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G01C19/5642
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PHYSICS
G01
Measuring instruments
G01C
MEASURING DISTANCES, LEVELS OR BEARINGS SURVEYING NAVIGATION GYROSCOPIC INSTRUMENTS PHOTOGRAMMETRY OR VIDEOGRAMMETRY
G01C19/00
Gyroscopes Turn-sensitive devices using vibrating masses Turn-sensitive devices without moving masses Measuring angular rate using gyroscopic effects
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G01C19/5642
using vibrating bars or beams
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Patents Grants
last 30 patents
Information
Patent Grant
Vibration-type angular velocity sensor
Patent number
12,281,895
Issue date
Apr 22, 2025
Sumitomo Precision Products Co., Ltd.
Takafumi Moriguchi
G01 - MEASURING TESTING
Information
Patent Grant
Sensor and electronic device
Patent number
12,264,916
Issue date
Apr 1, 2025
Kabushiki Kaisha Toshiba
Ryunosuke Gando
G01 - MEASURING TESTING
Information
Patent Grant
Oscillation apparatus, quantum computer, and control method
Patent number
12,267,042
Issue date
Apr 1, 2025
NEC Corporation
Tsuyoshi Yamamoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Vibrator device, electronic apparatus, and vehicle
Patent number
11,940,275
Issue date
Mar 26, 2024
Seiko Epson Corporation
Seiichiro Ogura
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Sensor element and angular velocity sensor
Patent number
11,656,078
Issue date
May 23, 2023
Kyocera Corporation
Munetaka Soejima
G01 - MEASURING TESTING
Information
Patent Grant
Vibrator device, electronic apparatus, and vehicle
Patent number
11,340,070
Issue date
May 24, 2022
Seiko Epson Corporation
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
Vibrator device, electronic apparatus, and vehicle
Patent number
11,326,882
Issue date
May 10, 2022
Seiko Epson Corporation
Seiichiro Ogura
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Vibrator device
Patent number
11,293,755
Issue date
Apr 5, 2022
Seiko Epson Corporation
Seiichiro Ogura
G01 - MEASURING TESTING
Information
Patent Grant
MEMS inertial measurement apparatus having slanted electrodes for q...
Patent number
11,280,612
Issue date
Mar 22, 2022
Georgia Tech Research Corporation
Farrokh Ayazi
G01 - MEASURING TESTING
Information
Patent Grant
MEMS inertial measurement apparatus having slanted electrodes for q...
Patent number
11,280,613
Issue date
Mar 22, 2022
Georgia Tech Research Corporation
Farrokh Ayazi
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope start-up process and circuit
Patent number
11,162,790
Issue date
Nov 2, 2021
STMicroelectronics, Inc.
Deyou Fang
G01 - MEASURING TESTING
Information
Patent Grant
Angular velocity sensor, sensor element, and multi-axis angular vel...
Patent number
11,112,247
Issue date
Sep 7, 2021
Kyocera Corporation
Munetaka Soejima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Physical quantity sensor, composite sensor, inertial measurement un...
Patent number
11,105,629
Issue date
Aug 31, 2021
Seiko Epson Corporation
Tatsuro Torimoto
G01 - MEASURING TESTING
Information
Patent Grant
Rotation rate sensor and method for manufacturing a rotation rate s...
Patent number
11,060,867
Issue date
Jul 13, 2021
Robert Bosch GmbH
Martin Putnik
G01 - MEASURING TESTING
Information
Patent Grant
Vibrator device including reduced mounting stress and frequency var...
Patent number
11,009,351
Issue date
May 18, 2021
Seiko Epson Corporation
Masashi Shimura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Piezoelectric rotational MEMS resonator
Patent number
10,910,549
Issue date
Feb 2, 2021
Murata Manufacturing Co., Ltd.
Heikki Kuisma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Piezoelectric rotational MEMS resonator
Patent number
10,884,018
Issue date
Jan 5, 2021
Murata Manufacturing Co., Ltd.
Heikki Kuisma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensor element, physical quantity sensor, electronic apparatus, and...
Patent number
10,866,097
Issue date
Dec 15, 2020
Seiko Epson Corporation
Keiichi Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Concatenated suspension in a piezoelectric gyroscope
Patent number
10,782,130
Issue date
Sep 22, 2020
Murata Manufacturing Co., Ltd.
Heikki Kuisma
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Piezoelectric gyroscope with transversal drive transducer
Patent number
10,775,172
Issue date
Sep 15, 2020
Murata Manufacturing Co., Ltd.
