Claims
- 1. A system for analyzing a liquid sample comprising the effluent of a liquid chromatography column which comprises,
- an ultrasonic nebulizer capable of vibrating at a frequency between about 50 Khz and 760 khz to form capillary waves in a liquid which are fractured to form a liquid aerosol,
- conduit means for introducing said liquid sample to be converted to said liquid aerosol, axially into said nebulizer,
- means for converting said liquid aerosol to a solid aerosol by evaporating solvent of said liquid aerosol with a heated gas stream at a pressure of at least atmospheric pressure which surrounds and contacts said liquid aerosol,
- a bent chamber for capturing liquid particles larger than said solid aerosol, said chamber positioned after said means for converting said liquid aerosol to a solid aerosol;
- skimmer means for separating said solid aerosol from said evaporated solvent,
- means to ionize constituent molecules of said solid aerosol thus producing an ion beam, and
- means for analyzing said ion beam.
- 2. The system of claim 1 wherein said means for analyzing comprises a mass spectrometer.
- 3. A process for analyzing a liquid sample which comprises:
- introducing said sample axially into an ultrasonic nebulizer,
- vibrating said nebulizer to form capillary waves on the surface of said liquid sample which are fractured to form a liquid aerosol,
- heating said liquid aerosol to evaporate solvent of said liquid aerosol with a heated gas stream at a pressure of at least atmospheric pressure surrounding and contacting said liquid aerosol to convert said liquid aerosol to a solid aerosol,
- separating liquid particles larger than said solid aerosol from said solid aerosol,
- separating evaporated solvent from said solid aerosol with a skimmer,
- ionizing constituent molecules of said solid aerosol thus producing an ion beam, and
- analyzing said ion beam.
- 4. The process of claim 3 wherein said liquid sample is produced in a liquid chromatography column.
- 5. The process of claim 3 wherein said ion beam is analyzed by mass spectroscopy.
REFERENCE TO RELATED APPLICATION
This is a continuation of application Ser. No. 07/987,863 filed on Dec. 9, 1992, now abandoned, which in turn is a continuation-in-part of application Ser. No. 07/694,703, filed May 2, 1991, now abandoned.
US Referenced Citations (8)
Continuations (1)
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Date |
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Parent |
987863 |
Dec 1992 |
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Continuation in Parts (1)
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694703 |
May 1991 |
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