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Patents Grantslast 30 patents

Information Patent Grant
Determine optimized read voltage via identification of distribution...
- Patent number 12,217,803
- Issue date Feb 4, 2025
- Micron Technology, Inc.
- AbdelHakim S. Alhussien
- G11 - INFORMATION STORAGE
Information Patent Grant
Imprint recovery for memory arrays
- Patent number 12,190,947
- Issue date Jan 7, 2025
- Micron Technology, Inc.
- Jonathan J. Strand
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory apparatus and testing method thereof
- Patent number 12,190,980
- Issue date Jan 7, 2025
- Winbond Electronics Corp.
- Shao-Ching Liao
- G11 - INFORMATION STORAGE
Information Patent Grant
Wordline system architecture supporting erase operation and I-V cha...
- Patent number 12,176,053
- Issue date Dec 24, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Ramesh Raghavan
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional memory device and method for detecting leakage state
- Patent number 12,165,727
- Issue date Dec 10, 2024
- Yangtze Memory Technologies Co., Ltd.
- Weihua Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Test device and test method thereof
- Patent number 12,154,644
- Issue date Nov 26, 2024
- NANYA TECHNOLOGY CORPORATION
- Yao-Chang Chiu
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of reprogramming data in nonvolatile memory device, method o...
- Patent number 12,154,646
- Issue date Nov 26, 2024
- Samsung Electronics Co., Ltd.
- Junyeong Seok
- G11 - INFORMATION STORAGE
Information Patent Grant
Readout from memory cells subjected to perturbations in threshold v...
- Patent number 12,148,496
- Issue date Nov 19, 2024
- Apple Inc.
- Nir Tishbi
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional semiconductor memory device and method of detecti...
- Patent number 12,144,178
- Issue date Nov 12, 2024
- Samsung Electronics Co., Ltd.
- Taeyoung Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device, memory system including the memory device, and test...
- Patent number 12,125,550
- Issue date Oct 22, 2024
- SK hynix Inc.
- Jun Hyuk Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Test devices having parallel impedances to reduce measurement input...
- Patent number 12,051,478
- Issue date Jul 30, 2024
- Micron Technology, Inc.
- Eric J. Stave
- G11 - INFORMATION STORAGE
Information Patent Grant
Imprint recovery for memory cells
- Patent number 12,040,038
- Issue date Jul 16, 2024
- Micron Technology, Inc.
- Jonathan D. Harms
- G11 - INFORMATION STORAGE
Information Patent Grant
Chip test method and apparatus, computer device, and readable stora...
- Patent number 12,033,712
- Issue date Jul 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yinchuan Gu
- G11 - INFORMATION STORAGE
Information Patent Grant
Program and operating methods of nonvolatile memory device
- Patent number 12,020,761
- Issue date Jun 25, 2024
- Samsung Electronics Co., Ltd.
- Boh-Chang Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of screening non-volatile memory cells
- Patent number 12,014,793
- Issue date Jun 18, 2024
- Silicon Storage Technology, Inc.
- Viktor Markov
- G11 - INFORMATION STORAGE
Information Patent Grant
Program and operating methods of nonvolatile memory device
- Patent number 12,009,046
- Issue date Jun 11, 2024
- Samsung Electronics Co., Ltd.
- Boh-Chang Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage testing circuit with error protection scheme
- Patent number 11,984,184
- Issue date May 14, 2024
- Micron Technology, Inc.
- Subhasis Sasmal
- G11 - INFORMATION STORAGE
Information Patent Grant
Techniques for checking vulnerability to cross-temperature read err...
- Patent number 11,972,804
- Issue date Apr 30, 2024
- SanDisk Technologies, LLC
- Xuan Tian
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with defect detection capability
- Patent number 11,955,195
- Issue date Apr 9, 2024
- Samsung Electronics Co., Ltd.
- Seongkyung Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for optimizing semiconductor device placement on a substrat...
- Patent number 11,929,139
- Issue date Mar 12, 2024
