number
11,921,040
Issue date
Mar 5, 2024
Shimadzu Corporation
Kazune Mano
G01 - MEASURING TESTING
Information
Patent Grant
Isotopocule analysis of hydrocarbon contamination
Patent number
11,906,503
Issue date
Feb 20, 2024
ExxonMobil Technology and Engineering Company
David T. Wang
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Tunable hybrid III-V/ IV laser sensor system-on-a chip for real-tim...
Patent number
11,896,373
Issue date
Feb 13, 2024
Brolis Sensor Technology, UAB
Augustinas Vizbaras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spectroscopic devices, systems, and methods for optical sensing of...
Patent number
11,898,956
Issue date
Feb 13, 2024
SHELL OIL COMPNY
Mark Zondlo
G01 - MEASURING TESTING
Information
Patent Grant
Short-wave infrared sensor for identifying based on water content
Patent number
11,896,346
Issue date
Feb 13, 2024
OMNI MEDSCI, LLC
Mohammed N. Islam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Substrate processing apparatus and substrate processing method
Patent number
11,879,839
Issue date
Jan 23, 2024
Tokyo Electron Limited
Koudai Higashi
G01 - MEASURING TESTING
Information
Patent Grant
Techniques for rapid detection and quantitation of volatile organic...
Patent number
11,874,270
Issue date
Jan 16, 2024
InspectIR Systems, LLC
Guido Fridolin Verbeck
G01 - MEASURING TESTING
Information
Patent Grant
Laser gas detector and laser gas detection system
Patent number
11,867,816
Issue date
Jan 9, 2024
HESAI TECHNOLOGY CO., LTD.
Kai Sun
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical detection system
Patent number
11,867,616
Issue date
Jan 9, 2024
STATE GRID CHONGQING ELECTRIC POWER CO. ELECTRIC POWER RESEARCH INSTITUTE
Qiang Yao
G01 - MEASURING TESTING
Information
Patent Grant
Use of gradient-index lenses for cavity enhanced absorption spectro...
Patent number
11,867,623
Issue date
Jan 9, 2024
ABB Schweiz AG
John B. Leen
G01 - MEASURING TESTING
Information
Patent Grant
Laser gas detector and laser gas detection system
Patent number
11,867,815
Issue date
Jan 9, 2024
HESAI TECHNOLOGY CO., LTD.
Kai Sun
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Process analyzer adapter
Patent number
11,867,622
Issue date
Jan 9, 2024
ABB Schweiz AG
Johannes Schmitt
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Receiver, early anomaly detection system and method, and computer-r...
Patent number
11,860,089
Issue date
Jan 2, 2024
NEC Corporation
Yuma Matsuda
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for nanoscale infrared absorption tomography
Patent number
11,860,087
Issue date
Jan 2, 2024
The Board of Trustees of the University of Illinois
Rohit Bhargava
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for spectroscopically detecting a sample
Patent number
11,828,705
Issue date
Nov 28, 2023
Sparrow Detect, Inc.
Eric R. Crosson
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopy in frequency, time, and position with correlated frequ...
Patent number
11,821,838
Issue date
Nov 21, 2023
Jean-Claude Diels
G01 - MEASURING TESTING
Information
Patent Grant
Gas measurement device and gas measurement method
Patent number
11,796,468
Issue date
Oct 24, 2023
Shimadzu Corporation
Kazune Mano
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for analyzing a sample desorbed at different temp...
Patent number
11,788,957
Issue date
Oct 17, 2023
PICOMOLE INC.
Gisia Beydaghyan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Material identification method and device based on laser speckle an...
Patent number
11,782,285
Issue date
Oct 10, 2023
Tsinghua University
Lu Fang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Reflected light wavelength scanning device including silicon photon...
Patent number
11,781,888
Issue date
Oct 10, 2023
Hyung Myung Moon
G01 - MEASURING TESTING
Information
Patent Grant
Gas analyzer
Patent number
11,774,358
Issue date
Oct 3, 2023
Yokogawa Electric Corporation
Junichi Matsuo
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for analyzing gaseous samples
Patent number
11,774,350
Issue date
Oct 3, 2023
Teknologian tutkimuskeskus VTT Oy
Teemu Kääriäinen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DETERMINING A PROPERTY OF A GAS PLUME PRODUCED BY BURNING HYDROCARB...
Publication number
20240151640
Publication date
May 9, 2024
SCHLUMBERGER TECHNOLOGY CORPORATION
Sebastien Catheline
G01 - MEASURING TESTING
Information
Patent Application
CAMERA BASED SYSTEM WITH PROCESSING USING ARTIFICIAL INTELLIGENCE F...
Publication number
20240130621
Publication date
Apr 25, 2024
Omni MedSci, Inc.
Mohammed N. Islam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
Publication number
20240125697
Publication date
Apr 18, 2024
TOKYO ELECTRON LIMITED
Koudai Higashi
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ANALYSIS SYSTEM AND OPTICAL ANALYSIS METHOD
Publication number
20240118199
Publication date
Apr 11, 2024
MEGA CRYSTAL BIOTECHNOLOGY SINGAPORE PTE. LTD
Yi-Sheng Ting
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
Publication number
20240110866
Publication date
Apr 4, 2024
Ushio Denki Kabushiki Kaisha
Takuma YOKOYAMA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING A CONCENTRATION OF A GAS AND ASSOCIATED APPARATUS
Publication number
20240094122
Publication date
Mar 21, 2024
SICK AG
Thomas BEYER
G01 - MEASURING TESTING
Information
Patent Application
LASER GAS DETECTOR AND LASER GAS DETECTION SYSTEM
Publication number
20240061120
Publication date
Feb 22, 2024
Hesai Technology Co., Ltd.