Heikki Kuisma
G01 - MEASURING TESTING
Information
Patent Grant
Sensor element, sensor, electronic apparatus, and vehicle
Patent number
10,690,500
Issue date
Jun 23, 2020
Seiko Epson Corporation
Ryuta Nishizawa
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Physical quantity sensor, electronic apparatus, and moving object
Patent number
10,634,498
Issue date
Apr 28, 2020
Seiko Epson Corporation
Tsugio Ide
G01 - MEASURING TESTING
Information
Patent Grant
MEMS inertial measurement apparatus having slanted electrodes for q...
Patent number
10,634,499
Issue date
Apr 28, 2020
Georgia Tech Research Corporation
Farrokh Ayazi
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, electronic apparatus, and moving object
Patent number
10,563,983
Issue date
Feb 18, 2020
Seiko Epson Corporation
Tsugio Ide
G01 - MEASURING TESTING
Information
Patent Grant
Dual-axis ultra-robust rotation rate sensor for automotive applicat...
Patent number
10,557,710
Issue date
Feb 11, 2020
Robert Bosch GmbH
Andreas Lassl
G01 - MEASURING TESTING
Information
Patent Grant
Gyroscope with piezoelectric monocrystal transducers
Patent number
10,488,199
Issue date
Nov 26, 2019
Innalabs Limited
Jose Beitia
G01 - MEASURING TESTING
Information
Patent Grant
Angular velocity sensor
Patent number
10,408,618
Issue date
Sep 10, 2019
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Satoshi Ohuchi
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity detection circuit, electronic device, and moving...
Patent number
10,302,431
Issue date
May 28, 2019
Seiko Epson Corporation
Takashi Aoyama
G01 - MEASURING TESTING
Information
Patent Grant
Circuit device, physical-quantity detecting apparatus, electronic a...
Patent number
10,288,426
Issue date
May 14, 2019
Seiko Epson Corporation
Takashi Aoyama
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Electronic device, electronic apparatus, and moving object
Patent number
10,156,443
Issue date
Dec 18, 2018
Seiko Epson Corporation
Norifumi Shimizu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Vibrator Device, Electronic Apparatus, And Vehicle
Publication number
20220236058
Publication date
Jul 28, 2022
SEIKO EPSON CORPORATION
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
Vibrator Device, Electronic Apparatus, And Vehicle
Publication number
20220236057
Publication date
Jul 28, 2022
SEIKO EPSON CORPORATION
Seiichiro OGURA
B60 - VEHICLES IN GENERAL
Information
Patent Application
VIBRATOR DEVICE
Publication number
20210063155
Publication date
Mar 4, 2021
SEIKO EPSON CORPORATION
Seiichiro Ogura
G01 - MEASURING TESTING
Information
Patent Application
VIBRATOR DEVICE, ELECTRONIC APPARATUS, AND VEHICLE
Publication number
20210033395
Publication date
Feb 4, 2021
SEIKO EPSON CORPORATION
Seiichiro OGURA
B60 - VEHICLES IN GENERAL
Information
Patent Application
VIBRATOR DEVICE, ELECTRONIC APPARATUS, AND VEHICLE
Publication number
20210033398
Publication date
Feb 4, 2021
SEIKO EPSON CORPORATION
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
SENSOR ELEMENT AND ANGULAR VELOCITY SENSOR
Publication number
20200249021
Publication date
Aug 6, 2020
KYOCERA CORPORATION
Munetaka SOEJIMA
G01 - MEASURING TESTING
Information
Patent Application
MEMS INERTIAL MEASUREMENT APPARATUS HAVING SLANTED ELECTRODES FOR Q...
Publication number
20200225036
Publication date
Jul 16, 2020
Farrokh Ayazi
G01 - MEASURING TESTING
Information
Patent Application
MEMS INERTIAL MEASUREMENT APPARATUS HAVING SLANTED ELECTRODES FOR Q...
Publication number
20200225037
Publication date
Jul 16, 2020
Farrokh Ayazi
G01 - MEASURING TESTING
Information
Patent Application
SENSOR ELEMENT, PHYSICAL QUANTITY SENSOR, ELECTRONIC APPARATUS, AND...
Publication number
20190301868
Publication date
Oct 3, 2019
SEIKO EPSON CORPORATION
Keiichi YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
VIBRATOR DEVICE, METHOD OF MANUFACTURING VIBRATOR DEVICE, ELECTRONI...
Publication number
20190195630
Publication date
Jun 27, 2019
SEIKO EPSON CORPORATION
Masashi SHIMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PIEZOELECTRIC ROTATIONAL MEMS RESONATOR
Publication number
20180342667
Publication date
Nov 29, 2018
Murata Manufacturing Co., Ltd.
Heikki KUISMA
G01 - MEASURING TESTING
Information
Patent Application
CONCATENATED SUSPENSION IN A PIEZOELECTRIC GYROSCOPE
Publication number
20180340776
Publication date
Nov 29, 2018
Murata Manufacturing Co., Ltd.
