using vacuum

Industry

CPC
G01N2203/0417

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2203/00Investigating strength properties of solid materials by application of mechanical stress

Current Industry

G01N2203/0417using vacuum

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Test apparatus for flexible screen
- Patent number 12,061,176
- Issue date Aug 13, 2024
- Kunshan Go-Visionox Opto-Electronics Co., Ltd.
- Yuexing Ma
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and method
- Patent number 11,506,596
- Issue date Nov 22, 2022
- ULTRASONIC TECHNOLOGIES, INC.
- Sergei Ostapenko
- G01 - MEASURING TESTING
Information Patent Grant
Fluid flow control of vacuum mounting
- Patent number 11,340,144
- Issue date May 24, 2022
- Illinois Tool Works Inc.
- Ruibin Zhang
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
High speed vacuum cycling excitation system for optical inspection...
- Patent number 10,876,943
- Issue date Dec 29, 2020
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Grant
High speed vacuum cycling excitation system for optical inspection...
- Patent number 10,337,969
- Issue date Jul 2, 2019
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Grant
Substrate bending stiffness measurement method and system
- Patent number 7,374,161
- Issue date May 20, 2008
- Xerox Corporation
- Robert A. Clark
- G01 - MEASURING TESTING
Information Patent Grant
Manipulator for microscopy sample preparation and methods for makin...
- Patent number 7,041,985
- Issue date May 9, 2006
- Western Digital (Fremont), Inc.
- Haifeng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Flexible substrate, semiconductor device, imaging device, radiation...
- Patent number 6,909,173
- Issue date Jun 21, 2005
- Canon Kabushiki Kaisha
- Osamu Hamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Substrate bending stiffness measurement method and system
- Patent number 6,772,628
- Issue date Aug 10, 2004
- Xerox Corporation
- Robert A. Clark
- G01 - MEASURING TESTING
Information Patent Grant
Substrate bending stiffness measurement method and system
- Patent number 6,748,801
- Issue date Jun 15, 2004
- Xerox Corporation
- Robert A. Clark
- G01 - MEASURING TESTING
Information Patent Grant
Substrate bending stiffness measurement method and system
- Patent number 6,581,456
- Issue date Jun 24, 2003
- Xerox Corporation
- Robert A. Clark
- G01 - MEASURING TESTING
Information Patent Grant
Stiction-based chuck for bulge tester and method of bulge testing
- Patent number 6,539,790
- Issue date Apr 1, 2003
- University of Vermont and State Agricultural College
- Dryver R. Huston
- G01 - MEASURING TESTING
Information Patent Grant
Micro-ball impact tester
- Patent number 6,050,127
- Issue date Apr 18, 2000
- Seagate Technology, Inc.
- Mukund Channagiri Rao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating fold endurance and surface adhe...
- Patent number 5,566,570
- Issue date Oct 22, 1996
- Director, Bureau of Engraving and Printing, Department of the Treasury
- Steven G. Hankel
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of surface properties
- Patent number 4,206,769
- Issue date Jun 10, 1980
- Shabtay Dikstein
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for evaluating rebounding characteristics of o...
- Patent number 4,006,626
- Issue date Feb 8, 1977
- Josef Ruzicka
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
3344660
- Patent number 3,344,660
- Issue date Oct 3, 1967
- G01 - MEASURING TESTING
Information Patent Grant
3321961
- Patent number 3,321,961
- Issue date May 30, 1967
- G01 - MEASURING TESTING
Information Patent Grant
2992554
- Patent number 2,992,554
- Issue date Jul 18, 1961
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Substrate bending stiffness measurement method and system
- Publication number 20040217539
- Publication date Nov 4, 2004
- Xerox Corporation.
- Robert A. Clark
- G01 - MEASURING TESTING
Information Patent Application
Substrate bending stiffness measurement method and system
- Publication number 20030205093
- Publication date Nov 6, 2003
- Xerox Corporation.
- Robert A. Clark
- G01 - MEASURING TESTING
Information Patent Application
Substrate bending stiffness measurement method and system
- Publication number 20030200815
- Publication date Oct 30, 2003
- Xerox Corporation.
- Robert A. Clark
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE BENDING STIFFNESS MEASUREMENT METHOD AND SYSTEM
- Publication number 20030126931
- Publication date Jul 10, 2003
- Xerox Corporation.
- Robert A. Clark
- G01 - MEASURING TESTING
Information Patent Application
Flexible substrate, semiconductor device, imaging device, radiation...
- Publication number 20020195676
- Publication date Dec 26, 2002
- Canon Kabushiki Kaisha
- Osamu Hamamoto
- G01 - MEASURING TESTING
Information Patent Application
Stiction-based chuck for bulge tester and method of bulge testing
- Publication number 20020066311
- Publication date Jun 6, 2002
- University of Vermont and State Agricultural College
- Dryver R. Huston
- G01 - MEASURING TESTING

using vacuum

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test apparatus for flexible screen

Inspection device and method

Fluid flow control of vacuum mounting

High speed vacuum cycling excitation system for optical inspection...

High speed vacuum cycling excitation system for optical inspection...

Substrate bending stiffness measurement method and system

Manipulator for microscopy sample preparation and methods for makin...

Flexible substrate, semiconductor device, imaging device, radiation...

Substrate bending stiffness measurement method and system

Substrate bending stiffness measurement method and system

Substrate bending stiffness measurement method and system

Stiction-based chuck for bulge tester and method of bulge testing

Micro-ball impact tester

Method and apparatus for evaluating fold endurance and surface adhe...

Measurement of surface properties

Method and apparatus for evaluating rebounding characteristics of o...

3344660

3321961

2992554

Patents Applicationslast 30 patents

Substrate bending stiffness measurement method and system

Substrate bending stiffness measurement method and system

Substrate bending stiffness measurement method and system

SUBSTRATE BENDING STIFFNESS MEASUREMENT METHOD AND SYSTEM

Flexible substrate, semiconductor device, imaging device, radiation...

Stiction-based chuck for bulge tester and method of bulge testing