Vacuum systems

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CPC
H01J49/24

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/24Vacuum systems

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for single particle analysis
- Patent number 12,154,777
- Issue date Nov 26, 2024
- SHANGHAI POLARIS BIOLOGY CO., LTD.
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for sampling into an atmospheric pressure inlet mass spectr...
- Patent number 12,148,606
- Issue date Nov 19, 2024
- University of South Florida
- Theresa Evans-Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Package comprising an ion-trap and method of fabrication
- Patent number 12,142,473
- Issue date Nov 12, 2024
- Duke University
- Jungsang Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bench-top time of flight mass spectrometer
- Patent number 12,123,421
- Issue date Oct 22, 2024
- Micromass UK Limited
- Cedric Marsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complemented ion funnel for mass spectrometer
- Patent number 12,125,692
- Issue date Oct 22, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Water-containing simulated lunar soil preparation and water content...
- Patent number 12,080,538
- Issue date Sep 3, 2024
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CAS
- Ziheng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for rapid exchange of ion sources and ion transmission devices
- Patent number 12,080,540
- Issue date Sep 3, 2024
- Micromass UK Limited
- Paul Murray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometers that utilize ionic wind and methods of use thereof
- Patent number 12,068,148
- Issue date Aug 20, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method of controlling the same
- Patent number 12,033,842
- Issue date Jul 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Yasuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,031,943
- Issue date Jul 9, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 12,027,360
- Issue date Jul 2, 2024
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum chamber connector
- Patent number 12,025,246
- Issue date Jul 2, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Aivaras Venckus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top Time of Flight mass spectrometer
- Patent number 12,009,193
- Issue date Jun 11, 2024
- Micromass UK Limited
- Ruth Wamsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with charge up determiner using ion intensity signal
- Patent number 11,990,326
- Issue date May 21, 2024
- Shimadzu Corporation
- Kazuma Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,990,328
- Issue date May 21, 2024
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-power mass interrogation system and assay for determining Vitam...
- Patent number 11,967,495
- Issue date Apr 23, 2024
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fourier transform mass spectrometers and methods of analysis using...
- Patent number 11,881,388
- Issue date Jan 23, 2024
- DH Technologies Development Pte. Ltd.
- James W. Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top time of flight mass spectrometer
- Patent number 11,879,470
- Issue date Jan 23, 2024
- Micromass UK Limited
- Cedric Marsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry device and mass spectrometry method
- Patent number 11,874,257
- Issue date Jan 16, 2024
- Shimadzu Corporation
- Ryo Kageyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for producing hydrogen and carbon products
- Patent number 11,873,219
- Issue date Jan 16, 2024
- SHELL USA, INC.
- Leonardo Spanu
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Sample analysis systems and methods of use thereof
- Patent number 11,837,455
- Issue date Dec 5, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry method and mass spectrometer
- Patent number 11,804,369
- Issue date Oct 31, 2023
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method for analysing a gas by mass spectrometry
- Patent number 11,791,147
- Issue date Oct 17, 2023
- LEYBOLD GMBH
- Anthony Hin Yiu Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source with gas delivery for high-fidelity analysis
- Patent number 11,768,176
- Issue date Sep 26, 2023
- MKS Instruments, Inc.
- James Edward Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometric analysis of microbes
- Patent number 11,764,048
- Issue date Sep 19, 2023
- Micromass UK Limited
- Zoltan Takats
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Methods and systems for cooling a vacuum pump
- Patent number 11,754,062
- Issue date Sep 12, 2023
- Thermo Finnigan LLC.
- Jaime A. Carrera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Package comprising an ion-trap and method of fabrication
- Patent number 11,749,518
- Issue date Sep 5, 2023
- Duke University
- Jungsang Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for enhanced ion pump lifespan
- Patent number 11,742,191
- Issue date Aug 29, 2023
- Hamilton Sundstrand Corporation
- Ben D. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 11,742,194
- Issue date Aug 29, 2023
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for rapid detection and quantitation of volatile organic...
- Patent number 11,721,533
- Issue date Aug 8, 2023
- InspectIR Systems, LLC
- Guido Fridolin Verbeck
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETER
- Publication number 20240412965
- Publication date Dec 12, 2024
- Shimadzu Corporation
- Yusuke SAKAGOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR FLASH BOILING OF A LIQUID SAMPLE
- Publication number 20240395527