Heikki KUISMA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SENSOR ELEMENT, SENSOR, ELECTRONIC APPARATUS, AND VEHICLE
Publication number
20180283865
Publication date
Oct 4, 2018
SEIKO EPSON CORPORATION
Ryuta NISHIZAWA
B60 - VEHICLES IN GENERAL
Information
Patent Application
DUAL-AXIS ULTRA-ROBUST ROTATION RATE SENSOR FOR AUTOMOTIVE APPLICAT...
Publication number
20180231381
Publication date
Aug 16, 2018
ROBERT BOSCH GmbH
Andreas Lassl
G01 - MEASURING TESTING
Information
Patent Application
GYROSCOPE WITH PIEZOELECTRIC MONOCRYSTAL TRANSDUCERS
Publication number
20170350700
Publication date
Dec 7, 2017
Innalabs Limited
JOSE BEITIA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR ELEMENT, METHOD OF MANUFACTURING SENSOR ELEMENT, SENSOR, ELE...
Publication number
20170234725
Publication date
Aug 17, 2017
SEIKO EPSON CORPORATION
Fumio ICHIKAWA
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL QUANTITY DETECTION CIRCUIT, ELECTRONIC DEVICE, AND MOVING...
Publication number
20170131099
Publication date
May 11, 2017
SEIKO EPSON CORPORATION
Takashi AOYAMA
G01 - MEASURING TESTING
Information
Patent Application
ANGULAR VELOCITY SENSOR
Publication number
20170131100
Publication date
May 11, 2017
Panasonic Intellectual Property Management Co., Ltd.
Satoshi Ohuchi
G01 - MEASURING TESTING
Information
Patent Application
Physical Quantity Sensor, Electronic Apparatus, and Moving Object
Publication number
20170115116
Publication date
Apr 27, 2017
SEIKO EPSON CORPORATION
Tsugio Ide
G01 - MEASURING TESTING
Information
Patent Application
OSCILLATOR, ELECTRONIC DEVICE, AND MOVING OBJECT
Publication number
20170074654
Publication date
Mar 16, 2017
SEIKO EPSON CORPORATION
Makoto FURUHATA
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL QUANTITY SENSOR, ELECTRONIC DEVICE, AND MOVING OBJECT
Publication number
20170074655
Publication date
Mar 16, 2017
SEIKO EPSON CORPORATION
Makoto FURUHATA
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE, ELECTRONIC APPARATUS, AND MOVING OBJECT
Publication number
20170016725
Publication date
Jan 19, 2017
SEIKO EPSON CORPORATION
Norifumi SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
DATA PROCESSING CIRCUIT, PHYSICAL QUANTITY DETECTION CIRCUIT, PHYSI...
Publication number
20160282116
Publication date
Sep 29, 2016
SEIKO EPSON CORPORATION
Hideo HANEDA
G01 - MEASURING TESTING
Information
Patent Application
ANGULAR VELOCITY DETECTION ELEMENT, ANGULAR VELOCITY DETECTION DEVI...
Publication number
20160282117
Publication date
Sep 29, 2016
SEIKO EPSON CORPORATION
Keiji NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT DEVICE, PHYSICAL-QUANTITY DETECTING APPARATUS, ELECTRONIC A...
Publication number
20160276990
Publication date
Sep 22, 2016
SEIKO EPSON CORPORATION
Takashi AOYAMA
G01 - MEASURING TESTING
Information
Patent Application
ANGULAR RATE SENSOR
Publication number
20150316377
Publication date
Nov 5, 2015
Ramot at Tel Aviv University Ltd.
Yuval GERSON
G01 - MEASURING TESTING
Information
Patent Application
ANGULAR VELOCITY DETECTION ELEMENT
Publication number
20150285634
Publication date
Oct 8, 2015
Murata Manufacturing Co., Ltd.
Kosuke WATANABE
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL QUANTITY DETECTION CIRCUIT, PHYSICAL QUANTITY DETECTING DE...
Publication number
20150276404
Publication date
Oct 1, 2015
SEIKO EPSON CORPORATION
Ryuta NISHIZAWA
G01 - MEASURING TESTING
Information
Patent Application
ANGULAR VELOCITY SENSOR
Publication number
20150247726
Publication date
Sep 3, 2015
Murata Manufacturing Co., Ltd.
Kosuke WATANABE
G01 - MEASURING TESTING
Information
Patent Application
INERTIAL FORCE SENSOR
Publication number
20150122021
Publication date
May 7, 2015
PANASONIC CORPORATION
Satoshi Ohuchi
G01 - MEASURING TESTING