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage device and operating method for controller
- Patent number 11,923,022
- Issue date Mar 5, 2024
- SK Hynix Inc.
- Chol Su Chae
- G11 - INFORMATION STORAGE
Information Patent Grant
Leakage detection for three-dimensional NAND memory
- Patent number 11,923,032
- Issue date Mar 5, 2024
- Yangtze Memory Technologies Co., Ltd.
- Kun Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system including a nonvolatile memory device, and an erasing...
- Patent number 11,894,092
- Issue date Feb 6, 2024
- Samsung Electronics Co., Ltd.
- Myoungho Son
- G11 - INFORMATION STORAGE
Information Patent Grant
Screening of memory circuits
- Patent number 11,881,275
- Issue date Jan 23, 2024
- Texas Instruments Incorporated
- Francisco Adolfo Cano
- G11 - INFORMATION STORAGE
Information Patent Grant
Deterioration detection device
- Patent number 11,862,277
- Issue date Jan 2, 2024
- Samsung Electronics Co., Ltd.
- Youngduk Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Signal processing system capable of performing voltage and frequenc...
- Patent number 11,854,643
- Issue date Dec 26, 2023
- Realtek Semiconductor Corp.
- Cheng-Pin Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Temperature-accelerated solid-state storage testing methods
- Patent number 11,842,785
- Issue date Dec 12, 2023
- Dell Products L.P.
- Samuel Hudson
- G11 - INFORMATION STORAGE
Information Patent Grant
Tracking of read voltages while reading memory cells
- Patent number 11,842,786
- Issue date Dec 12, 2023
- Apple Inc.
- Nir Tishbi
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for improving system DRAM reliability, and sto...
- Patent number 11,837,274
- Issue date Dec 5, 2023
- ZTE Corporation
- Fengpeng Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with efficient DVS controlled by asynchronous inputs
- Patent number 11,837,313
- Issue date Dec 5, 2023
- QUALCOMM Incorporated
- Pradeep Raj
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
IMPRINT RECOVERY FOR MEMORY CELLS
- Publication number 20250054560
- Publication date Feb 13, 2025
- Micron Technology, Inc.
- Jonathan D. Harms
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE, MEMORY SYSTEM INCLUDING THE MEMORY DEVICE, AND TEST...
- Publication number 20250014669
- Publication date Jan 9, 2025
- SK HYNIX INC.
- Jun Hyuk LEE
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH ADJUSTABLE RAMP RATE
- Publication number 20240412804
- Publication date Dec 12, 2024
- Western Digital Technologies, Inc.
- Sai Gautham Thoppa
- G11 - INFORMATION STORAGE
Information Patent Application
MULTIPLIER BASED DEVICE DEGRADATION READOUT CIRCUIT
- Publication number 20240386941
- Publication date Nov 21, 2024
- Micron Technology, Inc.
- Zhi Qi Huang
- G11 - INFORMATION STORAGE
Information Patent Application
READ VOLTAGE CALIBRATION METHOD, MEMORY STORAGE DEVICE AND MEMORY C...
- Publication number 20240377972
- Publication date Nov 14, 2024
- PHISON ELECTRONICS CORP.
- Szu-Wei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
READ PASS VOLTAGE ADJUSTMENT AMONG MULTIPLE ERASE BLOCKS COUPLED TO...
- Publication number 20240347126
- Publication date Oct 17, 2024
- Micron Technology, Inc.
- Akira Goda
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE DOMAIN BASED ERROR MANAGEMENT
- Publication number 20240321380
- Publication date Sep 26, 2024
- Micron Technology, Inc.
- Leon Zlotnik
- G11 - INFORMATION STORAGE
Information Patent Application
MULTI-VOLTAGE RAM USED TO CROSS CLOCK AND VOLTAGE DOMAINS
- Publication number 20240296875
- Publication date Sep 5, 2024
- NVIDIA Corporation
- Jason Golbus
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH DUAL INTERFACE, TEST METHOD AND TEST SYSTEM THEREOF
- Publication number 20240296900
- Publication date Sep 5, 2024
- SILICON MOTION, INC.
- Hsu-Ping OU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICES PROVIDING TEST MODE RELATED TO RELIABILITY
- Publication number 20240282350
- Publication date Aug 22, 2024
- SK HYNIX INC.
- Yun Suk HONG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY APPARATUS AND TESTING METHOD THEREOF
