Vibration

Industry

CPC
Y10S73/01

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Parent Industries

YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S73/00Measuring and testing

Current Industry

Y10S73/01Vibration

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Sensor apparatus
- Patent number 7,299,678
- Issue date Nov 27, 2007
- Baker Hughes Incorporated
- Eric Atherton
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical device
- Patent number 6,684,699
- Issue date Feb 3, 2004
- Sensonor ASA
- Daniel Lapadatu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Single crystal silicon sensor with high aspect ratio and curvilinea...
- Patent number 6,316,796
- Issue date Nov 13, 2001
- Lucas NovaSensor
- Kurt E. Petersen
- G01 - MEASURING TESTING
Information Patent Grant
Axis alignment method
- Patent number 6,285,111
- Issue date Sep 4, 2001
- AlliedSignal
- Rand H. Hulsing
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Low vibration link
- Patent number 6,282,955
- Issue date Sep 4, 2001
- L-3 Communications Corporation
- Rand H. Hulsing
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Axis alignment method
- Patent number 6,276,203
- Issue date Aug 21, 2001
- L-3 Communications Corporation
- Rand H. Hulsing
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Axis alignment method
- Patent number 6,273,514
- Issue date Aug 14, 2001
- AlliedSignal
- Rand H. Hulsing
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Method and apparatus for pre-processing of semiconductor substrate...
- Patent number 6,164,133
- Issue date Dec 26, 2000
- NEC Corporation
- Kaori Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring the damping characteristics of a...
- Patent number 6,145,382
- Issue date Nov 14, 2000
- Kabushiki Kaisha Toyota Chuo Kenkyusho
- Yuji Nagasawa
- G01 - MEASURING TESTING
Information Patent Grant
Low vibration link
- Patent number 6,098,462
- Issue date Aug 8, 2000
- L-3 Communications Corp.
- Rand H. Hulsing
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Single crystal silicon sensor with high aspect ratio and curvilinea...
- Patent number 6,084,257
- Issue date Jul 4, 2000
- Lucas NovaSensor
- Kurt E. Petersen
- G01 - MEASURING TESTING
Information Patent Grant
Low vibration link
- Patent number 6,079,271
- Issue date Jun 27, 2000
- L-3 Communications Corporation
- Rand H. Hulsing
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Microstructures and single mask, single-crystal process for fabrica...
- Patent number 6,051,866
- Issue date Apr 18, 2000
- Cornell Research Foundation, Inc.
- Kevin A. Shaw
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for evaluating piezoelectric materials
- Patent number 6,047,600
- Issue date Apr 11, 2000
- Topaz Technologies, Inc.
- Mats G. Ottosson
- G01 - MEASURING TESTING
Information Patent Grant
Transducer and interface circuit
- Patent number 6,043,524
- Issue date Mar 28, 2000
- Motorola, Inc.
- Eric D. Joseph
- G01 - MEASURING TESTING
Information Patent Grant
Scan assembly and method for calibrating the width of an input puls...
- Patent number 6,035,696
- Issue date Mar 14, 2000
- Gas Research Institute
- Karl F. Kiefer
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor type yaw rate sensor
- Patent number 6,028,332
- Issue date Feb 22, 2000
- Denso Corporation
- Kazuhiko Kano
- G01 - MEASURING TESTING
Information Patent Grant
Micromachined rate and acceleration sensor
- Patent number 6,023,972
- Issue date Feb 15, 2000
- AlliedSignal Inc.
- Rand H. Hulsing
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Semiconductor acceleration sensor with cantilever
- Patent number 6,005,275
- Issue date Dec 21, 1999
- Seiko Instruments Inc.
- Masataka Shinogi
- G01 - MEASURING TESTING
Information Patent Grant
Sensor element with removal resistance region
- Patent number 5,998,816
- Issue date Dec 7, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Yoshiyuki Nakaki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Micromachined rate and acceleration sensor
- Patent number 5,920,011
- Issue date Jul 6, 1999
- AlliedSignal Inc.
- Rand H. Hulsing
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
PZT microdevice
- Patent number 5,914,507
- Issue date Jun 22, 1999
- Regents of The University of Minnesota
- Dennis L. Polla
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor acceleration sensor
- Patent number 5,894,144
- Issue date Apr 13, 1999
- Akebono Brake Industry Co., Ltd.,
- Masatomo Mori
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring mass change using a quartz crystal microbalance
- Patent number 5,869,763
- Issue date Feb 9, 1999
- The United States of America as represented by the Secretary of the Army
- John R. Vig
- G01 - MEASURING TESTING
Information Patent Grant
Microstructure and single mask, single-crystal process for fabricat...
- Patent number 5,846,849
- Issue date Dec 8, 1998
- Cornell Research Foundation, Inc.
- Kevin A. Shaw
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Electrically isolated released microstructures
- Patent number 5,847,454
- Issue date Dec 8, 1998
- Cornell Research Foundcatton, Inc.
- Kevin A. Shaw
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method and device for measuring the characteristics of an oscillati...
- Patent number 5,837,885
- Issue date Nov 17, 1998
- Joseph Goodbread
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Force sensor device
- Patent number 5,834,646
- Issue date Nov 10, 1998
- SensoNor asa
- Terje Kvisteroy
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for seismic tornado detection
- Patent number 5,801,636
- Issue date Sep 1, 1998
- Frank B. Tatom
- G01 - MEASURING TESTING
Information Patent Grant
Accelerometers using silicon on insulator technology
- Patent number 5,780,885
- Issue date Jul 14, 1998
- Commissariat a l'Energie Atomique
- Bernard Diem
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Single crystal silicon sensor with high aspect ratio and curvilinea...
- Publication number 20030205739
- Publication date Nov 6, 2003
- Kurt E. Petersen
- G01 - MEASURING TESTING
Information Patent Application
Sensor apparatus
- Publication number 20030101822
- Publication date Jun 5, 2003
- Eric Atherton
- E21 - EARTH DRILLING MINING
Information Patent Application
Single crystal silicon sensor with high aspect ratio and curvilinea...
- Publication number 20010020726
- Publication date Sep 13, 2001
- Kurt Peterson
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sensor apparatus

Micromechanical device

Single crystal silicon sensor with high aspect ratio and curvilinea...

Axis alignment method

Low vibration link

Axis alignment method

Axis alignment method

Method and apparatus for pre-processing of semiconductor substrate...

Method and apparatus for measuring the damping characteristics of a...

Low vibration link

Single crystal silicon sensor with high aspect ratio and curvilinea...

Low vibration link

Microstructures and single mask, single-crystal process for fabrica...

Method for evaluating piezoelectric materials

Transducer and interface circuit

Scan assembly and method for calibrating the width of an input puls...

Semiconductor type yaw rate sensor

Micromachined rate and acceleration sensor

Semiconductor acceleration sensor with cantilever

Sensor element with removal resistance region

Micromachined rate and acceleration sensor

PZT microdevice

Semiconductor acceleration sensor

Method for measuring mass change using a quartz crystal microbalance

Microstructure and single mask, single-crystal process for fabricat...

Electrically isolated released microstructures

Method and device for measuring the characteristics of an oscillati...

Force sensor device

Method and apparatus for seismic tornado detection

Accelerometers using silicon on insulator technology

Patents Applicationslast 30 patents

Single crystal silicon sensor with high aspect ratio and curvilinea...

Sensor apparatus

Single crystal silicon sensor with high aspect ratio and curvilinea...