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Velocity or momentum separators
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CPC
G01N30/7293
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G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N30/00
Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange
Current Industry
G01N30/7293
Velocity or momentum separators
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Patents Grants
last 30 patents
Information
Patent Grant
Chromatograph mass spectrometer
Patent number
11,940,426
Issue date
Mar 26, 2024
Shimadzu Corporation
Kazuma Maeda
G01 - MEASURING TESTING
Information
Patent Grant
Expanded bed affinity selection
Patent number
11,474,085
Issue date
Oct 18, 2022
FloDesign Sonics, Inc.
Bart Lipkens
C07 - ORGANIC CHEMISTRY
Information
Patent Grant
Optimised ion mobility separation timescales for targeted ions
Patent number
11,255,817
Issue date
Feb 22, 2022
Micromass UK Limited
Kevin Giles
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sampling system for use with surface ionization spectroscopy
Patent number
8,497,474
Issue date
Jul 30, 2013
Ionsense Inc.
Brian D. Musselman
G01 - MEASURING TESTING
Information
Patent Grant
Sampling system for use with surface ionization spectroscopy
Patent number
8,217,341
Issue date
Jul 10, 2012
Ionsense
Brian D. Musselman
G01 - MEASURING TESTING
Information
Patent Grant
Method for fractionating various components contained in a sample s...
Patent number
7,901,628
Issue date
Mar 8, 2011
Shimadzu Corporation
Yoshitake Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Sampling system for use with surface ionization spectroscopy
Patent number
7,700,913
Issue date
Apr 20, 2010
IonSense, Inc.
Brian D. Musselman
G01 - MEASURING TESTING
Information
Patent Grant
Electrospray and atmospheric pressure chemical ionization sources
Patent number
5,844,237
Issue date
Dec 1, 1998
Craig M. Whitehouse
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometer
Patent number
5,567,938
Issue date
Oct 22, 1996
Hitachi, Ltd.
Tadao Mimura
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for analyzing sample solutions
Patent number
5,526,682
Issue date
Jun 18, 1996
Waters Investments Limited
Joseph A. Jarrell
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometer
Patent number
5,481,107
Issue date
Jan 2, 1996
Hitachi, Ltd.
Yasuaki Takada
G01 - MEASURING TESTING
Information
Patent Grant
Ion focusing lensing system for a mass spectrometer interfaced to a...
Patent number
5,432,343
Issue date
Jul 11, 1995
Erol E. Gulcicek
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometry with gas counterflow for particle beam
Patent number
5,359,196
Issue date
Oct 25, 1994
Hewlett-Packard Company
Robert T. Whitt
G01 - MEASURING TESTING
Information
Patent Grant
Particle-beam generator for LC/MS interface
Patent number
5,331,160
Issue date
Jul 19, 1994
Hewlett-Packard Company
Robert T. Whitt
G01 - MEASURING TESTING
Information
Patent Grant
Combined electrospray/particle beam liquid chromatography/mass spec...
Patent number
5,331,159
Issue date
Jul 19, 1994
Hewlett-Packard Company
James A. Apffel
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for improving electrospray ionization of solut...
Patent number
5,306,412
Issue date
Apr 26, 1994
Analytica of Branford, Inc.
Craig M. Whitehouse
G01 - MEASURING TESTING
Information
Patent Grant
Housing for converting an electrospray to an ion stream
Patent number
5,304,798
Issue date
Apr 19, 1994
Millipore Corporation
Michael J. Tomany
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometer
Patent number
5,298,744
Issue date
Mar 29, 1994
Hitachi, Ltd.
Tadao Mimura
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for shaping and detecting a particle beam
Patent number
5,270,542
Issue date
Dec 14, 1993
Regents of The University of Minnesota
Peter H. McMurry
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for interfacing liquid chromatograph with magnetic sector...