- Publication number 20240282397
- Publication date Aug 22, 2024
- WINBOND ELECTRONICS CORP.
- Shao-Ching Liao
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...
- Publication number 20240177743
- Publication date May 30, 2024
- Micron Technology, Inc.
- James S. Rehmeyer
- G11 - INFORMATION STORAGE
Information Patent Application
POWER SUPPLY CIRCUIT, MEMORY, TESTING DEVICE, MEMORY SYSTEM, AND EL...
- Publication number 20240170041
- Publication date May 23, 2024
- Yangtze Memory Technologies Co., Ltd.
- Yu WANG
- G11 - INFORMATION STORAGE
Information Patent Application
TEST DEVICE AND TEST METHOD THEREOF
- Publication number 20240145024
- Publication date May 2, 2024
- NANYA TECHNOLOGY CORPORATION
- Yao-Chang Chiu
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STORAGE APPARATUS
- Publication number 20240071551
- Publication date Feb 29, 2024
- ABLIC Inc.
- Yasushi IMAI
- G11 - INFORMATION STORAGE
Information Patent Application
MULTI-ZONE TEMPERATURE TESTING SYSTEM
- Publication number 20240071552
- Publication date Feb 29, 2024
- Dell Products L.P.
- Robert Proulx
- G11 - INFORMATION STORAGE
Information Patent Application
PERFORMING SENSE OPERATIONS IN MEMORY
- Publication number 20240038322
- Publication date Feb 1, 2024
- Micron Technology, Inc.
- Michele Maria Venturini
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE TESTING CIRCUIT WITH ERROR PROTECTION SCHEME
- Publication number 20240038321
- Publication date Feb 1, 2024
- Micron Technology, Inc.
- Subhasis Sasmal
- G11 - INFORMATION STORAGE
Information Patent Application
Readout from memory cells subjected to perturbations in threshold v...
- Publication number 20240006014
- Publication date Jan 4, 2024
- Apple Inc.
- Nir Tishbi
- G11 - INFORMATION STORAGE
Information Patent Application
Tracking of read voltages while reading memory cells
- Publication number 20240006015
- Publication date Jan 4, 2024
- Apple Inc.
- Nir Tishbi
- G11 - INFORMATION STORAGE
Information Patent Application
BONDING DEFECT DETECTION FOR DIE-TO-DIE BONDING IN MEMORY DEVICES
- Publication number 20230410934
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Junyoung KO
- G11 - INFORMATION STORAGE
Information Patent Application
TEST DEVICES AND SYSTEMS THAT UTILIZE EFFICIENT TEST ALGORITHMS TO...
- Publication number 20230408554
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Jungmin Bak
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF SCREENING NON-VOLATILE MEMORY CELLS
- Publication number 20230335212
- Publication date Oct 19, 2023
- Silicon Storage Technology, Inc.
- Viktor Markov
- G11 - INFORMATION STORAGE
Information Patent Application
TEMPERATURE-ACCELERATED SOLID-STATE STORAGE TESTING METHODS
- Publication number 20230326541
- Publication date Oct 12, 2023
- Dell Products L.P.
- Samuel Hudson
- G11 - INFORMATION STORAGE
Information Patent Application
CHIP TEST METHOD AND APPARATUS, COMPUTER DEVICE, AND READABLE STORA...
- Publication number 20230317199
- Publication date Oct 5, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Yinchuan GU
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE STORAGE SYSTEM WITH POWER ON READ TIMING REDUCTION
- Publication number 20230260589
- Publication date Aug 17, 2023
- SANDISK TECHNOLOGIES LLC
- Hua-Ling Cynthia Hsu
- G11 - INFORMATION STORAGE
Information Patent Application
IMPRINT MANAGEMENT FOR MEMORY
- Publication number 20230253064
- Publication date Aug 10, 2023
- Micron Technology, Inc.
- Shashank Bangalore Lakshman
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAM AND OPERATING METHODS OF NONVOLATILE MEMORY DEVICE
- Publication number 20230245710
- Publication date Aug 3, 2023
- Samsung Electronics Co., Ltd.
- Boh-Chang KIM
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF REPROGRAMMING DATA IN NONVOLATILE MEMORY DEVICE, METHOD O...
- Publication number 20230207044
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Junyeong SEOK
- G11 - INFORMATION STORAGE
Information Patent Application
IMPRINT RECOVERY FOR MEMORY CELLS
- Publication number 20230187010
- Publication date Jun 15, 2023
- Micron Technology, Inc.
- Jonathan D. Harms
- G11 - INFORMATION STORAGE