Kai Sun
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR CHARACTERIZING ATMOSPHERIC EMISSIONS
Publication number
20240053265
Publication date
Feb 15, 2024
The Regents of the University of Colorado, a Body Corporate
Caroline B. Alden
G01 - MEASURING TESTING
Information
Patent Application
CAVITY ENHANCED OPTICAL MICROSCOPY
Publication number
20240044788
Publication date
Feb 8, 2024
Ludwig-Maximilians-Universitaet Munich
Thomas Huemmer
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL FOREIGN MATTER INSPECTION DEVICE
Publication number
20240044806
Publication date
Feb 8, 2024
HITACHI HIGH-TECH CORPORATION
Hisaaki KANAI
G01 - MEASURING TESTING
Information
Patent Application
Integrated cat's-eye tunable laser spectroscopy system and method
Publication number
20240019363
Publication date
Jan 18, 2024
KineoLabs
Walid A. Atia
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR ANALYST OF CRYSTALS AND CRYSTALLIZATION
Publication number
20240019360
Publication date
Jan 18, 2024
PROTEIN DYNAMIC SOLUTIONS, INC.
Belinda Pastrana-Rios
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING A CONCENTRATION OF A GAS IN A CON...
Publication number
20240011862
Publication date
Jan 11, 2024
GasPorOx AB
Patrik LUNDIN
G01 - MEASURING TESTING
Information
Patent Application
IDENTIFYING OBJECTS USING NEAR-INFRARED SENSORS, CAMERAS OR TIME-OF...
Publication number
20240000317
Publication date
Jan 4, 2024
Omni MedSci, Inc.
Mohammed N. Islam
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
SYSTEMS AND METHODS FOR MEASURING TRACE CONTAMINANTS IN GAS MATRIX...
Publication number
20230417663
Publication date
Dec 28, 2023
ABB SCHWEIZ AG
François Tanguay
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MEASURING TRACE CONTAMINANTS IN GAS MATRIX...
Publication number
20230417597
Publication date
Dec 28, 2023
ABB Schweiz AG
François Tanguay
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYZER CALIBRATION
Publication number
20230417717
Publication date
Dec 28, 2023
Baker Hughes Holdings LLC
Chong Tao
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYSIS DEVICE AND GAS ANALYSIS METHOD
Publication number
20230417660
Publication date
Dec 28, 2023
Horiba Stec, Co., Ltd.
Yuhei SAKAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYSER APPARATUS AND METHOD
Publication number
20230417659
Publication date
Dec 28, 2023
MIRO Analytical AG
Oleg Aseev
G01 - MEASURING TESTING
Information
Patent Application
Spectroscopy Device Incorporating a Mid-Infrared Laser
Publication number
20230408406
Publication date
Dec 21, 2023
California Institute of Technology
Mathieu Fradet
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SINGLE SENSOR IMAGING SPECTROSCOPY FOR DETECTING NANOPARTICLES TO Q...
Publication number
20230408413
Publication date
Dec 21, 2023
Applied Materials, Inc.
Viswanath BAVIGADDA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MEASUREMENT OF AN ANALYTE
Publication number
20230393064
Publication date
Dec 7, 2023
UNIVERSITY OF DURHAM
David CARTY
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
OPTICAL SENSING MODULE
Publication number
20230375525
Publication date
Nov 23, 2023
ROCKLEY PHOTONICS LIMITED
Sean Merritt
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
LIDAR DEVICE
Publication number
20230350071
Publication date
Nov 2, 2023
Mitsubishi Electric Corporation
Masaharu IMAKI
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Spectroscopically Detecting a Sample
Publication number
20230314318
Publication date
Oct 5, 2023
Sparrow Detect, Inc.
Eric R. Crosson
G01 - MEASURING TESTING
Information
Patent Application
APPARATUSES AND METHODS FOR ANOMALOUS GAS CONCENTRATION DETECTION
Publication number
20230314266
Publication date
Oct 5, 2023
BRIDGER PHOTONICS, INC
Aaron Thomas Kreitinger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FAST SINGLE-MODE SPECTROSCOPY
Publication number
20230304927
Publication date
Sep 28, 2023
IonQ, Inc.
Jason Hieu Van Nguyen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TIME RESPONSE MEASUREMENT APPARATUS AND TIME RESPONSE MEASUREMENT M...
Publication number
20230304926
Publication date
Sep 28, 2023
HAMAMATSU PHOTONICS K. K.
Hisanari TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
LINE FIELD SWEPT SOURCE OCT SYSTEM AND SPECTROSCOPY SYSTEM
Publication number
20230296508
Publication date
Sep 21, 2023
KineoLabs
Walid A. Atia
G01 - MEASURING TESTING
Information
Patent Application
MOUNTING SYSTEM FOR A SENSOR IN A DUCTWORK
Publication number
20230296248
Publication date
Sep 21, 2023
Valmet AB
Mikhail Y. Shekhter
D06 - TREATMENT OF TEXTILES OR THE LIKE LAUNDERING FLEXIBLE MATERIALS NOT OTH...