- Publication date Nov 28, 2024
- DH Technologies Development Pte. Ltd.
- Peter KOVARIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADVECTION-BASED TRANSPORT OF ABLATED MATERIAL
- Publication number 20240371623
- Publication date Nov 7, 2024
- Agilent Technologies, Inc.
- Trygve RISTROPH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA-HIGH VACUUM SEAL, ASSEMBLY, AND METHOD OF MAKING THE SAME
- Publication number 20240355607
- Publication date Oct 24, 2024
- Quantinuum LLC
- Benjamin Norman Spaun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY SYSTEM FOR DETERMINING A MEASURE OF A RATE OF DECAY
- Publication number 20240355608
- Publication date Oct 24, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Jan-Peter HAUSCHILD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Improved Low-Power Mass Interrogation System and Assay For Determin...
- Publication number 20240347330
- Publication date Oct 17, 2024
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS AND/OR MOBILITY SPECTROMETER VACUUM PUMPING LINE
- Publication number 20240297033
- Publication date Sep 5, 2024
- Micromass UK Limited
- Marcus Dawber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD USING THE SAME
- Publication number 20240290603
- Publication date Aug 29, 2024
- YOUNG IN ACE Co., Ltd.
- Sungwon KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20240282559
- Publication date Aug 22, 2024
- Micromass UK Limited
- Ruth Wamsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20240274427
- Publication date Aug 15, 2024
- Shimadzu Corporation
- Tomoyoshi MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM SYSTEM FOR A MASS SPECTROMETER
- Publication number 20240266162
- Publication date Aug 8, 2024
- Micromass UK Limited
- Andrew Whatley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLOW RECIRCULATION FOR MOBILITY SEPARATION IMPROVEMENT
- Publication number 20240255466
- Publication date Aug 1, 2024
- Thermo Finnigan LLC
- Mikhail V. UGAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WATER-CONTAINING SIMULATED LUNAR SOIL PREPARATION AND WATER CONTENT...
- Publication number 20240242952
- Publication date Jul 18, 2024
- Institute of Geology and Geophysics, CAS
- Ziheng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR OPERATING A VACUUM INTERFACE OF A MASS SPE...
- Publication number 20240239653
- Publication date Jul 18, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Christoph WEHE
- C01 - INORGANIC CHEMISTRY
Information Patent Application
PARTICLE SAMPLING DEVICE, AEROSOL MASS SPECTROMETER AND METHOD FOR...
- Publication number 20240234120
- Publication date Jul 11, 2024
- Yongyang Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Performing MS/MS of High Intensity Ion Beams Using a Band...
- Publication number 20240234123
- Publication date Jul 11, 2024
- DH Technologies Development Pte. Ltd.
- Bruce COLLINGS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Apparatus for Washing Sampling Probe for Use in Mass Sp...
- Publication number 20240234117
- Publication date Jul 11, 2024
- DH Technologies Development Pte. Ltd.
- Thomas R. COVEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUCTING GAS OF MASS SPECTROMETER
- Publication number 20240234122
- Publication date Jul 11, 2024
- Thermo Finnigan LLC
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE APPARATUS AND MASS SPECTROMETER
- Publication number 20240213011
- Publication date Jun 27, 2024
- Shimadzu Corporation
- Xiaoqiang ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR SINGLE-ION MASS SPECTROMETRY WITH TEMPORAL...
- Publication number 20240203724
- Publication date Jun 20, 2024
- Brown University
- Derek M. Stein
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Method for Analyzing Samples Including a High M/Z Cutoff
- Publication number 20240177987
- Publication date May 30, 2024
- DH Technologies Development Pte. Ltd.
- Leigh BEDFORD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Differential Mobility Spectrometer/Mass Spectrometer Interface With...
- Publication number 20240175846
- Publication date May 30, 2024
- DH Technologies Development Pte. Ltd.
- Thomas COVEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME
- Publication number 20240177983
- Publication date May 30, 2024
- HITACHI HIGH-TECH COORPORATION
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20240170273
- Publication date May 23, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- G01 - MEASURING TESTING
Information Patent Application
ION GUIDE
- Publication number 20240162023
- Publication date May 16, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry Methods And Systems For High Pressure Charge Stat...
- Publication number 20240162022
- Publication date May 16, 2024
- DH Technologies Development Pte. Ltd.
- Yves LE BLANC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Package Comprising an Ion-Trap and Method of Fabrication
- Publication number 20240162028
- Publication date May 16, 2024
- DUKE UNIVERSITY
- Jungsang KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASS SPECTROMETER
- Publication number 20240145225
- Publication date May 2, 2024
- Shimadzu Corporation
- Tomoyoshi MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES FOR IMPROVED ROBUSTNESS
- Publication number 20240145228
- Publication date May 2, 2024
- Thermo Finnigan LLC
- Scott T. Quarmby
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
DUCTING GAS OF MASS SPECTROMETER
- Publication number 20240136171
- Publication date Apr 25, 2024
- Thermo Finnigan LLC
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS

Vacuum systems

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for single particle analysis

Methods for sampling into an atmospheric pressure inlet mass spectr...

Package comprising an ion-trap and method of fabrication

Bench-top time of flight mass spectrometer

Complemented ion funnel for mass spectrometer

Water-containing simulated lunar soil preparation and water content...

Device for rapid exchange of ion sources and ion transmission devices

Mass spectrometers that utilize ionic wind and methods of use thereof

Mass spectrometer and method of controlling the same

Ion analyzer

Mass spectrometer

Vacuum chamber connector

Bench-top Time of Flight mass spectrometer

Mass spectrometer with charge up determiner using ion intensity signal

Mass spectrometer

Low-power mass interrogation system and assay for determining Vitam...

Fourier transform mass spectrometers and methods of analysis using...

Bench-top time of flight mass spectrometer

Mass spectrometry device and mass spectrometry method

Process for producing hydrogen and carbon products

Sample analysis systems and methods of use thereof

Mass spectrometry method and mass spectrometer

Mass spectrometer and method for analysing a gas by mass spectrometry

Ion source with gas delivery for high-fidelity analysis

Spectrometric analysis of microbes

Methods and systems for cooling a vacuum pump

Package comprising an ion-trap and method of fabrication

System and method for enhanced ion pump lifespan

Apparatus and method for thermal assisted desorption ionization sys...

Techniques for rapid detection and quantitation of volatile organic...

Patents Applicationslast 30 patents

MASS SPECTROMETER

SYSTEMS AND METHODS FOR FLASH BOILING OF A LIQUID SAMPLE

ADVECTION-BASED TRANSPORT OF ABLATED MATERIAL

ULTRA-HIGH VACUUM SEAL, ASSEMBLY, AND METHOD OF MAKING THE SAME

MASS SPECTROMETRY SYSTEM FOR DETERMINING A MEASURE OF A RATE OF DECAY

Improved Low-Power Mass Interrogation System and Assay For Determin...

MASS AND/OR MOBILITY SPECTROMETER VACUUM PUMPING LINE

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD USING THE SAME

BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER

MASS SPECTROMETER

VACUUM SYSTEM FOR A MASS SPECTROMETER

FLOW RECIRCULATION FOR MOBILITY SEPARATION IMPROVEMENT

WATER-CONTAINING SIMULATED LUNAR SOIL PREPARATION AND WATER CONTENT...

METHOD AND APPARATUS FOR OPERATING A VACUUM INTERFACE OF A MASS SPE...

PARTICLE SAMPLING DEVICE, AEROSOL MASS SPECTROMETER AND METHOD FOR...

Method of Performing MS/MS of High Intensity Ion Beams Using a Band...

Methods and Apparatus for Washing Sampling Probe for Use in Mass Sp...

DUCTING GAS OF MASS SPECTROMETER

ION SOURCE APPARATUS AND MASS SPECTROMETER

SYSTEMS AND METHODS FOR SINGLE-ION MASS SPECTROMETRY WITH TEMPORAL...

Method for Analyzing Samples Including a High M/Z Cutoff

Differential Mobility Spectrometer/Mass Spectrometer Interface With...

MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME

SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF

ION GUIDE

Mass Spectrometry Methods And Systems For High Pressure Charge Stat...

Package Comprising an Ion-Trap and Method of Fabrication

MASS SPECTROMETER

ION SOURCES FOR IMPROVED ROBUSTNESS

DUCTING GAS OF MASS SPECTROMETER