using tunnel effects

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CPC
H01J2237/2583

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2583using tunnel effects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for SEM-guided AFM scan with dynamically varied scan speed
- Patent number 11,158,486
- Issue date Oct 26, 2021
- JIANGSU JITRI MICRO-NANO AUTOMATION INSTITUTE CO., LTD.
- Yu Sun
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for correlating images of a photolithographic...
- Patent number 9,990,737
- Issue date Jun 5, 2018
- Carl Zeiss SMT GmbH
- Dieter Weber
- G02 - OPTICS
Information Patent Grant
Micromachined electron or ion-beam source and secondary pickup for...
- Patent number 7,960,695
- Issue date Jun 14, 2011
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of observing and method of working diamond stylus for workin...
- Patent number 7,804,067
- Issue date Sep 28, 2010
- SII NanoTechnology Inc.
- Osamu Takaoka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Inspection system and inspection method
- Patent number 7,755,776
- Issue date Jul 13, 2010
- Hitachi High-Technologies Corporation
- Hiroshi Makino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement device for electron microscope
- Patent number 7,363,802
- Issue date Apr 29, 2008
- Nanofactory Instruments AB
- Håkan Olin
- G01 - MEASURING TESTING
Information Patent Grant
System for analyzing surfaces of samples
- Patent number 5,619,035
- Issue date Apr 8, 1997
- Biotechnology Research and Development Corporation
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Small cavity analytical instruments
- Patent number 5,559,328
- Issue date Sep 24, 1996
- Biotechnology Research and Development Corporation
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for analyzing surfaces of samples
- Patent number 5,504,366
- Issue date Apr 2, 1996
- Biotechnology Research and Development Corp.
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for imaging and detecting threshold phenomena associated wit...
- Patent number 5,281,814
- Issue date Jan 25, 1994
- The Penn State Research Foundation, Penn State Rsrch Foundtn & Biotechnol. Rs...
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for detecting threshold phenomena associated with and/or ato...
- Patent number 5,268,573
- Issue date Dec 7, 1993
- The Penn State Research Foundation
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Low-energy scanning transmission electron microscope
- Patent number 4,618,767
- Issue date Oct 21, 1986
- International Business Machines Corporation
- David A. Smith
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
IN-LINE DEPTH MEASUREMENTS BY AFM
- Publication number 20240212976
- Publication date Jun 27, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD FOR SEM-GUIDED AFM SCAN WITH DYNAMICALLY VARIED SCAN SPEED
- Publication number 20210125809
- Publication date Apr 29, 2021
- JIANGSU JITRI MICRO-NANO AUTOMATION INSTITUTE CO., LTD.
- Yu SUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR PRODUCING THREE DIMENSIONAL NANO AND MICRO...
- Publication number 20120067718
- Publication date Mar 22, 2012
- The University of Surrey
- David Cox
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IDENTIFYING INDIVIDUAL VIRUSES IN A SAMPLE
- Publication number 20110165558
- Publication date Jul 7, 2011
- Jürgen Popp
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF OBSERVING AND METHOD OF WORKING DIAMOND STYLUS FOR WORKIN...
- Publication number 20080141764
- Publication date Jun 19, 2008
- Osamu Takaoka
- G01 - MEASURING TESTING
Information Patent Application
Inspection system and inspection method
- Publication number 20080073533
- Publication date Mar 27, 2008
- Hitachi High-Technologies Corporation
- Hiroshi Makino
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Measurement device for electron microscope
- Publication number 20050103996
- Publication date May 19, 2005
- Hakan Olin
- G01 - MEASURING TESTING
Information Patent Application
Method and system for surface or cross-sectional processing and obs...
- Publication number 20040154744
- Publication date Aug 12, 2004
- Takashi Kaito
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

using tunnel effects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for SEM-guided AFM scan with dynamically varied scan speed

Apparatus and method for correlating images of a photolithographic...

Micromachined electron or ion-beam source and secondary pickup for...

Method of observing and method of working diamond stylus for workin...

Inspection system and inspection method

Measurement device for electron microscope

System for analyzing surfaces of samples

Small cavity analytical instruments

System for analyzing surfaces of samples

System for imaging and detecting threshold phenomena associated wit...

System for detecting threshold phenomena associated with and/or ato...

Low-energy scanning transmission electron microscope

Patents Applicationslast 30 patents

IN-LINE DEPTH MEASUREMENTS BY AFM

A METHOD FOR SEM-GUIDED AFM SCAN WITH DYNAMICALLY VARIED SCAN SPEED

METHOD AND APPARATUS FOR PRODUCING THREE DIMENSIONAL NANO AND MICRO...

METHOD FOR IDENTIFYING INDIVIDUAL VIRUSES IN A SAMPLE

METHOD OF OBSERVING AND METHOD OF WORKING DIAMOND STYLUS FOR WORKIN...

Inspection system and inspection method

Measurement device for electron microscope

Method and system for surface or cross-sectional processing and obs...