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Determine optimized read voltage via identification of distribution...

Imprint recovery for memory arrays

Semiconductor memory apparatus and testing method thereof

Wordline system architecture supporting erase operation and I-V cha...

Three-dimensional memory device and method for detecting leakage state

Test device and test method thereof

Method of reprogramming data in nonvolatile memory device, method o...

Readout from memory cells subjected to perturbations in threshold v...

Three-dimensional semiconductor memory device and method of detecti...

Memory device, memory system including the memory device, and test...

Test devices having parallel impedances to reduce measurement input...

Imprint recovery for memory cells

Chip test method and apparatus, computer device, and readable stora...

Program and operating methods of nonvolatile memory device

Method of screening non-volatile memory cells

Program and operating methods of nonvolatile memory device

Voltage testing circuit with error protection scheme

Techniques for checking vulnerability to cross-temperature read err...

Semiconductor memory device with defect detection capability

Methods for optimizing semiconductor device placement on a substrat...

Storage device and operating method for controller

Leakage detection for three-dimensional NAND memory

Memory system including a nonvolatile memory device, and an erasing...

Screening of memory circuits

Deterioration detection device

Signal processing system capable of performing voltage and frequenc...

Temperature-accelerated solid-state storage testing methods

Tracking of read voltages while reading memory cells

Method and apparatus for improving system DRAM reliability, and sto...

Memory with efficient DVS controlled by asynchronous inputs

Patents Applicationslast 30 patents

IMPRINT RECOVERY FOR MEMORY CELLS

MEMORY DEVICE, MEMORY SYSTEM INCLUDING THE MEMORY DEVICE, AND TEST...

NON-VOLATILE MEMORY WITH ADJUSTABLE RAMP RATE

MULTIPLIER BASED DEVICE DEGRADATION READOUT CIRCUIT

READ VOLTAGE CALIBRATION METHOD, MEMORY STORAGE DEVICE AND MEMORY C...

READ PASS VOLTAGE ADJUSTMENT AMONG MULTIPLE ERASE BLOCKS COUPLED TO...

VOLTAGE DOMAIN BASED ERROR MANAGEMENT

MULTI-VOLTAGE RAM USED TO CROSS CLOCK AND VOLTAGE DOMAINS

MEMORY DEVICE WITH DUAL INTERFACE, TEST METHOD AND TEST SYSTEM THEREOF

SEMICONDUCTOR DEVICES PROVIDING TEST MODE RELATED TO RELIABILITY

SEMICONDUCTOR MEMORY APPARATUS AND TESTING METHOD THEREOF

METHODS FOR OPTIMIZING SEMICONDUCTOR DEVICE PLACEMENT ON A SUBSTRAT...

POWER SUPPLY CIRCUIT, MEMORY, TESTING DEVICE, MEMORY SYSTEM, AND EL...

TEST DEVICE AND TEST METHOD THEREOF

SEMICONDUCTOR STORAGE APPARATUS

MULTI-ZONE TEMPERATURE TESTING SYSTEM

PERFORMING SENSE OPERATIONS IN MEMORY

VOLTAGE TESTING CIRCUIT WITH ERROR PROTECTION SCHEME

Readout from memory cells subjected to perturbations in threshold v...

Tracking of read voltages while reading memory cells

BONDING DEFECT DETECTION FOR DIE-TO-DIE BONDING IN MEMORY DEVICES

TEST DEVICES AND SYSTEMS THAT UTILIZE EFFICIENT TEST ALGORITHMS TO...

METHOD OF SCREENING NON-VOLATILE MEMORY CELLS

TEMPERATURE-ACCELERATED SOLID-STATE STORAGE TESTING METHODS

CHIP TEST METHOD AND APPARATUS, COMPUTER DEVICE, AND READABLE STORA...

NON-VOLATILE STORAGE SYSTEM WITH POWER ON READ TIMING REDUCTION

IMPRINT MANAGEMENT FOR MEMORY

PROGRAM AND OPERATING METHODS OF NONVOLATILE MEMORY DEVICE

METHOD OF REPROGRAMMING DATA IN NONVOLATILE MEMORY DEVICE, METHOD O...

IMPRINT RECOVERY FOR MEMORY CELLS