Patent number
5,266,192
Issue date
Nov 30, 1993
General Electric Company
Woodfin V. Ligon
G01 - MEASURING TESTING
Information
Patent Grant
Monodisperse aerosol generator for use with infrared spectrometry
Patent number
5,175,433
Issue date
Dec 29, 1992
Georgia Tech Research Corporation
Richard F. Browner
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Electrospray ion source with reduced neutral noise and method
Patent number
5,171,990
Issue date
Dec 15, 1992
Finnigan Corporation
Ian C. Mylchreest
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for multi-stage particle separation with gas a...
Patent number
5,162,650
Issue date
Nov 10, 1992
Finnigan Corporation
Mark E. Bier
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for focusing ions in viscous flow jet expansio...
Patent number
5,157,260
Issue date
Oct 20, 1992
Finnian Corporation
Iain C. Mylchreest
G01 - MEASURING TESTING
Information
Patent Grant
Ion analyzer
Patent number
5,132,002
Issue date
Jul 21, 1992
Hitachi, Ltd.
Yoshiaki Kato
G01 - MEASURING TESTING
Information
Patent Grant
Multilayer flow electrospray ion source using improved sheath liquid
Patent number
5,122,670
Issue date
Jun 16, 1992
Finnigan Corporation
Iain C. Mylchreest
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometer
Patent number
5,103,093
Issue date
Apr 7, 1992
Hitachi, Ltd.
Minoru Sakairi
G01 - MEASURING TESTING
Information
Patent Grant
Single port thermospray ion source with coaxial vapor flow
Patent number
5,030,826
Issue date
Jul 9, 1991
Hewlett-Packard Company
Stuart C. Hansen
G01 - MEASURING TESTING
Information
Patent Grant
Electrospray method for mass spectrometry
Patent number
5,015,845
Issue date
May 14, 1991
Vestec Corporation
Mark Allen
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for introduction of fluid streams into mass sp...
Patent number
4,977,785
Issue date
Dec 18, 1990
Extrel Corporation
Ross C. Willoughby
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CHROMATOGRAPH MASS SPECTROMETER
Publication number
20220178888
Publication date
Jun 9, 2022
SHIMADZU CORPORATION
Kazuma MAEDA
G01 - MEASURING TESTING
Information
Patent Application
OPTIMISED ION MOBILITY SEPARATION TIMESCALES FOR TARGETED IONS
Publication number
20220128509
Publication date
Apr 28, 2022
Micromass UK Limited
Kevin Giles
G01 - MEASURING TESTING
Information
Patent Application
Expanded Bed Affinity Selection
Publication number
20190011407
Publication date
Jan 10, 2019
Flodesign Sonics, Inc.
Bart Lipkens
G01 - MEASURING TESTING
Information
Patent Application
Expanded Bed Affinity Selection
Publication number
20180275106
Publication date
Sep 27, 2018
Flodesign Sonics, Inc.
Bart Lipkens
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
SAMPLING SYSTEM FOR USE WITH SURFACE IONIZATION SPECTROSCOPY
Publication number
20120273675
Publication date
Nov 1, 2012
IONSENSE, INC.
Brian D. Musselman
G01 - MEASURING TESTING
Information
Patent Application
SAMPLING SYSTEM FOR USE WITH SURFACE IONIZATION SPECTROSCOPY
Publication number
20100102222
Publication date
Apr 29, 2010
IONSENSE, INC.
Brian D. Musselman
G01 - MEASURING TESTING
Information
Patent Application
Method for fractionating various components contained in a sample s...
Publication number
20090001264
Publication date
Jan 1, 2009
Shimadzu Corporation
Yoshitake Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
Sampling system for use with surface ionization spectroscopy
Publication number
20070205362
Publication date
Sep 6, 2007
IonSense, Inc.
Brian D. Musselman
G01 - MEASURING TESTING
Information
Patent Application
Liquid chromatograph mass spectrometer
Publication number
20040126277
Publication date
Jul 1, 2004
Yoshitake Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
Liquid chromatograph mass spectrometer
Publication number
20030113936
Publication date
Jun 19, 2003
SHIMADZU CORPORATION
Yoshitake Yamamoto
G01 - MEASURING TESTING